NO332795B1 - Fremgangsmate og anordning til laserbehandling av kretskort - Google Patents
Fremgangsmate og anordning til laserbehandling av kretskort Download PDFInfo
- Publication number
- NO332795B1 NO332795B1 NO20012728A NO20012728A NO332795B1 NO 332795 B1 NO332795 B1 NO 332795B1 NO 20012728 A NO20012728 A NO 20012728A NO 20012728 A NO20012728 A NO 20012728A NO 332795 B1 NO332795 B1 NO 332795B1
- Authority
- NO
- Norway
- Prior art keywords
- laser beam
- value
- laser processing
- laser
- hole
- Prior art date
Links
- 238000012545 processing Methods 0.000 title claims abstract description 229
- 238000000034 method Methods 0.000 title claims description 70
- 230000002159 abnormal effect Effects 0.000 claims abstract description 98
- 238000003672 processing method Methods 0.000 claims abstract description 66
- 239000010410 layer Substances 0.000 claims description 76
- 239000002344 surface layer Substances 0.000 claims description 8
- 230000005855 radiation Effects 0.000 claims description 5
- 238000001514 detection method Methods 0.000 description 94
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 33
- 239000011889 copper foil Substances 0.000 description 33
- 238000007689 inspection Methods 0.000 description 32
- 230000003287 optical effect Effects 0.000 description 28
- 238000010586 diagram Methods 0.000 description 22
- 230000005856 abnormality Effects 0.000 description 19
- 229920005989 resin Polymers 0.000 description 10
- 239000011347 resin Substances 0.000 description 10
- 230000000694 effects Effects 0.000 description 9
- 230000001788 irregular Effects 0.000 description 9
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 6
- 230000010354 integration Effects 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 238000012805 post-processing Methods 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 238000010330 laser marking Methods 0.000 description 4
- 229910002092 carbon dioxide Inorganic materials 0.000 description 3
- 239000001569 carbon dioxide Substances 0.000 description 3
- 230000000644 propagated effect Effects 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 125000004122 cyclic group Chemical group 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 238000003908 quality control method Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000020477 pH reduction Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000007781 pre-processing Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/03—Observing, e.g. monitoring, the workpiece
- B23K26/032—Observing, e.g. monitoring, the workpiece using optical means
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/0026—Etching of the substrate by chemical or physical means by laser ablation
- H05K3/0032—Etching of the substrate by chemical or physical means by laser ablation of organic insulating material
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0266—Marks, test patterns or identification means
- H05K1/0269—Marks, test patterns or identification means for visual or optical inspection
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/05—Patterning and lithography; Masks; Details of resist
- H05K2203/0548—Masks
- H05K2203/0554—Metal used as mask for etching vias, e.g. by laser ablation
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/163—Monitoring a manufacturing process
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49155—Manufacturing circuit on or in base
- Y10T29/49165—Manufacturing circuit on or in base by forming conductive walled aperture in base
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Laser Beam Processing (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000165991A JP3460678B2 (ja) | 2000-06-02 | 2000-06-02 | レーザ加工方法および加工装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
NO20012728D0 NO20012728D0 (no) | 2001-06-01 |
NO20012728L NO20012728L (no) | 2001-12-03 |
NO332795B1 true NO332795B1 (no) | 2013-01-14 |
Family
ID=18669377
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NO20012728A NO332795B1 (no) | 2000-06-02 | 2001-06-01 | Fremgangsmate og anordning til laserbehandling av kretskort |
Country Status (7)
Country | Link |
---|---|
US (1) | US6694614B2 (ko) |
EP (1) | EP1161126B1 (ko) |
JP (1) | JP3460678B2 (ko) |
KR (1) | KR100864067B1 (ko) |
CN (1) | CN1198490C (ko) |
NO (1) | NO332795B1 (ko) |
TW (1) | TWI250059B (ko) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6947802B2 (en) * | 2000-04-10 | 2005-09-20 | Hypertherm, Inc. | Centralized control architecture for a laser materials processing system |
US7916388B2 (en) | 2007-12-20 | 2011-03-29 | Cymer, Inc. | Drive laser for EUV light source |
US6690692B2 (en) * | 2002-01-29 | 2004-02-10 | Hans Laser Technology Co., Ltd. | Third harmonic laser system |
US7186947B2 (en) | 2003-03-31 | 2007-03-06 | Hypertherm, Inc. | Process monitor for laser and plasma materials processing of materials |
JP2005125359A (ja) * | 2003-10-23 | 2005-05-19 | Honda Motor Co Ltd | レーザビームによる溝の加工方法 |
US20060163220A1 (en) | 2005-01-27 | 2006-07-27 | Brandt Aaron D | Automatic gas control for a plasma arc torch |
JP2006305608A (ja) * | 2005-04-28 | 2006-11-09 | Toshiba Corp | レーザ加工装置、及びレーザ加工方法 |
JP2007206550A (ja) * | 2006-02-03 | 2007-08-16 | Toshiba Corp | 液晶パネルの欠陥画素修正装置 |
US7945087B2 (en) * | 2006-06-26 | 2011-05-17 | Orbotech Ltd. | Alignment of printed circuit board targets |
JP5090690B2 (ja) * | 2006-08-28 | 2012-12-05 | 三菱電機株式会社 | 半導体薄膜の製造方法、薄膜トランジスタの製造方法、及び半導体薄膜の製造装置 |
JP5132911B2 (ja) * | 2006-10-03 | 2013-01-30 | 浜松ホトニクス株式会社 | レーザ加工方法 |
JP5029804B2 (ja) * | 2006-11-02 | 2012-09-19 | 澁谷工業株式会社 | 脆性材料の割断方法 |
TW200936287A (en) * | 2007-11-26 | 2009-09-01 | Nat Inst Of Advanced Ind Scien | Mold removing method |
US8284247B2 (en) * | 2008-02-15 | 2012-10-09 | Enerize Corporation | Method and apparatus for detecting and inspecting through-penetrating defects in foils and films |
US9390172B2 (en) * | 2009-12-03 | 2016-07-12 | Microsoft Technology Licensing, Llc | Communication channel between web application and process outside browser |
JP6425368B2 (ja) * | 2012-04-27 | 2018-11-21 | 株式会社ディスコ | レーザー加工装置及びレーザー加工方法 |
JP5967122B2 (ja) * | 2014-03-20 | 2016-08-10 | トヨタ自動車株式会社 | レーザー溶接装置及びレーザー溶接方法 |
JP2016019997A (ja) * | 2014-07-15 | 2016-02-04 | ファナック株式会社 | 被加工物をレーザ加工するレーザ加工システム |
JP6423812B2 (ja) * | 2016-02-29 | 2018-11-14 | ファナック株式会社 | 反射光を抑制しつつレーザ加工を開始できるレーザ加工装置 |
TWI571761B (zh) * | 2016-03-08 | 2017-02-21 | 國立勤益科技大學 | 印刷電路板之裝配排程最佳化方法 |
CN109365410B (zh) * | 2018-10-17 | 2020-09-18 | 北京航天控制仪器研究所 | 一种实现高效激光清洗的加工头装置及清洗方法 |
JP6983369B1 (ja) * | 2021-04-05 | 2021-12-17 | 三菱電機株式会社 | レーザ加工装置、学習装置、および推論装置 |
JP2023008089A (ja) * | 2021-07-05 | 2023-01-19 | 浜松ホトニクス株式会社 | レーザ加工装置及びレーザ加工方法 |
CN113618837B (zh) * | 2021-08-09 | 2023-03-24 | 金宝电子(铜陵)有限公司 | 自动化覆铜箔层压板加工方法、***及其装置 |
WO2024024579A1 (ja) * | 2022-07-28 | 2024-02-01 | パナソニックIpマネジメント株式会社 | レーザ溶接モニタリング装置 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5645715B2 (ko) * | 1973-06-29 | 1981-10-28 | ||
US4328410A (en) * | 1978-08-24 | 1982-05-04 | Slivinsky Sandra H | Laser skiving system |
US4519064A (en) * | 1980-10-27 | 1985-05-21 | Nippon Columbia Kabushikikaisha | Optical record disc |
US4412743A (en) * | 1981-09-08 | 1983-11-01 | Discovision Associates | Off-axis light beam defect detector |
JPH0785128B2 (ja) * | 1986-01-14 | 1995-09-13 | 三晃技研工業株式会社 | 細孔内壁内視方法およびその装置 |
JPH0292482A (ja) * | 1988-09-30 | 1990-04-03 | Hitachi Ltd | レーザ穿孔装置 |
US5310986A (en) * | 1992-04-28 | 1994-05-10 | Mitsubishi Denki Kabushiki Kaisha | Laser machining apparatus |
US5317141A (en) * | 1992-08-14 | 1994-05-31 | National Semiconductor Corporation | Apparatus and method for high-accuracy alignment |
US5726443A (en) * | 1996-01-18 | 1998-03-10 | Chapman Glenn H | Vision system and proximity detector |
US6037103A (en) * | 1996-12-11 | 2000-03-14 | Nitto Denko Corporation | Method for forming hole in printed board |
US6040552A (en) * | 1997-01-30 | 2000-03-21 | Jain; Kanti | High-speed drilling system for micro-via pattern formation, and resulting structure |
JP3346263B2 (ja) * | 1997-04-11 | 2002-11-18 | イビデン株式会社 | プリント配線板及びその製造方法 |
JP3794120B2 (ja) * | 1997-09-02 | 2006-07-05 | 松下電器産業株式会社 | レーザ孔加工方法および装置 |
TW436357B (en) * | 1997-12-12 | 2001-05-28 | Matsushita Electric Ind Co Ltd | Laser drilling equipment and control method |
JP3011173B2 (ja) * | 1998-01-27 | 2000-02-21 | 日本電気株式会社 | 半導体装置のホール開口検査方法とそのための装置 |
-
2000
- 2000-06-02 JP JP2000165991A patent/JP3460678B2/ja not_active Expired - Fee Related
-
2001
- 2001-05-30 EP EP01112831.1A patent/EP1161126B1/en not_active Expired - Lifetime
- 2001-05-31 KR KR1020010030341A patent/KR100864067B1/ko not_active IP Right Cessation
- 2001-05-31 US US09/867,621 patent/US6694614B2/en not_active Expired - Lifetime
- 2001-06-01 TW TW090113376A patent/TWI250059B/zh not_active IP Right Cessation
- 2001-06-01 CN CNB011208341A patent/CN1198490C/zh not_active Expired - Fee Related
- 2001-06-01 NO NO20012728A patent/NO332795B1/no not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TWI250059B (en) | 2006-03-01 |
EP1161126A2 (en) | 2001-12-05 |
US20020008093A1 (en) | 2002-01-24 |
NO20012728D0 (no) | 2001-06-01 |
US6694614B2 (en) | 2004-02-24 |
EP1161126A3 (en) | 2003-01-22 |
CN1198490C (zh) | 2005-04-20 |
KR20010110150A (ko) | 2001-12-12 |
JP2001340980A (ja) | 2001-12-11 |
NO20012728L (no) | 2001-12-03 |
EP1161126B1 (en) | 2013-11-20 |
JP3460678B2 (ja) | 2003-10-27 |
CN1326837A (zh) | 2001-12-19 |
KR100864067B1 (ko) | 2008-10-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM1K | Lapsed by not paying the annual fees |