NL177961C - Bistabiele inrichting die tijdens het bedrijf kan worden onderzocht. - Google Patents

Bistabiele inrichting die tijdens het bedrijf kan worden onderzocht.

Info

Publication number
NL177961C
NL177961C NLAANVRAGE7501108,A NL7501108A NL177961C NL 177961 C NL177961 C NL 177961C NL 7501108 A NL7501108 A NL 7501108A NL 177961 C NL177961 C NL 177961C
Authority
NL
Netherlands
Prior art keywords
output
logic
circuit
load
time
Prior art date
Application number
NLAANVRAGE7501108,A
Other languages
English (en)
Dutch (nl)
Other versions
NL177961B (nl
NL7501108A (nl
Original Assignee
Sie Forney Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sie Forney Spa filed Critical Sie Forney Spa
Publication of NL7501108A publication Critical patent/NL7501108A/
Publication of NL177961B publication Critical patent/NL177961B/xx
Application granted granted Critical
Publication of NL177961C publication Critical patent/NL177961C/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3185Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318522Test of Sequential circuits
    • G01R31/318525Test of flip-flops or latches
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30Marginal testing, e.g. by varying supply voltage
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/267Reconfiguring circuits for testing, e.g. LSSD, partitioning
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01Details
    • H03K3/013Modifications of generator to prevent operation by noise or interference
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037Bistable circuits
    • H03K3/0375Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
NLAANVRAGE7501108,A 1974-03-15 1975-01-30 Bistabiele inrichting die tijdens het bedrijf kan worden onderzocht. NL177961C (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT49300/74A IT1004381B (it) 1974-03-15 1974-03-15 Dispositivo elettronico bistabile verificabile durante il servizio

Publications (3)

Publication Number Publication Date
NL7501108A NL7501108A (nl) 1975-09-17
NL177961B NL177961B (nl) 1985-07-16
NL177961C true NL177961C (nl) 1985-12-16

Family

ID=11270262

Family Applications (1)

Application Number Title Priority Date Filing Date
NLAANVRAGE7501108,A NL177961C (nl) 1974-03-15 1975-01-30 Bistabiele inrichting die tijdens het bedrijf kan worden onderzocht.

Country Status (10)

Country Link
US (1) US3970873A (it)
BE (1) BE825909A (it)
CA (1) CA1030608A (it)
CH (1) CH586976A5 (it)
DE (1) DE2506351C3 (it)
ES (1) ES435128A1 (it)
FR (1) FR2264427B1 (it)
GB (1) GB1497745A (it)
IT (1) IT1004381B (it)
NL (1) NL177961C (it)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4742247A (en) * 1985-04-26 1988-05-03 Advanced Micro Devices, Inc. CMOS address transition detector with temperature compensation
US5541882A (en) * 1995-01-09 1996-07-30 Texas Instruments Incorporated Method of performing a column decode in a memory device and apparatus thereof
US20090067616A1 (en) * 2007-09-07 2009-03-12 Kerby William Suhre CAN echo cancellation level shifter
TR201917294A2 (tr) 2019-11-07 2021-05-21 Univ Istanbul Teknik Tersi̇ni̇r ve korunumlu kapilardan yararlanilarak cmos devrelerde oluşan eş zamanli hatalarin tamami̇yle tespi̇ti̇

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3870953A (en) * 1972-08-01 1975-03-11 Roger Boatman & Associates Inc In circuit electronic component tester
US3833853A (en) * 1973-04-13 1974-09-03 Honeywell Inf Systems Method and apparatus for testing printed wiring boards having integrated circuits

Also Published As

Publication number Publication date
FR2264427A1 (it) 1975-10-10
BE825909A (fr) 1975-06-16
IT1004381B (it) 1976-07-10
NL177961B (nl) 1985-07-16
CA1030608A (en) 1978-05-02
NL7501108A (nl) 1975-09-17
DE2506351B2 (de) 1981-06-11
DE2506351A1 (de) 1975-09-18
ES435128A1 (es) 1977-02-01
US3970873A (en) 1976-07-20
DE2506351C3 (de) 1982-05-27
FR2264427B1 (it) 1980-01-11
GB1497745A (en) 1978-01-12
CH586976A5 (it) 1977-04-15

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Legal Events

Date Code Title Description
BA A request for search or an international-type search has been filed
DNT Communications of changes of names of applicants whose applications have been laid open to public inspection

Free format text: SIE FORNEY S.P.A.

BB A search report has been drawn up
BC A request for examination has been filed
A85 Still pending on 85-01-01
V1 Lapsed because of non-payment of the annual fee