JP5461595B2 - 発光特性測定装置及び方法 - Google Patents
発光特性測定装置及び方法 Download PDFInfo
- Publication number
- JP5461595B2 JP5461595B2 JP2012015707A JP2012015707A JP5461595B2 JP 5461595 B2 JP5461595 B2 JP 5461595B2 JP 2012015707 A JP2012015707 A JP 2012015707A JP 2012015707 A JP2012015707 A JP 2012015707A JP 5461595 B2 JP5461595 B2 JP 5461595B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- light emitting
- emitting elements
- emitting element
- optical integrator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title description 17
- 238000004020 luminiscence type Methods 0.000 title 1
- 238000012545 processing Methods 0.000 claims description 36
- 230000003287 optical effect Effects 0.000 claims description 27
- 238000012937 correction Methods 0.000 claims description 25
- 238000000691 measurement method Methods 0.000 claims description 6
- 238000005259 measurement Methods 0.000 description 34
- 238000010586 diagram Methods 0.000 description 5
- 238000007689 inspection Methods 0.000 description 5
- 238000002360 preparation method Methods 0.000 description 4
- 238000001228 spectrum Methods 0.000 description 4
- 239000013307 optical fiber Substances 0.000 description 3
- 239000010949 copper Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000001174 ascending effect Effects 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- YDLQKLWVKKFPII-UHFFFAOYSA-N timiperone Chemical compound C1=CC(F)=CC=C1C(=O)CCCN1CCC(N2C(NC3=CC=CC=C32)=S)CC1 YDLQKLWVKKFPII-UHFFFAOYSA-N 0.000 description 1
- 229950000809 timiperone Drugs 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0252—Constructional arrangements for compensating for fluctuations caused by, e.g. temperature, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a photometer; Purge systems, cleaning devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0254—Spectrometers, other than colorimeters, making use of an integrating sphere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
- G01J2001/083—Testing response of detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/446—Photodiode
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012015707A JP5461595B2 (ja) | 2012-01-27 | 2012-01-27 | 発光特性測定装置及び方法 |
TW102102262A TW201346230A (zh) | 2012-01-27 | 2013-01-21 | 發光特性量測裝置及方法 |
CN2013100248977A CN103267628A (zh) | 2012-01-27 | 2013-01-23 | 发光特性测定装置以及方法 |
KR1020130008084A KR20130087421A (ko) | 2012-01-27 | 2013-01-24 | 발광 특성 측정 장치 및 방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012015707A JP5461595B2 (ja) | 2012-01-27 | 2012-01-27 | 発光特性測定装置及び方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013156080A JP2013156080A (ja) | 2013-08-15 |
JP5461595B2 true JP5461595B2 (ja) | 2014-04-02 |
Family
ID=49011268
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012015707A Expired - Fee Related JP5461595B2 (ja) | 2012-01-27 | 2012-01-27 | 発光特性測定装置及び方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP5461595B2 (zh) |
KR (1) | KR20130087421A (zh) |
CN (1) | CN103267628A (zh) |
TW (1) | TW201346230A (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101675543B1 (ko) * | 2015-06-17 | 2016-11-11 | (주) 동국이노텍 | 마이크로플레이트 기반 세포 대사 측정 실험 장치 |
CN106768875A (zh) * | 2016-11-21 | 2017-05-31 | 深圳市晶锐光电有限公司 | 一种半导体分光方法 |
KR102073558B1 (ko) * | 2018-07-17 | 2020-02-05 | 재단법인 한국기계전기전자시험연구원 | 조도 센서 평가 장치 |
CN110333051B (zh) * | 2019-09-03 | 2019-12-17 | 江西德瑞光电技术有限责任公司 | 一种半导体激光芯片的测试设备及方法 |
CN113008522A (zh) * | 2021-03-08 | 2021-06-22 | 苏州长光华芯光电技术股份有限公司 | 激光器寿命老化测试装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3133938B2 (ja) * | 1996-03-08 | 2001-02-13 | シャープ株式会社 | 半導体素子の電気光学特性測定装置 |
JP2008076126A (ja) * | 2006-09-20 | 2008-04-03 | Oputo System:Kk | 測光装置及び測光方法 |
CN200959025Y (zh) * | 2006-10-09 | 2007-10-10 | 深圳市量子光电子有限公司 | Led测试工作台 |
CN201429464Y (zh) * | 2009-04-09 | 2010-03-24 | 张九六 | 联排led自动测试分光机 |
JP5286571B2 (ja) * | 2009-05-22 | 2013-09-11 | 大塚電子株式会社 | 全光束測定装置および全光束測定方法 |
JP5547969B2 (ja) * | 2010-01-04 | 2014-07-16 | 日置電機株式会社 | 測光装置 |
-
2012
- 2012-01-27 JP JP2012015707A patent/JP5461595B2/ja not_active Expired - Fee Related
-
2013
- 2013-01-21 TW TW102102262A patent/TW201346230A/zh unknown
- 2013-01-23 CN CN2013100248977A patent/CN103267628A/zh active Pending
- 2013-01-24 KR KR1020130008084A patent/KR20130087421A/ko not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
JP2013156080A (ja) | 2013-08-15 |
KR20130087421A (ko) | 2013-08-06 |
CN103267628A (zh) | 2013-08-28 |
TW201346230A (zh) | 2013-11-16 |
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