KR101226404B1 - 반도체 집적 회로 및 시험 장치 - Google Patents

반도체 집적 회로 및 시험 장치 Download PDF

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Publication number
KR101226404B1
KR101226404B1 KR1020117000488A KR20117000488A KR101226404B1 KR 101226404 B1 KR101226404 B1 KR 101226404B1 KR 1020117000488 A KR1020117000488 A KR 1020117000488A KR 20117000488 A KR20117000488 A KR 20117000488A KR 101226404 B1 KR101226404 B1 KR 101226404B1
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KR
South Korea
Prior art keywords
circuit
signal
load balance
state
input
Prior art date
Application number
KR1020117000488A
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English (en)
Korean (ko)
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KR20110027770A (ko
Inventor
타수쿠 후지베
요시히토 나가타
마사카츠 수다
Original Assignee
가부시키가이샤 어드밴티스트
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Publication of KR20110027770A publication Critical patent/KR20110027770A/ko
Application granted granted Critical
Publication of KR101226404B1 publication Critical patent/KR101226404B1/ko

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G06F1/32—Means for saving power
    • G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1020117000488A 2008-06-09 2008-06-09 반도체 집적 회로 및 시험 장치 KR101226404B1 (ko)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2008/001469 WO2009150694A1 (ja) 2008-06-09 2008-06-09 半導体集積回路および試験装置

Publications (2)

Publication Number Publication Date
KR20110027770A KR20110027770A (ko) 2011-03-16
KR101226404B1 true KR101226404B1 (ko) 2013-01-24

Family

ID=41416423

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020117000488A KR101226404B1 (ko) 2008-06-09 2008-06-09 반도체 집적 회로 및 시험 장치

Country Status (5)

Country Link
US (1) US8555098B2 (ja)
JP (1) JPWO2009150694A1 (ja)
KR (1) KR101226404B1 (ja)
TW (1) TW201000914A (ja)
WO (1) WO2009150694A1 (ja)

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KR20120028858A (ko) * 2009-06-26 2012-03-23 파나소닉 주식회사 전자 부품과 그 고장 검지 방법
US9285848B2 (en) * 2012-04-27 2016-03-15 Semiconductor Energy Laboratory Co., Ltd. Power reception control device, power reception device, power transmission and reception system, and electronic device
JP2014185853A (ja) * 2013-03-21 2014-10-02 Advantest Corp 電流補償回路、半導体デバイス、タイミング発生器、試験装置
US9306457B2 (en) * 2013-12-04 2016-04-05 Apple Inc. Instantaneous load current monitoring
CN116256624A (zh) 2017-11-15 2023-06-13 普罗泰克斯公司 集成电路裕度测量和故障预测设备
WO2019102467A1 (en) * 2017-11-23 2019-05-31 Proteantecs Ltd. Integrated circuit pad failure detection
US11740281B2 (en) 2018-01-08 2023-08-29 Proteantecs Ltd. Integrated circuit degradation estimation and time-of-failure prediction using workload and margin sensing
WO2019135247A1 (en) 2018-01-08 2019-07-11 Proteantecs Ltd. Integrated circuit workload, temperature and/or sub-threshold leakage sensor
TWI828676B (zh) 2018-04-16 2024-01-11 以色列商普騰泰克斯有限公司 用於積體電路剖析及異常檢測之方法和相關的電腦程式產品
EP3903113A4 (en) 2018-12-30 2022-06-08 Proteantecs Ltd. IC I/O IC INTEGRITY AND DEGRADATION MONITORING
TW202127252A (zh) 2019-12-04 2021-07-16 以色列商普騰泰克斯有限公司 記憶體裝置退化偵測
EP4139697A4 (en) 2020-04-20 2024-05-22 Proteantecs Ltd. CHIP-TO-CHIP CONNECTIVITY MONITORING
US11815551B1 (en) 2022-06-07 2023-11-14 Proteantecs Ltd. Die-to-die connectivity monitoring using a clocked receiver
US12013800B1 (en) 2023-02-08 2024-06-18 Proteantecs Ltd. Die-to-die and chip-to-chip connectivity monitoring

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001007297A (ja) * 1999-04-21 2001-01-12 Advantest Corp Ｃｍｏｓ集積回路及びこれを用いたタイミング信号発生装置
JP2002350503A (ja) * 2001-05-28 2002-12-04 Hitachi Electronics Eng Co Ltd 半導体試験方法及び半導体試験装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59194229A (ja) * 1983-04-20 1984-11-05 Fujitsu Ltd クロツク断検出回路
JPH1174768A (ja) 1997-06-24 1999-03-16 Advantest Corp Ｃｍｏｓ回路用消費電流バランス回路
US6433567B1 (en) * 1999-04-21 2002-08-13 Advantest Corp. CMOS integrated circuit and timing signal generator using same
US6657455B2 (en) * 2000-01-18 2003-12-02 Formfactor, Inc. Predictive, adaptive power supply for an integrated circuit under test
JP4106025B2 (ja) * 2001-11-20 2008-06-25 株式会社アドバンテスト 半導体試験装置
JP4109951B2 (ja) 2002-10-01 2008-07-02 株式会社アドバンテスト マルチストローブ装置、試験装置、及び調整方法
JP4152710B2 (ja) 2002-10-01 2008-09-17 株式会社アドバンテスト ジッタ測定装置、及び試験装置
JP4181987B2 (ja) * 2003-12-26 2008-11-19 株式会社リコー 半導体集積回路および電子装置並びに半導体集積回路のクロック供給状態検出方法
US7558692B2 (en) 2004-09-27 2009-07-07 Advantest Corp. Consumption current balance circuit, compensation current amount adjusting method, timing generator, and semiconductor testing apparatus
US7046027B2 (en) * 2004-10-15 2006-05-16 Teradyne, Inc. Interface apparatus for semiconductor device tester
KR101024220B1 (ko) * 2006-04-28 2011-03-29 가부시키가이샤 어드밴티스트 전력 인가 회로 및 시험 장치

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001007297A (ja) * 1999-04-21 2001-01-12 Advantest Corp Ｃｍｏｓ集積回路及びこれを用いたタイミング信号発生装置
JP2002350503A (ja) * 2001-05-28 2002-12-04 Hitachi Electronics Eng Co Ltd 半導体試験方法及び半導体試験装置

Also Published As

Publication number Publication date
WO2009150694A1 (ja) 2009-12-17
TW201000914A (en) 2010-01-01
JPWO2009150694A1 (ja) 2011-11-04
KR20110027770A (ko) 2011-03-16
US20110109377A1 (en) 2011-05-12
US8555098B2 (en) 2013-10-08

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