JPS5585957A - Logic circuit for test bit selection - Google Patents

Logic circuit for test bit selection

Info

Publication number
JPS5585957A
JPS5585957A JP14583078A JP14583078A JPS5585957A JP S5585957 A JPS5585957 A JP S5585957A JP 14583078 A JP14583078 A JP 14583078A JP 14583078 A JP14583078 A JP 14583078A JP S5585957 A JPS5585957 A JP S5585957A
Authority
JP
Japan
Prior art keywords
circuit
inputted
output
signal
logic circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14583078A
Other languages
Japanese (ja)
Other versions
JPS5853440B2 (en
Inventor
Toshitaka Fukushima
Koji Ueno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP53145830A priority Critical patent/JPS5853440B2/en
Priority to EP79302622A priority patent/EP0011974B1/en
Priority to DE7979302622T priority patent/DE2966682D1/en
Publication of JPS5585957A publication Critical patent/JPS5585957A/en
Publication of JPS5853440B2 publication Critical patent/JPS5853440B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)

Abstract

PURPOSE: To enable one additional circuit independently of the number of test bits, by providing the detection circuit which is outputted with the higher level signal than H level address signal with the path of the address signal bit, and receiving the output with NOR gate.
CONSTITUTION: Among the two address signals A0, A1, the address signal A0 in common use with selection is inputted to the inverter I1 and level detection circuit LC, and the outputs are inputted to the 2-input NOR circuit NR0. The output of the circuit LC is 0 when the signal A0 is 0 and 1L and 1I when 1H only. The output of the inverter I1 and the gate NR0 is respectively fed to the NAND gates NG1, NG2. The output of the circuit LC is inputted to the NAND gates NG3, NG4 via the amplifier B0. The signal A1 is for selection of the test bits Tb1, Tb2 and inputted respectively to the gates NG3, NG4 via the inverters I3, I4. The word lines W1, W2 are selected in the combination of (00), (1L0) of A0, A1, and the test bit Tb1 is selected when A0 is 1H and A1 is 0, and Tb2when A0 is 1H and A1 is 1L.
COPYRIGHT: (C)1980,JPO&Japio
JP53145830A 1978-11-25 1978-11-25 Logic circuit for test bit selection Expired JPS5853440B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP53145830A JPS5853440B2 (en) 1978-11-25 1978-11-25 Logic circuit for test bit selection
EP79302622A EP0011974B1 (en) 1978-11-25 1979-11-19 Programmable memory device provided with test means
DE7979302622T DE2966682D1 (en) 1978-11-25 1979-11-19 Programmable memory device provided with test means

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53145830A JPS5853440B2 (en) 1978-11-25 1978-11-25 Logic circuit for test bit selection

Publications (2)

Publication Number Publication Date
JPS5585957A true JPS5585957A (en) 1980-06-28
JPS5853440B2 JPS5853440B2 (en) 1983-11-29

Family

ID=15394095

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53145830A Expired JPS5853440B2 (en) 1978-11-25 1978-11-25 Logic circuit for test bit selection

Country Status (1)

Country Link
JP (1) JPS5853440B2 (en)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5755600A (en) * 1980-08-14 1982-04-02 Siemens Ag Device for testing memory cell of semiconductor memory
JPS5897800U (en) * 1981-12-22 1983-07-02 日本電気株式会社 memory device
JPS58115828A (en) * 1981-12-29 1983-07-09 Fujitsu Ltd Semiconductor integrated circuit
JPS5960800A (en) * 1982-08-30 1984-04-06 シ−メンス・アクチエンゲゼルシヤフト Digital semiconductor circuit
JPS59217293A (en) * 1983-05-25 1984-12-07 Nec Corp Semiconductor integrated circuit
JPS6059599A (en) * 1983-09-13 1985-04-05 Nec Corp Non-volatile semiconductor memory
JPS60140600A (en) * 1983-12-28 1985-07-25 Oki Electric Ind Co Ltd Nonvolatile memory device
JPS6134800A (en) * 1984-07-25 1986-02-19 Nec Corp Reading exclusive-use semiconductor memory device
JPS62112300A (en) * 1985-10-15 1987-05-23 テキサス　インスツルメンツ　インコ−ポレイテツド Array of programmable solid memory cell and testing therefor
JPS62128099A (en) * 1985-11-28 1987-06-10 Fujitsu Ltd Test circuit for one-time rom
JPS6314400A (en) * 1986-07-04 1988-01-21 Toshiba Corp Nonvolatile semiconductor memory

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5755600A (en) * 1980-08-14 1982-04-02 Siemens Ag Device for testing memory cell of semiconductor memory
JPH0132600B2 (en) * 1980-08-14 1989-07-06 Siemens Ag
JPS6138160Y2 (en) * 1981-12-22 1986-11-04
JPS5897800U (en) * 1981-12-22 1983-07-02 日本電気株式会社 memory device
JPS58115828A (en) * 1981-12-29 1983-07-09 Fujitsu Ltd Semiconductor integrated circuit
JPH03719B2 (en) * 1981-12-29 1991-01-08 Fujitsu Ltd
JPS5960800A (en) * 1982-08-30 1984-04-06 シ−メンス・アクチエンゲゼルシヤフト Digital semiconductor circuit
JPH0524599B2 (en) * 1982-08-30 1993-04-08 Siemens Ag
JPS59217293A (en) * 1983-05-25 1984-12-07 Nec Corp Semiconductor integrated circuit
JPH0120520B2 (en) * 1983-05-25 1989-04-17 Nippon Electric Co
JPH0313680B2 (en) * 1983-09-13 1991-02-25 Nippon Electric Co
JPS6059599A (en) * 1983-09-13 1985-04-05 Nec Corp Non-volatile semiconductor memory
JPS60140600A (en) * 1983-12-28 1985-07-25 Oki Electric Ind Co Ltd Nonvolatile memory device
JPS6134800A (en) * 1984-07-25 1986-02-19 Nec Corp Reading exclusive-use semiconductor memory device
JPS62112300A (en) * 1985-10-15 1987-05-23 テキサス　インスツルメンツ　インコ−ポレイテツド Array of programmable solid memory cell and testing therefor
JPS62128099A (en) * 1985-11-28 1987-06-10 Fujitsu Ltd Test circuit for one-time rom
JPS6314400A (en) * 1986-07-04 1988-01-21 Toshiba Corp Nonvolatile semiconductor memory

Also Published As

Publication number Publication date
JPS5853440B2 (en) 1983-11-29

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