KR20150104538A - 진직형상 측정방법 및 진직형상 측정장치 - Google Patents

진직형상 측정방법 및 진직형상 측정장치 Download PDF

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Publication number
KR20150104538A
KR20150104538A KR1020150031106A KR20150031106A KR20150104538A KR 20150104538 A KR20150104538 A KR 20150104538A KR 1020150031106 A KR1020150031106 A KR 1020150031106A KR 20150031106 A KR20150031106 A KR 20150031106A KR 20150104538 A KR20150104538 A KR 20150104538A
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South Korea
Prior art keywords
measured
curvature
shape
height data
sampling
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KR1020150031106A
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English (en)
Korean (ko)
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고이치 이치하라
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스미도모쥬기가이고교 가부시키가이샤
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Publication of KR20150104538A publication Critical patent/KR20150104538A/ko

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/30Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
KR1020150031106A 2014-03-05 2015-03-05 진직형상 측정방법 및 진직형상 측정장치 KR20150104538A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2014-042251 2014-03-05
JP2014042251A JP6199205B2 (ja) 2014-03-05 2014-03-05 真直形状測定方法及び真直形状測定装置

Publications (1)

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KR20150104538A true KR20150104538A (ko) 2015-09-15

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KR1020150031106A KR20150104538A (ko) 2014-03-05 2015-03-05 진직형상 측정방법 및 진직형상 측정장치

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JP (1) JP6199205B2 (zh)
KR (1) KR20150104538A (zh)
CN (1) CN104897105B (zh)
TW (1) TWI534410B (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108844497A (zh) * 2018-06-07 2018-11-20 东北大学 一种数控机床导轨安装面直线度检测装置及方法
CN109855590B (zh) * 2019-01-12 2021-03-23 吉林大学 一种圆柱类零件弯曲变形轴线杠杆式连续测量方法
CN109596075A (zh) * 2019-01-28 2019-04-09 天津市兆瑞测控技术有限公司 一种直线度或弯曲度在线测量装置及方法
JP7296334B2 (ja) * 2020-03-26 2023-06-22 住友重機械工業株式会社 真直度計測システム、変位センサ校正方法、及び真直度計測方法
CN111644901B (zh) * 2020-04-09 2022-05-13 武汉船用机械有限责任公司 工件加工轴线的校正方法和装置
CN115235376B (zh) * 2022-09-23 2023-01-17 国网天津市电力公司电力科学研究院 一种非接触式电缆敷设质量检测方法及检测装置
CN115854949B (zh) * 2023-03-02 2023-05-16 泗水县金佳工贸有限公司 一种卷纸用弧形辊的弧形自动检测装置及控制方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2617707C2 (de) * 1975-04-23 1986-02-20 The Rank Organisation Ltd., London Vorrichtung zum Vermessen einer Oberfläche
FR2727198A1 (fr) * 1994-11-18 1996-05-24 Otis Elevator Co Capteur de distance et notamment du positionnement des cabines d'ascenseur
JPH09210668A (ja) * 1996-02-07 1997-08-12 Mitsubishi Heavy Ind Ltd 真直形状測定方法
JP2003254747A (ja) * 2002-02-28 2003-09-10 Mitsutoyo Corp 真直度測定法
JP2005062016A (ja) * 2003-08-13 2005-03-10 Fuji Photo Film Co Ltd 放射線像変換体およびその製造方法
JP4400331B2 (ja) * 2004-06-17 2010-01-20 信越半導体株式会社 ウエーハの形状評価方法及び管理方法
JP4197339B2 (ja) * 2006-01-16 2008-12-17 アンリツ株式会社 三次元形状測定装置
JP2007333556A (ja) * 2006-06-15 2007-12-27 Micro Engineering Inc 逐次多点式真直度測定法および測定装置
JP5100612B2 (ja) * 2008-10-29 2012-12-19 住友重機械工業株式会社 真直度測定方法及び真直度測定装置
JP5263126B2 (ja) * 2009-11-09 2013-08-14 新日鐵住金株式会社 板材の光学式形状測定方法及び測定装置
CN102221354B (zh) * 2011-04-02 2013-01-09 中南大学 一种多测点浮动定位表面不平顺测量方法
CN104359413B (zh) * 2014-10-15 2017-02-15 武汉中科创新技术股份有限公司 一种利用激光位移传感器测量钢管直径的装置及方法

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Publication number Publication date
TWI534410B (zh) 2016-05-21
TW201534864A (zh) 2015-09-16
CN104897105A (zh) 2015-09-09
JP2015169451A (ja) 2015-09-28
CN104897105B (zh) 2018-08-07
JP6199205B2 (ja) 2017-09-20

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