JPS5585957A - Logic circuit for test bit selection - Google Patents
Logic circuit for test bit selectionInfo
- Publication number
- JPS5585957A JPS5585957A JP14583078A JP14583078A JPS5585957A JP S5585957 A JPS5585957 A JP S5585957A JP 14583078 A JP14583078 A JP 14583078A JP 14583078 A JP14583078 A JP 14583078A JP S5585957 A JPS5585957 A JP S5585957A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- inputted
- output
- signal
- logic circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53145830A JPS5853440B2 (ja) | 1978-11-25 | 1978-11-25 | テストビット選択用論理回路 |
EP79302622A EP0011974B1 (en) | 1978-11-25 | 1979-11-19 | Programmable memory device provided with test means |
DE7979302622T DE2966682D1 (en) | 1978-11-25 | 1979-11-19 | Programmable memory device provided with test means |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP53145830A JPS5853440B2 (ja) | 1978-11-25 | 1978-11-25 | テストビット選択用論理回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5585957A true JPS5585957A (en) | 1980-06-28 |
JPS5853440B2 JPS5853440B2 (ja) | 1983-11-29 |
Family
ID=15394095
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53145830A Expired JPS5853440B2 (ja) | 1978-11-25 | 1978-11-25 | テストビット選択用論理回路 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5853440B2 (ja) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5755600A (en) * | 1980-08-14 | 1982-04-02 | Siemens Ag | Device for testing memory cell of semiconductor memory |
JPS5897800U (ja) * | 1981-12-22 | 1983-07-02 | 日本電気株式会社 | メモリ装置 |
JPS58115828A (ja) * | 1981-12-29 | 1983-07-09 | Fujitsu Ltd | 半導体集積回路 |
JPS5960800A (ja) * | 1982-08-30 | 1984-04-06 | シ−メンス・アクチエンゲゼルシヤフト | デイジタル半導体回路 |
JPS59217293A (ja) * | 1983-05-25 | 1984-12-07 | Nec Corp | 半導体集積回路 |
JPS6059599A (ja) * | 1983-09-13 | 1985-04-05 | Nec Corp | 不揮発性半導体メモリ |
JPS60140600A (ja) * | 1983-12-28 | 1985-07-25 | Oki Electric Ind Co Ltd | 不揮発性メモリ装置 |
JPS6134800A (ja) * | 1984-07-25 | 1986-02-19 | Nec Corp | 読出し専用半導体記憶装置 |
JPS62112300A (ja) * | 1985-10-15 | 1987-05-23 | テキサス インスツルメンツ インコ−ポレイテツド | プログラム可能な固定メモリ・セルのアレ−とその試験方法 |
JPS62128099A (ja) * | 1985-11-28 | 1987-06-10 | Fujitsu Ltd | ワンタイムromの試験回路 |
JPS6314400A (ja) * | 1986-07-04 | 1988-01-21 | Toshiba Corp | 不揮発性半導体メモリ |
-
1978
- 1978-11-25 JP JP53145830A patent/JPS5853440B2/ja not_active Expired
Cited By (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5755600A (en) * | 1980-08-14 | 1982-04-02 | Siemens Ag | Device for testing memory cell of semiconductor memory |
JPH0132600B2 (ja) * | 1980-08-14 | 1989-07-06 | Siemens Ag | |
JPS6138160Y2 (ja) * | 1981-12-22 | 1986-11-04 | ||
JPS5897800U (ja) * | 1981-12-22 | 1983-07-02 | 日本電気株式会社 | メモリ装置 |
JPS58115828A (ja) * | 1981-12-29 | 1983-07-09 | Fujitsu Ltd | 半導体集積回路 |
JPH03719B2 (ja) * | 1981-12-29 | 1991-01-08 | Fujitsu Ltd | |
JPS5960800A (ja) * | 1982-08-30 | 1984-04-06 | シ−メンス・アクチエンゲゼルシヤフト | デイジタル半導体回路 |
JPH0524599B2 (ja) * | 1982-08-30 | 1993-04-08 | Siemens Ag | |
JPS59217293A (ja) * | 1983-05-25 | 1984-12-07 | Nec Corp | 半導体集積回路 |
JPH0120520B2 (ja) * | 1983-05-25 | 1989-04-17 | Nippon Electric Co | |
JPH0313680B2 (ja) * | 1983-09-13 | 1991-02-25 | Nippon Electric Co | |
JPS6059599A (ja) * | 1983-09-13 | 1985-04-05 | Nec Corp | 不揮発性半導体メモリ |
JPS60140600A (ja) * | 1983-12-28 | 1985-07-25 | Oki Electric Ind Co Ltd | 不揮発性メモリ装置 |
JPS6134800A (ja) * | 1984-07-25 | 1986-02-19 | Nec Corp | 読出し専用半導体記憶装置 |
JPS62112300A (ja) * | 1985-10-15 | 1987-05-23 | テキサス インスツルメンツ インコ−ポレイテツド | プログラム可能な固定メモリ・セルのアレ−とその試験方法 |
JPS62128099A (ja) * | 1985-11-28 | 1987-06-10 | Fujitsu Ltd | ワンタイムromの試験回路 |
JPS6314400A (ja) * | 1986-07-04 | 1988-01-21 | Toshiba Corp | 不揮発性半導体メモリ |
Also Published As
Publication number | Publication date |
---|---|
JPS5853440B2 (ja) | 1983-11-29 |
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