JP6229877B2 - 検査装置 - Google Patents
検査装置 Download PDFInfo
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- JP6229877B2 JP6229877B2 JP2013176094A JP2013176094A JP6229877B2 JP 6229877 B2 JP6229877 B2 JP 6229877B2 JP 2013176094 A JP2013176094 A JP 2013176094A JP 2013176094 A JP2013176094 A JP 2013176094A JP 6229877 B2 JP6229877 B2 JP 6229877B2
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- current
- pattern
- partial discharge
- spark
- inspected
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- 238000007689 inspection Methods 0.000 title claims description 66
- 238000009413 insulation Methods 0.000 claims description 56
- 238000005259 measurement Methods 0.000 claims description 25
- 230000002123 temporal effect Effects 0.000 claims description 2
- 238000012360 testing method Methods 0.000 description 25
- 230000003071 parasitic effect Effects 0.000 description 16
- 230000007423 decrease Effects 0.000 description 11
- 230000002950 deficient Effects 0.000 description 9
- 239000000523 sample Substances 0.000 description 8
- 230000000694 effects Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/1659—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/14—Circuits therefor, e.g. for generating test voltages, sensing circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Relating To Insulation (AREA)
Description
上記の検査装置は、前記プラス側パターンに電流の供給を開始してから所定の制限時間内に、前記電流測定部が測定した電流が所定の第2閾値を下回らなかった場合、前記検査対象の配線パターン間の絶縁性が不十分であると判定する制御部を備えることが好ましい。
このように、電流に基づいて、配線パターン間の絶縁性を検査することができる。従って、上記構成の検査装置によれば、絶縁検査と、スパーク及び部分放電の検出を、共通の構成(電流源、電流測定部など)を用いて実現することができ、検査装置を簡素化することができる。
11 定電流源
16 電流測定部
22 判定部
P1 プラス側パターン
P2 マイナス側パターン
Claims (3)
- 回路基板に形成された配線パターンの絶縁性を検査する検査装置であって、
検査対象の配線パターンの一方であるプラス側パターンに電流を供給する電流源と、
前記検査対象の配線パターンに流れた電流を測定する電流測定部と、
前記電流測定部で測定された電流の時間変化に基づいて、前記検査対象の配線パターンにスパーク又は部分放電が発生したか否かを判定する判定部と、
前記プラス側パターンに電流の供給を開始してから、前記電流測定部が測定した電流が所定の第1閾値を下回るまでに要した時間である終了時間を測定する終了時間測定部と、
を備え、
前記判定部は、前記終了時間が規定の時間を超えた場合に、スパーク又は部分放電が発生したと判定することを特徴とする検査装置。 - 請求項1に記載の検査装置であって、
前記プラス側パターンに電流の供給を開始してから所定の制限時間内に、前記電流測定部が測定した電流が所定の第2閾値を下回らなかった場合、前記検査対象の配線パターン間の絶縁性が不十分であると判定する制御部を備えることを特徴とする検査装置。 - 請求項1又は2に記載の検査装置であって、
前記電流測定部は、前記検査対象の配線パターンの他方であるマイナス側パターンに流れた電流を測定することを特徴とする検査装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013176094A JP6229877B2 (ja) | 2013-08-27 | 2013-08-27 | 検査装置 |
KR1020140102146A KR102215841B1 (ko) | 2013-08-27 | 2014-08-08 | 검사 장치 |
CN201410397343.6A CN104422859B (zh) | 2013-08-27 | 2014-08-13 | 检测装置 |
TW103128645A TWI636263B (zh) | 2013-08-27 | 2014-08-20 | 檢測裝置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013176094A JP6229877B2 (ja) | 2013-08-27 | 2013-08-27 | 検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2015045542A JP2015045542A (ja) | 2015-03-12 |
JP6229877B2 true JP6229877B2 (ja) | 2017-11-15 |
Family
ID=52671157
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013176094A Active JP6229877B2 (ja) | 2013-08-27 | 2013-08-27 | 検査装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP6229877B2 (ja) |
KR (1) | KR102215841B1 (ja) |
CN (1) | CN104422859B (ja) |
TW (1) | TWI636263B (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6095735B2 (ja) * | 2014-07-29 | 2017-03-15 | ヤマハファインテック株式会社 | プリント基板検査装置及び検査方法 |
CN110673000B (zh) * | 2019-10-28 | 2021-11-30 | 国网江苏省电力有限公司电力科学研究院 | 一种油浸式电流互感器局部放电在线监测方法及装置 |
CN111880055B (zh) | 2020-07-09 | 2024-04-16 | 上海联影医疗科技股份有限公司 | 打火检测装置和方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5840703B2 (ja) * | 1976-02-20 | 1983-09-07 | 日本精密計測株式会社 | 非破壊絶縁試験装置 |
JPS546046A (en) | 1977-06-16 | 1979-01-17 | Toray Ind Inc | Acrylonitrile polymer compsition |
JP3546046B2 (ja) * | 2001-09-26 | 2004-07-21 | 日本電産リード株式会社 | 回路基板の絶縁検査装置及び絶縁検査方法 |
JP3953087B2 (ja) * | 2005-10-18 | 2007-08-01 | 日本電産リード株式会社 | 絶縁検査装置及び絶縁検査方法 |
JP4059291B2 (ja) * | 2005-10-18 | 2008-03-12 | 日本電産リード株式会社 | 絶縁検査装置及び絶縁検査方法 |
JP2007178318A (ja) * | 2005-12-28 | 2007-07-12 | Nidec-Read Corp | 基板検査装置及び方法 |
JP2008002823A (ja) * | 2006-06-20 | 2008-01-10 | Nidec-Read Corp | 基板検査装置及び基板検査方法 |
JP4918339B2 (ja) * | 2006-11-30 | 2012-04-18 | 日本電産リード株式会社 | 基板検査装置 |
JP5014778B2 (ja) * | 2006-12-28 | 2012-08-29 | 日本電産リード株式会社 | 基板検査方法及び基板検査装置 |
JP4838193B2 (ja) * | 2007-05-10 | 2011-12-14 | 日置電機株式会社 | 回路基板検査装置 |
JP4987591B2 (ja) * | 2007-07-02 | 2012-07-25 | 日置電機株式会社 | 回路基板検査装置 |
JP2010032457A (ja) * | 2008-07-31 | 2010-02-12 | Hioki Ee Corp | 絶縁検査装置および絶縁検査方法 |
JP2010175339A (ja) * | 2009-01-28 | 2010-08-12 | Mitsubishi Electric Corp | 絶縁検査装置 |
JP5391869B2 (ja) * | 2009-06-26 | 2014-01-15 | 日本電産リード株式会社 | 基板検査方法 |
JP5541720B2 (ja) * | 2010-08-30 | 2014-07-09 | 日置電機株式会社 | 検査装置 |
-
2013
- 2013-08-27 JP JP2013176094A patent/JP6229877B2/ja active Active
-
2014
- 2014-08-08 KR KR1020140102146A patent/KR102215841B1/ko active IP Right Grant
- 2014-08-13 CN CN201410397343.6A patent/CN104422859B/zh active Active
- 2014-08-20 TW TW103128645A patent/TWI636263B/zh active
Also Published As
Publication number | Publication date |
---|---|
TWI636263B (zh) | 2018-09-21 |
JP2015045542A (ja) | 2015-03-12 |
CN104422859A (zh) | 2015-03-18 |
KR20150024773A (ko) | 2015-03-09 |
KR102215841B1 (ko) | 2021-02-16 |
TW201508288A (zh) | 2015-03-01 |
CN104422859B (zh) | 2018-11-30 |
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