EP4246148A3 - Automatic analysis device - Google Patents

Automatic analysis device Download PDF

Info

Publication number
EP4246148A3
EP4246148A3 EP23183471.4A EP23183471A EP4246148A3 EP 4246148 A3 EP4246148 A3 EP 4246148A3 EP 23183471 A EP23183471 A EP 23183471A EP 4246148 A3 EP4246148 A3 EP 4246148A3
Authority
EP
European Patent Office
Prior art keywords
reagent
measuring units
display
necessity
information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP23183471.4A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP4246148A2 (en
Inventor
Chie Yabutani
Takumi Yamada
Masahiko Iijima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Tech Corp filed Critical Hitachi High Tech Corp
Publication of EP4246148A2 publication Critical patent/EP4246148A2/en
Publication of EP4246148A3 publication Critical patent/EP4246148A3/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N35/00732—Identification of carriers, materials or components in automatic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00693—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1002—Reagent dispensers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G01N2035/00673—Quality control of consumables of reagents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N2035/00891—Displaying information to the operator
    • G01N2035/009—Displaying information to the operator alarms, e.g. audible
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N2035/00891—Displaying information to the operator
    • G01N2035/0091—GUI [graphical user interfaces]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0439—Rotary sample carriers, i.e. carousels
    • G01N2035/0453—Multiple carousels working in parallel

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
EP23183471.4A 2017-03-07 2018-02-15 Automatic analysis device Pending EP4246148A3 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2017042328 2017-03-07
EP18763403.5A EP3594688B1 (en) 2017-03-07 2018-02-15 Automatic analysis device
PCT/JP2018/005244 WO2018163745A1 (ja) 2017-03-07 2018-02-15 自動分析装置

Related Parent Applications (2)

Application Number Title Priority Date Filing Date
EP18763403.5A Division-Into EP3594688B1 (en) 2017-03-07 2018-02-15 Automatic analysis device
EP18763403.5A Division EP3594688B1 (en) 2017-03-07 2018-02-15 Automatic analysis device

Publications (2)

Publication Number Publication Date
EP4246148A2 EP4246148A2 (en) 2023-09-20
EP4246148A3 true EP4246148A3 (en) 2023-12-06

Family

ID=63448574

Family Applications (2)

Application Number Title Priority Date Filing Date
EP23183471.4A Pending EP4246148A3 (en) 2017-03-07 2018-02-15 Automatic analysis device
EP18763403.5A Active EP3594688B1 (en) 2017-03-07 2018-02-15 Automatic analysis device

Family Applications After (1)

Application Number Title Priority Date Filing Date
EP18763403.5A Active EP3594688B1 (en) 2017-03-07 2018-02-15 Automatic analysis device

Country Status (5)

Country Link
US (3) US11156625B2 (ja)
EP (2) EP4246148A3 (ja)
JP (4) JP6700645B2 (ja)
CN (2) CN111579806B (ja)
WO (1) WO2018163745A1 (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3892999B1 (en) * 2018-12-06 2024-01-10 Hitachi High-Tech Corporation Automatic analysis device
WO2020217720A1 (ja) * 2019-04-24 2020-10-29 株式会社日立ハイテク 自動分析装置および自動分析装置におけるメンテナンスガイド方法
EP4010791A1 (en) * 2019-08-06 2022-06-15 Leica Biosystems Imaging, Inc. Graphical user interface for slide-scanner control
JP7395392B2 (ja) * 2020-03-13 2023-12-11 株式会社日立ハイテク 自動分析装置及び分析方法
CN114527041B (zh) * 2020-10-30 2024-07-09 深圳市瑞图生物技术有限公司 一种显示控制方法及装置、***质量分析***和存储介质
WO2023190216A1 (ja) * 2022-03-31 2023-10-05 株式会社日立ハイテク 自動分析装置
CN114660310B (zh) * 2022-05-24 2022-10-28 深圳市帝迈生物技术有限公司 样本分析***的自动定标方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040096361A1 (en) * 2002-06-28 2004-05-20 Shigeki Matsubara Automatic analyzer
US20050175506A1 (en) * 2002-06-28 2005-08-11 Shigeki Matsubara Automatic analyzer
WO2017033576A1 (ja) * 2015-08-27 2017-03-02 株式会社日立ハイテクノロジーズ 自動分析装置

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1038889A (ja) * 1996-07-22 1998-02-13 Hitachi Ltd 自動分析装置
DE69837230T2 (de) * 1997-04-10 2007-12-20 Hitachi, Ltd. Automatische Analysevorrichtung
JP4217237B2 (ja) * 1997-04-10 2009-01-28 株式会社日立製作所 自動分析装置およびその支援システム
JP2000227434A (ja) * 1999-02-04 2000-08-15 Hitachi Ltd 自動分析装置
JP2001013151A (ja) * 1999-06-30 2001-01-19 Mitsubishi Chemicals Corp 血液の検査装置
JP4478108B2 (ja) * 2003-03-24 2010-06-09 富士機械製造株式会社 部品実装システム用メンテナンス作業支援システムおよびそれを含む部品実装システム
JP4241434B2 (ja) * 2004-03-01 2009-03-18 株式会社日立ハイテクノロジーズ 自動分析システム
US9341640B2 (en) 2005-04-01 2016-05-17 Mitsubishi Kagaku Iatron, Inc. Apparatus for multiple automatic analysis of biosamples, method for autoanalysis, and reaction cuvette
JP4619892B2 (ja) * 2005-08-04 2011-01-26 株式会社日立ハイテクノロジーズ 自動分析装置
US20100223556A1 (en) * 2006-01-30 2010-09-02 Shimadzu Corporation Operational status display system for analyzing apparatus
JP4851267B2 (ja) * 2006-08-18 2012-01-11 シスメックス株式会社 試料分析装置
JP4926812B2 (ja) * 2007-02-01 2012-05-09 シスメックス株式会社 血球分析装置および体液分析方法
JP4866808B2 (ja) * 2007-07-31 2012-02-01 株式会社日立ハイテクノロジーズ 自動分析装置
JP5203141B2 (ja) * 2008-10-31 2013-06-05 シスメックス株式会社 検体分析装置、検体分析装置における試薬情報の表示方法およびコンピュータプログラム
JP5500861B2 (ja) * 2009-04-20 2014-05-21 株式会社日立ハイテクノロジーズ 自動分析装置
US20120239676A1 (en) * 2009-12-03 2012-09-20 Hitachi High-Technologies Corporation Automatic analyzing device
JP5606875B2 (ja) * 2010-10-29 2014-10-15 シスメックス株式会社 検体処理装置及びコンピュータプログラム
JP5535047B2 (ja) * 2010-11-18 2014-07-02 株式会社日立ハイテクノロジーズ 自動分析装置
WO2012120755A1 (ja) * 2011-03-04 2012-09-13 株式会社 日立ハイテクノロジーズ 分析装置
WO2013094485A1 (ja) * 2011-12-22 2013-06-27 株式会社日立ハイテクノロジーズ 自動分析装置
JP5939833B2 (ja) * 2012-02-24 2016-06-22 株式会社日立ハイテクノロジーズ 自動分析装置
CN109416319B (zh) * 2016-07-19 2021-07-13 株式会社日立高新技术 自动分析装置及自动分析方法
JP7016349B2 (ja) * 2017-03-14 2022-02-04 株式会社日立ハイテク 自動分析システム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040096361A1 (en) * 2002-06-28 2004-05-20 Shigeki Matsubara Automatic analyzer
US20050175506A1 (en) * 2002-06-28 2005-08-11 Shigeki Matsubara Automatic analyzer
WO2017033576A1 (ja) * 2015-08-27 2017-03-02 株式会社日立ハイテクノロジーズ 自動分析装置

Also Published As

Publication number Publication date
US20200241024A1 (en) 2020-07-30
EP3594688A4 (en) 2020-12-23
JP2020160072A (ja) 2020-10-01
JP7068527B2 (ja) 2022-05-16
US11747355B2 (en) 2023-09-05
EP3594688B1 (en) 2023-08-16
EP4246148A2 (en) 2023-09-20
JP7315749B2 (ja) 2023-07-26
US20230408537A1 (en) 2023-12-21
JPWO2018163745A1 (ja) 2019-11-14
US11156625B2 (en) 2021-10-26
CN111579806B (zh) 2024-07-02
JP6873295B2 (ja) 2021-05-19
JP2022093567A (ja) 2022-06-23
CN110366683A (zh) 2019-10-22
JP6700645B2 (ja) 2020-05-27
US20220003794A1 (en) 2022-01-06
EP3594688A1 (en) 2020-01-15
CN110366683B (zh) 2020-06-23
WO2018163745A1 (ja) 2018-09-13
JP2021105619A (ja) 2021-07-26
CN111579806A (zh) 2020-08-25

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