JP6639175B2 - 乾燥装置及び乾燥処理方法 - Google Patents

乾燥装置及び乾燥処理方法 Download PDF

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Publication number
JP6639175B2
JP6639175B2 JP2015191651A JP2015191651A JP6639175B2 JP 6639175 B2 JP6639175 B2 JP 6639175B2 JP 2015191651 A JP2015191651 A JP 2015191651A JP 2015191651 A JP2015191651 A JP 2015191651A JP 6639175 B2 JP6639175 B2 JP 6639175B2
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Prior art keywords
substrate
pressure
drying
processing container
height position
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Japanese (ja)
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JP2017067343A (ja
Inventor
明典 島村
明典 島村
林 輝幸
輝幸 林
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Tokyo Electron Ltd
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Tokyo Electron Ltd
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Priority to JP2015191651A priority Critical patent/JP6639175B2/ja
Priority to KR1020160123241A priority patent/KR101874521B1/ko
Priority to CN201910012458.1A priority patent/CN110048027B/zh
Priority to CN201610849761.3A priority patent/CN106972114B/zh
Priority to TW105131096A priority patent/TWI637656B/zh
Publication of JP2017067343A publication Critical patent/JP2017067343A/ja
Priority to KR1020180074712A priority patent/KR101973016B1/ko
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Publication of JP6639175B2 publication Critical patent/JP6639175B2/ja
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J11/00Devices or arrangements  of selective printing mechanisms, e.g. ink-jet printers or thermal printers, for supporting or handling copy material in sheet or web form
    • B41J11/0015Devices or arrangements  of selective printing mechanisms, e.g. ink-jet printers or thermal printers, for supporting or handling copy material in sheet or web form for treating before, during or after printing or for uniform coating or laminating the copy material before or after printing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02043Cleaning before device manufacture, i.e. Begin-Of-Line process
    • H01L21/02046Dry cleaning only
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/67034Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68742Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/12Deposition of organic active material using liquid deposition, e.g. spin coating
    • H10K71/13Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing
    • H10K71/135Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing using ink-jet printing
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/40Thermal treatment, e.g. annealing in the presence of a solvent vapour
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/811Controlling the atmosphere during processing

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Drying Of Solid Materials (AREA)
  • Electroluminescent Light Sources (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
JP2015191651A 2015-09-29 2015-09-29 乾燥装置及び乾燥処理方法 Active JP6639175B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2015191651A JP6639175B2 (ja) 2015-09-29 2015-09-29 乾燥装置及び乾燥処理方法
KR1020160123241A KR101874521B1 (ko) 2015-09-29 2016-09-26 건조 장치 및 건조 처리 방법
CN201910012458.1A CN110048027B (zh) 2015-09-29 2016-09-26 干燥装置和干燥处理方法
CN201610849761.3A CN106972114B (zh) 2015-09-29 2016-09-26 干燥装置和干燥处理方法
TW105131096A TWI637656B (zh) 2015-09-29 2016-09-26 乾燥裝置及乾燥處理方法
KR1020180074712A KR101973016B1 (ko) 2015-09-29 2018-06-28 건조 장치 및 건조 처리 방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015191651A JP6639175B2 (ja) 2015-09-29 2015-09-29 乾燥装置及び乾燥処理方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2019232727A Division JP6878557B2 (ja) 2019-12-24 2019-12-24 乾燥装置及び乾燥処理方法

Publications (2)

Publication Number Publication Date
JP2017067343A JP2017067343A (ja) 2017-04-06
JP6639175B2 true JP6639175B2 (ja) 2020-02-05

Family

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JP2015191651A Active JP6639175B2 (ja) 2015-09-29 2015-09-29 乾燥装置及び乾燥処理方法

Country Status (4)

Country Link
JP (1) JP6639175B2 (zh)
KR (2) KR101874521B1 (zh)
CN (2) CN106972114B (zh)
TW (1) TWI637656B (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6886866B2 (ja) * 2017-05-31 2021-06-16 東京エレクトロン株式会社 減圧乾燥装置
CN107676498B (zh) * 2017-09-25 2019-05-07 武汉华星光电技术有限公司 软烤设备的排气阀组件
JP7119617B2 (ja) * 2018-06-15 2022-08-17 東京エレクトロン株式会社 塗布膜形成方法及び塗布膜形成装置
JP7076135B2 (ja) 2018-07-27 2022-05-27 株式会社Joled 有機el表示パネルの製造方法
CN110328975A (zh) * 2019-07-01 2019-10-15 深圳市华星光电半导体显示技术有限公司 真空干燥装置
CN112254504B (zh) * 2020-10-19 2023-10-17 西安圣华农业科技股份有限公司 隔板可调的农产品烘干设备
CN112880307B (zh) * 2021-01-12 2022-11-22 扬州大学 多片晶圆干燥用的多孔介质型稳定可调节气悬浮流场的装置及实现方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3920699B2 (ja) * 2001-09-19 2007-05-30 東京エレクトロン株式会社 減圧乾燥装置及び塗布膜形成方法
JP4244555B2 (ja) * 2002-02-25 2009-03-25 東京エレクトロン株式会社 被処理体の支持機構
EP3318928A1 (en) * 2004-06-09 2018-05-09 Nikon Corporation Exposure apparatus and method for producing a device
JP2006105524A (ja) * 2004-10-07 2006-04-20 Dainippon Screen Mfg Co Ltd 減圧乾燥装置および減圧乾燥方法
JP2007073833A (ja) * 2005-09-08 2007-03-22 Dainippon Screen Mfg Co Ltd 減圧乾燥装置及び基板乾燥方法
JP2007253043A (ja) * 2006-03-22 2007-10-04 Toshiba Corp 液滴噴射装置及び塗布体の製造方法
JP5172132B2 (ja) 2006-11-01 2013-03-27 凸版印刷株式会社 カラーフィルタの製造方法
JP4272230B2 (ja) * 2006-12-22 2009-06-03 東京エレクトロン株式会社 減圧乾燥装置
JP2008311250A (ja) * 2007-06-12 2008-12-25 Tokyo Electron Ltd リフローシステムおよびリフロー方法
JP2010272382A (ja) * 2009-05-22 2010-12-02 Panasonic Corp 機能性素子の製造方法および装置
JP2013161946A (ja) * 2012-02-06 2013-08-19 Tokyo Electron Ltd 基板処理装置及び基板処理方法
JP6181358B2 (ja) * 2012-07-25 2017-08-16 東京エレクトロン株式会社 ベーク処理システム及び有機el素子の有機機能膜の積層体の製造方法
JP6328434B2 (ja) * 2013-03-14 2018-05-23 東京エレクトロン株式会社 乾燥装置及び乾燥処理方法
US9053917B2 (en) 2013-03-29 2015-06-09 Agilent Technologies, Inc. Vacuum fired and brazed ion pump element

Also Published As

Publication number Publication date
KR20180079263A (ko) 2018-07-10
KR101874521B1 (ko) 2018-07-04
CN106972114A (zh) 2017-07-21
KR101973016B1 (ko) 2019-04-26
TW201728230A (zh) 2017-08-01
KR20170038161A (ko) 2017-04-06
CN106972114B (zh) 2019-01-04
JP2017067343A (ja) 2017-04-06
TWI637656B (zh) 2018-10-01
CN110048027A (zh) 2019-07-23
CN110048027B (zh) 2021-09-28

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