CN114068463A - 芯片的导流结构 - Google Patents

芯片的导流结构 Download PDF

Info

Publication number
CN114068463A
CN114068463A CN202110873141.4A CN202110873141A CN114068463A CN 114068463 A CN114068463 A CN 114068463A CN 202110873141 A CN202110873141 A CN 202110873141A CN 114068463 A CN114068463 A CN 114068463A
Authority
CN
China
Prior art keywords
chip
bumps
conductive
flow
adjacent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202110873141.4A
Other languages
English (en)
Inventor
曾国玮
陈柏琦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sitronix Technology Corp
Original Assignee
Sitronix Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sitronix Technology Corp filed Critical Sitronix Technology Corp
Publication of CN114068463A publication Critical patent/CN114068463A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/10Bump connectors ; Manufacturing methods related thereto
    • H01L24/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L24/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/32Additional lead-in metallisation on a device or substrate, e.g. additional pads or pad portions, lines in the scribe line, sacrificed conductors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2601Apparatus or methods therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2886Features relating to contacting the IC under test, e.g. probe heads; chucks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02Bonding areas ; Manufacturing methods related thereto
    • H01L24/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/81Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/91Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L24/80 - H01L24/90
    • H01L24/92Specific sequence of method steps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/04026Bonding areas specifically adapted for layer connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
    • H01L2224/05553Shape in top view being rectangular
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
    • H01L2224/05554Shape in top view being square
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0556Disposition
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0556Disposition
    • H01L2224/05567Disposition the external layer being at least partially embedded in the surface
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • H01L2224/0601Structure
    • H01L2224/0603Bonding areas having different sizes, e.g. different heights or widths
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • H01L2224/0605Shape
    • H01L2224/06051Bonding areas having different shapes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/06Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
    • H01L2224/061Disposition
    • H01L2224/0612Layout
    • H01L2224/0613Square or rectangular array
    • H01L2224/06131Square or rectangular array being uniform, i.e. having a uniform pitch across the array
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/1012Auxiliary members for bump connectors, e.g. spacers
    • H01L2224/10122Auxiliary members for bump connectors, e.g. spacers being formed on the semiconductor or solid-state body to be connected
    • H01L2224/10145Flow barriers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/13Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
    • H01L2224/13001Core members of the bump connector
    • H01L2224/1301Shape
    • H01L2224/13012Shape in top view
    • H01L2224/13013Shape in top view being rectangular or square
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/13Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
    • H01L2224/13001Core members of the bump connector
    • H01L2224/1302Disposition
    • H01L2224/13023Disposition the whole bump connector protruding from the surface
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/1401Structure
    • H01L2224/1403Bump connectors having different sizes, e.g. different diameters, heights or widths
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/1405Shape
    • H01L2224/14051Bump connectors having different shapes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/141Disposition
    • H01L2224/1412Layout
    • H01L2224/1413Square or rectangular array
    • H01L2224/14131Square or rectangular array being uniform, i.e. having a uniform pitch across the array
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/141Disposition
    • H01L2224/1412Layout
    • H01L2224/1413Square or rectangular array
    • H01L2224/14132Square or rectangular array being non uniform, i.e. having a non uniform pitch across the array
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/141Disposition
    • H01L2224/1412Layout
    • H01L2224/1413Square or rectangular array
    • H01L2224/14133Square or rectangular array with a staggered arrangement, e.g. depopulated array
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/141Disposition
    • H01L2224/1412Layout
    • H01L2224/1413Square or rectangular array
    • H01L2224/14134Square or rectangular array covering only portions of the surface to be connected
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L2224/14Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
    • H01L2224/141Disposition
    • H01L2224/1412Layout
    • H01L2224/14177Combinations of arrays with different layouts
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/16227Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/2612Auxiliary members for layer connectors, e.g. spacers
    • H01L2224/26122Auxiliary members for layer connectors, e.g. spacers being formed on the semiconductor or solid-state body to be connected
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/2612Auxiliary members for layer connectors, e.g. spacers
    • H01L2224/26122Auxiliary members for layer connectors, e.g. spacers being formed on the semiconductor or solid-state body to be connected
    • H01L2224/26145Flow barriers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/28Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L2224/29Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
    • H01L2224/29001Core members of the layer connector
    • H01L2224/29099Material
    • H01L2224/29198Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
    • H01L2224/29199Material of the matrix
    • H01L2224/2929Material of the matrix with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/28Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L2224/29Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
    • H01L2224/29001Core members of the layer connector
    • H01L2224/29099Material
    • H01L2224/29198Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
    • H01L2224/29298Fillers
    • H01L2224/29299Base material
    • H01L2224/293Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/81Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • H01L2224/8119Arrangement of the bump connectors prior to mounting
    • H01L2224/81191Arrangement of the bump connectors prior to mounting wherein the bump connectors are disposed only on the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/81Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • H01L2224/819Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector with the bump connector not providing any mechanical bonding
    • H01L2224/81901Pressing the bump connector against the bonding areas by means of another connector
    • H01L2224/81903Pressing the bump connector against the bonding areas by means of another connector by means of a layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/83007Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector involving a permanent auxiliary member being left in the finished device, e.g. aids for holding or protecting the layer connector during or after the bonding process
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/838Bonding techniques
    • H01L2224/8385Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
    • H01L2224/83851Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester being an anisotropic conductive adhesive
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/91Methods for connecting semiconductor or solid state bodies including different methods provided for in two or more of groups H01L2224/80 - H01L2224/90
    • H01L2224/92Specific sequence of method steps
    • H01L2224/921Connecting a surface with connectors of different types
    • H01L2224/9211Parallel connecting processes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02Bonding areas ; Manufacturing methods related thereto
    • H01L24/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/10Bump connectors ; Manufacturing methods related thereto
    • H01L24/12Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L24/13Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/10Bump connectors ; Manufacturing methods related thereto
    • H01L24/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L24/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/28Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L24/29Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L24/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Wire Bonding (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Control Of Vending Devices And Auxiliary Devices For Vending Devices (AREA)
  • Magnetic Heads (AREA)
  • Fittings On The Vehicle Exterior For Carrying Loads, And Devices For Holding Or Mounting Articles (AREA)

Abstract

本发明提供一种芯片的导流结构,其包含至少一导流件,该至少一导流件设置于一芯片的一表面,并相邻设置于芯片的表面的多个连接凸块,当芯片设置于一板件时,该至少一导流件可导引位于芯片的表面的导电介质向该多个连接凸块流动,驱使导电介质的多个导电粒子往该多个连接凸块移动,进而可增加位于该多个连接凸块的表面的导电粒子的数量,又或者可减缓导电介质流动,而可避免导电粒子离开该多个连接凸块的表面,可避免降低位于该多个连接凸块的表面的导电粒子的数量。

Description

芯片的导流结构
技术领域
本发明是关于一种芯片的导流结构,尤其指一种设置于芯片,并能引导导电介质的流向或者减缓导电介质的流动的结构。
背景技术
随着时代的演进,电子产品逐渐朝轻、薄小型化快速发展,各种电子产品几乎都以显示器作为展示信息的组件,例如在摄录放影机、笔记本电脑、智能型手机或其他行动装置等产品,显示器已是电子产品中重要的组件。
显示器的面板需搭配驱动芯片才能显示影像,驱动芯片用于驱动面板运作,以显示影像。一般而言,有多种技术可将驱动芯片设置于面板,而该些技术通常需要使用导电介质,例如异向性导电膜(Anisotropic Conductive Film,ACF),导电介质包含导电粒子,导电粒子可接触驱动芯片的连接凸块(Bump)与面板的电连接件,所以驱动芯片可电性连接面板,如此驱动芯片可传递驱动讯号至面板,而驱动面板显示影像。
但习知技术中,设置驱动芯片于面板时,导电介质会任意流动于驱动芯片的表面,导致导电介质的导电粒子无法有效地分布于驱动芯片的连接凸块的表面,如此即会影响驱动芯片传输讯号至面板的能力,而面板可能无法正常运作。此外,此问题并非仅存在于面板的驱动芯片,也存在于其他类型芯片,例如芯片设置于电路板,因此,产业界需要一种导流结构,其可以导引导电介质往芯片的连接凸块流动,以增加导电粒子分布于连接凸块的表面的数量,又或者可以减缓导电介质流动,以避免降低位于连接凸块的表面的导电粒子的数量。
发明内容
本发明的一目的在于提供一种芯片的导流结构,其包含至少一导流件,导流件设置于芯片的表面,并相邻于设置在芯片的表面的多个连接凸块,当芯片设置于板件时,导流件可导引导电介质向连接凸块流动,驱使导电粒子往连接凸块移动,如此可增加位于连接凸块的表面的导电粒子的数量,又或者可减缓导电介质流动,而可避免导电粒子离开连接凸块的表面,以可避免降低位于连接凸块的表面的导电粒子的数量。
本发明的一目的在于提供一种芯片的导流结构,其包含多个连接凸块群组,其设置于芯片的表面,该多个连接凸块群组各别包含多个凸块,当芯片设置于板件时,该多个凸块可减缓导电介质流动,而可避免导电粒子离开凸块的表面,如此可避免降低位于凸块的表面的导电粒子的数量。
本发明提供一种芯片的导流结构,其包含多个连接凸块以及至少一导流件,该多个连接凸块设置于一芯片的一表面,该至少一导流件亦设置于芯片的表面,并相邻于该多个连接凸块,利用导流件阻挡导电介质,迫使导电介质流向该多个连接凸块,或者减缓导电介质流动,进而避免位于该多个连接凸块的表面的导电粒子的数量过低。
本发明提供另一种芯片的导流结构,其包含多个连接凸块群组,该多个连接凸块群组设置于一芯片的一表面,该多个连接凸块群组各别包含多个凸块,同一连接凸块群组的该多个凸块互相相邻,并对应同一电连接件,利用此结构阻挡导电介质,而减缓导电介质流动,进而避免位于该多个凸块的表面的导电粒子的数量过低。
附图说明
图1:其为本发明的导流结构的第一实施例的立体示意图;
图2:其为本发明的导流结构的第一实施例的俯视示意图;
图3:其为本发明的导流结构的第一实施例的剖视示意图;
图4:其为本发明的导流结构的第二实施例的俯视示意图;
图5:其为本发明的导流结构的第三实施例的立体示意图;
图6:其为本发明的导流结构的第三实施例的俯视示意图;
图7:其为本发明的导流结构的第三实施例的剖视示意图;
图8:其为本发明的导流结构的第四实施例的立体示意图;
图9:其为本发明的导流结构的第四实施例的俯视示意图;
图10:其为本发明的导流结构的第四实施例的剖视示意图;
图11:其为本发明的导流结构的第五实施例的俯视示意图;
图12:其为本发明的导流结构的第六实施例的立体示意图;以及
图13:其为本发明的导流结构的第六实施例的剖视示意图。
【图号对照说明】
1 导流结构
2 芯片
3 表面
4 线路区域
10 连接凸块
101 第二侧面
12 间隔
20 导流件
202 斜面
203 底面
204 斜面
22 导流凸块
221 第一侧面
24 填充件
242 间隔
30 板件
32 电连接件
40 导电介质
42 导电粒子
50 连接凸块群组
52 凸块
H1 高度
H2 高度
具体实施方式
为了使本发明的结构特征及所达成的功效有更进一步的了解与认识,特用较佳的实施例及配合详细的说明,说明如下:
请参阅图1,其为本发明的导流结构的第一实施例的立体示意图。如图所示,本发明的导流结构1包含多个连接凸块10以及至少一导流件20。
再次参阅图1以及参阅图3,图3为本发明的导流结构的第一实施例的剖视示意图。于本实施例中,该多个连接凸块10设置于一芯片2的一表面3,该多个连接凸块10的材料为导电材料,该至少一导流件20设置于芯片2的表面3,并相邻于该多个连接凸块10。该至少一导流件20具有一高度H1,该多个连接凸块10具有一高度H2,高度H1小于或等于高度H2,该至少一导流件20不高于该多个连接凸块10。
再次参阅第1、3图以及参阅图2,图2为本发明的导流结构的第一实施例的俯视示意图。如图所示,本实施例的导流件20的数量为多个,并以该多个导流件20为例进行说明,该多个导流件20可包含多个导流凸块22,该多个导流凸块22相邻于该多个连接凸块10。该多个导流凸块22的一第一侧面221对应于该多个连接凸块10的一第二侧面101,且第一侧面221的一面积可大于第二侧面101的一面积。当芯片2设置于一板件30,板件30可为显示面板或者电路板等,该多个导流凸块22可有效阻挡一导电介质40,而减缓导电介质40的流动,且驱使其回流至该多个连接凸块10,其相当于该多个导流凸块22导引导电介质40流到该多个连接凸块10。
如图2、图3所示,加入导电介质40于芯片2的表面3而欲将芯片2设置于板件30时,芯片2受力而导致导电介质40流动于芯片2的表面3。如图2所示,导电介质40会受该多个导流凸块22阻挡而减缓流动,且导电介质40受到该多个导流凸块22的阻挡后也会回流至该多个连接凸块10。如图3所示,导电介质40包含的多个导电粒子42也随的向该多个连接凸块10移动,而可位于该多个连接凸块10的表面。多个电连接件32设置于板件30,而该多个连接凸块10各别对应该多个电连接件32。
当芯片2设置于板件30时,位于该多个连接凸块10的表面的该多个导电粒子42会接触该多个连接凸块10与对应的该多个电连接件32,如此该多个连接凸块10可各别电性连接对应的该多个电连接件32,即芯片2可电性连接板件30。该多个导流凸块22阻挡导电介质40,而减缓导体介质40的流动,可避免该多个导电粒子42离开该多个连接凸块10的表面。此外,导电介质40受到该多个导流凸块22的阻挡而回流至该多个连接凸块10时,该多个导电粒子42向该多个连接凸块10移动,可增加该多个连接凸块10与该多个电连接件32之间的该些导电粒子42的数量,而提升芯片2与板件30间的传输能力。于本发明的一实施例中,该多个导流凸块22可不对应于该多个电连接件32,即该多个导流凸块22可不电性连接于该多个电连接件32。
再次参阅图3,该多个导流件20的至少一侧面相邻该多个连接凸块10,该多个导流件20的该至少一侧面可为非斜面或者斜面。于本实施例中,该至少一导流件20以该多个导流凸块22举例,该多个导流凸块22的该至少一侧面可为一斜面202,也可为一非斜面。导电介质40流动时,斜面202可导引导电介质40及其包含的导电粒子42向该多个连接凸块10移动,如此可增加位于该多个连接凸块10与该多个电连接件32之间的该些导电粒子42的数量。斜面202与导流凸块22的底面203间的夹角可为锐角,该多个导流凸块22可为导体或者非导体,导电介质40可为异向性导电膜(Anisotropic Conductive Film,ACF),但本发明不在此限制。
请参阅图4,其为本发明的导流结构的第二实施例的俯视示意图。如图所示,本实施例中,在该多个连接凸块10的其中的至少一的周围可设置超过一个导流凸块22,即相对于连接凸块10的前侧面、后侧面、左侧面或者右侧面各设置一个导流凸块22,也就是多个导流凸块22相邻于至少一连接凸块10的多个侧面,利用该多个导流凸块22限制导电介质40的流动,进一步驱使该多个导电粒子42可集中于该多个连接凸块10与该多个电连接件32之间。
请参阅图5,其为本发明的导流结构的第三实施例的立体示意图。如图所示,本实施例的导流结构1包含多个连接凸块群组50,该多个连接凸块群组50设置于芯片2的表面3,该多个连接凸块群组50各别包含多个凸块52,同一連接凸块群组50的该多个凸块52互相相邻,并对应板件30的同一个电连接件32。本实施例相对于第一实施例,该多个连接凸块10各别分割成该多个凸块52,该多个凸块52仍对应同一个电连接件32。
再次参阅图5以及参阅图6、图7,图6为本发明的导流结构的第三实施例的俯视示意图;图7为本发明的导流结构的第三实施例的剖视示意图。如图所示,于本实施例中,加入导电介质40于芯片2的表面3而欲将芯片2设置于板件30时,芯片2受力而导致导电介质40于芯片2的表面3流动,导电介质40受该多个凸块52阻挡,而减缓导电介质40的流动,使导电介质40可尽量保持于该多个凸块52的周围,以避免该多个导电粒子42离开该多个凸块52的表面,且将该多个导电粒子42集中于该多个凸块52与该多个电连接件32之间。
请参阅图8,其为本发明的导流结构的第四实施例的立体示意图。如图所示,本实施例的导流结构1包含多个连接凸块10以及至少一导流件20。于本实施例中,该至少一导流件20为至少一填充件24,该至少一填充件24填充于芯片2的一线路区域4,且相邻该多个连接凸块10。线路区域4为芯片2的线路的所在区域。于本实施例中,该至少一填充件24围绕于该多个连接凸块10。如图10所示,该至少一填充件24具有高度H1,该多个连接凸块10具有高度H2,高度H1小于或等于高度H2。
再次参阅图8以及请参阅图9、图10,图9为本发明的导流结构的第四实施例的俯视示意图,图10为本发明的导流结构的第四实施例的剖视示意图。如图所示,加入导电介质40于芯片2的表面3与该至少一填充件24的表面而欲将芯片2设置于板件30时,芯片2受力而导致导电介质40于芯片2的表面3与该至少一填充件24的表面流动。由于该至少一填充件24围绕该多个连接凸块10,所以位于芯片2的表面3的导电介质40会被该至少一填充件24阻挡,而被限制流动于该多个连接凸块10的所在位置,相当于导引导电介质40流动至该多个连接凸块10的表面,而集中导电粒子42于该多个连接凸块10与该多个电连接件32之间。此外,当芯片2受力设置于板件30时,位于该至少一填充件24的表面的导电介质40受该至少一填充件24阻挡,驱使导电介质40流动至未被该至少一填充件24填充的芯片2的表面,也就是该多个连接凸块10的所在位置。如图10所示,位于该至少一填充件24的表面的导电介质40包含的该多个导电粒子42也随的向该多个连接凸块10移动,而增加位于该多个连接凸块10与该多个电连接件32之间的该多个导电粒子42的数量。
再次参阅图10,本实施例中,该至少一填充件24的至少一侧面相邻该多个连接凸块10,该至少一填充件24的该至少一侧面可为斜面204,但也可以为非斜面。该至少一填充件24的材料为绝缘材,例如聚酰亚胺(Polyimide,PI)、苯并环丁烯(Benzocyclobutene,BCB),但本实施例不在此限制。
请参阅图11,其为本发明的导流结构的第五实施例的俯视示意图。如图所示,本实施例的导流结构1可包含多个填充件24,该多个填充件24之间具有一间隔242。加入导电介质40于芯片2的表面3与该多个填充件24的表面而欲将芯片2设置于板件30时,位于芯片2的表面3的导电介质40会被该多个填充件24阻挡,而减缓导电介质40的流动,且导电介质40向该多个连接凸块10回流,相当于导引导电介质40流动至该多个连接凸块10的表面。此外,如上述说明,位于该多个填充件24的表面的导电介质40流动至该多个连接凸块10。本实施例中,该多个填充件24的至少一侧面可为斜面。
请参阅图12,其为本发明的导流结构的第六实施例的立体示意图。如图所示,本实施例中填充件24更填充于该多个连接凸块10间的多个间隔12,使填充件24包覆该多个连接凸块10的侧面。于本实施例中,填充件24几乎覆盖芯片2的所有表面。于一实施例中,填充件24的高度可小于或者等于该多个连接凸块10的高度。
再次参阅图12以及请参阅图13,图13为本发明的第六实施例的剖视示意图。如图所示,加入导电介质40于填充件24的表面而欲将芯片2设置于板件30时,如先前所述,位于填充件24的表面的导电介质40流动至该多个连接凸块10。如图13所示,导电介质40包含的该多个导电粒子42也随的向该多个连接凸块10移动,增加位于该多个连接凸块10与该多个电连接件32之间的该多个导电粒子42的数量。上述各实施例可相互结合应用,以提高效能。
综上所述,本发明提供一种芯片的导流结构,其包含至少一导流件,导流件设置于芯片的表面,并相邻设置在芯片的表面的多个连接凸块,导流件可阻挡导电介质,使导电介质向该多个连接凸块流动,进而增加位于该多个连接凸块的表面的导电粒子的数量,导流件亦可减缓导电介质的流动,而可避免导电粒子离开该多个连接凸块的表面。此外,更可将该多个连接凸块分为多个凸块,该多个凸块可减缓导电介质的流动,让导电介质保持于该多个凸块的周围,进而避免位于该多个凸块的表面的导电粒子离开该多个凸块的表面。
上文仅为本发明的较佳实施例而已,并非用来限定本发明实施的范围,凡依本发明权利要求范围所述的形状、构造、特征及精神所为的均等变化与修饰,均应包括于本发明的权利要求范围内。

Claims (16)

1.一种芯片的导流结构,其特征在于,其包含:
多个连接凸块,其设置于一芯片的一表面;以及
至少一导流件,其设置于该芯片的该表面,并相邻于该多个连接凸块。
2.如权利要求1所述的芯片的导流结构,其特征在于,其中该至少一导流件的一高度小于或等于该多个连接凸块的一高度。
3.如权利要求1所述的芯片的导流结构,其特征在于,其中该至少一导流件的至少一侧面相邻该多个连接凸块,该至少一导流件的该至少一侧面为一斜面。
4.如权利要求1所述的芯片的导流结构,其特征在于,其中该至少一导流件包含多个导流件,该多个导流件包含多个导流凸块,该多个导流凸块相邻于该多个连接凸块。
5.如权利要求4所述的芯片的导流结构,其特征在于,其中该多个导流凸块的一第一侧面对应于该多个连接凸块的一第二侧面,该第一侧面的一面积大于该第二侧面的一面积。
6.如权利要求4所述的芯片的导流结构,其特征在于,其中该多个导流凸块其中的多个导流凸块相邻于该多个连接凸块其中的至少一连接凸块的多个侧面。
7.如权利要求4所述的芯片的导流结构,其特征在于,其中该多个导流凸块的至少一侧面相邻该多个连接凸块,该多个导流凸块的该至少一侧面为一斜面。
8.如权利要求4所述的芯片的导流结构,其特征在于,其中该多个导流凸块为导体或者非导体。
9.如权利要求1所述的芯片的导流结构,其特征在于,其中该至少一导流件为至少一填充件,该至少一填充件填充于该芯片的一线路区域,且相邻该多个连接凸块。
10.如权利要求9所述的芯片的导流结构,其特征在于,其中该至少一填充件包含多个填充件,该多个填充件之间具有一间隔。
11.如权利要求9所述的芯片的导流结构,其特征在于,其中该至少一填充件更填充于该多个连接凸块间的多个间隔。
12.如权利要求9所述的芯片的导流结构,其特征在于,其中该至少一填充件的至少一侧面相邻该多个连接凸块,该至少一填充件的该至少一侧面为一斜面。
13.如权利要求9所述的芯片的导流结构,其特征在于,其中该至少一填充件的材料为绝缘材。
14.如权利要求1所述的芯片的导流结构,其特征在于,其中该多个连接凸块各别对应多个电连接件,该多个电连接件设置于一板件。
15.一种芯片的导流结构,其特征在于,其包含:
多个连接凸块群组,其设置于一芯片的一表面,该多个连接凸块群组各别包含多个凸块,同一连接凸块群组的该多个凸块互相相邻,并对应同一电连接件。
16.如权利要求15所述的芯片的导流结构,其特征在于,其中该电连接件设置于一板件。
CN202110873141.4A 2020-07-31 2021-07-30 芯片的导流结构 Pending CN114068463A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US202063059178P 2020-07-31 2020-07-31
US63/059,178 2020-07-31

Publications (1)

Publication Number Publication Date
CN114068463A true CN114068463A (zh) 2022-02-18

Family

ID=80003342

Family Applications (2)

Application Number Title Priority Date Filing Date
CN202110873141.4A Pending CN114068463A (zh) 2020-07-31 2021-07-30 芯片的导流结构
CN202110882063.4A Pending CN114062718A (zh) 2020-07-31 2021-08-02 芯片的测试垫结构

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN202110882063.4A Pending CN114062718A (zh) 2020-07-31 2021-08-02 芯片的测试垫结构

Country Status (5)

Country Link
US (2) US20220037275A1 (zh)
JP (2) JP7311561B2 (zh)
KR (2) KR20220016004A (zh)
CN (2) CN114068463A (zh)
TW (3) TWI806112B (zh)

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55141949U (zh) * 1979-03-29 1980-10-11
JPH0375531U (zh) * 1989-11-27 1991-07-29
US6180426B1 (en) * 1999-03-01 2001-01-30 Mou-Shiung Lin High performance sub-system design and assembly
TW479304B (en) * 2001-02-06 2002-03-11 Acer Display Tech Inc Semiconductor apparatus and its manufacturing method, and liquid crystal display using semiconductor apparatus
JP2003273490A (ja) * 2002-03-12 2003-09-26 Sharp Corp 基板接合構造及びそれを備えた電子装置
US6937047B2 (en) * 2003-08-05 2005-08-30 Freescale Semiconductor, Inc. Integrated circuit with test pad structure and method of testing
JP2005228871A (ja) 2004-02-12 2005-08-25 Seiko Epson Corp 実装構造体、電気光学装置及び電子機器
TWI243386B (en) * 2004-02-26 2005-11-11 Au Optronics Corp Anisotropic conductive film pad
JP4067502B2 (ja) 2004-03-11 2008-03-26 シャープ株式会社 半導体装置、半導体装置の実装構造およびそれを備える電子機器ならびに表示装置
JP4141403B2 (ja) * 2004-04-01 2008-08-27 富士通株式会社 半導体装置及び半導体装置の製造方法
US20060109014A1 (en) * 2004-11-23 2006-05-25 Te-Tsung Chao Test pad and probe card for wafer acceptance testing and other applications
TWI269045B (en) * 2004-12-16 2006-12-21 Nanya Technology Corp Method for measuring the resistance of deep trench capacitor
JP2008135468A (ja) * 2006-11-27 2008-06-12 Nec Lcd Technologies Ltd 半導体素子及び該半導体素子を備える表示装置
RU2487435C1 (ru) * 2009-06-16 2013-07-10 Шарп Кабусики Кайся Полупроводниковый кристалл и его монтажная структура
TW201117336A (en) * 2009-11-05 2011-05-16 Raydium Semiconductor Corp Electronic chip and substrate providing insulation protection between conducting nodes
JP2014053597A (ja) 2012-08-09 2014-03-20 Hitachi Chemical Co Ltd チップ型電子部品及び接続構造体
KR20140128739A (ko) * 2013-04-29 2014-11-06 삼성디스플레이 주식회사 도전성 입자 및 이를 포함하는 표시 장치
US10283424B1 (en) * 2018-03-08 2019-05-07 Taiwan Semiconductor Manufacturing Co., Ltd. Wafer structure and packaging method

Also Published As

Publication number Publication date
KR20220016004A (ko) 2022-02-08
JP2022028636A (ja) 2022-02-16
JP2022031629A (ja) 2022-02-22
TW202349576A (zh) 2023-12-16
KR20220016003A (ko) 2022-02-08
CN114062718A (zh) 2022-02-18
KR102663115B1 (ko) 2024-05-21
JP7311561B2 (ja) 2023-07-19
TWI812987B (zh) 2023-08-21
TW202207379A (zh) 2022-02-16
TW202210843A (zh) 2022-03-16
US11694983B2 (en) 2023-07-04
US20220037275A1 (en) 2022-02-03
TWI806112B (zh) 2023-06-21
US20220037218A1 (en) 2022-02-03
JP7394273B2 (ja) 2023-12-08

Similar Documents

Publication Publication Date Title
JP5068067B2 (ja) 表示装置および平面型表示装置
US7224424B2 (en) Drive IC and display device having the same
CN109976051B (zh) 显示面板
KR20080020858A (ko) 칩 필름 패키지 및 이를 포함하는 디스플레이 패널어셈블리
US7084517B2 (en) Semiconductor device connecting structure, liquid crystal display unit based on the same connecting structure, and electronic apparatus using the same display unit
EP2432006A1 (en) Semiconductor chip and structure for mounting same
CN212380069U (zh) 一种拼接显示装置
KR100622170B1 (ko) 전자 부품의 실장 방법, 전자 부품의 실장 구조, 전자부품 모듈 및 전자 기기
CN100426068C (zh) 具有外部端子的lcd器件
CN113178132A (zh) 覆晶薄膜组、显示面板及显示模组
CN108718481B (zh) 一种引脚结构及显示面板的绑定结构
CN102157475B (zh) 电子器件及电子设备
JP2006154726A (ja) フレキシブル回路基板およびこれを用いた液晶表示装置
KR102391249B1 (ko) 표시 장치
CN114068463A (zh) 芯片的导流结构
CN101252105A (zh) 电路板结构、覆晶电路和驱动电路的布线结构
CN101539690A (zh) 基板电极结构及使用其与驱动元件的接合结构
CN217822793U (zh) 电子装置
US11307457B1 (en) Direct type backlight device
CN105323947A (zh) 可挠性线路载板
CN114255658A (zh) 显示面板及显示装置
US20230369265A1 (en) Film package and package module including the same
CN115206187B (zh) 一种覆晶薄膜组
CN115206916A (zh) 芯片的凸块结构
CN114501967B (zh) 显示面板及电子设备

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination