KR102455657B1 - 수지 마스크 박리용 세정제 조성물 - Google Patents

수지 마스크 박리용 세정제 조성물 Download PDF

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Publication number
KR102455657B1
KR102455657B1 KR1020197006640A KR20197006640A KR102455657B1 KR 102455657 B1 KR102455657 B1 KR 102455657B1 KR 1020197006640 A KR1020197006640 A KR 1020197006640A KR 20197006640 A KR20197006640 A KR 20197006640A KR 102455657 B1 KR102455657 B1 KR 102455657B1
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KR
South Korea
Prior art keywords
component
cleaning composition
resin mask
mass
preferable
Prior art date
Application number
KR1020197006640A
Other languages
English (en)
Korean (ko)
Other versions
KR20190051965A (ko
Inventor
이사오 니시
Original Assignee
카오카부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=61562305&utm_source=***_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=KR102455657(B1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by 카오카부시키가이샤 filed Critical 카오카부시키가이샤
Publication of KR20190051965A publication Critical patent/KR20190051965A/ko
Application granted granted Critical
Publication of KR102455657B1 publication Critical patent/KR102455657B1/ko

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Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/42Stripping or agents therefor
    • G03F7/422Stripping or agents therefor using liquids only
    • G03F7/425Stripping or agents therefor using liquids only containing mineral alkaline compounds; containing organic basic compounds, e.g. quaternary ammonium compounds; containing heterocyclic basic compounds containing nitrogen
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • B08B3/08Cleaning involving contact with liquid the liquid having chemical or dissolving effect
    • C11D11/0047
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D17/00Detergent materials or soaps characterised by their shape or physical properties
    • C11D17/08Liquid soap, e.g. for dispensers; capsuled
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/02Inorganic compounds
    • C11D7/04Water-soluble compounds
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/26Organic compounds containing oxygen
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/50Solvents
    • C11D7/5004Organic solvents
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/42Stripping or agents therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10Objects to be cleaned
    • C11D2111/14Hard surfaces
    • C11D2111/22Electronic devices, e.g. PCBs or semiconductors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Organic Chemistry (AREA)
  • Wood Science & Technology (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Health & Medical Sciences (AREA)
  • Emergency Medicine (AREA)
  • Inorganic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Detergent Compositions (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Cleaning By Liquid Or Steam (AREA)
KR1020197006640A 2016-09-09 2017-08-24 수지 마스크 박리용 세정제 조성물 KR102455657B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2016-176651 2016-09-09
JP2016176651A JP6860276B2 (ja) 2016-09-09 2016-09-09 樹脂マスク剥離用洗浄剤組成物
PCT/JP2017/030352 WO2018047631A1 (ja) 2016-09-09 2017-08-24 樹脂マスク剥離用洗浄剤組成物

Publications (2)

Publication Number Publication Date
KR20190051965A KR20190051965A (ko) 2019-05-15
KR102455657B1 true KR102455657B1 (ko) 2022-10-17

Family

ID=61562305

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020197006640A KR102455657B1 (ko) 2016-09-09 2017-08-24 수지 마스크 박리용 세정제 조성물

Country Status (5)

Country Link
JP (1) JP6860276B2 (ja)
KR (1) KR102455657B1 (ja)
CN (1) CN109791377B (ja)
TW (1) TW201817864A (ja)
WO (1) WO2018047631A1 (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019111479A1 (ja) * 2017-12-07 2019-06-13 株式会社Jcu レジストの剥離液
JP7020905B2 (ja) * 2017-12-27 2022-02-16 花王株式会社 樹脂マスク剥離用洗浄剤組成物
WO2019172377A1 (ja) 2018-03-07 2019-09-12 株式会社小糸製作所 車両用クリーナシステム
WO2020021721A1 (ja) * 2018-07-27 2020-01-30 花王株式会社 樹脂マスク剥離用洗浄剤組成物
WO2020022491A1 (ja) * 2018-07-27 2020-01-30 花王株式会社 洗浄方法
JP2022087052A (ja) * 2020-11-30 2022-06-09 花王株式会社 樹脂マスク剥離用洗浄剤組成物
WO2022270333A1 (ja) * 2021-06-24 2022-12-29 日油株式会社 回路基板用樹脂膜の剥離剤および回路基板の製造方法
JP7290194B1 (ja) 2022-10-19 2023-06-13 Jsr株式会社 半導体処理用組成物及び処理方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005055701A (ja) 2003-08-05 2005-03-03 Kao Corp レジスト用剥離剤組成物
JP2005509693A (ja) * 2001-11-13 2005-04-14 サムスン エレクトロニクス カンパニー リミテッド シンナー組成物
US20150331313A1 (en) 2012-12-21 2015-11-19 Arkema France Method for manufacturing a nanolithography mask

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0212254A (ja) * 1988-06-30 1990-01-17 Mitsubishi Kasei Corp 現像液組成物
JPH07140676A (ja) 1993-11-16 1995-06-02 Ibiden Co Ltd エポキシ樹脂系フォトソルダーレジストの剥離液
EP1335016A1 (en) * 2002-02-06 2003-08-13 Shipley Company LLC Cleaning composition
US7098181B2 (en) * 2002-05-22 2006-08-29 Kao Corporation Liquid detergent composition
JP4104387B2 (ja) * 2002-07-08 2008-06-18 花王株式会社 剥離剤組成物
JP2004157284A (ja) * 2002-11-06 2004-06-03 Nippon Zeon Co Ltd レジスト剥離液
CN101421386B (zh) * 2005-10-13 2011-08-10 高级技术材料公司 金属相容的光致抗蚀剂和/或牺牲性抗反射涂层去除组合物
US7960328B2 (en) * 2005-11-09 2011-06-14 Advanced Technology Materials, Inc. Composition and method for recycling semiconductor wafers having low-k dielectric materials thereon
JP2008214545A (ja) * 2007-03-06 2008-09-18 Lion Corp 液体洗浄剤組成物
EP2693270B1 (en) * 2011-03-28 2015-12-09 FUJIFILM Corporation Method for producing lithographic printing plate
US20140100151A1 (en) 2012-10-08 2014-04-10 Air Products And Chemicals Inc. Stripping and Cleaning Compositions for Removal of Thick Film Resist
EP3004287B1 (en) * 2013-06-06 2021-08-18 Entegris, Inc. Compositions and methods for selectively etching titanium nitride
US10428271B2 (en) * 2013-08-30 2019-10-01 Entegris, Inc. Compositions and methods for selectively etching titanium nitride
CN104427781B (zh) 2013-09-11 2019-05-17 花王株式会社 树脂掩模层用洗涤剂组合物及电路基板的制造方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005509693A (ja) * 2001-11-13 2005-04-14 サムスン エレクトロニクス カンパニー リミテッド シンナー組成物
JP2005055701A (ja) 2003-08-05 2005-03-03 Kao Corp レジスト用剥離剤組成物
US20150331313A1 (en) 2012-12-21 2015-11-19 Arkema France Method for manufacturing a nanolithography mask

Also Published As

Publication number Publication date
WO2018047631A1 (ja) 2018-03-15
CN109791377A (zh) 2019-05-21
KR20190051965A (ko) 2019-05-15
JP2018041033A (ja) 2018-03-15
JP6860276B2 (ja) 2021-04-14
CN109791377B (zh) 2023-03-28
TW201817864A (zh) 2018-05-16

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