JP2011519817A - 高密度itoスパッタリングターゲットの製造方法 - Google Patents
高密度itoスパッタリングターゲットの製造方法 Download PDFInfo
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- JP2011519817A JP2011519817A JP2011509007A JP2011509007A JP2011519817A JP 2011519817 A JP2011519817 A JP 2011519817A JP 2011509007 A JP2011509007 A JP 2011509007A JP 2011509007 A JP2011509007 A JP 2011509007A JP 2011519817 A JP2011519817 A JP 2011519817A
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- ito
- target
- slurry
- indium
- mold
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 22
- 238000005477 sputtering target Methods 0.000 title claims abstract description 15
- 238000000034 method Methods 0.000 claims abstract description 69
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- 239000000843 powder Substances 0.000 claims abstract description 26
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims abstract description 16
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 claims abstract description 13
- 229910052738 indium Inorganic materials 0.000 claims abstract description 11
- 239000011230 binding agent Substances 0.000 claims abstract description 9
- CVNKFOIOZXAFBO-UHFFFAOYSA-J tin(4+);tetrahydroxide Chemical class [OH-].[OH-].[OH-].[OH-].[Sn+4] CVNKFOIOZXAFBO-UHFFFAOYSA-J 0.000 claims abstract description 9
- 239000002270 dispersing agent Substances 0.000 claims abstract description 8
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- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 claims description 19
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical class O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 claims description 18
- -1 phosphorus compound Chemical class 0.000 claims description 17
- 238000001354 calcination Methods 0.000 claims description 15
- 229910052698 phosphorus Inorganic materials 0.000 claims description 12
- 239000011574 phosphorus Substances 0.000 claims description 12
- 239000000203 mixture Substances 0.000 claims description 11
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- 229910052801 chlorine Inorganic materials 0.000 claims description 10
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 10
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- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 6
- 150000001875 compounds Chemical class 0.000 claims description 6
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- CZMRCDWAGMRECN-UGDNZRGBSA-N Sucrose Chemical compound O[C@H]1[C@H](O)[C@@H](CO)O[C@@]1(CO)O[C@@H]1[C@H](O)[C@@H](O)[C@H](O)[C@@H](CO)O1 CZMRCDWAGMRECN-UGDNZRGBSA-N 0.000 claims description 5
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- WQZGKKKJIJFFOK-VFUOTHLCSA-N beta-D-glucose Chemical compound OC[C@H]1O[C@@H](O)[C@H](O)[C@@H](O)[C@@H]1O WQZGKKKJIJFFOK-VFUOTHLCSA-N 0.000 claims description 3
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- 239000011872 intimate mixture Substances 0.000 claims description 2
- QUBMWJKTLKIJNN-UHFFFAOYSA-B tin(4+);tetraphosphate Chemical compound [Sn+4].[Sn+4].[Sn+4].[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O QUBMWJKTLKIJNN-UHFFFAOYSA-B 0.000 claims description 2
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- 238000000576 coating method Methods 0.000 claims 2
- YWEUIGNSBFLMFL-UHFFFAOYSA-N diphosphonate Chemical compound O=P(=O)OP(=O)=O YWEUIGNSBFLMFL-UHFFFAOYSA-N 0.000 claims 1
- DLYUQMMRRRQYAE-UHFFFAOYSA-N phosphorus pentoxide Inorganic materials O1P(O2)(=O)OP3(=O)OP1(=O)OP2(=O)O3 DLYUQMMRRRQYAE-UHFFFAOYSA-N 0.000 claims 1
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- 238000005266 casting Methods 0.000 abstract description 12
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 abstract description 2
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
- C01G15/00—Compounds of gallium, indium or thallium
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- C01—INORGANIC CHEMISTRY
- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
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- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/453—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates
- C04B35/457—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates based on tin oxides or stannates
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Abstract
【解決手段】 インジウムとスズの水酸化物を共沈殿させ、塩化物イオンの存在下でか焼し、得られた酸化物粉末を、分散剤、バインダー、特別の密度増加剤とともに水性の泥漿を調製し、その泥漿を特別に表面コートされた多孔質鋳型に鋳込み成形により注入し、その後得られたターゲット体をか焼して高密度ITOターゲットとする。
【選択図】図1
Description
ITOスパッタリングターゲットは、高密度ITO物質の、長方形タイルのような形状体である。
しかしリサイクルは、以下の場合実行可能ではない。すなわち、使用効率が、低密度か又は不均一なターゲット密度により、さらに不利に影響される場合であり、これらは使用中に「ノジュール」、又はターゲットひび割れのような問題を起こし得る。これらの問題はともに、ITO薄膜の品質に悪影響を与える。
従来技術では、ITOターゲットは酸化インジウムと酸化スズの粉末の混合物を、ホットプレス成型プロセスのような高圧成型プロセスにより製造され、成型された形状のITO体を製造する。しかし、これらのタイプの圧力成型プロセスにはいくつかの制限がある。ひとつの制限は、現在のLCD製造ラインは、第7,8又は10世代ラインと呼ばれる、非常に大きなITOシートがコートされたガラスを要求するということである。これはすなわち、ITOスパッタリングラインは大きなサイズのITOターゲットを必要とすることを意味する。しかしながら、大きなITOターゲットをホットプレスのようなプロセスで製造する場合、ターゲット全体に亘って均一な圧力を得ることは困難であり、ターゲットの反りやひび割れをもたらす。加えて、そのようなターゲットは、ターゲット体全体に亘る化学的及び物理的性質の不均一性と同様に、密度の不均一性が生じ、プラズマスパッタリングプロセスの際にターゲット表面全体に不均一なスパッタリングという結果をもたらす。このことは、つまり、ターゲット表面にノジュールの形成をもたらし、ターゲットの使用率を30%よりもずっと低くすることになる。というのもノジュールはITO薄膜の品質に対し悪影響を及ぼすからである。
方法の第1段階は、インジウムとスズの水酸化物を、塩化物含有媒体中で共沈殿させ(S1)、ろ過し(S2)、洗浄し(S3)、そして800から1200℃でか焼(calcined)する(S4)。洗浄は、すべての塩素イオンが沈殿から除かれないように行われる。その結果、塩化物が、か焼工程の際に酸化物を緊密に混合させる。塩素イオンは、水酸化物粒子に、分子吸引性の弱いファンデルワールス力で付着していると考えられる。塩素イオンは、高温のか焼温度で分解し、酸化物粒子に顕微鏡的レベルで緊密に近い場所で塩素ガスを放出する。塩素の酸化性が、金属をもっとも安定な酸化状態に維持することを助け、一方でまた酸化物粒子の周りにガス状態をもたらすことでか焼を助けると考えられる。当技術において熟練した者にとっては以下のことは明らかである。すなわち、酸化物と緊密に混合された塩素イオンを分解することにより、酸化物粉末マトリックス中に塩素を顕微鏡レベルで導入するという本発明の方法は、上で説明したJP10330926の危険な方法、すなわち塩素ガスを酸化物か焼炉に注入するという方法よりも、より効率的で、より安全であるということである。
Claims (22)
- ITOスパッタリングターゲットを製造に使用するITO泥漿を形成する方法であって、
顆粒状ITO粉末と水の泥漿を形成することを含み、
前記泥漿は、リン化合物を、重量で0.001%と1%の間の濃度で含む方法。
- 前記リン化合物が、1又は2以上のリン酸、リン酸化物、リン酸インジウム(III)、及びリン酸スズ(IV)である、請求項1に記載の方法。
- 前記リン化合物が、5酸化リンである、請求項2に記載の方法。
- 前記泥漿中の前記顆粒ITO粉末が、表面積が4.5から10m2/gであり、濃度が75重量%以上である、インジウム(III)及びスズ(IV)酸化物を含む、請求項1,2又は3のいずれか1項に記載の方法。
- 前記泥漿が、さらにバインダー及び/又は分散剤を含む、請求項1〜4のいずれか1項に記載の方法。
- ITOスパッタリングターゲットを製造に使用する顆粒状ITO粉末を製造する方法であって、インジウムとスズの水酸化物と、InCl3、及びSnCl4として存在する塩素イオンとの緊密な混合物を空気中でか焼することを含み、InCl3、及びSnCl4の前記混合物中での濃度が、約1ppmと約100ppmの間である。
- 前記混合物を、約800℃から1200℃の範囲の温度でか焼する、請求項6に記載の方法。
- 前記混合物が、約900℃でか焼する、請求項7に記載の方法。
- 前記混合物が、
インジウムとスズの水酸化物を塩化物含有媒体中で共沈殿させ、
前記沈殿をろ過し、
前記沈殿を、すべての塩素イオンが前記沈殿から除去されないように洗浄して製造される、請求項6、7、8のいずれか1項に記載の方法。
- さらに、前記顆粒状ITO粉末を泥漿に形成することを含む、請求項6〜9のいずれか1項に記載の方法。
- 前記顆粒状ITO粉末が、請求項6〜9のいずれかに記載の方法で製造される、請求項1〜5のいずれか1項に記載の方法。
- ITOスパッタリングターゲットを製造する方法であって、
石膏又はギプスの多孔性鋳型を用意し、
前記鋳型を離型剤の層でコートし、そして
ITO泥漿を前記鋳型に注入する、ことを含む方法。
- 前記離型剤が、糖化合物及び/又はキレート剤を含む、請求項12に記載の方法。
- 前記糖化合物が、スクロース又はグルコースを含む、請求項13に記載の方法。
- 前記キレート剤が、少なくとも1つの、EGTA、BAPTA及びEDTAを含む、請求項13又は14のいずれか1項に記載の方法。
- 前記鋳型をコートする工程が、鋳型を砂糖溶液と、EGTA,BAPTA,又はEDTAでスプレーする、請求項12〜15のいずれか1項に記載の方法。
- 前記泥漿を鋳型に一定時間放置して、グリーン体を製造し、前記生の体を、1000℃と1750℃の間の温度で、高純度酸素下でか焼する、請求項12〜16のいずれか1項に記載の方法。
- 前記グリーン体を、か焼の前に3から5日オーブン中で乾燥する、請求項17に記載の方法。
- 前記泥漿が、請求項1〜5又は11のいずれか1項に記載の方法を用いて形成された、請求項12〜18のいずれか1項に記載の方法。
- 請求項12〜19のいずれか1項に記載の方法で製造された、ITOターゲット。
- インジウム(III)酸化物とスズ(IV)酸化物とを含み、インジウム(III)酸化物含有量が75重量%以上であり、さらに少なくともリン化合物を含む第3の成分を含む、ITOターゲット。
- 前記ターゲットに存在するリン化合物の比率が、1から200ppmの範囲である、請求項20又は21のいずれか1項に記載の、ITOターゲット。
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- 2009-05-07 JP JP2011509007A patent/JP2011519817A/ja active Pending
- 2009-05-07 US US12/992,067 patent/US8778234B2/en not_active Expired - Fee Related
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WO2022102333A1 (ja) * | 2020-11-12 | 2022-05-19 | 株式会社豊田中央研究所 | 多孔質酸化物半導体粒子 |
JP7504542B2 (ja) | 2020-11-12 | 2024-06-24 | 株式会社豊田中央研究所 | 多孔質酸化物半導体粒子 |
Also Published As
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KR20110004914A (ko) | 2011-01-14 |
WO2009138774A1 (en) | 2009-11-19 |
CN101910087A (zh) | 2010-12-08 |
GB0808431D0 (en) | 2008-06-18 |
US20110127162A1 (en) | 2011-06-02 |
EP2276712A1 (en) | 2011-01-26 |
US8778234B2 (en) | 2014-07-15 |
GB2459917A (en) | 2009-11-18 |
GB2459917B (en) | 2013-02-27 |
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