DE69508885T2 - Halbleiterdiode und Verfahren zur Herstellung - Google Patents

Halbleiterdiode und Verfahren zur Herstellung

Info

Publication number
DE69508885T2
DE69508885T2 DE69508885T DE69508885T DE69508885T2 DE 69508885 T2 DE69508885 T2 DE 69508885T2 DE 69508885 T DE69508885 T DE 69508885T DE 69508885 T DE69508885 T DE 69508885T DE 69508885 T2 DE69508885 T2 DE 69508885T2
Authority
DE
Germany
Prior art keywords
manufacturing
semiconductor diode
diode
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69508885T
Other languages
English (en)
Other versions
DE69508885D1 (de
Inventor
Noriyuki Soejima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of DE69508885D1 publication Critical patent/DE69508885D1/de
Application granted granted Critical
Publication of DE69508885T2 publication Critical patent/DE69508885T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70—Bipolar devices
    • H01L29/74—Thyristor-type devices, e.g. having four-zone regenerative action
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66083—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by variation of the electric current supplied or the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. two-terminal devices
    • H01L29/6609—Diodes
    • H01L29/66136—PN junction diodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/30—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by physical imperfections; having polished or roughened surface
    • H01L29/32—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by physical imperfections; having polished or roughened surface the imperfections being within the semiconductor body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861—Diodes

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Thyristors (AREA)
  • Electrodes Of Semiconductors (AREA)
DE69508885T 1994-10-25 1995-10-16 Halbleiterdiode und Verfahren zur Herstellung Expired - Lifetime DE69508885T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6260541A JPH08125200A (ja) 1994-10-25 1994-10-25 半導体装置及びその製造方法

Publications (2)

Publication Number Publication Date
DE69508885D1 DE69508885D1 (de) 1999-05-12
DE69508885T2 true DE69508885T2 (de) 1999-12-09

Family

ID=17349401

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69508885T Expired - Lifetime DE69508885T2 (de) 1994-10-25 1995-10-16 Halbleiterdiode und Verfahren zur Herstellung

Country Status (5)

Country Link
US (1) US5717244A (de)
EP (1) EP0709898B1 (de)
JP (1) JPH08125200A (de)
KR (1) KR0173498B1 (de)
DE (1) DE69508885T2 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19713962C1 (de) * 1997-04-04 1998-07-02 Siemens Ag Leistungsdiode (FCI-Diode)
WO1999009600A1 (en) * 1997-08-14 1999-02-25 Mitsubishi Denki Kabushiki Kaisha Semiconductor device and method for manufacturing the same
JP4267083B2 (ja) * 1998-06-01 2009-05-27 三菱電機株式会社 ダイオード
DE19837944A1 (de) 1998-08-21 2000-02-24 Asea Brown Boveri Verfahren zur Fertigung eines Halbleiterbauelements
JP4080659B2 (ja) * 2000-01-28 2008-04-23 三菱電機株式会社 半導体装置
US7485920B2 (en) * 2000-06-14 2009-02-03 International Rectifier Corporation Process to create buried heavy metal at selected depth
DE10048345A1 (de) 2000-09-29 2002-05-16 Eupec Gmbh & Co Kg Körper aus Halbleitermaterial mit reduzierter mittlerer freier Weglänge
DE10065525B4 (de) * 2000-12-28 2006-07-20 Robert Bosch Gmbh Verfahren zur Herstellung einer Halbleiteranordnung mit einem PN-Übergang
JP5359567B2 (ja) * 2002-02-20 2013-12-04 富士電機株式会社 半導体装置およびその製造方法
US7405465B2 (en) 2004-09-29 2008-07-29 Sandisk 3D Llc Deposited semiconductor structure to minimize n-type dopant diffusion and method of making
DE102005032074B4 (de) * 2005-07-08 2007-07-26 Infineon Technologies Austria Ag Halbleiterbauelement mit Feldstopp
CN105552115B (zh) * 2009-11-02 2019-10-29 富士电机株式会社 半导体器件以及用于制造半导体器件的方法
JP5776485B2 (ja) * 2011-10-12 2015-09-09 三菱電機株式会社 半導体装置
JP5672269B2 (ja) * 2012-06-04 2015-02-18 富士電機株式会社 半導体装置の製造方法
JP6073092B2 (ja) * 2012-09-07 2017-02-01 株式会社 日立パワーデバイス ダイオード及び電力変換システム、並びにダイオードの製造方法
CN105814694B (zh) 2014-10-03 2019-03-08 富士电机株式会社 半导体装置以及半导体装置的制造方法
WO2017146148A1 (ja) 2016-02-23 2017-08-31 富士電機株式会社 半導体装置
JP6846119B2 (ja) * 2016-05-02 2021-03-24 株式会社 日立パワーデバイス ダイオード、およびそれを用いた電力変換装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4259683A (en) * 1977-02-07 1981-03-31 General Electric Company High switching speed P-N junction devices with recombination means centrally located in high resistivity layer
JPS59189679A (ja) * 1983-04-13 1984-10-27 Hitachi Ltd ダイオ−ド
JPH0640581B2 (ja) * 1984-03-23 1994-05-25 株式会社東芝 スイツチング素子
US4752818A (en) * 1985-09-28 1988-06-21 Kabushiki Kaisha Toyota Chuo Kenkyusho Semiconductor device with multiple recombination center layers
JPS63205958A (ja) * 1987-02-21 1988-08-25 Matsushita Electric Works Ltd 静電誘導サイリスタ
JPH0193167A (ja) * 1987-10-05 1989-04-12 Toyota Autom Loom Works Ltd 高耐圧トランジスタ
JPH03171777A (ja) * 1989-11-30 1991-07-25 Toshiba Corp 半導体装置
JPH0650738B2 (ja) * 1990-01-11 1994-06-29 株式会社東芝 半導体装置及びその製造方法
JPH04348527A (ja) * 1991-05-27 1992-12-03 Fuji Electric Co Ltd 半導体装置の製造方法
US5710437A (en) * 1993-03-05 1998-01-20 Nippon Steel Corporation Radiation detecting device using superconducting tunnel junction and method of fabricating the same
DE4310444C2 (de) * 1993-03-31 1995-05-11 Semikron Elektronik Gmbh Schnelle Leistungsdiode

Also Published As

Publication number Publication date
JPH08125200A (ja) 1996-05-17
KR960015948A (ko) 1996-05-22
DE69508885D1 (de) 1999-05-12
KR0173498B1 (ko) 1999-02-01
US5717244A (en) 1998-02-10
EP0709898A2 (de) 1996-05-01
EP0709898B1 (de) 1999-04-07
EP0709898A3 (de) 1996-06-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)