SG119174A1 - Method and apparatus for inspecting display base plate - Google Patents

Method and apparatus for inspecting display base plate

Info

Publication number
SG119174A1
SG119174A1 SG200301150A SG200301150A SG119174A1 SG 119174 A1 SG119174 A1 SG 119174A1 SG 200301150 A SG200301150 A SG 200301150A SG 200301150 A SG200301150 A SG 200301150A SG 119174 A1 SG119174 A1 SG 119174A1
Authority
SG
Singapore
Prior art keywords
base plate
display base
inspecting display
inspecting
plate
Prior art date
Application number
SG200301150A
Other languages
English (en)
Inventor
Anzai Masayuki
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of SG119174A1 publication Critical patent/SG119174A1/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nonlinear Science (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
SG200301150A 2002-11-18 2003-03-05 Method and apparatus for inspecting display base plate SG119174A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002333450A JP2004170495A (ja) 2002-11-18 2002-11-18 表示用基板の検査方法及び装置

Publications (1)

Publication Number Publication Date
SG119174A1 true SG119174A1 (en) 2006-02-28

Family

ID=32588052

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200301150A SG119174A1 (en) 2002-11-18 2003-03-05 Method and apparatus for inspecting display base plate

Country Status (5)

Country Link
JP (1) JP2004170495A (ja)
KR (1) KR20040044071A (ja)
CN (1) CN1249426C (ja)
SG (1) SG119174A1 (ja)
TW (1) TW571079B (ja)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100722223B1 (ko) * 2004-12-11 2007-05-29 주식회사 매크론 백라이트 유닛 검사 장치
JP4884738B2 (ja) * 2005-09-26 2012-02-29 株式会社日本マイクロニクス 液晶パネル検査装置
JP5051874B2 (ja) * 2006-01-11 2012-10-17 日東電工株式会社 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置
KR100783309B1 (ko) * 2006-02-15 2007-12-10 주식회사 동진쎄미켐 평판 표시 장치의 검사 시스템
TWI409450B (zh) * 2006-05-04 2013-09-21 Au Optronics Corp 光學量測機構
JP4842034B2 (ja) * 2006-07-12 2011-12-21 株式会社日本マイクロニクス 液晶パネルの検査方法および画像処理装置
KR100834730B1 (ko) * 2006-09-04 2008-06-05 케이 이엔지(주) 비전 센서 시스템을 이용한 액정 디스플레이 패널의 불량검사 시스템
JP4960161B2 (ja) * 2006-10-11 2012-06-27 日東電工株式会社 検査データ処理装置及び検査データ処理方法
KR101286534B1 (ko) 2008-02-29 2013-07-16 엘지디스플레이 주식회사 액정표시장치의 검사장치 및 검사방법
TWI376500B (en) 2008-03-28 2012-11-11 Ind Tech Res Inst System for detecting defect of panel device
CN101825781B (zh) * 2009-03-06 2012-02-29 北京京东方光电科技有限公司 光学测试装置
CN102914889B (zh) * 2012-11-15 2016-05-04 昆山迈致治具科技有限公司 Lcd测试治具
TWI502186B (zh) * 2014-05-08 2015-10-01 Utechzone Co Ltd A bright spot detection device for filtering foreign matter noise and its method
KR102250032B1 (ko) * 2014-12-29 2021-05-12 삼성디스플레이 주식회사 표시 장치의 검사 장치 및 표시 장치의 검사 방법
CN105806850A (zh) * 2016-03-10 2016-07-27 惠州高视科技有限公司 一种lcd玻璃缺陷检测装置及检测方法
CN106444105A (zh) * 2016-10-18 2017-02-22 凌云光技术集团有限责任公司 一种液晶屏缺陷检测的方法、装置及***
CN107515222A (zh) * 2017-09-20 2017-12-26 哈尔滨工程大学 一种冰的微观结构观测装置
JP6834903B2 (ja) * 2017-10-20 2021-02-24 トヨタ自動車株式会社 検査装置および検査装置故障確認方法
CN108267453B (zh) * 2017-12-20 2021-05-25 张家港康得新光电材料有限公司 可切换式3d模组的不良检测方法
JP7051445B2 (ja) * 2018-01-10 2022-04-11 日東電工株式会社 光学表示パネルの連続検査方法および連続検査装置、並びに、光学表示パネルの連続製造方法および連続製造システム
CN109632829B (zh) * 2018-12-26 2021-09-24 江苏宏芯亿泰智能装备有限公司 玻璃基板宏观检查装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03217817A (ja) * 1990-01-24 1991-09-25 Nippon Maikuronikusu:Kk 液晶表示パネルの検査方法と検査装置
JPH09257641A (ja) * 1996-03-26 1997-10-03 Seiko Epson Corp 液晶パネルの表示面検査方法及び装置
US5734158A (en) * 1995-04-24 1998-03-31 Advantest Corp. LCD panel test apparatus
WO1998015871A1 (fr) * 1996-10-07 1998-04-16 Hitachi, Ltd. Procede pour la fabrication d'affichages a cristaux liquides, instrument d'inspection optique et procede d'inspection optique
JPH10160628A (ja) * 1996-11-29 1998-06-19 Advantest Corp Ｌｃｄパネルの画質検査装置
JP2000010064A (ja) * 1998-06-25 2000-01-14 Seiko Epson Corp 液晶表示パネルの検査装置及び液晶表示パネルの検査方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61178648A (ja) * 1985-02-04 1986-08-11 Seiko Epson Corp 液晶表示素子検査装置
JPH07146253A (ja) * 1993-11-25 1995-06-06 Sekisui Chem Co Ltd 粘着偏光フィルムの欠陥検査装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03217817A (ja) * 1990-01-24 1991-09-25 Nippon Maikuronikusu:Kk 液晶表示パネルの検査方法と検査装置
US5734158A (en) * 1995-04-24 1998-03-31 Advantest Corp. LCD panel test apparatus
JPH09257641A (ja) * 1996-03-26 1997-10-03 Seiko Epson Corp 液晶パネルの表示面検査方法及び装置
WO1998015871A1 (fr) * 1996-10-07 1998-04-16 Hitachi, Ltd. Procede pour la fabrication d'affichages a cristaux liquides, instrument d'inspection optique et procede d'inspection optique
JPH10160628A (ja) * 1996-11-29 1998-06-19 Advantest Corp Ｌｃｄパネルの画質検査装置
JP2000010064A (ja) * 1998-06-25 2000-01-14 Seiko Epson Corp 液晶表示パネルの検査装置及び液晶表示パネルの検査方法

Also Published As

Publication number Publication date
CN1249426C (zh) 2006-04-05
TW571079B (en) 2004-01-11
TW200408800A (en) 2004-06-01
CN1501073A (zh) 2004-06-02
JP2004170495A (ja) 2004-06-17
KR20040044071A (ko) 2004-05-27

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