CA1030608A - Bistable logic circuit with in-service test capability - Google Patents

Bistable logic circuit with in-service test capability

Info

Publication number: CA1030608A
Authority: CA; Canada
Prior art keywords: logic circuit; service test; test capability; bistable logic; bistable
Prior art date: 1974-03-15
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired

Application number

CA218,237A

Other languages

English (en)

French (fr)

Inventor

Antonio Banfi

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

ITALIANA ELETTRONICA SpA Soc

Original Assignee

ITALIANA ELETTRONICA SpA Soc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1974-03-15

Filing date

1975-01-20

Publication date

1978-05-02

1975-01-20 Application filed by ITALIANA ELETTRONICA SpA Soc filed Critical ITALIANA ELETTRONICA SpA Soc

1978-05-02 Application granted granted Critical

1978-05-02 Publication of CA1030608A publication Critical patent/CA1030608A/en

Status Expired legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318522—Test of Sequential circuits
- G01R31/318525—Test of flip-flops or latches
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/01—Details
- H03K3/013—Modifications of generator to prevent operation by noise or interference
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H03K3/037—Bistable circuits
- H03K3/0375—Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Theoretical Computer Science (AREA)
Computer Hardware Design (AREA)
Quality & Reliability (AREA)
Microelectronics & Electronic Packaging (AREA)
Tests Of Electronic Circuits (AREA)
Logic Circuits (AREA)
Test And Diagnosis Of Digital Computers (AREA)

CA218,237A 1974-03-15 1975-01-20 Bistable logic circuit with in-service test capability Expired CA1030608A (en)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
IT49300/74A IT1004381B (it)	1974-03-15	1974-03-15	Dispositivo elettronico bistabile verificabile durante il servizio

Publications (1)

Publication Number	Publication Date
CA1030608A true CA1030608A (en)	1978-05-02

Family

ID=11270262

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
CA218,237A Expired CA1030608A (en)	1974-03-15	1975-01-20	Bistable logic circuit with in-service test capability

Country Status (10)

Country	Link
US (1)	US3970873A (it)
BE (1)	BE825909A (it)
CA (1)	CA1030608A (it)
CH (1)	CH586976A5 (it)
DE (1)	DE2506351C3 (it)
ES (1)	ES435128A1 (it)
FR (1)	FR2264427B1 (it)
GB (1)	GB1497745A (it)
IT (1)	IT1004381B (it)
NL (1)	NL177961C (it)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4742247A (en) *	1985-04-26	1988-05-03	Advanced Micro Devices, Inc.	CMOS address transition detector with temperature compensation
US5541882A (en) *	1995-01-09	1996-07-30	Texas Instruments Incorporated	Method of performing a column decode in a memory device and apparatus thereof
US20090067616A1 (en) *	2007-09-07	2009-03-12	Kerby William Suhre	CAN echo cancellation level shifter
TR201917294A2 (tr)	2019-11-07	2021-05-21	Univ Istanbul Teknik	Tersi̇ni̇r ve korunumlu kapilardan yararlanilarak cmos devrelerde oluşan eş zamanli hatalarin tamami̇yle tespi̇ti̇

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3870953A (en) *	1972-08-01	1975-03-11	Roger Boatman & Associates Inc	In circuit electronic component tester
US3833853A (en) *	1973-04-13	1974-09-03	Honeywell Inf Systems	Method and apparatus for testing printed wiring boards having integrated circuits

1974
- 1974-03-15 IT IT49300/74A patent/IT1004381B/it active
1975
- 1975-01-02 US US05/537,849 patent/US3970873A/en not_active Expired - Lifetime
- 1975-01-20 CA CA218,237A patent/CA1030608A/en not_active Expired
- 1975-01-30 NL NLAANVRAGE7501108,A patent/NL177961C/xx not_active IP Right Cessation
- 1975-02-14 GB GB6308/75A patent/GB1497745A/en not_active Expired
- 1975-02-14 DE DE2506351A patent/DE2506351C3/de not_active Expired
- 1975-02-25 BE BE2054172A patent/BE825909A/xx unknown
- 1975-02-25 FR FR7506503A patent/FR2264427B1/fr not_active Expired
- 1975-02-27 ES ES435128A patent/ES435128A1/es not_active Expired
- 1975-03-05 CH CH274375A patent/CH586976A5/xx not_active IP Right Cessation

Also Published As

Publication number	Publication date
FR2264427A1 (it)	1975-10-10
BE825909A (fr)	1975-06-16
IT1004381B (it)	1976-07-10
NL177961B (nl)	1985-07-16
NL7501108A (nl)	1975-09-17
NL177961C (nl)	1985-12-16
DE2506351B2 (de)	1981-06-11
DE2506351A1 (de)	1975-09-18
ES435128A1 (es)	1977-02-01
US3970873A (en)	1976-07-20
DE2506351C3 (de)	1982-05-27
FR2264427B1 (it)	1980-01-11
GB1497745A (en)	1978-01-12
CH586976A5 (it)	1977-04-15

Publication	Publication Date	Title
AU8053975A (en)	1976-10-28	Testing logic networks
CA965479A (en)	1975-04-01	Large-scale integrated circuit testing structure
CA1033786A (en)	1978-06-27	Bistable electromagnetic switching device
HK42279A (en)	1979-07-06	Logic circuit
CA1003499A (en)	1977-01-11	Logic test probe and indicator circuit
IL46732A (en)	1977-07-31	Test arrangement
CA1024609A (en)	1978-01-17	Bistable multivibrator circuit
AU465484B2 (en)	1975-10-02	Logic circuit operation testing apparatus
AU1541470A (en)	1971-11-25	Reactance circuit tester
CA1030608A (en)	1978-05-02	Bistable logic circuit with in-service test capability
CA950969A (en)	1974-07-09	Battery tester
CA946929A (en)	1974-05-07	Battery tester
CA1017411A (en)	1977-09-13	Circuit for testing a logic delay timer
JPS5166957A (en)	1976-06-10	Rooracheenno pin
CA1036255A (en)	1978-08-08	Trunk busy test circuit
GB1549683A (en)	1979-08-08	Comparator/bistable circuit
CA935228A (en)	1973-10-09	Single pulse test circuit
JPS51138151A (en)	1976-11-29	Bistable circuit
CA921121A (en)	1973-02-13	Battery tester for testing intercell connectors
CA899052A (en)	1972-05-02	Testing machine
CA942327A (en)	1974-02-19	Low-temperature spinel porcelain
JPS5166958A (en)	1976-06-10	Rooracheenno pin
AU492793B2 (en)	1976-11-04	Testing bistable memory cells
CA939747A (en)	1974-01-08	In-service bushing test
AU8067975A (en)	1976-11-04	Testing bistable memory cells