CN109844504A - 外观检查方法 - Google Patents

外观检查方法 Download PDF

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Publication number
CN109844504A
CN109844504A CN201780061898.5A CN201780061898A CN109844504A CN 109844504 A CN109844504 A CN 109844504A CN 201780061898 A CN201780061898 A CN 201780061898A CN 109844504 A CN109844504 A CN 109844504A
Authority
CN
China
Prior art keywords
appearance
abnormal
operating personnel
check
bad order
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201780061898.5A
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English (en)
Chinese (zh)
Inventor
高见敦
饭塚裕二
司明波
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kawasaki Motors Ltd
Original Assignee
Kawasaki Jukogyo KK
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Publication date
Application filed by Kawasaki Jukogyo KK filed Critical Kawasaki Jukogyo KK
Publication of CN109844504A publication Critical patent/CN109844504A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
CN201780061898.5A 2016-10-06 2017-10-03 外观检查方法 Pending CN109844504A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2016-197907 2016-10-06
JP2016197907A JP2018059830A (ja) 2016-10-06 2016-10-06 外観検査方法
PCT/JP2017/036029 WO2018066576A1 (ja) 2016-10-06 2017-10-03 外観検査方法

Publications (1)

Publication Number Publication Date
CN109844504A true CN109844504A (zh) 2019-06-04

Family

ID=61832039

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201780061898.5A Pending CN109844504A (zh) 2016-10-06 2017-10-03 外观检查方法

Country Status (3)

Country Link
JP (2) JP2018059830A (ja)
CN (1) CN109844504A (ja)
WO (1) WO2018066576A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112444519A (zh) * 2019-08-30 2021-03-05 比亚迪股份有限公司 车辆故障检测装置和方法
CN113267516A (zh) * 2020-01-30 2021-08-17 株式会社日立制作所 警报输出定时控制装置及其控制方法、记录介质

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7077807B2 (ja) * 2018-06-12 2022-05-31 オムロン株式会社 画像検査システム及びその制御方法
JP7257750B2 (ja) * 2018-07-25 2023-04-14 シーシーエス株式会社 光検査システム用支援装置
KR102206753B1 (ko) 2019-01-24 2021-01-22 주식회사 수아랩 결함 검사 장치
JP7304756B2 (ja) * 2019-07-08 2023-07-07 三菱重工業株式会社 圧着端子の検査装置および方法
JP6653929B1 (ja) * 2019-07-18 2020-02-26 Ｊｅインターナショナル株式会社 自動判別処理装置、自動判別処理方法、検査システム、プログラム、および記録媒体
JP7029201B1 (ja) 2021-02-04 2022-03-03 コネクテッドロボティクス株式会社 物体検査装置、検査用プログラム、及びシステム
CN113378810B (zh) * 2021-04-28 2022-04-15 合肥联宝信息技术有限公司 一种螺丝锁附检测方法、装置、设备和可读存储介质

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002031605A (ja) * 2000-07-13 2002-01-31 Hitachi Ltd 欠陥確認装置および自動外観検査装置
JP2004198265A (ja) * 2002-12-18 2004-07-15 Dainippon Printing Co Ltd 加工製品の外観検査、選別方法および加工製品の外観検査、選別システム
CN1737548A (zh) * 2004-08-20 2006-02-22 大日本网目版制造株式会社 目视确认装置和检查***
CN1808055A (zh) * 2005-01-18 2006-07-26 奥林巴斯株式会社 坐标检测装置及被检测体检查装置
JP2007240434A (ja) * 2006-03-10 2007-09-20 Omron Corp 表面状態の検査方法および表面状態検査装置
JP2008051781A (ja) * 2006-08-28 2008-03-06 I-Pulse Co Ltd 基板の外観検査方法および装置
JP2013228232A (ja) * 2012-04-24 2013-11-07 Asahi Glass Co Ltd 基板外観検査方法
CN103207187B (zh) * 2012-01-17 2016-03-16 斯克林集团公司 外观检查装置及外观检查方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08178858A (ja) * 1994-12-26 1996-07-12 Nec Corp スルーホール検査装置
JP2000051939A (ja) * 1998-08-06 2000-02-22 Nkk Corp 薄鋼板への欠陥マーキングシステム
US20100027873A1 (en) * 2006-08-28 2010-02-04 I-Pulse Kabushiki Kaisha Board appearance inspection method and device
JP2013024666A (ja) * 2011-07-20 2013-02-04 Panasonic Corp 欠陥検出方法および欠陥検出装置
JP2014126494A (ja) * 2012-12-27 2014-07-07 Seiko Epson Corp 検査支援装置、検査支援方法、ロボットシステム、制御装置、ロボット、及び、プログラム
KR101362329B1 (ko) * 2013-09-12 2014-02-12 한동희 디스플레이용 패널의 검사장치
JP2016072335A (ja) * 2014-09-29 2016-05-09 株式会社Ｓｃｒｅｅｎホールディングス プロセス監視装置およびプロセス監視方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002031605A (ja) * 2000-07-13 2002-01-31 Hitachi Ltd 欠陥確認装置および自動外観検査装置
JP2004198265A (ja) * 2002-12-18 2004-07-15 Dainippon Printing Co Ltd 加工製品の外観検査、選別方法および加工製品の外観検査、選別システム
CN1737548A (zh) * 2004-08-20 2006-02-22 大日本网目版制造株式会社 目视确认装置和检查***
CN1808055A (zh) * 2005-01-18 2006-07-26 奥林巴斯株式会社 坐标检测装置及被检测体检查装置
JP2007240434A (ja) * 2006-03-10 2007-09-20 Omron Corp 表面状態の検査方法および表面状態検査装置
JP2008051781A (ja) * 2006-08-28 2008-03-06 I-Pulse Co Ltd 基板の外観検査方法および装置
CN103207187B (zh) * 2012-01-17 2016-03-16 斯克林集团公司 外观检查装置及外观检查方法
JP2013228232A (ja) * 2012-04-24 2013-11-07 Asahi Glass Co Ltd 基板外観検査方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112444519A (zh) * 2019-08-30 2021-03-05 比亚迪股份有限公司 车辆故障检测装置和方法
CN113267516A (zh) * 2020-01-30 2021-08-17 株式会社日立制作所 警报输出定时控制装置及其控制方法、记录介质

Also Published As

Publication number Publication date
WO2018066576A1 (ja) 2018-04-12
JP2021183982A (ja) 2021-12-02
JP2018059830A (ja) 2018-04-12

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Application publication date: 20190604