JP2016156715A - 電子部品搬送装置および電子部品検査装置 - Google Patents

電子部品搬送装置および電子部品検査装置 Download PDF

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Publication number
JP2016156715A
JP2016156715A JP2015034916A JP2015034916A JP2016156715A JP 2016156715 A JP2016156715 A JP 2016156715A JP 2015034916 A JP2015034916 A JP 2015034916A JP 2015034916 A JP2015034916 A JP 2015034916A JP 2016156715 A JP2016156715 A JP 2016156715A
Authority
JP
Japan
Prior art keywords
unit
electronic component
supply
gripping
transport
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2015034916A
Other languages
English (en)
Japanese (ja)
Inventor
清水　博之
Hiroyuki Shimizu
博之 清水
聡興 下島
Soko Shimojima
聡興 下島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2015034916A priority Critical patent/JP2016156715A/ja
Priority to CN201610055013.8A priority patent/CN105905600B/zh
Priority to TW105105178A priority patent/TWI619951B/zh
Publication of JP2016156715A publication Critical patent/JP2016156715A/ja
Pending legal-status Critical Current

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Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
    • B65G47/74—Feeding, transfer, or discharging devices of particular kinds or types
    • B65G47/90—Devices for picking-up and depositing articles or materials
    • B65G47/91—Devices for picking-up and depositing articles or materials incorporating pneumatic, e.g. suction, grippers
    • B65G47/918—Devices for picking-up and depositing articles or materials incorporating pneumatic, e.g. suction, grippers with at least two picking-up heads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2015034916A 2015-02-25 2015-02-25 電子部品搬送装置および電子部品検査装置 Pending JP2016156715A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2015034916A JP2016156715A (ja) 2015-02-25 2015-02-25 電子部品搬送装置および電子部品検査装置
CN201610055013.8A CN105905600B (zh) 2015-02-25 2016-01-27 电子部件输送装置以及电子部件检查装置
TW105105178A TWI619951B (zh) 2015-02-25 2016-02-22 電子零件搬送裝置及電子零件檢查裝置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015034916A JP2016156715A (ja) 2015-02-25 2015-02-25 電子部品搬送装置および電子部品検査装置

Publications (1)

Publication Number Publication Date
JP2016156715A true JP2016156715A (ja) 2016-09-01

Family

ID=56744350

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015034916A Pending JP2016156715A (ja) 2015-02-25 2015-02-25 電子部品搬送装置および電子部品検査装置

Country Status (3)

Country Link
JP (1) JP2016156715A (zh)
CN (1) CN105905600B (zh)
TW (1) TWI619951B (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108414850A (zh) * 2017-01-30 2018-08-17 精工爱普生株式会社 电子部件输送装置及电子部件检查装置
JP2018141699A (ja) * 2017-02-28 2018-09-13 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
JP2019045232A (ja) * 2017-08-31 2019-03-22 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
TWI821780B (zh) * 2021-09-17 2023-11-11 致茂電子股份有限公司 溫度控制系統、溫度控制方法以及具備該系統之影像感測器測試設備

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2628392B2 (ja) * 1990-01-16 1997-07-09 新明和工業株式会社 Ｉｃパッケージのハンドリング方法
JPH04371419A (ja) * 1991-06-18 1992-12-24 Matsushita Electron Corp 半導体装置用着脱装置
JP3341324B2 (ja) * 1992-12-01 2002-11-05 日立電子エンジニアリング株式会社 ワーク移載装置及びワーク移載方法
JP2005127903A (ja) * 2003-10-24 2005-05-19 Seiko Epson Corp 半導体チップのプロービングテスト方法
JP2006292590A (ja) * 2005-04-12 2006-10-26 Seiko Epson Corp 検査方法および検査装置
EP1752778A3 (en) * 2005-08-09 2008-10-29 Mirae Corporation IC Sorter
KR100897068B1 (ko) * 2007-05-03 2009-05-14 (주)테크윙 테스트핸들러
JP4539685B2 (ja) * 2007-06-22 2010-09-08 セイコーエプソン株式会社 部品搬送装置及びｉｃハンドラ
JP4471011B2 (ja) * 2008-03-11 2010-06-02 セイコーエプソン株式会社 部品試験装置及び部品搬送方法
JP2011014583A (ja) * 2009-06-30 2011-01-20 Tesetsuku:Kk 電子部品用搬送装置
JP5621313B2 (ja) * 2010-05-14 2014-11-12 セイコーエプソン株式会社 電子部品検査装置及び電子部品搬送方法
JP2013053991A (ja) * 2011-09-06 2013-03-21 Seiko Epson Corp ハンドラー及び部品検査装置
JP5942459B2 (ja) * 2012-02-14 2016-06-29 セイコーエプソン株式会社 ハンドラー、及び部品検査装置
JP5219056B1 (ja) * 2012-09-06 2013-06-26 上野精機株式会社 テーピングユニット及び電子部品検査装置
TW201421013A (zh) * 2012-11-16 2014-06-01 Prov Technology Corp 電子元件檢查分類設備

Also Published As

Publication number Publication date
CN105905600A (zh) 2016-08-31
TWI619951B (zh) 2018-04-01
TW201702617A (zh) 2017-01-16
CN105905600B (zh) 2018-08-03

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