JP5461595B2 - 発光特性測定装置及び方法 - Google Patents

発光特性測定装置及び方法 Download PDF

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Publication number: JP5461595B2
Authority: JP; Japan
Prior art keywords: light; light emitting; emitting elements; emitting element; optical integrator
Prior art date: 2012-01-27
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

JP2012015707A

Other languages

English (en)

Japanese (ja)

Other versions

JP2013156080A (ja

Inventor

昭成伊藤

幸樹柳澤

憲典松本

哲也佐藤

真治石川

練内田

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Sharp Corp

Yokogawa Electric Corp

Original Assignee

Sharp Corp

Yokogawa Electric Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2012-01-27

Filing date

2012-01-27

Publication date

2014-04-02

2012-01-27 Application filed by Sharp Corp, Yokogawa Electric Corp filed Critical Sharp Corp

2012-01-27 Priority to JP2012015707A priority Critical patent/JP5461595B2/ja

2013-01-21 Priority to TW102102262A priority patent/TW201346230A/zh

2013-01-23 Priority to CN2013100248977A priority patent/CN103267628A/zh

2013-01-24 Priority to KR1020130008084A priority patent/KR20130087421A/ko

2013-08-15 Publication of JP2013156080A publication Critical patent/JP2013156080A/ja

2014-04-02 Application granted granted Critical

2014-04-02 Publication of JP5461595B2 publication Critical patent/JP5461595B2/ja

Status Expired - Fee Related legal-status Critical Current

2032-01-27 Anticipated expiration legal-status Critical

Links

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238000010586 diagram Methods 0.000 description 5
238000007689 inspection Methods 0.000 description 5
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Images

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0252—Constructional arrangements for compensating for fluctuations caused by, e.g. temperature, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a photometer; Purge systems, cleaning devices
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0254—Spectrometers, other than colorimeters, making use of an integrating sphere
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
- G01J2001/083—Testing response of detector
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/446—Photodiode

Landscapes

Physics & Mathematics (AREA)
Spectroscopy & Molecular Physics (AREA)
General Physics & Mathematics (AREA)
Electromagnetism (AREA)
Testing Of Optical Devices Or Fibers (AREA)
Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

JP2012015707A 2012-01-27 2012-01-27 発光特性測定装置及び方法 Expired - Fee Related JP5461595B2 (ja)

Priority Applications (4)

Application Number	Priority Date	Filing Date	Title
JP2012015707A JP5461595B2 (ja)	2012-01-27	2012-01-27	発光特性測定装置及び方法
TW102102262A TW201346230A (zh)	2012-01-27	2013-01-21	發光特性量測裝置及方法
CN2013100248977A CN103267628A (zh)	2012-01-27	2013-01-23	发光特性测定装置以及方法
KR1020130008084A KR20130087421A (ko)	2012-01-27	2013-01-24	발광 특성 측정 장치 및 방법

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP2012015707A JP5461595B2 (ja)	2012-01-27	2012-01-27	発光特性測定装置及び方法

Publications (2)

Publication Number	Publication Date
JP2013156080A JP2013156080A (ja)	2013-08-15
JP5461595B2 true JP5461595B2 (ja)	2014-04-02

Family

ID=49011268

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP2012015707A Expired - Fee Related JP5461595B2 (ja)	2012-01-27	2012-01-27	発光特性測定装置及び方法

Country Status (4)

Country	Link
JP (1)	JP5461595B2 (zh)
KR (1)	KR20130087421A (zh)
CN (1)	CN103267628A (zh)
TW (1)	TW201346230A (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
KR101675543B1 (ko) *	2015-06-17	2016-11-11	(주) 동국이노텍	마이크로플레이트 기반 세포 대사 측정 실험 장치
CN106768875A (zh) *	2016-11-21	2017-05-31	深圳市晶锐光电有限公司	一种半导体分光方法
KR102073558B1 (ko) *	2018-07-17	2020-02-05	재단법인 한국기계전기전자시험연구원	조도 센서 평가 장치
CN110333051B (zh) *	2019-09-03	2019-12-17	江西德瑞光电技术有限责任公司	一种半导体激光芯片的测试设备及方法
CN113008522A (zh) *	2021-03-08	2021-06-22	苏州长光华芯光电技术股份有限公司	激光器寿命老化测试装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP3133938B2 (ja) *	1996-03-08	2001-02-13	シャープ株式会社	半導体素子の電気光学特性測定装置
JP2008076126A (ja) *	2006-09-20	2008-04-03	Oputo System:Kk	測光装置及び測光方法
CN200959025Y (zh) *	2006-10-09	2007-10-10	深圳市量子光电子有限公司	Led测试工作台
CN201429464Y (zh) *	2009-04-09	2010-03-24	张九六	联排led自动测试分光机
JP5286571B2 (ja) *	2009-05-22	2013-09-11	大塚電子株式会社	全光束測定装置および全光束測定方法
JP5547969B2 (ja) *	2010-01-04	2014-07-16	日置電機株式会社	測光装置

2012
- 2012-01-27 JP JP2012015707A patent/JP5461595B2/ja not_active Expired - Fee Related
2013
- 2013-01-21 TW TW102102262A patent/TW201346230A/zh unknown
- 2013-01-23 CN CN2013100248977A patent/CN103267628A/zh active Pending
- 2013-01-24 KR KR1020130008084A patent/KR20130087421A/ko not_active Application Discontinuation

Also Published As

Publication number	Publication date
JP2013156080A (ja)	2013-08-15
KR20130087421A (ko)	2013-08-06
CN103267628A (zh)	2013-08-28
TW201346230A (zh)	2013-11-16

Legal Events

Date	Code	Title	Description
2013-12-10	A977	Report on retrieval	Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20131210
2013-12-11	TRDD	Decision of grant or rejection written
2013-12-18	A01	Written decision to grant a patent or to grant a registration (utility model)	Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20131217
2014-01-23	A61	First payment of annual fees (during grant procedure)	Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20140115
2014-01-24	R150	Certificate of patent or registration of utility model	Free format text: JAPANESE INTERMEDIATE CODE: R150
2017-01-24	LAPS	Cancellation because of no payment of annual fees

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