JPS5585957A - Logic circuit for test bit selection - Google Patents

Logic circuit for test bit selection

Info

Publication number
JPS5585957A
JPS5585957A JP14583078A JP14583078A JPS5585957A JP S5585957 A JPS5585957 A JP S5585957A JP 14583078 A JP14583078 A JP 14583078A JP 14583078 A JP14583078 A JP 14583078A JP S5585957 A JPS5585957 A JP S5585957A
Authority
JP
Japan
Prior art keywords
circuit
inputted
output
signal
logic circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14583078A
Other languages
English (en)
Other versions
JPS5853440B2 (ja
Inventor
Toshitaka Fukushima
Koji Ueno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP53145830A priority Critical patent/JPS5853440B2/ja
Priority to EP79302622A priority patent/EP0011974B1/en
Priority to DE7979302622T priority patent/DE2966682D1/de
Publication of JPS5585957A publication Critical patent/JPS5585957A/ja
Publication of JPS5853440B2 publication Critical patent/JPS5853440B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP53145830A 1978-11-25 1978-11-25 テストビット選択用論理回路 Expired JPS5853440B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP53145830A JPS5853440B2 (ja) 1978-11-25 1978-11-25 テストビット選択用論理回路
EP79302622A EP0011974B1 (en) 1978-11-25 1979-11-19 Programmable memory device provided with test means
DE7979302622T DE2966682D1 (en) 1978-11-25 1979-11-19 Programmable memory device provided with test means

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53145830A JPS5853440B2 (ja) 1978-11-25 1978-11-25 テストビット選択用論理回路

Publications (2)

Publication Number Publication Date
JPS5585957A true JPS5585957A (en) 1980-06-28
JPS5853440B2 JPS5853440B2 (ja) 1983-11-29

Family

ID=15394095

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53145830A Expired JPS5853440B2 (ja) 1978-11-25 1978-11-25 テストビット選択用論理回路

Country Status (1)

Country Link
JP (1) JPS5853440B2 (ja)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5755600A (en) * 1980-08-14 1982-04-02 Siemens Ag Device for testing memory cell of semiconductor memory
JPS5897800U (ja) * 1981-12-22 1983-07-02 日本電気株式会社 メモリ装置
JPS58115828A (ja) * 1981-12-29 1983-07-09 Fujitsu Ltd 半導体集積回路
JPS5960800A (ja) * 1982-08-30 1984-04-06 シ−メンス・アクチエンゲゼルシヤフト デイジタル半導体回路
JPS59217293A (ja) * 1983-05-25 1984-12-07 Nec Corp 半導体集積回路
JPS6059599A (ja) * 1983-09-13 1985-04-05 Nec Corp 不揮発性半導体メモリ
JPS60140600A (ja) * 1983-12-28 1985-07-25 Oki Electric Ind Co Ltd 不揮発性メモリ装置
JPS6134800A (ja) * 1984-07-25 1986-02-19 Nec Corp 読出し専用半導体記憶装置
JPS62112300A (ja) * 1985-10-15 1987-05-23 テキサス　インスツルメンツ　インコ−ポレイテツド プログラム可能な固定メモリ・セルのアレ−とその試験方法
JPS62128099A (ja) * 1985-11-28 1987-06-10 Fujitsu Ltd ワンタイムｒｏｍの試験回路
JPS6314400A (ja) * 1986-07-04 1988-01-21 Toshiba Corp 不揮発性半導体メモリ

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5755600A (en) * 1980-08-14 1982-04-02 Siemens Ag Device for testing memory cell of semiconductor memory
JPH0132600B2 (ja) * 1980-08-14 1989-07-06 Siemens Ag
JPS6138160Y2 (ja) * 1981-12-22 1986-11-04
JPS5897800U (ja) * 1981-12-22 1983-07-02 日本電気株式会社 メモリ装置
JPS58115828A (ja) * 1981-12-29 1983-07-09 Fujitsu Ltd 半導体集積回路
JPH03719B2 (ja) * 1981-12-29 1991-01-08 Fujitsu Ltd
JPS5960800A (ja) * 1982-08-30 1984-04-06 シ−メンス・アクチエンゲゼルシヤフト デイジタル半導体回路
JPH0524599B2 (ja) * 1982-08-30 1993-04-08 Siemens Ag
JPS59217293A (ja) * 1983-05-25 1984-12-07 Nec Corp 半導体集積回路
JPH0120520B2 (ja) * 1983-05-25 1989-04-17 Nippon Electric Co
JPH0313680B2 (ja) * 1983-09-13 1991-02-25 Nippon Electric Co
JPS6059599A (ja) * 1983-09-13 1985-04-05 Nec Corp 不揮発性半導体メモリ
JPS60140600A (ja) * 1983-12-28 1985-07-25 Oki Electric Ind Co Ltd 不揮発性メモリ装置
JPS6134800A (ja) * 1984-07-25 1986-02-19 Nec Corp 読出し専用半導体記憶装置
JPS62112300A (ja) * 1985-10-15 1987-05-23 テキサス　インスツルメンツ　インコ−ポレイテツド プログラム可能な固定メモリ・セルのアレ−とその試験方法
JPS62128099A (ja) * 1985-11-28 1987-06-10 Fujitsu Ltd ワンタイムｒｏｍの試験回路
JPS6314400A (ja) * 1986-07-04 1988-01-21 Toshiba Corp 不揮発性半導体メモリ

Also Published As

Publication number Publication date
JPS5853440B2 (ja) 1983-11-29

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