ATE525757T1 - Organischer feldeffekttransistor mit organischem dielektrikum - Google Patents

Organischer feldeffekttransistor mit organischem dielektrikum

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Publication number
ATE525757T1
ATE525757T1 AT02779719T AT02779719T ATE525757T1 AT E525757 T1 ATE525757 T1 AT E525757T1 AT 02779719 T AT02779719 T AT 02779719T AT 02779719 T AT02779719 T AT 02779719T AT E525757 T1 ATE525757 T1 AT E525757T1
Authority
AT
Austria
Prior art keywords
organic
field effect
effect transistor
insulating material
dielectric
Prior art date
Application number
AT02779719T
Other languages
English (en)
Inventor
Stephen William Leeming
Soad Mohialdin-Khaffaf
Simon Dominic Ogier
Janos Veres
Original Assignee
Merck Patent Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=27256358&utm_source=***_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=ATE525757(T1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from GB0130321A external-priority patent/GB0130321D0/en
Priority claimed from GB0130451A external-priority patent/GB0130451D0/en
Priority claimed from GB0220504A external-priority patent/GB0220504D0/en
Application filed by Merck Patent Gmbh filed Critical Merck Patent Gmbh
Application granted granted Critical
Publication of ATE525757T1 publication Critical patent/ATE525757T1/de

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    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09BORGANIC DYES OR CLOSELY-RELATED COMPOUNDS FOR PRODUCING DYES, e.g. PIGMENTS; MORDANTS; LAKES
    • C09B57/00Other synthetic dyes of known constitution
    • C09B57/008Triarylamine dyes containing no other chromophores
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    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/468Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
    • H10K10/471Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising only organic materials
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    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09BORGANIC DYES OR CLOSELY-RELATED COMPOUNDS FOR PRODUCING DYES, e.g. PIGMENTS; MORDANTS; LAKES
    • C09B69/00Dyes not provided for by a single group of this subclass
    • C09B69/10Polymeric dyes; Reaction products of dyes with monomers or with macromolecular compounds
    • C09B69/109Polymeric dyes; Reaction products of dyes with monomers or with macromolecular compounds containing other specific dyes
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    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
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    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02112Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
    • H01L21/02118Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer carbon based polymeric organic or inorganic material, e.g. polyimides, poly cyclobutene or PVC
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    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02112Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
    • H01L21/02118Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer carbon based polymeric organic or inorganic material, e.g. polyimides, poly cyclobutene or PVC
    • H01L21/0212Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer carbon based polymeric organic or inorganic material, e.g. polyimides, poly cyclobutene or PVC the material being fluoro carbon compounds, e.g.(CFx) n, (CHxFy) n or polytetrafluoroethylene
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    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02225Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/0226Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
    • H01L21/02282Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process liquid deposition, e.g. spin-coating, sol-gel techniques, spray coating
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    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/468Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
    • H10K10/474Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising a multilayered structure
    • H10K10/476Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising a multilayered structure comprising at least one organic layer and at least one inorganic layer
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    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/10Definition of the polymer structure
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    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
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    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/30Monomer units or repeat units incorporating structural elements in the main chain
    • C08G2261/31Monomer units or repeat units incorporating structural elements in the main chain incorporating aromatic structural elements in the main chain
    • C08G2261/314Condensed aromatic systems, e.g. perylene, anthracene or pyrene
    • C08G2261/3142Condensed aromatic systems, e.g. perylene, anthracene or pyrene fluorene-based, e.g. fluorene, indenofluorene, or spirobifluorene
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    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/30Monomer units or repeat units incorporating structural elements in the main chain
    • C08G2261/31Monomer units or repeat units incorporating structural elements in the main chain incorporating aromatic structural elements in the main chain
    • C08G2261/316Monomer units or repeat units incorporating structural elements in the main chain incorporating aromatic structural elements in the main chain bridged by heteroatoms, e.g. N, P, Si or B
    • C08G2261/3162Arylamines
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    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/30Monomer units or repeat units incorporating structural elements in the main chain
    • C08G2261/32Monomer units or repeat units incorporating structural elements in the main chain incorporating heteroaromatic structural elements in the main chain
    • C08G2261/322Monomer units or repeat units incorporating structural elements in the main chain incorporating heteroaromatic structural elements in the main chain non-condensed
    • C08G2261/3223Monomer units or repeat units incorporating structural elements in the main chain incorporating heteroaromatic structural elements in the main chain non-condensed containing one or more sulfur atoms as the only heteroatom, e.g. thiophene
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/90Applications
    • C08G2261/92TFT applications
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    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02112Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
    • H01L21/02172Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides
    • H01L21/02175Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides characterised by the metal
    • H01L21/02183Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides characterised by the metal the material containing tantalum, e.g. Ta2O5
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    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
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    • H01L21/02186Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides characterised by the metal the material containing titanium, e.g. TiO2
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    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
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    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
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    • H01L28/55Capacitors with a dielectric comprising a perovskite structure material
    • H01L28/56Capacitors with a dielectric comprising a perovskite structure material the dielectric comprising two or more layers, e.g. comprising buffer layers, seed layers, gradient layers
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    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
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    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
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    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
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    • H10K85/631Amine compounds having at least two aryl rest on at least one amine-nitrogen atom, e.g. triphenylamine

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Thin Film Transistor (AREA)
  • Formation Of Insulating Films (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Electrodes Of Semiconductors (AREA)
AT02779719T 2001-12-19 2002-11-21 Organischer feldeffekttransistor mit organischem dielektrikum ATE525757T1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB0130321A GB0130321D0 (en) 2001-12-19 2001-12-19 Electronic devices
GB0130451A GB0130451D0 (en) 2001-12-20 2001-12-20 Electronic devices
GB0220504A GB0220504D0 (en) 2002-09-03 2002-09-03 Electronic devices
PCT/GB2002/005248 WO2003052841A1 (en) 2001-12-19 2002-11-21 Organic field effect transistor with an organic dielectric

Publications (1)

Publication Number Publication Date
ATE525757T1 true ATE525757T1 (de) 2011-10-15

Family

ID=27256358

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02779719T ATE525757T1 (de) 2001-12-19 2002-11-21 Organischer feldeffekttransistor mit organischem dielektrikum

Country Status (9)

Country Link
US (1) US7029945B2 (de)
EP (3) EP2207217A1 (de)
JP (3) JP2005513788A (de)
KR (1) KR100949304B1 (de)
AT (1) ATE525757T1 (de)
AU (1) AU2002343058A1 (de)
CA (1) CA2469912A1 (de)
NO (1) NO20043049L (de)
WO (1) WO2003052841A1 (de)

Families Citing this family (175)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004241528A (ja) * 2003-02-05 2004-08-26 Ricoh Co Ltd 有機半導体装置及びそれを有する表示素子
US6950299B2 (en) 2003-02-13 2005-09-27 Plastic Logic Limited Non-linear capacitors
GB0303267D0 (en) * 2003-02-13 2003-03-19 Plastic Logic Ltd Non lineur capacitors
US7361926B2 (en) * 2003-06-27 2008-04-22 Tdk Corporation Field-effect transistor
KR100995451B1 (ko) * 2003-07-03 2010-11-18 삼성전자주식회사 다층 구조의 게이트 절연막을 포함하는 유기 박막 트랜지스터
JP4325479B2 (ja) * 2003-07-17 2009-09-02 セイコーエプソン株式会社 有機トランジスタの製造方法、アクティブマトリクス装置の製造方法、表示装置の製造方法および電子機器の製造方法
JP2005072569A (ja) * 2003-08-06 2005-03-17 Mitsubishi Chemicals Corp 有機電界効果トランジスタ
GB0318817D0 (en) * 2003-08-11 2003-09-10 Univ Cambridge Tech Method of making a polymer device
DE10340608A1 (de) * 2003-08-29 2005-03-24 Infineon Technologies Ag Polymerformulierung und Verfahren zur Herstellung einer Dielektrikumsschicht
JP2005079549A (ja) * 2003-09-03 2005-03-24 Victor Co Of Japan Ltd 有機薄膜トランジスタ
JP2005136383A (ja) * 2003-10-09 2005-05-26 Canon Inc 有機半導体素子、その製造方法および有機半導体装置
US8450723B2 (en) 2003-11-04 2013-05-28 Alcatel Lucent Apparatus having an aromatic dielectric and an aromatic organic semiconductor including an alkyl chain
US7842942B2 (en) 2003-11-28 2010-11-30 Merck Patent Gmbh Organic semiconducting layers
JP2005175386A (ja) * 2003-12-15 2005-06-30 Asahi Kasei Corp 有機半導体素子
JP2005191437A (ja) * 2003-12-26 2005-07-14 Ricoh Co Ltd 半導体装置、その製造方法、および表示装置
GB0400997D0 (en) 2004-01-16 2004-02-18 Univ Cambridge Tech N-channel transistor
US7256436B2 (en) 2004-03-30 2007-08-14 Shin-Etsu Chemical Co., Ltd. Thin-film field-effect transistors and making method
JP4449549B2 (ja) * 2004-04-15 2010-04-14 日本電気株式会社 有橋環式炭化水素ラクトン構造を有する材料を用いた有機薄膜トランジスタとその製造方法
US7372070B2 (en) * 2004-05-12 2008-05-13 Matsushita Electric Industrial Co., Ltd. Organic field effect transistor and method of manufacturing the same
KR100560796B1 (ko) * 2004-06-24 2006-03-13 삼성에스디아이 주식회사 유기 박막트랜지스터 및 그의 제조방법
KR100635567B1 (ko) * 2004-06-29 2006-10-17 삼성에스디아이 주식회사 박막트랜지스터 및 그 제조 방법
EP1648040B1 (de) * 2004-08-31 2016-06-01 Osaka University Chemischer Dünnschichttransistor und seine Herstellung
GB2418062A (en) 2004-09-03 2006-03-15 Seiko Epson Corp An organic Field-Effect Transistor with a charge transfer injection layer
WO2007050049A1 (en) * 2004-09-14 2007-05-03 Northwestern University Carbonyl-functionalized thiophene compounds and related device structures
JP4502382B2 (ja) * 2004-11-02 2010-07-14 キヤノン株式会社 有機トランジスタ
KR100669752B1 (ko) * 2004-11-10 2007-01-16 삼성에스디아이 주식회사 유기 박막 트랜지스터, 이의 제조 방법 및 이를 구비한평판표시장치
KR101122231B1 (ko) * 2004-12-17 2012-03-19 삼성전자주식회사 유기 반도체를 이용한 박막 트랜지스터 표시판 및 그 제조방법
KR101142998B1 (ko) 2004-12-20 2012-05-08 재단법인서울대학교산학협력재단 유기 절연막 및 유기 절연막을 포함하는 박막 트랜지스터표시판 및 그 제조 방법
EP1839339A2 (de) 2004-12-23 2007-10-03 Northwestern University Dielektrische siloxan-polymer-zusammensetzungen und verwandte organische feldeffekttransistoren
KR101086159B1 (ko) * 2005-01-07 2011-11-25 삼성전자주식회사 불소계 고분자 박막을 포함하는 유기 박막 트랜지스터
EP1854159A1 (de) 2005-02-18 2007-11-14 Koninklijke Philips Electronics N.V. Elektronische vorrichtung
JP2006229053A (ja) * 2005-02-18 2006-08-31 Ricoh Co Ltd 有機半導体層を有する電界効果型有機薄膜トランジスタ
US7619242B2 (en) * 2005-02-25 2009-11-17 Xerox Corporation Celluloses and devices thereof
JP4450214B2 (ja) * 2005-03-11 2010-04-14 セイコーエプソン株式会社 有機薄膜トランジスタ、電子デバイスおよび電子機器
JP4951868B2 (ja) * 2005-03-18 2012-06-13 凸版印刷株式会社 薄膜トランジスタの製造方法
ES2450169T3 (es) * 2005-03-23 2014-03-24 Turkiye Sise Ve Cam Fabrikalari A.S. Transistores orgánicos de efecto de campo basados en imida/diimida y un método de producción de estos
JP2006269599A (ja) * 2005-03-23 2006-10-05 Sony Corp パターン形成方法、有機電界効果型トランジスタの製造方法、及び、フレキシブルプリント回路板の製造方法
US20060214154A1 (en) * 2005-03-24 2006-09-28 Eastman Kodak Company Polymeric gate dielectrics for organic thin film transistors and methods of making the same
US20060231908A1 (en) * 2005-04-13 2006-10-19 Xerox Corporation Multilayer gate dielectric
US20060231829A1 (en) * 2005-04-13 2006-10-19 Xerox Corporation TFT gate dielectric with crosslinked polymer
EP1880429B1 (de) 2005-05-12 2012-06-27 Merck Patent GmbH Polyazen und halbleiterformulierung
TW200703664A (en) * 2005-05-31 2007-01-16 Nat University Iwate Univ Inc Organic thin film transistor
CN101223439B (zh) 2005-07-19 2012-01-18 皇家飞利浦电子股份有限公司 流体分析仪
KR101209046B1 (ko) * 2005-07-27 2012-12-06 삼성디스플레이 주식회사 박막트랜지스터 기판과 박막트랜지스터 기판의 제조방법
US7781757B2 (en) 2005-08-24 2010-08-24 Sanyo Electric Co., Ltd. Organic semiconductor material, organic semiconductor element and field effect transistor using the same
TWI261361B (en) * 2005-08-31 2006-09-01 Ind Tech Res Inst Organic thin-film transistor structure and method for fabricating the same is provided
WO2007029971A1 (en) * 2005-09-07 2007-03-15 Iferro Co., Ltd. Method of forming organic layer on semiconductor substrate
US7569415B2 (en) 2005-09-30 2009-08-04 Alcatel-Lucent Usa Inc. Liquid phase fabrication of active devices including organic semiconductors
US7488834B2 (en) 2005-09-30 2009-02-10 Alcatel-Lucent Usa Inc. Organic semiconductors
US20070075308A1 (en) 2005-09-30 2007-04-05 Florian Dotz Active semiconductor devices
CN100511751C (zh) * 2005-10-17 2009-07-08 中国科学院化学研究所 一种有机场效应晶体管及其制备方法
KR100708720B1 (ko) * 2005-10-19 2007-04-17 삼성에스디아이 주식회사 유기 박막 트랜지스터, 이의 제조 방법 및 이를 구비한평판 표시 장치
DE102005059608B4 (de) * 2005-12-12 2009-04-02 Polyic Gmbh & Co. Kg Organisches elektronisches Bauelement mit verbesserter Spannungsstabilität und Verfahren zur Herstellung dazu
KR101213871B1 (ko) * 2005-12-15 2012-12-18 엘지디스플레이 주식회사 박막 트랜지스터 어레이 기판 및 그 제조 방법
US7425723B2 (en) * 2005-12-21 2008-09-16 Xerox Corporation Organic thin-film transistors
US7514710B2 (en) * 2005-12-28 2009-04-07 3M Innovative Properties Company Bottom gate thin film transistors
DE102006055067B4 (de) 2005-12-29 2017-04-20 Lg Display Co., Ltd. Organische Dünnfilmtransistoren und Verfahren zu deren Herstellung
KR101225372B1 (ko) * 2005-12-29 2013-01-22 엘지디스플레이 주식회사 박막트랜지스터 및 그 제조방법과 그 박막트랜지스터를포함하는 평판 표시 장치
GB2449023B (en) 2006-01-21 2011-06-15 Merck Patent Gmbh Electronic short channel device comprising an organic semiconductor formulation
WO2007097165A1 (ja) * 2006-02-27 2007-08-30 Murata Manufacturing Co., Ltd. 電界効果トランジスタ
TW200737520A (en) * 2006-03-17 2007-10-01 Univ Nat Chiao Tung Gate dielectric structure and an organic thin film transistor based thereon
DE112007000699T5 (de) 2006-05-12 2009-06-04 Merck Patent Gmbh Auf Indenofluorenpolymeren basierende organische Halbleitermaterialien
JP2007311377A (ja) * 2006-05-16 2007-11-29 Sony Corp 薄膜トランジスタの製造方法および薄膜トランジスタならびに表示装置
JP2007318025A (ja) * 2006-05-29 2007-12-06 Dainippon Printing Co Ltd 有機半導体素子、および、有機半導体素子の製造方法
JP5256583B2 (ja) * 2006-05-29 2013-08-07 大日本印刷株式会社 有機半導体素子、および、有機半導体素子の製造方法
US7919825B2 (en) * 2006-06-02 2011-04-05 Air Products And Chemicals, Inc. Thin film transistors with poly(arylene ether) polymers as gate dielectrics and passivation layers
WO2008002660A2 (en) * 2006-06-28 2008-01-03 Northwestern University Crosslinked polymeric dielectric materials and methods of manufacturing and use thereof
US8308886B2 (en) 2006-07-17 2012-11-13 E I Du Pont De Nemours And Company Donor elements and processes for thermal transfer of nanoparticle layers
US7528448B2 (en) * 2006-07-17 2009-05-05 E.I. Du Pont De Nemours And Company Thin film transistor comprising novel conductor and dielectric compositions
US8062824B2 (en) 2006-07-17 2011-11-22 E. I. Du Pont De Nemours And Company Thermally imageable dielectric layers, thermal transfer donors and receivers
EP2044139B1 (de) 2006-07-21 2011-12-21 Merck Patent GmbH Indenofluoren- und thiophen-copolymere
US20080224127A1 (en) * 2006-08-22 2008-09-18 Marks Tobin J Gate dielectric structures, organic semiconductors, thin film transistors and related methods
KR100794720B1 (ko) 2006-08-28 2008-01-21 경희대학교 산학협력단 유기 박막 트랜지스터 표시판 및 그 제조 방법
WO2008065927A1 (fr) * 2006-11-27 2008-06-05 Zeon Corporation Transistor à film fin organique, élément électronique composite organique, procédé de fabrication d'un tel transistor et d'un tel élément, écran d'affichage et mémoire
ES2525040T3 (es) 2006-11-28 2014-12-16 Polyera Corporation Materiales dieléctricos basados en fotopolímero y métodos de preparación y uso de los mismos
EP1936712A1 (de) * 2006-12-23 2008-06-25 ETH Zürich Organische Feldeffekttransistoren mit polymerem Gate-Dielektrikum und Herstellungsverfahren dafür
TWI323034B (en) * 2006-12-25 2010-04-01 Ind Tech Res Inst Electronic devices with hybrid high-k dielectric and fabrication methods thereof
JP5234533B2 (ja) * 2007-03-26 2013-07-10 国立大学法人九州大学 有機半導体素子およびその製造方法
JP5657379B2 (ja) * 2007-04-25 2015-01-21 メルク パテント ゲゼルシャフト ミット ベシュレンクテル ハフツングMerck Patent Gesellschaft mit beschraenkter Haftung 電子装置の製造方法
GB0709093D0 (en) * 2007-05-11 2007-06-20 Plastic Logic Ltd Electronic device incorporating parylene within a dielectric bilayer
GB2450382B (en) * 2007-06-22 2009-09-09 Cambridge Display Tech Ltd Organic thin film transistors, organic light-emissive devices and organic light-emissive displays
WO2009013291A2 (en) * 2007-07-25 2009-01-29 Basf Se Field effect elements
FR2919521B1 (fr) * 2007-08-01 2012-03-09 Commissariat Energie Atomique Couche d'accroche sur des polymeres fluores
TWI345671B (en) * 2007-08-10 2011-07-21 Au Optronics Corp Thin film transistor, pixel structure and liquid crystal display panel
KR20090065254A (ko) * 2007-12-17 2009-06-22 한국전자통신연구원 광반응성 유기고분자 게이트 절연막 조성물 및 이를 이용한유기 박막 트랜지스터
US7994495B2 (en) * 2008-01-16 2011-08-09 Xerox Corporation Organic thin film transistors
JP2009224689A (ja) * 2008-03-18 2009-10-01 Sanyo Electric Co Ltd 有機トランジスタ及びその製造方法
PT103999B (pt) * 2008-03-20 2012-11-16 Univ Nova De Lisboa Processo de utilização e criação de papel à base de fibras celulósicas naturais, fibras sintéticas ou mistas como suporte físico e meio armazenador de cargas elétricas em transístores de efeito de campo com memória autossustentáveis usando óxidos sem
GB2458940B (en) 2008-04-03 2010-10-06 Cambridge Display Tech Ltd Organic thin film transistors
EP2269244B1 (de) * 2008-04-24 2015-05-27 Merck Patent GmbH Organischer Feldeffekttransistor mit oben liegendem Gate
FR2934714B1 (fr) * 2008-07-31 2010-12-17 Commissariat Energie Atomique Transistor organique et procede de fabrication d'une couche dielectrique d'un tel transistor.
GB2467316B (en) 2009-01-28 2014-04-09 Pragmatic Printing Ltd Electronic devices, circuits and their manufacture
WO2010020329A1 (en) 2008-08-18 2010-02-25 Merck Patent Gmbh, Indacenodithiophene and indacenodiselenophene polymers and their use as organic semiconductors
JP2010062276A (ja) * 2008-09-03 2010-03-18 Brother Ind Ltd 酸化物薄膜トランジスタ、及びその製造方法
KR20110076926A (ko) 2008-09-19 2011-07-06 메르크 파텐트 게엠베하 비스(티에노시클로펜타)벤조티아디아졸 유래 중합체 및 그의 유기 반도체로서의 용도
US8709290B2 (en) 2008-09-19 2014-04-29 Merck Patent Gesellschaft Mit Beschrankter Haftung Polymers derived from benzobis(silolothiophene) and their use as organic semiconductors
JP2010093093A (ja) * 2008-10-09 2010-04-22 Hitachi Ltd 半導体装置およびその製造方法
JP5449736B2 (ja) * 2008-10-09 2014-03-19 株式会社日立製作所 ボトムゲート型有機薄膜トランジスタ及びその製造方法
EP3456756A3 (de) 2008-10-31 2019-05-01 Basf Se Diketopyrrolopyrrolpolymere für organische feldeffekttransistoren
KR100975913B1 (ko) * 2008-10-31 2010-08-13 한국전자통신연구원 유기 박막 트랜지스터용 조성물, 이를 이용하여 형성된 유기 박막 트랜지스터 및 그 형성방법
JP2010163521A (ja) * 2009-01-14 2010-07-29 Sumitomo Chemical Co Ltd 絶縁層用樹脂組成物
FR2945669B1 (fr) * 2009-05-14 2011-12-30 Commissariat Energie Atomique Transistor organique a effet de champ
US8853820B2 (en) 2009-05-25 2014-10-07 Basf Se Crosslinkable dielectrics and methods of preparation and use thereof
KR101805203B1 (ko) 2009-05-27 2018-01-10 바스프 에스이 폴리시클릭 디티오펜
JP5675787B2 (ja) 2009-05-27 2015-02-25 ビーエーエスエフ ソシエタス・ヨーロピアBasf Se 有機半導体装置で使用するためのジケトピロロピロールポリマー
JP5458669B2 (ja) * 2009-05-28 2014-04-02 ソニー株式会社 薄膜トランジスタ、薄膜トランジスタの製造方法、表示装置、および電子機器
EP2277944A3 (de) * 2009-07-24 2012-01-04 Electronics and Telecommunications Research Institute Zusammensetzung für organische dielektrische Dünnfilme und organische Dünnfilmtransistoren damit
GB2474827A (en) * 2009-08-04 2011-05-04 Cambridge Display Tech Ltd Surface modification
GB2473200B (en) 2009-09-02 2014-03-05 Pragmatic Printing Ltd Structures comprising planar electronic devices
TWI384616B (zh) * 2009-09-11 2013-02-01 Univ Nat Cheng Kung 具備有機多介電層之記憶體元件
US8164089B2 (en) 2009-10-08 2012-04-24 Xerox Corporation Electronic device
EP2513952A1 (de) * 2009-12-17 2012-10-24 Merck Patent GmbH Abscheidung von nanopartikeln
US8212243B2 (en) * 2010-01-22 2012-07-03 Eastman Kodak Company Organic semiconducting compositions and N-type semiconductor devices
JP2011187626A (ja) * 2010-03-08 2011-09-22 Sony Corp 薄膜トランジスタおよび電子機器
JP5605610B2 (ja) * 2010-04-23 2014-10-15 セイコーエプソン株式会社 有機トランジスタの製造方法
KR101839636B1 (ko) 2010-05-19 2018-03-16 바스프 에스이 유기 반도체 소자에 사용하기 위한 디케토피롤로피롤 중합체
JP5659568B2 (ja) * 2010-06-11 2015-01-28 富士ゼロックス株式会社 電界効果型有機トランジスタ
TW201213345A (en) * 2010-06-17 2012-04-01 Sumitomo Chemical Co Optical-energy crosslinkable organic thin film transistor insulation layer material, overcoat insulation layer and organic thin film transistor
KR20130094773A (ko) 2010-06-24 2013-08-26 바스프 에스이 온/오프 전류비가 개선되고 임계 이동이 제어가능한 유기 전계 효과 트랜지스터
US20130112964A1 (en) 2010-07-30 2013-05-09 Basf Se Amphiphilic protein in printed electronics
WO2012017005A2 (en) 2010-08-05 2012-02-09 Basf Se Polymers based on benzodiones
GB201013820D0 (en) * 2010-08-18 2010-09-29 Cambridge Display Tech Ltd Low contact resistance organic thin film transistors
WO2012029700A1 (ja) * 2010-08-30 2012-03-08 住友化学株式会社 有機薄膜トランジスタ絶縁層用組成物及び有機薄膜トランジスタ
CN105038069B (zh) 2010-09-02 2017-10-17 默克专利股份有限公司 用于电子器件的栅绝缘层
CN103097420B (zh) 2010-09-02 2016-06-22 默克专利股份有限公司 用于电子器件的夹层
JP5913107B2 (ja) * 2010-09-07 2016-04-27 日本化薬株式会社 有機半導体材料、有機半導体組成物、有機薄膜及び電界効果トランジスタ並びにその製造方法
US9368737B2 (en) * 2010-10-07 2016-06-14 Georgia Tech Research Corporation Multi-layer gate dielectric field-effect transistor and manufacturing process thereof
GB201105482D0 (en) 2011-03-31 2011-05-18 Imp Innovations Ltd Polymers
GB201108865D0 (en) 2011-05-26 2011-07-06 Ct For Process Innovation The Ltd Semiconductor compounds
GB201108864D0 (en) 2011-05-26 2011-07-06 Ct For Process Innovation The Ltd Transistors and methods of making them
EP2740167B1 (de) 2011-08-03 2018-12-26 Universita' Degli Studi Di Cagliari Herstellungsmethode eines organischen niederspannungstransistors
FR2980041B1 (fr) * 2011-09-14 2016-02-05 Commissariat Energie Atomique Transistor a effet de champ comprenant un limiteur de courant de fuite
FR2980040B1 (fr) * 2011-09-14 2016-02-05 Commissariat Energie Atomique Transistor organique a effet de champ
EP2764034B1 (de) 2011-10-04 2023-08-30 CLAP Co., Ltd. Auf benzodionen basierende polymere
KR20140101788A (ko) 2011-11-15 2014-08-20 바스프 에스이 유기 반도체 소자 및 이의 제조 방법
CN103975453B (zh) 2011-12-07 2018-01-30 巴斯夫欧洲公司 有机场效应晶体管
KR102017358B1 (ko) 2011-12-07 2019-09-26 바스프 에스이 유기 반도체 장치에 사용하기 위한 디케토피롤로피롤 중합체
PL397479A1 (pl) 2011-12-21 2013-06-24 Instytut Chemii Organicznej Polskiej Akademii Nauk Nowe, fluorescencyjne barwniki heterocykliczne i sposób ich otrzymywania
KR102030867B1 (ko) 2012-04-02 2019-10-10 바스프 에스이 전자 응용을 위한 페난트로[9,10-b]푸란 중합체 및 소분자
CN103367458B (zh) * 2012-04-03 2017-03-01 元太科技工业股份有限公司 薄膜晶体管及其制造方法
TWI500162B (zh) * 2012-04-03 2015-09-11 E Ink Holdings Inc 薄膜電晶體及其製造方法
EP2834286B1 (de) 2012-04-04 2019-01-23 Basf Se Diketopyrroloypyrrolpolymere und kleine moleküle
JP6262204B2 (ja) 2012-04-25 2018-01-17 メルク パテント ゲーエムベーハー 有機電子デバイス用バンク構造
EP2873300B1 (de) 2012-07-13 2019-05-01 Merck Patent GmbH Organische elektronische vorrichtung mit einem organischen halbleitermaterial
KR20150036641A (ko) 2012-07-23 2015-04-07 바스프 에스이 전자 응용을 위한 디티에노벤조푸란 중합체 및 소분자
KR20210041125A (ko) 2012-08-09 2021-04-14 메르크 파텐트 게엠베하 유기 반도성 제제
SG11201501508UA (en) * 2012-08-31 2015-04-29 Asahi Glass Co Ltd Curable composition and method for producing cured film
JP6036064B2 (ja) * 2012-09-13 2016-11-30 富士ゼロックス株式会社 有機半導体トランジスタ
WO2014044359A1 (en) 2012-09-21 2014-03-27 Merck Patent Gmbh Organic semiconductor formulations
WO2014053202A1 (en) 2012-10-04 2014-04-10 Merck Patent Gmbh Passivation layers for organic electronic devices
US9748487B2 (en) 2012-11-07 2017-08-29 Basf Se Polymers based on naphthodiones
WO2014086722A1 (en) 2012-12-04 2014-06-12 Basf Se Functionnalized benzodithiophene polymers for electronic application
KR102173448B1 (ko) 2013-05-06 2020-11-04 주식회사 클랩 유기 전자 응용품 내의 유전체로서의 가용성 시클릭 이미드 함유 중합체
JP6191235B2 (ja) * 2013-05-20 2017-09-06 富士電機株式会社 有機トランジスタ及びその製造方法
EP3013906B1 (de) 2013-06-24 2020-03-25 Basf Se Polymere auf der basis von geschmolzenen diketopyrrolopyrrolen
EP2818493A1 (de) 2013-06-25 2014-12-31 Basf Se Im Nahinfrarot absorbierende Polymere für elektronische Anwendungen
US9541829B2 (en) 2013-07-24 2017-01-10 Orthogonal, Inc. Cross-linkable fluorinated photopolymer
CN105706220B (zh) * 2013-11-21 2018-09-18 株式会社尼康 晶体管的制造方法和晶体管
US9330809B2 (en) 2013-12-17 2016-05-03 Dow Global Technologies Llc Electrically conducting composites, methods of manufacture thereof and articles comprising the same
US9336921B2 (en) 2013-12-17 2016-05-10 Dow Global Technologies Llc Electrically conducting composites, methods of manufacture thereof and articles comprising the same
WO2015120025A1 (en) 2014-02-07 2015-08-13 Orthogonal, Inc. Cross-linkable fluorinated photopolymer
GB2534600A (en) * 2015-01-29 2016-08-03 Cambridge Display Tech Ltd Organic thin film transistors
TWI762454B (zh) 2015-10-21 2022-05-01 南韓商Clap股份有限公司 基於二吡咯[1,2-b:1’,2’-g][2,6]啶-5,11-二酮之聚合物及化合物
CN105404046B (zh) * 2015-12-04 2018-06-01 深圳市华星光电技术有限公司 量子点彩膜基板的制作方法
DE102016104254A1 (de) * 2016-03-09 2017-10-26 Friedrich-Schiller-Universität Jena Verfahren zur Herstellung einer halbleitenden Folie und elektronisches Bauelement
WO2017202635A1 (en) 2016-05-25 2017-11-30 Basf Se Semiconductors
TW201832012A (zh) * 2017-01-20 2018-09-01 日商富士軟片股份有限公司 保護層形成用組成物、積層體及套組
GB201810710D0 (en) * 2018-06-29 2018-08-15 Smartkem Ltd Sputter Protective Layer For Organic Electronic Devices
CN109088000B (zh) * 2018-08-22 2022-04-12 宁波石墨烯创新中心有限公司 一种有机薄膜晶体管及其制备方法
DE102019200810B4 (de) * 2019-01-23 2023-12-07 Technische Universität Dresden Organischer dünnschicht-transistor und verfahren zur herstellung desselben
WO2020260393A1 (en) * 2019-06-24 2020-12-30 Flexenable Limited Modification of stress response and adhesion behavior of dielectric through tuning of mechanical properties
GB201919031D0 (en) 2019-12-20 2020-02-05 Smartkem Ltd Sputter protective layer for organic electronic devices
US20220223808A1 (en) * 2020-06-03 2022-07-14 Purdue Research Foundation Polyimide-based transistor devices and methods of fabricating the same
CN113299831B (zh) * 2021-05-21 2023-03-24 西安电子科技大学 基于三层绝缘介质的低功耗柔性薄膜晶体管及其制作方法
CN113410385A (zh) * 2021-06-15 2021-09-17 南方科技大学 一种低压浮栅光电存储器及制备方法

Family Cites Families (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4565860A (en) 1984-04-09 1986-01-21 Nissan Motor Co., Ltd. Polymer of triphenylamine
EP0237017B1 (de) * 1986-03-11 1995-09-06 Kanegafuchi Kagaku Kogyo Kabushiki Kaisha Elektrische oder elektronische Anordnung mit einer dünnen Schicht aus Polyimid
DE3610649A1 (de) 1986-03-29 1987-10-01 Basf Ag Polymere mit triphenylamineinheiten
JP2651691B2 (ja) * 1988-03-03 1997-09-10 バンドー化学株式会社 新規な芳香族アミン化合物
JP2533943B2 (ja) 1989-08-01 1996-09-11 キヤノン株式会社 電子写真感光体の製造法
FR2664430B1 (fr) 1990-07-04 1992-09-18 Centre Nat Rech Scient Transistor a effet de champ en couche mince de structure mis, dont l'isolant et le semiconducteur sont realises en materiaux organiques.
US5556706A (en) 1993-10-06 1996-09-17 Matsushita Electric Industrial Co., Ltd. Conductive layered product and method of manufacturing the same
JPH07221367A (ja) 1994-01-31 1995-08-18 Matsushita Electric Ind Co Ltd 配向積層膜とその製造方法及びそれを用いた有機電子素子とその製造方法
GB9403503D0 (en) 1994-02-24 1994-04-13 Inmos Ltd Memory cell
JP2725591B2 (ja) * 1994-03-10 1998-03-11 日本電気株式会社 電界効果型トランジスタ
US5681664A (en) 1994-08-04 1997-10-28 Toyo Ink Manufacturing Co., Ltd. Hole-transporting material and use thereof
US5677096A (en) 1995-09-19 1997-10-14 Ricoh Company, Ltd. Electrophotographic photoconductor
EP0765106B1 (de) 1995-09-25 2002-11-27 Toyo Ink Manufacturing Co., Ltd. Leuchtemittierender Stoff für organische Elektrolumineszensvorrichtung, und organische Elektrolumineszensvorrichtung mit diesem leuchtemittierendem dafür geeignetem Stoff
US6326640B1 (en) 1996-01-29 2001-12-04 Motorola, Inc. Organic thin film transistor with enhanced carrier mobility
WO1997033193A2 (en) 1996-02-23 1997-09-12 The Dow Chemical Company Cross-linkable or chain extendable polyarylpolyamines and films thereof
DE19712233C2 (de) 1996-03-26 2003-12-11 Lg Philips Lcd Co Flüssigkristallanzeige und Herstellungsverfahren dafür
US5612228A (en) 1996-04-24 1997-03-18 Motorola Method of making CMOS with organic and inorganic semiconducting region
US6188452B1 (en) 1996-07-09 2001-02-13 Lg Electronics, Inc Active matrix liquid crystal display and method of manufacturing same
US5728801A (en) 1996-08-13 1998-03-17 The Dow Chemical Company Poly (arylamines) and films thereof
US5981970A (en) 1997-03-25 1999-11-09 International Business Machines Corporation Thin-film field-effect transistor with organic semiconductor requiring low operating voltages
JPH10335671A (ja) * 1997-06-02 1998-12-18 Sharp Corp ドライバーモノリシック駆動素子
US5879821A (en) 1997-11-13 1999-03-09 Xerox Corporation Electroluminescent polymer compositions and processes thereof
WO2000078843A1 (en) 1997-12-19 2000-12-28 Avecia Limited Process for the isolation of polymer fractions
GB9726810D0 (en) 1997-12-19 1998-02-18 Zeneca Ltd Compounds composition & use
CN1167146C (zh) 1999-01-15 2004-09-15 陶氏环球技术公司 高分子半导体场效应晶体管
US6207472B1 (en) 1999-03-09 2001-03-27 International Business Machines Corporation Low temperature thin film transistor fabrication
JP2000275678A (ja) * 1999-03-26 2000-10-06 Matsushita Electric Ind Co Ltd 薄膜半導体装置およびその製造方法
EP1192676A1 (de) * 1999-06-21 2002-04-03 Cambridge University Technical Services Limited Organische polymere für einen organischen tft
DE60033012T2 (de) 1999-09-10 2007-09-13 Koninklijke Philips Electronics N.V. Leitende struktur basierend auf poly-3,4-alkendioxythiophen (pedot) und polystyrolsulfonsäure (pss)
JP2001094107A (ja) * 1999-09-20 2001-04-06 Hitachi Ltd 有機半導体装置及び液晶表示装置
CN100483774C (zh) 1999-12-21 2009-04-29 造型逻辑有限公司 半导体器件及其形成方法
GB0028867D0 (en) * 2000-11-28 2001-01-10 Avecia Ltd Field effect translators,methods for the manufacture thereof and materials therefor
EP1438757A2 (de) 2001-10-01 2004-07-21 Koninklijke Philips Electronics N.V. Zusammensetzung, verfahren und elektronische einrichtung
DE10151036A1 (de) 2001-10-16 2003-05-08 Siemens Ag Isolator für ein organisches Elektronikbauteil
US6946676B2 (en) * 2001-11-05 2005-09-20 3M Innovative Properties Company Organic thin film transistor with polymeric interface
CN1157807C (zh) * 2001-11-09 2004-07-14 清华大学 一种有机薄膜场效应晶体管及其制备方法
US6912473B2 (en) * 2002-06-28 2005-06-28 International Business Machines Corporation Method for verifying cross-sections

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CA2469912A1 (en) 2003-06-26
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NO20043049L (no) 2004-07-15
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EP2204861A1 (de) 2010-07-07
EP1459392A1 (de) 2004-09-22
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