DE3578253D1 - Halbleiterspeicher mit einer hohen datenlesegeschwindigkeit und einem hohen stoerabstand. - Google Patents
Halbleiterspeicher mit einer hohen datenlesegeschwindigkeit und einem hohen stoerabstand.Info
- Publication number
- DE3578253D1 DE3578253D1 DE8585116577T DE3578253T DE3578253D1 DE 3578253 D1 DE3578253 D1 DE 3578253D1 DE 8585116577 T DE8585116577 T DE 8585116577T DE 3578253 T DE3578253 T DE 3578253T DE 3578253 D1 DE3578253 D1 DE 3578253D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor memory
- data reading
- reading speed
- interference
- high data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/18—Address timing or clocking circuits; Address control signal generation or management, e.g. for row address strobe [RAS] or column address strobe [CAS] signals
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Static Random-Access Memory (AREA)
- Dram (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP27735684 | 1984-12-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3578253D1 true DE3578253D1 (de) | 1990-07-19 |
Family
ID=17582381
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8585116577T Expired - Lifetime DE3578253D1 (de) | 1984-12-27 | 1985-12-27 | Halbleiterspeicher mit einer hohen datenlesegeschwindigkeit und einem hohen stoerabstand. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4766572A (de) |
EP (1) | EP0186906B1 (de) |
JP (1) | JPH0650599B2 (de) |
DE (1) | DE3578253D1 (de) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0831275B2 (ja) * | 1986-09-09 | 1996-03-27 | 日本電気株式会社 | メモリ回路 |
US4947374A (en) * | 1987-05-12 | 1990-08-07 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor memeory device in which writing is inhibited in address skew period and controlling method thereof |
JP2569554B2 (ja) * | 1987-05-13 | 1997-01-08 | 三菱電機株式会社 | ダイナミツクram |
JP2585602B2 (ja) * | 1987-06-10 | 1997-02-26 | 株式会社日立製作所 | 半導体記憶装置 |
JP2530012B2 (ja) * | 1988-11-18 | 1996-09-04 | 株式会社東芝 | 半導体集積回路 |
JPH07118195B2 (ja) * | 1988-10-07 | 1995-12-18 | 株式会社東芝 | 半導体集積回路 |
NL8800872A (nl) * | 1988-04-06 | 1989-11-01 | Philips Nv | Geintegreerde schakeling. |
US5327392A (en) * | 1989-01-13 | 1994-07-05 | Kabushiki Kaisha Toshiba | Semiconductor integrated circuit capable of preventing occurrence of erroneous operation due to noise |
JPH0778989B2 (ja) * | 1989-06-21 | 1995-08-23 | 株式会社東芝 | 半導体メモリ装置 |
EP0405411B1 (de) * | 1989-06-26 | 1995-11-15 | Nec Corporation | Halbleiterspeicher mit einem verbesserten Datenleseschema |
US5146427A (en) * | 1989-08-30 | 1992-09-08 | Hitachi Ltd. | High speed semiconductor memory having a direct-bypass signal path |
KR100240523B1 (ko) * | 1989-08-30 | 2000-01-15 | 미다 가쓰시게 | 반도체 집적 회로 장치 |
JP2534782B2 (ja) * | 1989-11-10 | 1996-09-18 | 株式会社東芝 | 半導体装置 |
US5625593A (en) * | 1990-03-28 | 1997-04-29 | Mitsubishi Denki Kabushiki Kaisha | Memory card circuit with separate buffer chips |
JP2519580B2 (ja) * | 1990-06-19 | 1996-07-31 | 三菱電機株式会社 | 半導体集積回路 |
JPH0799630B2 (ja) * | 1990-09-11 | 1995-10-25 | 株式会社東芝 | スタティック型半導体記憶装置 |
US5305277A (en) * | 1991-04-24 | 1994-04-19 | International Business Machines Corporation | Data processing apparatus having address decoder supporting wide range of operational frequencies |
JPH05144273A (ja) * | 1991-11-18 | 1993-06-11 | Mitsubishi Electric Corp | 半導体集積回路装置 |
US5661694A (en) * | 1993-05-14 | 1997-08-26 | Fujitsu Limited | Programmable semiconductor memory device |
US6026052A (en) | 1994-05-03 | 2000-02-15 | Fujitsu Limited | Programmable semiconductor memory device |
US5592425A (en) * | 1995-12-20 | 1997-01-07 | Intel Corporation | Method and apparatus for testing a memory where data is passed through the memory for comparison with data read from the memory |
EP0805453B1 (de) * | 1996-04-29 | 2004-01-02 | STMicroelectronics S.r.l. | Speicherarchitektur für flexibele Leseverwaltung, insbesondere für nichtflüchtige Speicher, mit Rauschunempfindlichkeitsmerkmalen, mit Anlageleistungsanpassung und mit optimiertem Durchfluss |
KR100230747B1 (ko) * | 1996-11-22 | 1999-11-15 | 김영환 | 반도체 메모리장치의 저전력 감지증폭기(Low power sense amplifier in a semiconductor device) |
KR100226254B1 (ko) * | 1996-12-28 | 1999-10-15 | 김영환 | 반도체 메모리소자의 감지증폭기 인에이블신호 발생회로 |
US5917768A (en) * | 1997-04-24 | 1999-06-29 | Sgs-Thomson Microelectronics S.R.L. | Memory architecture for flexible reading management, particularly for non-volatile memories, having noise-immunity features, matching device performance, and having optimized throughout |
JPH11134224A (ja) * | 1997-10-29 | 1999-05-21 | Fujitsu Ltd | 信号観測方法及び信号観測装置 |
US6262920B1 (en) * | 1999-08-25 | 2001-07-17 | Micron Technology, Inc. | Program latch with charge sharing immunity |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3428951A (en) * | 1963-02-28 | 1969-02-18 | Ampex | Memory addressing apparatus |
US4060794A (en) * | 1976-03-31 | 1977-11-29 | Honeywell Information Systems Inc. | Apparatus and method for generating timing signals for latched type memories |
JPS5423337A (en) * | 1977-07-22 | 1979-02-21 | Mitsubishi Electric Corp | Semiconductor memory unit |
JPS6057156B2 (ja) * | 1978-05-24 | 1985-12-13 | 株式会社日立製作所 | 半導体メモリ装置 |
FR2443723A1 (fr) * | 1978-12-06 | 1980-07-04 | Cii Honeywell Bull | Dispositif de reduction du temps d'acces aux informations contenues dans une memoire d'un systeme de traitement de l'information |
GB2084361B (en) * | 1980-09-19 | 1984-11-21 | Sony Corp | Random access memory arrangements |
JPS58169383A (ja) * | 1982-03-30 | 1983-10-05 | Fujitsu Ltd | 半導体記憶装置 |
JPS5952492A (ja) * | 1982-09-17 | 1984-03-27 | Fujitsu Ltd | スタテイツク型半導体記憶装置 |
EP0125699A3 (de) * | 1983-05-17 | 1986-10-08 | Kabushiki Kaisha Toshiba | Datenausgabeanordnung für einen dynamischen Speicher |
US4616341A (en) * | 1983-06-30 | 1986-10-07 | International Business Machines Corporation | Directory memory system having simultaneous write and comparison data bypass capabilities |
-
1985
- 1985-12-26 US US06/813,604 patent/US4766572A/en not_active Expired - Lifetime
- 1985-12-27 DE DE8585116577T patent/DE3578253D1/de not_active Expired - Lifetime
- 1985-12-27 JP JP60296929A patent/JPH0650599B2/ja not_active Expired - Lifetime
- 1985-12-27 EP EP85116577A patent/EP0186906B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US4766572A (en) | 1988-08-23 |
EP0186906A2 (de) | 1986-07-09 |
JPH0650599B2 (ja) | 1994-06-29 |
EP0186906A3 (en) | 1987-09-02 |
JPS61267993A (ja) | 1986-11-27 |
EP0186906B1 (de) | 1990-06-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: NEC CORP., TOKIO/TOKYO, JP Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP |