KR20130087421A - 발광 특성 측정 장치 및 방법 - Google Patents

발광 특성 측정 장치 및 방법 Download PDF

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Publication number
KR20130087421A
KR20130087421A KR1020130008084A KR20130008084A KR20130087421A KR 20130087421 A KR20130087421 A KR 20130087421A KR 1020130008084 A KR1020130008084 A KR 1020130008084A KR 20130008084 A KR20130008084 A KR 20130008084A KR 20130087421 A KR20130087421 A KR 20130087421A
Authority
KR
South Korea
Prior art keywords
light
light emitting
receiving
light receiving
optical integrator
Prior art date
Application number
KR1020130008084A
Other languages
English (en)
Korean (ko)
Inventor
아키시게 이토
요시키 야나기사와
요시노리 마츠모토
데츠야 사토
신지 이시카와
렌 우치다
Original Assignee
요코가와 덴키 가부시키가이샤
샤프 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 요코가와 덴키 가부시키가이샤, 샤프 가부시키가이샤 filed Critical 요코가와 덴키 가부시키가이샤
Publication of KR20130087421A publication Critical patent/KR20130087421A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0252—Constructional arrangements for compensating for fluctuations caused by, e.g. temperature, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a photometer; Purge systems, cleaning devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0254—Spectrometers, other than colorimeters, making use of an integrating sphere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • G01J2001/083—Testing response of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/446—Photodiode

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
KR1020130008084A 2012-01-27 2013-01-24 발광 특성 측정 장치 및 방법 KR20130087421A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2012-015707 2012-01-27
JP2012015707A JP5461595B2 (ja) 2012-01-27 2012-01-27 発光特性測定装置及び方法

Publications (1)

Publication Number Publication Date
KR20130087421A true KR20130087421A (ko) 2013-08-06

Family

ID=49011268

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020130008084A KR20130087421A (ko) 2012-01-27 2013-01-24 발광 특성 측정 장치 및 방법

Country Status (4)

Country Link
JP (1) JP5461595B2 (zh)
KR (1) KR20130087421A (zh)
CN (1) CN103267628A (zh)
TW (1) TW201346230A (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101675543B1 (ko) * 2015-06-17 2016-11-11 (주) 동국이노텍 마이크로플레이트 기반 세포 대사 측정 실험 장치

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106768875A (zh) * 2016-11-21 2017-05-31 深圳市晶锐光电有限公司 一种半导体分光方法
KR102073558B1 (ko) * 2018-07-17 2020-02-05 재단법인 한국기계전기전자시험연구원 조도 센서 평가 장치
CN110333051B (zh) * 2019-09-03 2019-12-17 江西德瑞光电技术有限责任公司 一种半导体激光芯片的测试设备及方法
CN113008522A (zh) * 2021-03-08 2021-06-22 苏州长光华芯光电技术股份有限公司 激光器寿命老化测试装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3133938B2 (ja) * 1996-03-08 2001-02-13 シャープ株式会社 半導体素子の電気光学特性測定装置
JP2008076126A (ja) * 2006-09-20 2008-04-03 Oputo System:Kk 測光装置及び測光方法
CN200959025Y (zh) * 2006-10-09 2007-10-10 深圳市量子光电子有限公司 Led测试工作台
CN201429464Y (zh) * 2009-04-09 2010-03-24 张九六 联排led自动测试分光机
JP5286571B2 (ja) * 2009-05-22 2013-09-11 大塚電子株式会社 全光束測定装置および全光束測定方法
JP5547969B2 (ja) * 2010-01-04 2014-07-16 日置電機株式会社 測光装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101675543B1 (ko) * 2015-06-17 2016-11-11 (주) 동국이노텍 마이크로플레이트 기반 세포 대사 측정 실험 장치

Also Published As

Publication number Publication date
JP2013156080A (ja) 2013-08-15
JP5461595B2 (ja) 2014-04-02
CN103267628A (zh) 2013-08-28
TW201346230A (zh) 2013-11-16

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A201 Request for examination
E902 Notification of reason for refusal
E601 Decision to refuse application