KR101701084B1 - 형상계측장치, 가공장치 및 형상계측방법 - Google Patents

형상계측장치, 가공장치 및 형상계측방법 Download PDF

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KR101701084B1
KR101701084B1 KR1020160018399A KR20160018399A KR101701084B1 KR 101701084 B1 KR101701084 B1 KR 101701084B1 KR 1020160018399 A KR1020160018399 A KR 1020160018399A KR 20160018399 A KR20160018399 A KR 20160018399A KR 101701084 B1 KR101701084 B1 KR 101701084B1
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KR
South Korea
Prior art keywords
interpolation
shape
data
gap data
gap
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KR1020160018399A
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English (en)
Korean (ko)
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KR20160104552A (ko
Inventor
나 가오
코이치 이치하라
Original Assignee
스미도모쥬기가이고교 가부시키가이샤
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Publication of KR20160104552A publication Critical patent/KR20160104552A/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504—Calibration devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
KR1020160018399A 2015-02-26 2016-02-17 형상계측장치, 가공장치 및 형상계측방법 KR101701084B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2015-036783 2015-02-26
JP2015036783A JP6352833B2 (ja) 2015-02-26 2015-02-26 形状計測装置、加工装置及び形状計測方法

Publications (2)

Publication Number Publication Date
KR20160104552A KR20160104552A (ko) 2016-09-05
KR101701084B1 true KR101701084B1 (ko) 2017-01-31

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KR1020160018399A KR101701084B1 (ko) 2015-02-26 2016-02-17 형상계측장치, 가공장치 및 형상계측방법

Country Status (4)

Country Link
JP (1) JP6352833B2 (zh)
KR (1) KR101701084B1 (zh)
CN (1) CN105928482B (zh)
TW (1) TWI600879B (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7260871B2 (ja) * 2018-10-16 2023-04-19 ナブテスコ株式会社 変位センサ
JP7212559B2 (ja) * 2019-03-18 2023-01-25 住友重機械工業株式会社 形状測定装置及び形状測定方法
CN111940843A (zh) * 2020-07-29 2020-11-17 南京理工大学 基于非接触测量的大型结构件智能切削***及方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009063541A (ja) 2007-09-10 2009-03-26 Sumitomo Heavy Ind Ltd 幾何学量計測方法及び幾何学量計測装置
KR101266394B1 (ko) 2011-12-16 2013-05-22 한국과학기술연구원 거리측정 센서의 입사각 영향에 따른 오차 보정방법

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JPH0634360A (ja) * 1992-07-20 1994-02-08 Nippon Steel Corp 鋼板の形状測定方法
FI92529C (fi) * 1993-10-19 1994-11-25 Sitra Foundation Menetelmä sylinterimäisen kappaleen mittaamiseksi
FR2727198A1 (fr) * 1994-11-18 1996-05-24 Otis Elevator Co Capteur de distance et notamment du positionnement des cabines d'ascenseur
JPH0942941A (ja) * 1995-08-03 1997-02-14 Nissan Motor Co Ltd 三次元形状測定方法および装置
JPH11230735A (ja) * 1998-02-12 1999-08-27 Nikon Corp 座標測定装置のデータ処理方法
JP2003254747A (ja) 2002-02-28 2003-09-10 Mitsutoyo Corp 真直度測定法
JP2006236031A (ja) * 2005-02-25 2006-09-07 Seiko Epson Corp ロボット軌跡制御方法及び装置並びにロボット軌跡制御方法のプログラム
JP2007333556A (ja) * 2006-06-15 2007-12-27 Micro Engineering Inc 逐次多点式真直度測定法および測定装置
US8024068B2 (en) * 2006-08-04 2011-09-20 Hurco Companies, Inc. Machine tool control system
ES2428219T5 (es) * 2007-07-24 2021-02-18 Hexagon Metrology Spa Método para compensar errores de medición producidos por deformaciones de una bancada de máquina medidora bajo la carga de una pieza, y máquina medidora que opera según dicho método
JP5277692B2 (ja) * 2008-03-31 2013-08-28 株式会社ジェイテクト ポストプロセス定寸制御装置
JP5100612B2 (ja) * 2008-10-29 2012-12-19 住友重機械工業株式会社 真直度測定方法及び真直度測定装置
JP5100613B2 (ja) * 2008-10-29 2012-12-19 住友重機械工業株式会社 真直度測定方法及び真直度測定装置
CN102221354B (zh) * 2011-04-02 2013-01-09 中南大学 一种多测点浮动定位表面不平顺测量方法
CN102495961B (zh) * 2011-12-05 2014-08-27 山东电力研究院 简化的测量过程统计控制方法
TW201326741A (zh) * 2011-12-20 2013-07-01 Metal Ind Res & Dev Ct 探針量測補償方法
CN103871102B (zh) * 2014-03-28 2016-11-16 南京大学 一种基于高程点和道路轮廓面的道路三维精细建模方法
CN103900504A (zh) * 2014-04-10 2014-07-02 华中科技大学 纳米尺度下的实时三维视觉信息反馈方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009063541A (ja) 2007-09-10 2009-03-26 Sumitomo Heavy Ind Ltd 幾何学量計測方法及び幾何学量計測装置
KR101266394B1 (ko) 2011-12-16 2013-05-22 한국과학기술연구원 거리측정 센서의 입사각 영향에 따른 오차 보정방법

Also Published As

Publication number Publication date
TWI600879B (zh) 2017-10-01
CN105928482A (zh) 2016-09-07
CN105928482B (zh) 2020-09-29
KR20160104552A (ko) 2016-09-05
JP2016156793A (ja) 2016-09-01
JP6352833B2 (ja) 2018-07-04
TW201631295A (zh) 2016-09-01

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