ITMI930595A1 - Dispositivo a circuito integrato a semiconduttore con un convertitore riduttore di tensione interno - Google Patents
Dispositivo a circuito integrato a semiconduttore con un convertitore riduttore di tensione internoInfo
- Publication number
- ITMI930595A1 ITMI930595A1 IT93MI000595A ITMI930595A ITMI930595A1 IT MI930595 A1 ITMI930595 A1 IT MI930595A1 IT 93MI000595 A IT93MI000595 A IT 93MI000595A IT MI930595 A ITMI930595 A IT MI930595A IT MI930595 A1 ITMI930595 A1 IT MI930595A1
- Authority
- IT
- Italy
- Prior art keywords
- semiconductor integrated
- integrated circuit
- external
- circuit device
- aging mode
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 4
- 230000032683 aging Effects 0.000 abstract 7
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0214—Particular design considerations for integrated circuits for internal polarisation, e.g. I2L
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/06—Acceleration testing
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Dram (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Un dispositivo a circuito integrato a semiconduttore include un circuito di controllo della modalità di invecchiamento o aging (1), che rivela i tempi di commutazione di una tensione di alimentazione esterna (Vcc esterna) con un'ampiezza predeterminata e genera un segnale (BE) di abilitazione della modalità aging, e un circuito di riduzione della tensione interna (2) che trasmette una tensione, che cambia in accordo con il cambio di una tensione di alimentazione esterna (Vcc esterna), su una linea di alimentazione interna (20) in risposta al segnale (BE) di abilitazione della modalità aging. Il dispositivo a circuito integrato a semiconduttore entra in una modalità aging solo quando la tensione di alimentazione esterna oscilla predeterminate volte con un'ampiezza non inferiore all'ampiezza predeterminata. Il dispositivo a circuito integrato a semiconduttore non entra necessariamente nella modalità aging per una prova aging e in modo semplicistico e sicuro entra nella modalità aging senza utilizzare una speciale relazione di temporizzazione dei segnali esterni di controllo.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4120455A JPH05314769A (ja) | 1992-05-13 | 1992-05-13 | 半導体集積回路装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
ITMI930595A0 ITMI930595A0 (it) | 1993-03-26 |
ITMI930595A1 true ITMI930595A1 (it) | 1994-09-26 |
IT1272161B IT1272161B (it) | 1997-06-11 |
Family
ID=14786607
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ITMI930595A IT1272161B (it) | 1992-05-13 | 1993-03-26 | Dispositivo a circuito integrato a semiconduttore con un convertitore riduttore di tensione interno |
Country Status (5)
Country | Link |
---|---|
US (1) | US5451896A (it) |
JP (1) | JPH05314769A (it) |
KR (1) | KR960009400B1 (it) |
DE (1) | DE4244555C2 (it) |
IT (1) | IT1272161B (it) |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08101260A (ja) * | 1994-09-30 | 1996-04-16 | Mitsubishi Electric Corp | 半導体装置 |
US5541551A (en) * | 1994-12-23 | 1996-07-30 | Advinced Micro Devices, Inc. | Analog voltage reference generator system |
KR0165386B1 (ko) * | 1995-04-24 | 1999-02-01 | 김광호 | 반도체장치의 내부 승압회로 |
US6416714B1 (en) | 1995-04-25 | 2002-07-09 | Discovery Partners International, Inc. | Remotely programmable matrices with memories |
US6329139B1 (en) | 1995-04-25 | 2001-12-11 | Discovery Partners International | Automated sorting system for matrices with memory |
US6017496A (en) | 1995-06-07 | 2000-01-25 | Irori | Matrices with memories and uses thereof |
US5751629A (en) | 1995-04-25 | 1998-05-12 | Irori | Remotely programmable matrices with memories |
US6331273B1 (en) | 1995-04-25 | 2001-12-18 | Discovery Partners International | Remotely programmable matrices with memories |
US5874214A (en) | 1995-04-25 | 1999-02-23 | Irori | Remotely programmable matrices with memories |
US5719524A (en) * | 1995-10-11 | 1998-02-17 | Telcom Semiconductor, Inc. | Circuit having an input terminal for controlling two functions |
KR0167261B1 (ko) * | 1995-10-19 | 1999-04-15 | 문정환 | 전원공급 제어회로 |
JP2885187B2 (ja) * | 1996-05-17 | 1999-04-19 | 日本電気株式会社 | 半導体記憶装置 |
US6198339B1 (en) * | 1996-09-17 | 2001-03-06 | International Business Machines Corporation | CVF current reference with standby mode |
KR100197998B1 (ko) * | 1996-10-22 | 1999-06-15 | 김영환 | 반도체 장치의 저소비 전력 입력 버퍼 |
JP3963990B2 (ja) * | 1997-01-07 | 2007-08-22 | 株式会社ルネサステクノロジ | 内部電源電圧発生回路 |
JP3022815B2 (ja) * | 1997-07-24 | 2000-03-21 | 日本電気アイシーマイコンシステム株式会社 | 中間電位生成回路 |
US6023176A (en) * | 1998-03-27 | 2000-02-08 | Cypress Semiconductor Corp. | Input buffer |
JP2001035199A (ja) * | 1999-07-26 | 2001-02-09 | Mitsubishi Electric Corp | 半導体装置 |
US6515934B2 (en) | 1999-07-26 | 2003-02-04 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device including internal potential generating circuit allowing tuning in short period of time and reduction of chip area |
JP2003022697A (ja) | 2001-07-06 | 2003-01-24 | Mitsubishi Electric Corp | 半導体集積回路装置 |
JP3927788B2 (ja) * | 2001-11-01 | 2007-06-13 | 株式会社ルネサステクノロジ | 半導体装置 |
US7075284B2 (en) * | 2002-07-08 | 2006-07-11 | Kabushiki Kaisha Toshiba | Time limit function utilization |
CN1723601A (zh) * | 2002-12-10 | 2006-01-18 | 皇家飞利浦电子股份有限公司 | 集成的半桥功率电路 |
JP4287678B2 (ja) | 2003-03-14 | 2009-07-01 | Okiセミコンダクタ株式会社 | 内部電源回路 |
JP2007095075A (ja) * | 2005-09-29 | 2007-04-12 | Hynix Semiconductor Inc | 内部電圧生成装置 |
NL1032063C2 (nl) * | 2006-06-27 | 2008-01-02 | Maasland Nv | Combinatie van een melkbeker en een flexibele melkslang, koppelstuk, alsmede werkwijze voor het bewaken van integriteit van flexibele melkslang. |
KR100784908B1 (ko) | 2006-08-11 | 2007-12-11 | 주식회사 하이닉스반도체 | 전압 조절 장치 |
US7793119B2 (en) * | 2006-12-21 | 2010-09-07 | Texas Instruments Incorporated | Adaptive voltage scaling with age compensation |
KR100863015B1 (ko) * | 2007-05-11 | 2008-10-13 | 주식회사 하이닉스반도체 | 전압 안정화 회로 및 이를 이용한 반도체 메모리 장치 |
US8446187B1 (en) * | 2007-11-16 | 2013-05-21 | National Semiconductor Corporation | Apparatus and method for power-on reset circuit with current comparison |
US8736314B2 (en) * | 2011-03-22 | 2014-05-27 | Wisconsin Alumni Research Foundation | Leakage power management using programmable power gating transistors and on-chip aging and temperature tracking circuit |
US10371745B2 (en) * | 2014-01-23 | 2019-08-06 | Micron Technology, Inc. | Overheat protection circuit and method in an accelerated aging test of an integrated circuit |
WO2020078265A1 (en) * | 2018-10-16 | 2020-04-23 | Changxin Memory Technologies, Inc. | Data channel aging circuit, memory and aging method |
CN109087684B (zh) * | 2018-10-16 | 2023-09-12 | 长鑫存储技术有限公司 | 数据通道老化电路、存储器及其老化方法 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4428020A (en) * | 1981-10-14 | 1984-01-24 | Scm Corporation | Power supply sensing circuitry |
JPS60176121A (ja) * | 1984-02-22 | 1985-09-10 | Toshiba Corp | 電圧降下回路 |
JPS61163655A (ja) * | 1985-01-14 | 1986-07-24 | Toshiba Corp | 相補型半導体集積回路 |
JPH07113863B2 (ja) * | 1985-06-29 | 1995-12-06 | 株式会社東芝 | 半導体集積回路装置 |
JP2721151B2 (ja) * | 1986-04-01 | 1998-03-04 | 株式会社東芝 | 半導体集積回路装置 |
JPS6370451A (ja) * | 1986-09-11 | 1988-03-30 | Mitsubishi Electric Corp | 半導体集積回路 |
JPS6455857A (en) * | 1987-08-26 | 1989-03-02 | Nec Corp | Semiconductor integrated device |
JP2688976B2 (ja) * | 1989-03-08 | 1997-12-10 | 三菱電機株式会社 | 半導体集積回路装置 |
US5184031A (en) * | 1990-02-08 | 1993-02-02 | Kabushiki Kaisha Toshiba | Semiconductor integrated circuit |
JP2888898B2 (ja) * | 1990-02-23 | 1999-05-10 | 株式会社日立製作所 | 半導体集積回路 |
JPH0447591A (ja) * | 1990-06-14 | 1992-02-17 | Mitsubishi Electric Corp | 半導体集積回路装置 |
US5187396A (en) * | 1991-05-22 | 1993-02-16 | Benchmarq Microelectronics, Inc. | Differential comparator powered from signal input terminals for use in power switching applications |
JP2945508B2 (ja) * | 1991-06-20 | 1999-09-06 | 三菱電機株式会社 | 半導体装置 |
KR930008886B1 (ko) * | 1991-08-19 | 1993-09-16 | 삼성전자 주식회사 | 전기적으로 프로그램 할 수 있는 내부전원 발생회로 |
-
1992
- 1992-05-13 JP JP4120455A patent/JPH05314769A/ja not_active Withdrawn
- 1992-11-20 US US07/980,414 patent/US5451896A/en not_active Expired - Fee Related
- 1992-12-31 DE DE4244555A patent/DE4244555C2/de not_active Expired - Fee Related
-
1993
- 1993-03-26 IT ITMI930595A patent/IT1272161B/it active IP Right Grant
- 1993-05-11 KR KR93008065A patent/KR960009400B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
IT1272161B (it) | 1997-06-11 |
ITMI930595A0 (it) | 1993-03-26 |
KR960009400B1 (en) | 1996-07-18 |
KR940006342A (ko) | 1994-03-23 |
JPH05314769A (ja) | 1993-11-26 |
DE4244555C2 (de) | 1997-05-28 |
US5451896A (en) | 1995-09-19 |
DE4244555A1 (de) | 1993-11-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
0001 | Granted | ||
TA | Fee payment date (situation as of event date), data collected since 19931001 |
Effective date: 19970326 |