DK1131618T3 - Måleanordning og målemetode til parallel udlæsning af SPR-sensorer - Google Patents

Måleanordning og målemetode til parallel udlæsning af SPR-sensorer

Info

Publication number
DK1131618T3
DK1131618T3 DK99958102T DK99958102T DK1131618T3 DK 1131618 T3 DK1131618 T3 DK 1131618T3 DK 99958102 T DK99958102 T DK 99958102T DK 99958102 T DK99958102 T DK 99958102T DK 1131618 T3 DK1131618 T3 DK 1131618T3
Authority
DK
Denmark
Prior art keywords
light
wavelength
spr
readout
spr sensors
Prior art date
Application number
DK99958102T
Other languages
English (en)
Inventor
Kristina Schmidt
Stefan Dickopf
Dirk Vetter
Original Assignee
Graffinity Pharm Design Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Graffinity Pharm Design Gmbh filed Critical Graffinity Pharm Design Gmbh
Application granted granted Critical
Publication of DK1131618T3 publication Critical patent/DK1131618T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Sorting Of Articles (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
DK99958102T 1998-11-20 1999-11-16 Måleanordning og målemetode til parallel udlæsning af SPR-sensorer DK1131618T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19854370 1998-11-20

Publications (1)

Publication Number Publication Date
DK1131618T3 true DK1131618T3 (da) 2006-02-20

Family

ID=7888969

Family Applications (1)

Application Number Title Priority Date Filing Date
DK99958102T DK1131618T3 (da) 1998-11-20 1999-11-16 Måleanordning og målemetode til parallel udlæsning af SPR-sensorer

Country Status (10)

Country Link
US (1) US6441906B2 (da)
EP (1) EP1131618B1 (da)
JP (1) JP2002530668A (da)
AT (1) ATE306658T1 (da)
AU (1) AU751246B2 (da)
CA (1) CA2351454A1 (da)
DE (2) DE19955556B4 (da)
DK (1) DK1131618T3 (da)
ES (1) ES2251244T3 (da)
WO (1) WO2000031515A1 (da)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6559939B1 (en) * 1999-10-29 2003-05-06 Avery Dennison Corporation Method of high throughput haze screening of material
DE10008006C2 (de) 2000-02-22 2003-10-16 Graffinity Pharm Design Gmbh SPR-Sensor und SPR-Sensoranordnung
DE50112007D1 (de) 2000-02-22 2007-03-22 Santhera Pharmaceuticals Deuts Spr-sensorsystem
DE10020313C1 (de) * 2000-04-20 2001-07-05 Cybio Systems Gmbh Anordnung zur elektrochemischen Analyse mittels Oberflächenplasmonenresonanz
US6747737B2 (en) * 2000-06-29 2004-06-08 Carl Zeiss Jena Gmbh Method for optical detection of an illuminated specimen in a plurality of detection channels
DE10055655C2 (de) * 2000-11-10 2003-06-12 Jandratek Gmbh Plasmonenresonanzsensor, insbesondere für die Biosensorik
US7030988B2 (en) 2001-03-22 2006-04-18 Fuji Photo Film Co., Ltd. Measuring apparatus and measuring chip
US6734956B2 (en) * 2002-05-06 2004-05-11 Reichert, Inc. Optical configuration and method for differential refractive index measurements
JP4109022B2 (ja) * 2002-06-13 2008-06-25 富士フイルム株式会社 測定装置および該測定装置の使用方法
US6804007B2 (en) * 2002-09-10 2004-10-12 Reichert, Inc. Apparatus for multiplexing two surface plasma resonance channels onto a single linear scanned array
JP4173746B2 (ja) * 2003-02-12 2008-10-29 富士フイルム株式会社 測定装置
US7292333B2 (en) * 2003-06-24 2007-11-06 Corning Incorporated Optical interrogation system and method for 2-D sensor arrays
US7057720B2 (en) 2003-06-24 2006-06-06 Corning Incorporated Optical interrogation system and method for using same
WO2005022131A1 (ja) * 2003-08-27 2005-03-10 Toyo Boseki Kabushiki Kaisha 表面プラズモン共鳴装置
WO2005064317A1 (ja) * 2003-12-26 2005-07-14 Matsushita Electric Industrial Co., Ltd. サンプル中のリガンドの分析方法およびサンプル中のリガンドを分析する装置
JP3890362B2 (ja) * 2004-06-17 2007-03-07 国立大学法人室蘭工業大学 表面プラズモン共鳴現象測定装置
WO2006030957A1 (en) * 2004-09-16 2006-03-23 Canon Kabushiki Kaisha Device and method for acquiring information on objective substance to be detected by detecting a change of wavelenght characteristics on the optical transmittance
US7317519B2 (en) * 2004-10-29 2008-01-08 Agilent Technologies, Inc. Swept-angle SPR measurement system
CN100520394C (zh) * 2005-03-08 2009-07-29 中国科学院电子学研究所 一种单通道多参数表面等离子体谐振测试仪
DE102005023489B4 (de) * 2005-05-17 2014-01-30 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung zur Bestimmung der Position zweier entlang einer Messrichtung zueinander beweglicher Objekte und Verfahren zur Bildung eines Referenzimpulses für eine derartige Positionsmesseinrichtung
US7483127B1 (en) * 2005-08-08 2009-01-27 Sru Biosystems, Inc. Method and apparatus for generating an image of biomolecular sensor target area
JP2009543055A (ja) * 2006-06-30 2009-12-03 コーニング インコーポレイテッド フロースルーアッセイ用の流体取扱システム
US8743367B2 (en) * 2007-05-21 2014-06-03 Bio-Rad Laboratories Inc. Optical resonance analysis using a multi-angle source of illumination
KR100865755B1 (ko) * 2007-06-29 2008-10-28 삼성전기주식회사 표면 플라즈몬 공명을 이용한 다채널 바이오 센서
WO2010122547A1 (en) * 2009-04-20 2010-10-28 Bio-Rad Laboratories Inc. Non-scanning surface plasmon resonance ( spr) system
US10481089B2 (en) * 2013-03-12 2019-11-19 Integrated Plasmonics Corporation Optical detection system with tilted sensor
JP7205851B2 (ja) * 2018-05-30 2023-01-17 国立大学法人東京工業大学 屈折率測定装置、屈折率測定方法およびプログラム
CN112665618B (zh) * 2020-12-17 2022-05-17 安徽中元新材料技术有限公司 一种基于形态学的波长敏感模式提取装置及方法

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0627742B2 (ja) * 1982-12-21 1994-04-13 コムテツク リサ−チ ユニツト リミテツド 検定方法及びそのための装置
NL8700851A (nl) * 1987-04-10 1988-11-01 Tno Werkwijze en inrichting voor het detecteren van zeer lage concentraties van een in een meetmedium aanwezige chemische component onder toepassing van oppervlakte-plasmonresonantie en elektrochemisch gestimuleerde adsorptie.
GB8811919D0 (en) * 1988-05-20 1988-06-22 Amersham Int Plc Biological sensors
SE462408B (sv) * 1988-11-10 1990-06-18 Pharmacia Ab Optiskt biosensorsystem utnyttjande ytplasmonresonans foer detektering av en specific biomolekyl, saett att kalibrera sensoranordningen samt saett att korrigera foer baslinjedrift i systemet
DE3909144A1 (de) * 1989-03-21 1990-09-27 Basf Ag Verfahren zur bestimmung von brechungsindex und schichtdicke duenner schichten
US5359681A (en) * 1993-01-11 1994-10-25 University Of Washington Fiber optic sensor and methods and apparatus relating thereto
DE4315211A1 (de) * 1993-05-07 1994-02-03 Gunnar Brink Vorrichtung und Verfahren zum Nachweis der Adsorption von Molekülen mittels Nahinfrarot-Oberflächenplasmonenresonanz
FI96800C (fi) * 1994-02-16 1996-08-26 Valtion Teknillinen Laite analyysin suorittamiseksi
US5485277A (en) * 1994-07-26 1996-01-16 Physical Optics Corporation Surface plasmon resonance sensor and methods for the utilization thereof
AU7598996A (en) * 1995-10-25 1997-05-15 University Of Washington Surface plasmon resonance probe systems based on a folded planar lightpipe
AT403745B (de) * 1996-02-29 1998-05-25 Avl Verbrennungskraft Messtech Messanordnung mit einem für anregungs- und messstrahlung transparentem trägerelement
EP0797091A1 (en) * 1996-03-19 1997-09-24 Texas Instruments Incorporated Surface plasmon resonance sensor with interchangable optical element
DE19615366B4 (de) * 1996-04-19 2006-02-09 Carl Zeiss Jena Gmbh Verfahren und Einrichtung zum Nachweis physikalischer, chemischer, biologischer oder biochemischer Reaktionen und Wechselwirkungen
US5917607A (en) * 1996-04-25 1999-06-29 Fuji Photo Film Co., Ltd. Surface plasmon sensor for multiple channel analysis
WO1998032002A1 (en) * 1997-01-22 1998-07-23 Biacore Ab Pipette and carrier assembly for a sensor
DE19748211A1 (de) * 1997-10-31 1999-05-06 Zeiss Carl Fa Optisches Array-System und Reader für Mikrotiterplatten
DE19814811C1 (de) * 1998-04-02 1999-08-05 Inst Physikalische Hochtech Ev Anordnung für die Oberflächenplasmonen-Resonanz-Spektroskopie
JP2002518663A (ja) * 1998-05-20 2002-06-25 グラッフィニティ ファルマシューティカル デザイン ゲーエムベーハー 液体状態で存在する多数の試料を同時に測定するためのｓｐｒセンサー

Also Published As

Publication number Publication date
AU751246B2 (en) 2002-08-08
EP1131618A1 (de) 2001-09-12
AU1555900A (en) 2000-06-13
CA2351454A1 (en) 2000-06-02
JP2002530668A (ja) 2002-09-17
US20020001085A1 (en) 2002-01-03
DE19955556A1 (de) 2000-06-08
ATE306658T1 (de) 2005-10-15
EP1131618B1 (de) 2005-10-12
US6441906B2 (en) 2002-08-27
ES2251244T3 (es) 2006-04-16
DE19955556B4 (de) 2004-09-09
WO2000031515A1 (de) 2000-06-02
DE59912658D1 (de) 2005-11-17

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