DE69115131D1 - Verfahren zur Ziehung von Halbleitereinkristallen. - Google Patents
Verfahren zur Ziehung von Halbleitereinkristallen.Info
- Publication number
- DE69115131D1 DE69115131D1 DE69115131T DE69115131T DE69115131D1 DE 69115131 D1 DE69115131 D1 DE 69115131D1 DE 69115131 T DE69115131 T DE 69115131T DE 69115131 T DE69115131 T DE 69115131T DE 69115131 D1 DE69115131 D1 DE 69115131D1
- Authority
- DE
- Germany
- Prior art keywords
- single crystals
- semiconductor single
- pulling semiconductor
- pulling
- crystals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
- C30B15/305—Stirring of the melt
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10S117/917—Magnetic
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2136365A JPH0431386A (ja) | 1990-05-25 | 1990-05-25 | 半導体単結晶引上方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69115131D1 true DE69115131D1 (de) | 1996-01-18 |
DE69115131T2 DE69115131T2 (de) | 1996-08-01 |
Family
ID=15173466
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69115131T Expired - Fee Related DE69115131T2 (de) | 1990-05-25 | 1991-05-20 | Verfahren zur Ziehung von Halbleitereinkristallen. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5359959A (de) |
EP (1) | EP0461769B1 (de) |
JP (1) | JPH0431386A (de) |
DE (1) | DE69115131T2 (de) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0692773A (ja) * | 1991-06-07 | 1994-04-05 | Mitsubishi Materials Corp | 単結晶引上方法 |
JPH07247197A (ja) * | 1994-03-09 | 1995-09-26 | Fujitsu Ltd | 半導体装置とその製造方法 |
DE19529481A1 (de) * | 1995-08-10 | 1997-02-13 | Wacker Siltronic Halbleitermat | Verfahren und Vorrichtung zur Herstellung von Einkristallen |
JP3898247B2 (ja) * | 1995-12-06 | 2007-03-28 | 信越半導体株式会社 | 単結晶の製造装置および製造方法 |
JP3520883B2 (ja) * | 1995-12-29 | 2004-04-19 | 信越半導体株式会社 | 単結晶の製造方法 |
JP3969460B2 (ja) * | 1996-06-20 | 2007-09-05 | Sumco Techxiv株式会社 | 磁場印加による半導体単結晶の製造方法 |
EP0949360A1 (de) | 1998-04-07 | 1999-10-13 | Shin-Etsu Handotai Company Limited | Verfahren zur Herstellung eines Silizium-Einkristalls mittels Czochralski-Verfahren |
DE60041429D1 (de) * | 1999-03-17 | 2009-03-12 | Shinetsu Handotai Kk | Verfahren zur herstellung von silicium einkristallen |
US6592662B2 (en) | 2000-02-28 | 2003-07-15 | Shin-Etsu Handotai Co., Ltd. | Method for preparing silicon single crystal and silicon single crystal |
JP3598972B2 (ja) * | 2000-12-20 | 2004-12-08 | 三菱住友シリコン株式会社 | シリコン単結晶の製造方法 |
US6565652B1 (en) | 2001-12-06 | 2003-05-20 | Seh America, Inc. | High resistivity silicon wafer and method of producing same using the magnetic field Czochralski method |
JP2005213097A (ja) | 2004-01-30 | 2005-08-11 | Sumitomo Mitsubishi Silicon Corp | シリコン単結晶の引上げ方法 |
KR100749936B1 (ko) | 2005-05-11 | 2007-08-16 | 주식회사 실트론 | 실리콘 단결정 잉곳 및 이의 제조 방법 |
JP4829176B2 (ja) * | 2007-06-08 | 2011-12-07 | シルトロニック・ジャパン株式会社 | 単結晶の製造方法 |
JP5228671B2 (ja) * | 2008-07-24 | 2013-07-03 | 株式会社Sumco | シリコン単結晶の育成方法 |
JP6489209B2 (ja) | 2015-11-02 | 2019-03-27 | 株式会社Sumco | 単結晶シリコンの製造方法および単結晶シリコン |
CN105350070A (zh) * | 2015-12-09 | 2016-02-24 | 天津市环欧半导体材料技术有限公司 | 一种利用变频磁场控制直拉法硅单晶氧含量的方法 |
DE102015226399A1 (de) * | 2015-12-22 | 2017-06-22 | Siltronic Ag | Siliciumscheibe mit homogener radialer Sauerstoffvariation |
CN112095154B (zh) * | 2019-06-18 | 2021-05-14 | 上海新昇半导体科技有限公司 | 一种半导体晶体生长装置 |
CN114318499B (zh) * | 2020-09-29 | 2023-07-11 | 万华化学集团电子材料有限公司 | 一种大直径半导体硅单晶的生长方法及单晶炉 |
CN114086241B (zh) * | 2021-11-25 | 2023-03-28 | 西安奕斯伟材料科技有限公司 | 一种单晶硅棒的拉制方法及单晶硅棒 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3607139A (en) * | 1968-05-02 | 1971-09-21 | Air Reduction | Single crystal growth and diameter control by magnetic melt agitation |
US3929557A (en) * | 1973-06-11 | 1975-12-30 | Us Air Force | Periodically and alternately accelerating and decelerating rotation rate of a feed crystal |
GB2059932B (en) * | 1979-09-20 | 1983-10-12 | Sony Corp | Solidification processes |
JPH0244799B2 (ja) * | 1981-10-26 | 1990-10-05 | Sony Corp | Ketsushoseichohoho |
JPS5881086A (ja) * | 1981-11-11 | 1983-05-16 | 松下電器産業株式会社 | ミシン制御装置 |
US4637854A (en) * | 1983-01-18 | 1987-01-20 | Agency Of Industrial Science And Technology | Method for producing GaAs single crystal |
EP0135676A3 (de) * | 1983-06-30 | 1989-02-01 | International Business Machines Corporation | Vorrichtung zur Kristallzüchtung nach Czochralski und Züchtungsverfahren mit dieser Vorrichtung |
JPS6033291A (ja) * | 1983-07-29 | 1985-02-20 | Toshiba Ceramics Co Ltd | 単結晶シリコンの製造方法 |
JPS6144797A (ja) * | 1984-08-10 | 1986-03-04 | Toshiba Corp | 単結晶育成装置およびその制御方法 |
JPS6236096A (ja) * | 1985-08-07 | 1987-02-17 | Kawasaki Steel Corp | 単結晶の製造方法およびその装置 |
JPS62182190A (ja) * | 1986-02-03 | 1987-08-10 | Sumitomo Electric Ind Ltd | 化合物半導体単結晶の製造方法 |
US4659423A (en) * | 1986-04-28 | 1987-04-21 | International Business Machines Corporation | Semiconductor crystal growth via variable melt rotation |
JP2561072B2 (ja) * | 1986-04-30 | 1996-12-04 | 東芝セラミツクス株式会社 | 単結晶の育成方法及びその装置 |
JP2556966B2 (ja) * | 1986-04-30 | 1996-11-27 | 東芝セラミツクス株式会社 | 単結晶の育成装置 |
JPS6379789A (ja) * | 1986-09-24 | 1988-04-09 | Sumitomo Electric Ind Ltd | 半導体単結晶の製造方法および装置 |
JPS63242991A (ja) * | 1987-03-31 | 1988-10-07 | Shin Etsu Handotai Co Ltd | 結晶径制御方法 |
-
1990
- 1990-05-25 JP JP2136365A patent/JPH0431386A/ja active Pending
-
1991
- 1991-05-20 EP EP91304539A patent/EP0461769B1/de not_active Expired - Lifetime
- 1991-05-20 DE DE69115131T patent/DE69115131T2/de not_active Expired - Fee Related
-
1992
- 1992-09-30 US US07/953,918 patent/US5359959A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69115131T2 (de) | 1996-08-01 |
EP0461769B1 (de) | 1995-12-06 |
EP0461769A1 (de) | 1991-12-18 |
US5359959A (en) | 1994-11-01 |
JPH0431386A (ja) | 1992-02-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |