CN1799195B - 低通滤波器和电子器件 - Google Patents
低通滤波器和电子器件 Download PDFInfo
- Publication number
- CN1799195B CN1799195B CN2004800153707A CN200480015370A CN1799195B CN 1799195 B CN1799195 B CN 1799195B CN 2004800153707 A CN2004800153707 A CN 2004800153707A CN 200480015370 A CN200480015370 A CN 200480015370A CN 1799195 B CN1799195 B CN 1799195B
- Authority
- CN
- China
- Prior art keywords
- pass filter
- low pass
- capacitor
- filter
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000003990 capacitor Substances 0.000 claims abstract description 54
- 239000004065 semiconductor Substances 0.000 claims abstract description 48
- 239000000758 substrate Substances 0.000 claims description 21
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 4
- 229920005591 polysilicon Polymers 0.000 claims description 4
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 4
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 238000003466 welding Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 240000004050 Pentaglottis sempervirens Species 0.000 description 2
- 235000004522 Pentaglottis sempervirens Nutrition 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000004100 electronic packaging Methods 0.000 description 2
- 238000005538 encapsulation Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 238000003475 lamination Methods 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
- H03H7/01—Frequency selective two-port networks
- H03H7/06—Frequency selective two-port networks including resistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
- H03H7/01—Frequency selective two-port networks
- H03H7/12—Bandpass or bandstop filters with adjustable bandwidth and fixed centre frequency
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
- H03L7/093—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal using special filtering or amplification characteristics in the loop
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16135—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/16145—Disposition the bump connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16245—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32135—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/32145—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48145—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48145—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
- H01L2224/48147—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked with an intermediate bond, e.g. continuous wire daisy chain
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48257—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a die pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/4917—Crossed wires
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Filters And Equalizers (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
- Transceivers (AREA)
- Networks Using Active Elements (AREA)
Abstract
Description
频率GHz | 温度 | 2.402 | 2.441 | 2.478 |
DH1(kHz) | 25℃ | -17 | -16 | -18 |
DH5(kHz) | 25℃ | -29 | -26 | -30 |
频率GHz | 温度 | 2.402 | 2.441 | 2.478 |
DH1(kHz) | 85℃ | -10 | -19 | -19 |
DH5(kHz) | 85℃ | 26 | -25 | -32 |
频率GHz | 温度 | 2.402 | 2.441 | 2.478 |
DH1(kHz) | 30℃ | 15 | 13 | 15 |
DH5(kHz) | 30℃ | 40 | 17 | -28 |
频率GHz | 2.402 | 2.441 | 2.478 |
V<sub>tune</sub>(V) | 1.4 | 1.64 | 1.94 |
DH5(kHz) | -25 | -20 | -16 |
Claims (11)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03076725 | 2003-06-03 | ||
EP03076725.5 | 2003-06-03 | ||
PCT/IB2004/050778 WO2004107568A1 (en) | 2003-06-03 | 2004-05-26 | Low pass filter and electronic device |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1799195A CN1799195A (zh) | 2006-07-05 |
CN1799195B true CN1799195B (zh) | 2010-06-02 |
Family
ID=33483967
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2004800153707A Expired - Fee Related CN1799195B (zh) | 2003-06-03 | 2004-05-26 | 低通滤波器和电子器件 |
Country Status (8)
Country | Link |
---|---|
US (1) | US7388439B2 (zh) |
EP (1) | EP1634371B1 (zh) |
JP (1) | JP4704329B2 (zh) |
KR (1) | KR101145569B1 (zh) |
CN (1) | CN1799195B (zh) |
AT (1) | ATE403971T1 (zh) |
DE (1) | DE602004015596D1 (zh) |
WO (1) | WO2004107568A1 (zh) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100735455B1 (ko) | 2005-11-22 | 2007-07-04 | 삼성전기주식회사 | 주파수 드리프트 개선기능을 갖는 위상 동기 제어기 |
KR101315858B1 (ko) * | 2007-01-29 | 2013-10-08 | 엘지이노텍 주식회사 | 위성방송수신기의 주파수 드래프트 보상 장치 |
JP2009055116A (ja) * | 2007-08-23 | 2009-03-12 | Sanyo Electric Co Ltd | ローパスフィルタ及びオーディオアンプ |
EP2249478B1 (en) * | 2008-02-20 | 2015-01-07 | Taiyo Yuden Co., Ltd. | Filter, branching filter, communication module, and communication equipment |
US8143659B2 (en) * | 2008-04-14 | 2012-03-27 | Infineon Technologies Ag | Vertical trench capacitor, chip comprising the capacitor, and method for producing the capacitor |
US8178962B1 (en) | 2009-04-21 | 2012-05-15 | Xilinx, Inc. | Semiconductor device package and methods of manufacturing the same |
US8963671B2 (en) | 2012-08-31 | 2015-02-24 | Advanced Semiconductor Engineering, Inc. | Semiconductor transformer device and method for manufacturing the same |
FR3038105B1 (fr) * | 2015-06-29 | 2017-08-04 | Oberthur Technologies | Module equipe d'un condensateur et d'une antenne, avec disposition d'electrode de condensateur amelioree |
EP3680934A1 (en) * | 2019-01-08 | 2020-07-15 | Murata Manufacturing Co., Ltd. | Rc architectures, and methods of fabrication thereof |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1416216A (zh) * | 2001-11-02 | 2003-05-07 | 韩国电子通信研究院 | 用于高频应用的低通滤波器 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6343356A (ja) * | 1986-08-08 | 1988-02-24 | Fujitsu Ltd | 半導体記憶装置およびその製造方法 |
JPH06103741B2 (ja) * | 1988-06-30 | 1994-12-14 | 日本電気株式会社 | 半導体記憶装置 |
JPH02214213A (ja) * | 1989-02-15 | 1990-08-27 | Hitachi Ltd | 自走発振周波数調整不要hdd用データセパレータ |
JP3129750B2 (ja) * | 1990-09-27 | 2001-01-31 | 株式会社東芝 | 半導体記憶装置及びその製造方法 |
JPH07336141A (ja) * | 1994-06-03 | 1995-12-22 | Matsushita Electric Ind Co Ltd | 発振器 |
JPH08163113A (ja) * | 1994-12-01 | 1996-06-21 | Fujitsu Ltd | 誤差検出回路並びにこれを用いたクロック再生回路及び遅延ロック回路 |
JPH08274581A (ja) * | 1995-03-30 | 1996-10-18 | Matsushita Electric Ind Co Ltd | アナログフィルター |
KR100190002B1 (ko) | 1995-12-29 | 1999-06-01 | 윤종용 | 저항과 캐패시터를 함께 구비하는 반도체 소자 및 그제조방법 |
TW388877B (en) * | 1997-04-23 | 2000-05-01 | Toshiba Corp | Semiconductor device and its manufacturing process |
KR100290784B1 (ko) * | 1998-09-15 | 2001-07-12 | 박종섭 | 스택 패키지 및 그 제조방법 |
US6157271A (en) * | 1998-11-23 | 2000-12-05 | Motorola, Inc. | Rapid tuning, low distortion digital direct modulation phase locked loop and method therefor |
CA2380923C (en) * | 1999-08-02 | 2008-04-01 | Qualcomm Incorporated | Method and apparatus for multiple band voltage controlled oscillator with noise immunity |
US6700203B1 (en) * | 2000-10-11 | 2004-03-02 | International Business Machines Corporation | Semiconductor structure having in-situ formed unit resistors |
JP3839323B2 (ja) * | 2001-04-06 | 2006-11-01 | 株式会社ルネサステクノロジ | 半導体装置の製造方法 |
GB0127537D0 (en) * | 2001-11-16 | 2002-01-09 | Hitachi Ltd | A communication semiconductor integrated circuit device and a wireless communication system |
US6984860B2 (en) * | 2002-11-27 | 2006-01-10 | Semiconductor Components Industries, L.L.C. | Semiconductor device with high frequency parallel plate trench capacitor structure |
-
2004
- 2004-05-26 CN CN2004800153707A patent/CN1799195B/zh not_active Expired - Fee Related
- 2004-05-26 JP JP2006508458A patent/JP4704329B2/ja not_active Expired - Lifetime
- 2004-05-26 US US10/558,718 patent/US7388439B2/en active Active
- 2004-05-26 AT AT04734878T patent/ATE403971T1/de not_active IP Right Cessation
- 2004-05-26 EP EP04734878A patent/EP1634371B1/en not_active Expired - Lifetime
- 2004-05-26 KR KR1020057023110A patent/KR101145569B1/ko active IP Right Grant
- 2004-05-26 WO PCT/IB2004/050778 patent/WO2004107568A1/en active IP Right Grant
- 2004-05-26 DE DE602004015596T patent/DE602004015596D1/de not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1416216A (zh) * | 2001-11-02 | 2003-05-07 | 韩国电子通信研究院 | 用于高频应用的低通滤波器 |
Non-Patent Citations (2)
Title |
---|
F.Roozeboom等.High-value MOS capacitor arrays in ultradeep trenches insilicon.Microelectronic Engineering53 1-4.2000,53(1-4),581-584. |
F.Roozeboom等.High-value MOS capacitor arrays in ultradeep trenches insilicon.Microelectronic Engineering53 1-4.2000,53(1-4),581-584. * |
Also Published As
Publication number | Publication date |
---|---|
JP4704329B2 (ja) | 2011-06-15 |
WO2004107568A1 (en) | 2004-12-09 |
KR20060017836A (ko) | 2006-02-27 |
ATE403971T1 (de) | 2008-08-15 |
US20070018748A1 (en) | 2007-01-25 |
CN1799195A (zh) | 2006-07-05 |
DE602004015596D1 (de) | 2008-09-18 |
KR101145569B1 (ko) | 2012-05-15 |
US7388439B2 (en) | 2008-06-17 |
EP1634371A1 (en) | 2006-03-15 |
JP2006526928A (ja) | 2006-11-24 |
EP1634371B1 (en) | 2008-08-06 |
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