JP7415560B2 - 外観検査装置、外観検査方法、プログラム及びワークの製造方法 - Google Patents

外観検査装置、外観検査方法、プログラム及びワークの製造方法 Download PDF

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JP7415560B2
JP7415560B2 JP2019562965A JP2019562965A JP7415560B2 JP 7415560 B2 JP7415560 B2 JP 7415560B2 JP 2019562965 A JP2019562965 A JP 2019562965A JP 2019562965 A JP2019562965 A JP 2019562965A JP 7415560 B2 JP7415560 B2 JP 7415560B2
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scanning
section
unit
workpiece
line camera
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Japanese (ja)
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JPWO2019131155A1 (ja
Inventor
雄司 小堀
誠 利根川
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Sony Corp
Sony Group Corp
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Sony Corp
Sony Group Corp
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J19/00—Accessories fitted to manipulators, e.g. for monitoring, for viewing; Safety devices combined with or specially adapted for use in connection with manipulators
    • B25J19/02—Sensing devices
    • B25J19/04—Viewing devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules

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  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Robotics (AREA)
  • Mechanical Engineering (AREA)
  • Textile Engineering (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2019562965A 2017-12-26 2018-12-13 外観検査装置、外観検査方法、プログラム及びワークの製造方法 Active JP7415560B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2017248722 2017-12-26
JP2017248722 2017-12-26
PCT/JP2018/045789 WO2019131155A1 (fr) 2017-12-26 2018-12-13 Dispositif d'inspection d'apparence, procédé d'inspection d'apparence, programme et procédé de fabrication de pièce

Publications (2)

Publication Number Publication Date
JPWO2019131155A1 JPWO2019131155A1 (ja) 2020-12-10
JP7415560B2 true JP7415560B2 (ja) 2024-01-17

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ID=67067047

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JP2019562965A Active JP7415560B2 (ja) 2017-12-26 2018-12-13 外観検査装置、外観検査方法、プログラム及びワークの製造方法

Country Status (4)

Country Link
JP (1) JP7415560B2 (fr)
CN (1) CN111492231B (fr)
TW (1) TW201930826A (fr)
WO (1) WO2019131155A1 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021054059A1 (fr) * 2019-09-20 2021-03-25 株式会社Ｓｃｒｅｅｎホールディングス Dispositif d'imagerie
JP7278186B2 (ja) * 2019-09-20 2023-05-19 株式会社Ｓｃｒｅｅｎホールディングス 撮像装置
JP7436781B2 (ja) * 2019-09-25 2024-02-22 キョーラク株式会社 検査システム
CN112729251A (zh) * 2020-12-23 2021-04-30 上海微电机研究所(中国电子科技集团公司第二十一研究所) 一种柔性扫描机械臂***及柔性扫描方法
JP7316332B2 (ja) * 2021-09-02 2023-07-27 株式会社ジーテクト 外観検査装置
JP7486715B1 (ja) 2023-01-27 2024-05-20 ダイトロン株式会社 外観検査装置及び外観検査方法

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002257738A (ja) 2001-03-05 2002-09-11 Kanto Auto Works Ltd マーキング方法及びマーキング機能付塗面検査装置
JP2003254714A (ja) 2002-02-28 2003-09-10 Uht Corp 位置検出方法及び位置検出装置並びにプリント基板の位置決め方法
JP2007170955A (ja) 2005-12-21 2007-07-05 Nagasaki Univ 変位／ひずみ計測方法及び変位／ひずみ計測装置
JP2008046103A (ja) 2006-07-19 2008-02-28 Shimatec:Kk 表面検査装置
JP2008168372A (ja) 2007-01-10 2008-07-24 Toyota Motor Corp ロボット装置及び形状認識方法
JP2008203280A (ja) 2001-09-21 2008-09-04 Olympus Corp 欠陥検査装置
WO2015011782A1 (fr) 2013-07-23 2015-01-29 株式会社安川電機 Appareil d'inspection

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009168581A (ja) * 2008-01-15 2009-07-30 Saki Corp:Kk 被検査体の検査装置
JP4856672B2 (ja) * 2008-04-25 2012-01-18 株式会社リコー 画像処理装置、画像処理方法、および画像処理プログラム

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002257738A (ja) 2001-03-05 2002-09-11 Kanto Auto Works Ltd マーキング方法及びマーキング機能付塗面検査装置
JP2008203280A (ja) 2001-09-21 2008-09-04 Olympus Corp 欠陥検査装置
JP2003254714A (ja) 2002-02-28 2003-09-10 Uht Corp 位置検出方法及び位置検出装置並びにプリント基板の位置決め方法
JP2007170955A (ja) 2005-12-21 2007-07-05 Nagasaki Univ 変位／ひずみ計測方法及び変位／ひずみ計測装置
JP2008046103A (ja) 2006-07-19 2008-02-28 Shimatec:Kk 表面検査装置
JP2008168372A (ja) 2007-01-10 2008-07-24 Toyota Motor Corp ロボット装置及び形状認識方法
WO2015011782A1 (fr) 2013-07-23 2015-01-29 株式会社安川電機 Appareil d'inspection

Also Published As

Publication number Publication date
TW201930826A (zh) 2019-08-01
JPWO2019131155A1 (ja) 2020-12-10
CN111492231A (zh) 2020-08-04
WO2019131155A1 (fr) 2019-07-04
CN111492231B (zh) 2024-04-16

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