WO2010092714A1 - Tftアレイ基板、及び、液晶表示パネル - Google Patents
Tftアレイ基板、及び、液晶表示パネル Download PDFInfo
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- WO2010092714A1 WO2010092714A1 PCT/JP2009/068905 JP2009068905W WO2010092714A1 WO 2010092714 A1 WO2010092714 A1 WO 2010092714A1 JP 2009068905 W JP2009068905 W JP 2009068905W WO 2010092714 A1 WO2010092714 A1 WO 2010092714A1
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- wiring
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- branch
- array substrate
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
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- G02F1/1362—Active matrix addressed cells
- G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1222—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
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- G—PHYSICS
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- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1345—Conductors connecting electrodes to cell terminals
- G02F1/13454—Drivers integrated on the active matrix substrate
Definitions
- the present invention relates to a TFT array substrate in which a TFT element is provided on an insulating substrate, and a liquid crystal display panel using the TFT array substrate.
- TFT array substrate in which a TFT (Thin Film Transistor) element is formed on an insulating substrate has been widely used in display devices such as liquid crystal display panels and sensor devices.
- a wiring is connected to each electrode of the TFT element.
- a gate bus line as a wiring is connected to the gate electrode of the TFT element, and a source bus line as a wiring is connected to the source electrode.
- a pixel electrode is connected to the drain electrode.
- the gate bus line and the source bus line are provided in directions orthogonal to each other on the insulating substrate.
- the gate bus line and the source bus line are provided in different layers on the insulating substrate via the insulating layer so that they are not electrically connected to each other at the orthogonal portion.
- FIG. 12 is a plan view showing a schematic configuration of the TFT array substrate 20.
- a display region 22 is provided at the center of the TFT array substrate 20 in plan view.
- TFT elements and pixel electrodes connected to the TFT elements are arranged in a matrix.
- the region around the display region 22, and the region near the substrate edge 26 of the TFT array substrate 20 is the peripheral region 24.
- a drive circuit 60 and the like are provided in the peripheral area 24.
- FIG. 12 illustrates a configuration in which the drive circuit 60 is provided in the peripheral region 24 located in the left-right direction of the display region 22 (the arrow X direction shown in FIG. 12).
- the drive circuit 60 is connected to a TFT element (not shown) or the like in the display region 22 by a gate bus line 42 or the like.
- a driver 62 is provided on one side of the peripheral area 24 positioned in the vertical direction of the display area 22 (Y direction shown in FIG. 12).
- the driver 62 and the drive circuit 60 are connected by a gate drive circuit signal wiring 46 such as a clock wiring.
- the driver 62 is connected to a TFT element (not shown) or the like in the display area 22 by a source bus line 44 or the like.
- the TFT array substrate 20 and a counter substrate are bonded together via a seal 90 to constitute the liquid crystal display panel 10.
- the seal 90 is provided in a frame shape on the inner side along the substrate edge 26 of the TFT array substrate 20.
- peripheral region 24 (Peripheral area) Next, the peripheral region 24 will be specifically described with reference to FIG.
- FIG. 13 is a plan view showing a schematic configuration of the peripheral region 24.
- the peripheral region 24 is provided with various wirings connected to the driver 62 in addition to the drive circuit 60.
- This wiring is provided between the drive circuit 60 and the substrate edge 26 of the insulating substrate 16.
- FIG. 13 illustrates the TFT array substrate 20 provided with the low-potential-side power supply wiring 70, the clock wiring 72, and the branch wiring 74 as the wiring.
- the low-potential-side power supply wiring 70 and the clock wiring 72 extend in the vertical direction (Y direction), and the branch wiring 74 extends in the horizontal direction (X direction).
- the low-potential-side power supply wiring 70 and the clock wiring 72 and the drive circuit 60 are electrically connected by the branch wiring 74.
- the low-potential side power supply wiring 70 and the clock wiring 72 that are wiring extending in the Y direction and the branch wiring 74 that is wiring extending in the X direction are provided in different layers on the insulating substrate. Each wiring is made of a different metal material.
- FIG. 14 is a cross-sectional view showing a schematic configuration of the TFT array substrate 20.
- a first metal material M1 for forming the gate bus line 42, a first insulating material I1 for forming a gate insulating film 50, and the source bus line 44 are formed on the insulating substrate 16.
- the second metal material M2 for forming the second insulating material I2, the second insulating material I2 for forming the interlayer insulating film 52, and the third metal material M3 for forming the pixel electrode 48 are laminated in this order.
- the low-potential side power supply wiring 70 and the clock wiring 72 are made of the first metal material M1, and the branch wiring 74 is made of the second metal material M2.
- connection part 80 of FIG. 13 in order to electrically connect the wiring extending in the X direction and the wiring extending in the Y direction, it is necessary to provide a contact hole.
- Patent Document 1 Conventionally, as a configuration of this contact hole, for example, there is a configuration described in Patent Document 1.
- FIG. 15 is a view showing an amorphous silicon thin film transistor liquid crystal display panel described in Patent Document 1.
- FIG. 15 is a view showing an amorphous silicon thin film transistor liquid crystal display panel described in Patent Document 1.
- the main wiring 150 and the gate electrode 160 are electrically connected through the contact hole 100 provided in the connection portion 80.
- the configuration of the conventional contact hole 100 has a problem that the display quality of the liquid crystal display panel 10 is degraded. This will be described below.
- FIG. 16 is a diagram showing a schematic configuration of a conventional connection portion 80.
- FIG. 17 is a cross-sectional view taken along the line CC of FIG.
- the conventional contact hole 100 protrudes from the clock wiring 72 in plan view. That is, the conventional contact hole 100 has a protruding portion 104.
- the contact hole 100 connects the clock wiring 72 and the branch wiring 74.
- the clock wiring 72 is formed of the first metal material M1 of the gate bus line 42 layer.
- the branch wiring 74 is formed of the second metal material M2 of the source bus line 44 layer. Therefore, the clock wiring 72 and the branch wiring 74 are provided in different layers on the insulating substrate 16.
- connection conductor 102 provided in the contact hole 100 is connected to the clock wiring 72 and the branch wiring 74.
- the clock wiring 72 and the branch wiring 74 do not overlap in plan view. Therefore, the connection conductor 102 is provided so that the clock wiring 72 and the branch wiring 74 can be connected in a plan view.
- connection conductor 102 and the clock wiring 72 are electrically connected via the trunk wiring via 110 at a portion where the connection conductor 102 and the clock wiring 72 overlap in plan view.
- the connection conductor 102 and the branch wiring 74 are electrically connected via the branch wiring via 112 at a portion where the connection conductor 102 and the branch wiring 74 overlap in plan view.
- connection conductor 102 is formed of the third metal material M3.
- the third metal material M3 is a material for forming the pixel electrode.
- the gate insulating film 50 and the interlayer insulating film 52 are interposed between the clock wiring 72 and the connection conductor 102. Therefore, the trunk wiring via 110 penetrates the gate insulating film 50 and the interlayer insulating film 52 to connect the clock wiring 72 and the connection conductor 102.
- an interlayer insulating film 52 is interposed between the branch wiring 74 and the connection conductor 102 in the vicinity of the branch wiring via 112. Therefore, the branch wiring via 112 penetrates the interlayer insulating film 52 to connect the branch wiring 74 and the connection conductor 102.
- trunk wiring via 110 and the branch wiring via 112 are connected by the connection conductor 102.
- the clock wiring 72 and the branch wiring 74 do not overlap in plan view. That is, the extension of the branch wiring 74 stops before the clock wiring 72. Therefore, the connecting conductor 102 is provided with a protruding portion 104.
- the protruding portion 104 is a portion of the connection conductor 102 that protrudes from the clock wiring 72 in plan view.
- the seal 90 is provided in the peripheral region 24 of the TFT array substrate 20 along the substrate edge 26 as shown in FIG. As shown in FIG. 16, the seal 90 covers a part of the low potential side power supply wiring 70, the clock wiring 72, and the drive circuit 60. That is, the seal 90 is provided so as to overlap the wiring extending in the X direction and the wiring extending in the Y direction in plan view.
- the contact hole 100 is located under the seal 90.
- Cell thickness In the conventional liquid crystal display panel 10, the cell thickness tends to be non-uniform in the vicinity where the seal 90 is provided.
- the non-uniformity of the cell thickness is due to a step in the contact hole 100 and non-uniformity in the width and density of the wiring provided under the seal 90.
- the cell thickness is likely to be uneven.
- This nonuniformity of the cell thickness is due to a region where the contact hole 100 is provided and a region where the contact hole 100 is not provided when viewed in a direction extending in the Y direction. That is, the thickness of the seal 90 is not uniform in these two regions. This is because, in addition to the two recesses in the trunk wiring via 110 and the branch wiring via 112, the recesses are easily formed in the Y direction around the contact hole 100. And the Y direction recessed part around this contact hole 100 tends to cause nonuniformity of cell thickness.
- the cell thickness is likely to be non-uniform due to the non-uniform pattern arrangement and the wiring density in the peripheral region of the contact hole 100.
- the protruding portion when a photocurable resin or the like is provided in the peripheral region, the protruding portion is obstructed, and the resin is uniformly irradiated with light. Becomes difficult. This means that the resin cannot be cured sufficiently, and the sealing material oozes out to the liquid crystal layer, which tends to cause deterioration in display quality.
- the present invention has been made to solve the above-described problems, and an object of the present invention is to provide a TFT array substrate and a liquid crystal display panel that can suppress a reduction in display quality due to non-uniform cell thickness. It is in.
- a TFT array substrate of the present invention is a TFT array substrate in which TFT elements and pixel electrodes connected to the TFT elements are provided in a matrix on an insulating substrate, A gate bus line connected to the TFT element is formed of a first metal material on an insulating substrate, and a source bus line connected to the TFT element is formed of a second metal material on the insulating substrate.
- the pixel electrode is formed of a third metal material, and in the insulating substrate, a region in which the pixel electrodes are arranged in a matrix is a display region, and a region around the display region is a peripheral region. In the peripheral region, a driving circuit for driving the TFT element is provided.
- a branch wiring connected to the driving circuit and a branch wiring are connected.
- a trunk wiring that is connected, and the branch wiring is formed of one of the first metal material and the second metal material, and the trunk wiring includes the first metal material and the first metal material.
- the second metal material is formed of a metal material different from the branch wiring, and a connection portion for electrically connecting the trunk wiring and the branch wiring is provided in the peripheral region.
- the main wiring and the branch wiring are connected by a connection conductor, the connection conductor is formed of the third metal material, and the connection conductor is connected to the connection portion.
- a branch wiring via that exposes the branch wiring is provided, and at least one part of the branch wiring via overlaps the trunk wiring in plan view in at least one of the connection portions.
- the TFT array substrate of the present invention is a TFT array substrate in which TFT elements and pixel electrodes connected to the TFT elements are provided in a matrix on an insulating substrate.
- the gate bus line connected to the TFT element is formed of a first metal material on the insulating substrate
- the source bus line connected to the TFT element is formed of a second metal material on the insulating substrate.
- the pixel electrode is formed of a third metal material.
- a region where the pixel electrodes are arranged in a matrix is a display region, and a region around the display region is
- the peripheral region is provided with a peripheral TFT element for driving the TFT element, and the peripheral region has a branch arrangement connected to the peripheral TFT element.
- a trunk wiring connected to the branch wiring is formed of either the first metal material or the second metal material, and the trunk wiring is The first metal material and the second metal material are made of a metal material different from the branch wiring, and the trunk wiring and the branch wiring are electrically connected to the peripheral region.
- a connecting portion is provided, and in the connecting portion, the trunk wiring and the branch wiring are connected by a connecting conductor, and the connecting conductor is formed of the third metal material, and the connecting portion is connected to the connecting portion. Is provided with a branch wiring via that exposes the branch wiring through the connection conductor, and at least one part of the branch wiring via is at least one of the trunk wirings in plan view in the connection portion. It is special that it overlaps with To.
- connection portion at least a part of the branch wiring via overlaps the trunk wiring in a plan view. Therefore, the protruding portion is not easily formed in the connection conductor, and unevenness of the thickness of the wiring layer in the extending direction of the main wiring is suppressed.
- the gate bus line connected to the TFT element is formed of the first metal material on the insulating substrate, and is connected to the TFT element on the insulating substrate.
- the source bus line is formed of a second metal material
- the pixel electrode is formed of a third metal material
- the region where the pixel electrodes are arranged in a matrix in the insulating substrate is a display region.
- the peripheral region of the display region is a peripheral region, and the peripheral region is provided with a drive circuit / peripheral TFT element for driving the TFT element, and the peripheral region includes the drive circuit / A branch wiring connected to the peripheral TFT element and a trunk wiring connected to the branch wiring are provided, and the branch wiring is formed of either the first metal material or the second metal material.
- the trunk wiring is formed of a metal material different from the branch wiring of the first metal material and the second metal material, and the trunk wiring and the branch wiring are formed in the peripheral region. Are connected to each other, and the main wiring and the branch wiring are connected by a connection conductor in the connection portion, and the connection conductor is formed of the third metal material.
- the connection portion is provided with a branch wiring via that exposes the branch wiring through the connection conductor. At least one part of the branch wiring via is at least one of the connection portions. In the plan view, it overlaps with the trunk wiring.
- FIG. 1 showing an embodiment of the present invention, is a diagram showing a schematic configuration of a TFT array substrate.
- FIG. FIG. 2 is a view corresponding to a cross section taken along line AA in FIG. 1.
- Another embodiment of the present invention is shown and is a diagram showing a schematic configuration of a TFT array substrate.
- FIG. FIG. 4 is a view corresponding to a cross section taken along line BB in FIG. 3.
- Another embodiment of the present invention is shown and is a diagram showing a schematic configuration of a TFT array substrate.
- FIG. Another embodiment of the present invention is shown and is a diagram showing a schematic configuration of a TFT array substrate.
- FIG. Another embodiment of the present invention is shown and is a diagram showing a schematic configuration of a TFT array substrate.
- FIG. Another embodiment of the present invention is shown and is a diagram showing a schematic configuration of a TFT array substrate.
- FIG. Another embodiment of the present invention is shown and is a diagram showing a schematic configuration of a T
- FIG. 1 Another embodiment of the present invention is shown and is a diagram showing a schematic configuration of a TFT array substrate.
- FIG. Another embodiment of the present invention is shown and is a diagram showing a schematic configuration of a TFT array substrate.
- FIG. Another embodiment of the present invention is shown and is a diagram showing a schematic configuration of a TFT array substrate.
- FIG. Another embodiment of the present invention is shown and is a diagram showing a schematic configuration of a TFT array substrate.
- FIG. It is a top view which shows schematic structure of a TFT array substrate. It is a top view which shows schematic structure of the peripheral region of a TFT array substrate. It is sectional drawing which shows schematic structure of a TFT array substrate. It is a figure which shows the amorphous silicon thin-film transistor liquid crystal display panel of patent document 1.
- FIG. It is a figure which shows a prior art and shows schematic structure of a connection part. It is CC sectional view taken on the line of FIG.
- FIG. 1 is a diagram showing a schematic configuration of a TFT array substrate 20 of the present embodiment.
- the TFT array substrate 20 of the present embodiment has a schematic configuration substantially the same as the TFT array substrate 20 described above with reference to FIG.
- various wirings (wiring layers) and driving circuits are provided in the peripheral region 24 of the TFT array substrate 20.
- a low-potential-side power supply wiring 70 (scanning line driving circuit signal wiring) as a main wiring and a clock wiring 72 (main wiring) ( Scanning line driving circuit signal wiring).
- a low potential side power supply wiring 70 and then three clock wirings 72 are provided from the substrate edge 26 toward the display area 22.
- a drive circuit 60 such as a gate drive circuit is provided on the display area 22 side of various wirings.
- the display region 22 is a region in which TFT elements (not shown) and pixel electrodes (not shown) connected to the TFT elements are arranged in a matrix.
- a branch wiring 74 for connecting various wirings to the drive circuit 60 is provided.
- the branch wiring 74 is provided along the X direction.
- a contact hole 100 is provided in a connecting portion 80 between the branch wiring 74 and the low-potential side power supply wiring 70 and the clock wiring 72.
- connection portion 80 between the clock wiring 72 and the branch wiring 74 will be described as an example.
- connection portion 80 the clock wiring 72 and the branch wiring 74 are electrically connected through the contact hole 100.
- FIG. 2 is a cross-sectional view taken along line AA in FIG.
- the contact hole 100 is provided with two vias, a trunk wiring via 110 and a branch wiring via 112.
- the connection conductor 102 and the clock wiring 72 are connected in the trunk wiring via 110.
- the clock wiring 72 as the trunk wiring is exposed through the connection conductor 102.
- connection conductor 102 and the branch wiring 74 are connected. In other words, in the branch wiring via 112, the branch wiring 74 is exposed through the connection conductor 102.
- the clock wiring 72 is formed of the first metal material M1 that forms the gate bus line 42.
- the branch wiring 74 is formed of the second metal material M2 that forms the source bus line 44.
- the connection conductor 102 is made of the third metal material M3 that forms the pixel electrode 48.
- Each metal material is laminated on the insulating substrate 16 made of glass in the order of the first metal material M1, the second metal material M2, and the third metal material M3.
- a gate insulating film 50 made of the first insulating material I1 is provided between the first metal material M1 and the second metal material M2.
- An interlayer insulating film 52 made of the second insulating material I2 is provided between the second metal material M2 and the third metal material M3.
- the first metal material M1 and the second metal material M2 are not particularly limited. For example, aluminum, molybdenum, tantalum, or the like can be used.
- the third metal material M3 can be made of, for example, ITO (Indium Tin Oxide) or the like.
- connection conductor 102 penetrates the gate insulating film 50 and the interlayer insulating film 52 and is connected to the clock wiring 72.
- connection conductor 102 penetrates the interlayer insulating film 52 and is connected to the branch wiring 74.
- the clock wiring 72 and the branch wiring 74 overlap each other at the connection portion 80 in plan view.
- connection conductor 102 does not have a portion where neither the clock wiring 72 nor the branch wiring 74 is provided in the lower layer. In other words, either the clock wiring 72 or the branch wiring 74 is provided below the connection conductor 102.
- the lower layer means a layer between the connection conductor 102 and the insulating substrate 16.
- the connecting conductor 102 has no protruding portion which is a portion that does not overlap with any wiring connected by the connecting conductor 102 in plan view.
- the connection conductor 102 is provided only in the upper layer region of the wiring connected by the connection conductor 102 in the connection portion 80.
- connection conductor 102 overlaps the clock wiring 72 in plan view.
- the end sides of the connection conductor 102 and the end sides of the clock wiring 72 are aligned. Therefore, the connection conductor 102 does not have a portion protruding from the clock wiring 72 in plan view.
- connection conductor 102 of the present embodiment is provided at a position closer to the insulating substrate 16, in other words, a wiring provided in a lower layer of the two wirings connected to the connection conductor 102. It overlaps with the clock wiring 72, which is the other wiring, in a plan view without protruding.
- the branch wiring 74 connected to the clock wiring 72 is extended to a position overlapping with the clock wiring 72 in plan view.
- both the trunk wiring via 110 and the branch wiring via 112 can be provided at positions on the clock wiring 72 in plan view.
- the connection conductor 102 that covers the trunk wiring via 110 and the branch wiring via 112 and connects the trunk wiring via 110 and the branch wiring via 112 to each other can be provided so as not to protrude from the clock wiring 72 in plan view.
- connection conductor 102 is provided so as not to protrude from the clock wiring 72 in a plan view, it is possible to suppress uneven cell thickness.
- connection conductor 102 since the same conductor is provided on the entire lower surface of the connection conductor 102, the uneven shape of the connection conductor 102 is easily stabilized.
- connection conductor 102 the conductor provided on the entire lower surface of the connection conductor 102 is the clock wiring 72 provided on the insulating substrate 16. Therefore, the uneven shape of the connection conductor 102 is more stable.
- the protruding portion 104 is not provided in the connection conductor 102, the wiring density under the seal 90 is made more uniform when the contact hole is arranged on the signal wiring for the scanning line driving circuit. It becomes easy to make.
- the nonuniformity of the cell thickness is suppressed, in the TFT array substrate 20 of the present embodiment, the deterioration of display quality is suppressed.
- the effect of suppressing the deterioration of display quality due to the non-uniformity of the wiring under the seal 90 is particularly effective in the case where a planarizing film such as an organic film is not used as the interlayer insulating film 52.
- the peripheral region 24 of the TFT array substrate 20 is provided with a seal 90 for bonding the TFT array substrate 20 and a counter substrate (not shown). Therefore, the vicinity of the contact hole 100 is covered with the seal 90.
- the seal 90 is generally cured by being irradiated with UV. Further, the UV irradiation to the seal 90 is often performed from the back surface of the insulating substrate 16.
- the back side of the insulating substrate 16 means the side of the insulating substrate 16 where the clock wiring 72 is not provided.
- the clock wiring 72 and the branch wiring 74 generally do not transmit UV. This is because the wiring and the like are formed of a conductor, that is, a metal.
- the peripheral region 24 where the seal 90 is provided is not provided with much wiring or the like. Moreover, when wiring etc. are provided in the peripheral area
- the protruding portion 104 is not provided in the connection conductor 102.
- the connection conductor 102 does not have a portion protruding from the clock wiring 72 in plan view.
- the area of the peripheral region 24 where the metal is provided can be reduced.
- the TFT array substrate 20 of the present embodiment it is easy to make the light irradiation amount to the seal 90 uniform. Therefore, it becomes easy to ensure the curing of the seal 90.
- the certain effect of the seal 90 is particularly effective in a liquid crystal display panel configured to drop and inject liquid crystal.
- the protruding portion 104 is not provided in the connection conductor 102. Therefore, the area occupied by the contact hole 100 can be reduced. Therefore, the wiring area can be narrowed, and the frame of the liquid crystal display panel can be easily reduced.
- FIG. 1 a configuration in which the wiring width of the clock wiring 72 is the same is illustrated, but the wiring width is not limited to this.
- the wiring density be equal between the peripheral region (gate side) in the X direction and the peripheral region (source side) in the Y direction shown in FIG.
- the wiring density means the wiring width / space.
- the low-potential-side power supply wiring 70 and the clock wiring 72 as external wirings are not limited to being formed of the same metal material.
- the low potential side power supply wiring 70 can be formed of a second metal material. In this configuration, the low-potential-side power supply wiring 70 and the branch wiring 74 can be electrically connected without passing through the contact hole 100.
- the number of the low-potential side power supply wirings 70 is exemplified as one, the number of the low-potential side power supply wirings 70 is not limited to one, and may be plural.
- FIG. 3 is a diagram showing a schematic configuration of the TFT array substrate 20 of the present embodiment.
- 4 is a cross-sectional view taken along line BB in FIG.
- the TFT array substrate 20 of the present embodiment is different from the TFT array substrate 20 of the first embodiment in the form of the contact hole 100.
- the contact hole 100 in the present embodiment differs from the contact hole 100 in the first embodiment in the number of vias provided for one contact hole 100.
- the contact hole 100 of the first embodiment is provided with two vias, a trunk wiring via 110 and a branch wiring via 112.
- the branch wiring 74 is provided so as to overlap the clock wiring 72 in plan view.
- the connection conductor 102 overlaps the clock wiring 72 in plan view. Further, the connection conductor 102 does not have the protruding portion 104 from the clock wiring 72.
- a branch wiring 74 is provided in the vicinity of a via to which the connection conductor 102 and the clock wiring 72 are connected.
- the via sidewall 116 that connects the connection conductor 102 and the clock wiring 72 and the branch wiring 74 are electrically connected.
- the clock wiring 72 and the branch wiring 74 are connected by only one via, that is, a single via 114.
- the TFT array substrate 20 of the present embodiment is provided with a semiconductor layer 86.
- the semiconductor layer 86 is provided between the gate insulating film 50 and the branch wiring 74.
- the semiconductor layer 86 includes a lower semiconductor layer 86a provided on the gate insulating film 50 and an upper semiconductor layer 86b provided on the lower semiconductor layer 86a.
- the lower semiconductor layer 86a is formed from a normal semiconductor layer.
- the upper semiconductor layer 86b is formed of an ohmic contact layer.
- connection conductor can be prevented from being disconnected by providing the tapered portion of the ohmic contact layer.
- the branch wiring 74 is formed of two metal layers. Specifically, the branch wiring 74 includes a lower layer branch wiring 74 a and an upper layer branch wiring 74 b from the side closer to the insulating substrate 16.
- the lower layer branch wiring 74a is made of titanium: Ti (M2a).
- the upper layer branch wiring 74b is formed of aluminum: Al (M2b).
- FIG. 5 is a diagram showing a schematic configuration of a TFT array substrate 20 according to a modification of the present embodiment.
- two contact holes 100 are provided in one connection portion 80.
- two contact holes 100 are continuously provided along the Y direction which is the extending direction of the clock wiring 72.
- the connection conductors 102 of the two contact holes 100 are connected.
- connection conductor 102 overlaps with the clock wiring 72 in a plan view and does not protrude from the clock wiring 72 as in the TFT array substrate 20 described above.
- the number of contact holes 100 provided in one connection portion 80 is not limited to two.
- the number of contact holes 100 provided in one connection portion 80 can be three or more.
- a plurality of contact holes 100 are provided in one connection portion 80. Therefore, contact resistance can be reduced.
- FIGS. 6 and 7 are diagrams showing a schematic configuration of the TFT array substrate 20 of the present embodiment.
- the TFT array substrate 20 of the present embodiment is different in the shape of the wiring from the TFT array substrate 20 of each of the above embodiments. Specifically, the wiring extending in the Y direction is formed in a ladder shape.
- the low-potential-side power supply wiring 70 that is an external wiring close to the substrate edge 26 is formed in a ladder shape.
- a rectangular missing portion 76 is provided in the low potential side power supply wiring 70.
- the missing portions 76 are provided in two rows along the Y direction.
- the connecting portion 78 corresponds to a ladder scaffold.
- FIGS. 6 and 7 a configuration in which two rows of ladders are arranged in the X direction is illustrated.
- the number of ladders arranged in the X direction is not limited, and can be one row or three or more rows.
- the missing portion 76 is provided in the wiring.
- FIG. 8 is a diagram showing a schematic configuration of the TFT array substrate 20 of the present embodiment.
- the TFT array substrate 20 of the present embodiment is different from the TFT array substrate 20 of each of the above embodiments in the shape of wiring extending in the Y direction.
- the narrow portion 84 is provided in the wiring extending in the Y direction at the intersecting portion 82.
- the intersection 82 means a point where wiring extending in the Y direction and wiring extending in the X direction intersect without being electrically connected.
- the wiring width of the clock wiring 72 is narrowed at the portion where the clock wiring 72 intersects the branch wiring 74.
- a portion where the wiring width of the clock wiring 72 which is the wiring extending in the Y direction is narrowed is a narrow width portion 84.
- the narrow portion provided in the clock wiring 72 is the narrow width portion 84.
- the narrow width portion 84 is provided in the clock wiring 72, so that the area where the clock wiring 72 and the branch wiring 74 overlap in the intersecting portion 82 can be reduced.
- the overlapping area of the wiring extending in the Y direction and the wiring extending in the X direction can be reduced.
- circuit output characteristics such as signal delay can be improved.
- the method of narrowing the wiring width is not limited to the method shown in FIG. That is, instead of narrowing the wiring width from both sides in the wiring width direction, the wiring width can be narrowed from one side in the wiring width direction. Further, the wiring width can be substantially reduced by providing a cut-out portion of the wiring in the vicinity of the center in the width direction of the wiring. In other words, by providing a portion where the wiring is missing in the wiring, the overlapping area with the wiring extending in the X direction can be reduced.
- the semiconductor layer 86 can be provided so as to overlap the narrow width portion 84. By providing the semiconductor layer 86, disconnection of the branch wiring and leakage with the signal wiring can be suppressed.
- FIGS. 9 and 10 are diagrams showing a schematic configuration of the TFT array substrate 20 of the present embodiment.
- the TFT array substrate 20 of the present embodiment differs from the TFT array substrate 20 of each of the above embodiments in the arrangement of the drive circuit 60 and the arrangement of the seal 90.
- only one drive circuit 60 is provided in the X direction.
- the drive circuit 60 is not provided between the wirings extending in the Y direction.
- the drive circuit 60 is provided at the boundary portion between the peripheral region 24 and the display region 22.
- the drive circuit 60 is divided into two in the X direction. Therefore, the first column drive circuit 60a and the second column drive circuit 60b are provided side by side in the X direction. Specifically, a first column drive circuit 60 a is provided between the low-potential-side power supply wiring 70 and the clock wiring 72 that are external wirings. The second column drive circuit 60 b is provided at the boundary portion between the display area 22 and the peripheral area 24.
- the scanning line driving circuit signal wiring is provided between the driving circuits 60 outside the seal 90 or on the display area 22 side as an active area.
- the seal 90 covers all of the wiring extending in the Y direction in the peripheral region 24. Specifically, all of the low potential side power supply wiring 70 and the clock wiring 72 were covered with the seal 90.
- the seal 90 covers only a part of the low potential side power supply wiring 70 and the first column drive circuit 60a.
- the clock wiring 72 and the second column drive circuit 60b are not covered with the seal 90.
- the contact hole 100 provided on the clock wiring 72 is not covered with the seal 90.
- the TFT array substrate 20 of the present embodiment it is possible to further suppress cell thickness unevenness. This is because the number of contact holes 100 covered with the seal 90 can be reduced.
- the line width of the signal wiring for the scanning line driving circuit provided between the first column driving circuit 60a and the second column driving circuit 60b can be reduced. Further, by narrowing the line width, it becomes easy to narrow the frame of the liquid crystal display panel.
- the effect of suppressing the nonuniformity of the cell thickness is that one or more wirings extending in the Y direction, for example, clock wirings 72, are provided between the first column driving circuit 60a and the second column driving circuit 60b in the X direction. By being provided, the effect can be produced.
- FIG. 11 is a diagram showing a schematic configuration of the TFT array substrate 20 of the present embodiment.
- the TFT array substrate 20 of this embodiment differs from the TFT array substrate 20 of each of the above embodiments in that branch wirings 74 are extended so as to overlap the low potential side power supply wiring 70.
- the branch wiring 74 that extends in the X direction and overlaps the low potential side power supply wiring 70 is further extended in the Y direction on the low potential side power supply wiring 70.
- the branch wiring 74 extended in the Y direction is a branch wiring extending portion 88 as an extending portion.
- the first metal material, the second metal material, and the third metal material are laminated in the region where the low potential side power supply wiring 70 as the external wiring is provided.
- multilayer metal wiring is realized.
- the number of contact holes 100 can be made smaller than the number of stages of the drive circuit 60.
- the number of contact holes 100 provided in the low-potential-side power supply wiring 70 as the external wiring is smaller than the number of wiring branches (branching wiring such as the branch wiring 74) from the low-potential-side power supply wiring 70. can do.
- the drive circuit 60 of each stage (first stage drive circuit 601, second stage drive circuit 602, third stage drive circuit 603, fourth stage drive circuit 604). Therefore, it is necessary to provide a contact hole 100 for connecting the branch wiring 74 and the low potential side power supply wiring 70.
- the branch wiring extending portion 88 when the branch wiring extending portion 88 is provided, the branch wiring 74 corresponding to each stage is electrically connected by the branch wiring extending portion 88 on the low potential side power supply wiring 70. ing. Therefore, the branch wiring 74 corresponding to one of the stages is connected to the low potential side power supply wiring 70 through the contact hole 100, so that the branch wiring 74 corresponding to the other stage is also connected to the low potential side power supply wiring 70. Connected. Thereby, the number of contact holes 100 can be reduced.
- the branch wiring 74 corresponding to the second stage driving circuit 602 and the branch wiring 74 corresponding to the fourth stage driving circuit 604 are electrically connected via the low potential side power supply wiring 70 and the contact hole 100. It is connected to the.
- the branch wiring 74 corresponding to the first stage driving circuit 601 and the branch wiring 74 corresponding to the third stage driving circuit 603 are connected to the branch wiring extending portion 88, but are connected to the low potential side via the contact hole 100.
- the power supply wiring 70 is not directly connected.
- the number of contact holes provided in the lower layer of the seal 90 can be reduced. Therefore, it is possible to further suppress the deterioration of display quality due to the nonuniform cell thickness.
- the low-potential-side power supply wiring 70 that is an external wiring close to the substrate edge 26 may be formed in a ladder shape as shown in FIGS. it can.
- connection conductor 102 is connected along the low potential side power supply wiring 70 in the same manner as the branch wiring extending portion 88. You may provide the extended connection conductor extension part.
- the branch wiring 74 and the trunk wiring such as the low-potential-side power supply wiring 70 are formed of the same metal material, so that the branch wiring 74 and the trunk wiring can be electrically connected without providing the contact hole 100. Can be connected.
- the position where the missing portion 76 is provided is not limited to the low-potential-side power supply wiring 70, and can be provided in the clock wiring 72, for example.
- the wiring extending in the Y direction the wiring extending in the X direction, for example, the branch wiring 74 can be provided.
- the position where the narrow width portion 84 is provided is not limited to the clock wiring 72, and may be provided in, for example, a wiring extending in the X direction, for example, the branch wiring 74, instead of extending in the Y direction.
- the trunk wiring is formed of the first metal material M1 that forms the gate bus line 42
- the branch wiring is formed of the second metal material M2 that forms the source bus line 44.
- the combination of the wiring and the metal material is not limited to the above combination, and for example, the first metal material M1 and the second metal material M2 can be interchanged.
- the drive circuit is exemplified as a circuit connected to the trunk wiring via the branch wiring in the peripheral region of the insulating substrate.
- a circuit or an element connected to the trunk line via the branch line is not limited to the above drive circuit.
- a peripheral TFT provided in the peripheral area to drive a TFT element provided in the display area It can also be an element or the like.
- the trunk wiring is formed of the first metal material
- the branch wiring is formed of the second metal material
- at least one of the connection portions includes the above All of the branch wiring vias overlap with the trunk wiring in a plan view.
- the main wirings are provided in the peripheral region, and the main wirings remain except for the main wiring that is closest to the substrate edge of the insulating substrate.
- the trunk wiring is characterized in that the wiring width is the same.
- the TFT array substrate of the present invention is characterized in that a plurality of the above-described trunk wirings are provided in the peripheral region, and the wiring widths of the trunk wirings are the same.
- the remaining trunk wirings except for the trunk wiring closest to the substrate edge of the insulating substrate, or the wiring widths of all the trunk wirings are the same.
- the trunk wiring closest to the substrate edge of the insulating substrate is more than the remaining trunk wiring except for the trunk wiring closest to the substrate edge of the insulating substrate. Also, the wiring width is large.
- the TFT array substrate of the present invention is characterized in that, among the trunk wirings, the trunk wiring closest to the substrate edge of the insulating substrate is a low potential side power wiring.
- the TFT array substrate of the present invention is characterized in that a missing portion is provided in the main wiring closest to the substrate edge of the insulating substrate among the main wiring.
- the TFT array substrate of the present invention is characterized in that the connection conductor is provided only in an upper layer region of the trunk wiring in a plan view at the connection portion.
- connection conductor is provided only in the upper layer region of the trunk wiring in a plan view at the connection portion. That is, the trunk wiring exists in the lower layer region of the connection conductor.
- a specific metal material layer is present in the entire lower layer region of the connection conductor. Therefore, it is possible to further suppress the cell thickness from becoming uneven.
- connection portion is provided with a trunk wiring via that exposes the trunk wiring through the connection conductor, and the trunk wiring via is connected to the trunk wiring.
- a conductor is electrically connected, and the branch wiring and the connection conductor are electrically connected by the branch wiring via.
- the trunk wiring and the branch wiring are connected by providing two vias in the connection portion.
- the trunk wiring is exposed together with the branch wiring through the connection conductor, and the trunk wiring and the branch wiring are connected in the branch wiring via. In addition, it is electrically connected through the connection conductor.
- the TFT array substrate of the present invention is characterized in that in the peripheral region, at least one of the trunk wiring and the branch wiring is provided with a missing portion which is a portion where no metal material exists.
- an intersection is provided in the peripheral region where the trunk wiring and the branch wiring intersect without being electrically connected. At least one of the main wiring and the branch wiring is provided with a narrow portion in which the wiring width is narrowed.
- the area where the trunk wiring and the branch wiring overlap can be reduced.
- the capacity generated between the trunk wiring and the branch wiring can be reduced. Therefore, it becomes easy to suppress signal delay in the wiring, and it is easy to improve circuit output characteristics.
- a plurality of the branch wirings are provided in the peripheral region, and the branch wirings are extended along the trunk wiring in the upper layer region of the trunk wiring.
- the branch wiring extending portion is provided, and the branch wiring extending portion is electrically connected to a plurality of the branch wirings.
- a plurality of the branch wirings are provided in the peripheral region, and the branch wirings are extended along the trunk wiring in the upper layer region of the trunk wiring.
- the branch wiring extending portion is provided, and the branch wiring extending portion is electrically connected to the plurality of branch wirings, so that the branch wiring extending portion is provided in the upper layer region.
- the number of the connecting portions provided in is less than the number of the branch wirings provided in plural.
- the TFT array substrate of the present invention includes a connection conductor extension portion extended along the trunk wiring in the upper layer region of the trunk wiring in which the branch wiring extension portion is provided in the upper layer region of the connection conductor. Is provided.
- the trunk wiring and the plurality of branch wirings include the branch wiring extending portion in which the branch wiring is extended along the trunk wiring or the connecting conductor extending portion in which the connection conductor is extended along the trunk wiring. Connected through.
- the TFT array substrate of the present invention is characterized in that at least a part of the drive circuit is provided in the peripheral region between the connection portion and the substrate edge of the insulating substrate.
- the peripheral TFT element is provided in the peripheral region between the connection portion and the substrate edge of the insulating substrate.
- At least a part of the drive circuit or the peripheral TFT element is provided between the substrate edge and the connection portion.
- a part of the drive circuit is provided in the peripheral region between the connection portion and the substrate edge of the insulating substrate. And the other part of the drive circuit are arranged with a trunk wiring, and the trunk wiring is a clock wiring.
- a part of the peripheral TFT element is provided between the connection portion and the substrate edge of the insulating substrate.
- a trunk line is arranged between a part and the other part of the peripheral TFT element, and the trunk line is a clock line.
- the liquid crystal display panel of the present invention is a liquid crystal display panel in which the TFT array substrate and the counter substrate are bonded together via a seal, and the seal is provided in the peripheral region.
- the liquid crystal display panel of the present invention is characterized in that the connection portion is provided in a lower layer region of the seal.
- the liquid crystal display panel of the present invention is characterized in that the seal is cured by UV light.
- the present invention can be suitably used for a liquid crystal display device or the like that requires high-quality display since the deterioration of display quality is suppressed.
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Abstract
Description
つぎに、TFTアレイ基板の概略構成について説明する。
つぎに、図13に基づいて、周辺領域24を具体的に説明する。
つぎに、配線を形成する金属材料などについて説明する。
従来、このコンタクトホールの構成としては、例えば特許文献1に記載の構成がある。
具体的には、接続導体102とクロック配線72とが平面視において重なり合う部分で、接続導体102とクロック配線72とは、幹配線ビア110を介して電気的に接続されている。また、接続導体102と枝配線74とは、接続導体102と枝配線74とが平面視において重なり合う部分で、枝配線ビア112を介して電気的に接続されている。
そして、幹配線ビア110と枝配線ビア112とは、接続導体102で接続されている。
つぎに、TFTアレイ基板20と対向基板とをはり合わせるためのシール90について説明する。
ここで、従来の液晶表示パネル10では、シール90が設けられた近傍において、セル厚が不均一になりやすい。
このセル厚の不均一は、Y方向に延伸した方向で見た場合にコンタクトホール100が設けられている領域とそうでない領域とがあることによる。つまりこの2つの領域でシール90の厚さが不均一になることに起因する。これは、幹配線ビア110及び枝配線ビア112における2個の凹部が設けられていることに加えて、コンタクトホール100周辺のY方向にて凹部が形成されやすい。そして、このコンタクトホール100周辺のY方向凹部が、セル厚の不均一を招きやすい。
そして、セル厚の不均一は表示品位の低下を生じやすい。
さらに、近年の表示パネルの外形サイズ縮小化の流れの中で、TFTアレイ基板20の周辺領域24の面積を縮小する場合に、低電位側電源配線70、クロック配線72などの配線間距離を小さくすることが考えられる。この際には、このようなはみ出し部が設けられた構造が障害となる。つまり、隣接配線間の距離を縮小する際に、はみ出し部の隣接配線上への配置や距離を縮小すると、配線負荷が増加し、駆動回路の出力特性の低下となる。
本発明の一実施の形態について図1及び図2に基づいて説明すると以下の通りである。
以上のように、接続導体102が平面視においてクロック配線72からはみ出すことなく設けられているので、セル厚の不均一を抑制することができる。
また、本実施の形態のTFTアレイ基板20では、シール90を確実に硬化させることが容易になる。
また、上記の構成では、接続導体102に、はみ出し部104が設けられていない。そのためコンタクトホール100が占める領域を縮小することができる。したがって、配線領域を狭くすることができ、液晶表示パネルの狭額縁化が容易になる。
本発明の他の実施の形態について、図3及び図4に基づいて説明すれば、以下のとおりである。図3は、本実施の形態のTFTアレイ基板20の概略構成を示す図である。また、図4は、図3のB-B線断面図である。
つぎに、図5に基づいて、本実施の形態のTFTアレイ基板20の変形例について説明する。図5は、本実施の形態の変形例のTFTアレイ基板20の概略構成を示す図である。
本発明の他の実施の形態について、図6及び図7に基づいて説明すれば、以下のとおりである。図6及び図7は、本実施の形態のTFTアレイ基板20の概略構成を示す図である。
本発明の他の実施の形態について、図8に基づいて説明すれば、以下のとおりである。図8は、本実施の形態のTFTアレイ基板20の概略構成を示す図である。
また、狭幅部84に重なり合うように半導体層86を設けることもできる。この半導体層86を設けることにより、枝配線の断線及び信号配線とのリークを抑制することができる。
本発明の他の実施の形態について、図9及び図10に基づいて説明すれば、以下のとおりである。図9及び図10は、本実施の形態のTFTアレイ基板20の概略構成を示す図である。
まず、駆動回路60について説明する。
つぎに、シール90について説明する。
本発明の他の実施の形態について、図11に基づいて説明すれば、以下のとおりである。図11は、本実施の形態のTFTアレイ基板20の概略構成を示す図である。
16 絶縁基板
20 TFTアレイ基板
22 表示領域
24 周辺領域
26 基板端辺
42 ゲートバスライン
44 ソースバスライン
48 画素電極
60 駆動回路
70 低電位側電源配線 (幹配線)
72 クロック配線 (幹配線)
74 枝配線 (枝配線)
76 欠落部
80 接続部分
82 交差部分
84 狭幅部
88 枝配線延伸部
90 シール
102 接続導体
110 幹配線ビア
112 枝配線ビア
114 単一ビア
Claims (23)
- 絶縁基板上にTFT素子と、当該TFT素子に接続された画素電極とがマトリクス状に設けられてなるTFTアレイ基板であって、
上記絶縁基板上に、上記TFT素子に接続されたゲートバスラインが第1金属材料で形成されており、
上記絶縁基板上に、上記TFT素子に接続されたソースバスラインが第2金属材料で形成されており、
上記画素電極は、第3金属材料で形成されており、
上記絶縁基板において、上記画素電極がマトリクス状に配置された領域が表示領域であり、
上記表示領域の周辺の領域が周辺領域であり、
上記周辺領域には、上記TFT素子を駆動するための駆動回路が設けられており、
上記周辺領域には、上記駆動回路に接続される枝配線と、上記枝配線に接続される幹配線とが設けられており、
上記枝配線は、上記第1金属材料又は上記第2金属材料のいずれか一方で形成されており、
上記幹配線は、上記第1金属材料及び上記第2金属材料のうちの、上記枝配線とは異なる方の金属材料で形成されており、
上記周辺領域に、上記幹配線と上記枝配線とが電気的に接続される接続部分が設けられており、
上記接続部分において、上記幹配線と上記枝配線とが接続導体で接続されており、
上記接続導体は、上記第3金属材料で形成されており、
上記接続部分には、上記接続導体を介して、上記枝配線を露出する枝配線ビアが設けられており、
少なくとも1箇所の上記接続部分において、上記枝配線ビアの少なくとも一部が、平面視において、上記幹配線と重なっていることを特徴とするTFTアレイ基板。 - 絶縁基板上にTFT素子と、当該TFT素子に接続された画素電極とがマトリクス状に設けられてなるTFTアレイ基板であって、
上記絶縁基板上に、上記TFT素子に接続されたゲートバスラインが第1金属材料で形成されており、
上記絶縁基板上に、上記TFT素子に接続されたソースバスラインが第2金属材料で形成されており、
上記画素電極は、第3金属材料で形成されており、
上記絶縁基板において、上記画素電極がマトリクス状に配置された領域が表示領域であり、
上記表示領域の周辺の領域が周辺領域であり、
上記周辺領域には、上記TFT素子を駆動するための周辺TFT素子が設けられており、
上記周辺領域には、上記周辺TFT素子に接続される枝配線と、上記枝配線に接続される幹配線とが設けられており、
上記枝配線は、上記第1金属材料又は上記第2金属材料のいずれか一方で形成されており、
上記幹配線は、上記第1金属材料及び上記第2金属材料のうちの、上記枝配線とは異なる方の金属材料で形成されており、
上記周辺領域に、上記幹配線と上記枝配線とが電気的に接続される接続部分が設けられており、
上記接続部分において、上記幹配線と上記枝配線とが接続導体で接続されており、
上記接続導体は、上記第3金属材料で形成されており、
上記接続部分には、上記接続導体を介して、上記枝配線を露出する枝配線ビアが設けられており、
少なくとも1箇所の上記接続部分において、上記枝配線ビアの少なくとも一部が、平面視において、上記幹配線と重なっていることを特徴とするTFTアレイ基板。 - 上記幹配線が上記第1金属材料で形成されており、
上記枝配線が上記第2金属材料で形成されており、
上記接続部分の少なくとも1箇所において、上記枝配線ビアの全部が、平面視において、上記幹配線と重なっていることを特徴とする請求項1又は2に記載のTFTアレイ基板。 - 上記周辺領域には、上記幹配線が複数本設けられており、
上記幹配線のうちで、上記絶縁基板の基板端辺に最も近い幹配線を除いた残る幹配線は、その配線幅が同じであることを特徴とする請求項1から3のいずれか1項に記載のTFTアレイ基板。 - 上記幹配線のうちで、上記絶縁基板の基板端辺に最も近い幹配線は、上記絶縁基板の基板端辺に最も近い幹配線を除いた残る幹配線よりも、その配線幅が大きいことを特徴とする請求項4に記載のTFTアレイ基板。
- 上記幹配線のうちで、上記絶縁基板の基板端辺に最も近い幹配線は、低電位側電源配線であることを特徴とする請求項4に記載のTFTアレイ基板。
- 上記幹配線のうちで、上記絶縁基板の基板端辺に最も近い幹配線には、欠落部が設けられていることを特徴とする請求項4に記載のTFTアレイ基板。
- 上記周辺領域には、上記幹配線が複数本設けられており、
上記幹配線の配線幅が同じであることを特徴とする請求項1から3のいずれか1項に記載のTFTアレイ基板。 - 上記接続導体は、上記接続部分で、平面視において、幹配線の上層領域にのみ設けられていることを特徴とする請求項1から8のいずれか1項に記載のTFTアレイ基板。
- 上記接続部分には、上記接続導体を介して、上記幹配線を露出する幹配線ビアが設けられており、
上記枝配線ビアで、上記枝配線と上記接続導体とが電気的に接続されており、
上記幹配線ビアで、上記幹配線と上記接続導体とが電気的に接続されていることを特徴とする請求項1から9のいずれか1項に記載のTFTアレイ基板。 - 上記枝配線ビアでは、上記枝配線と共に幹配線が、上記接続導体を介して露出しており、
上記枝配線ビアで、上記幹配線と上記枝配線とが、上記接続導体を介して電気的に接続されていることを特徴とする請求項1から9のいずれか1項に記載のTFTアレイ基板。 - 上記周辺領域において、上記幹配線及び上記枝配線の少なくとも一方の配線に、金属材料が存在しない部分である欠落部が設けられていることを特徴とする請求項1から11のいずれか1項に記載のTFTアレイ基板。
- 上記周辺領域に、上記幹配線と、上記枝配線とが、電気的に接続されることなく交差する交差部分が設けられており、
上記交差部分において、上記幹配線及び上記枝配線の少なくとも一方の配線に、配線の幅が狭められた狭幅部が設けられていることを特徴とする請求項1から12のいずれか1項に記載のTFTアレイ基板。 - 上記周辺領域には、上記枝配線が複数本設けられており、
上記枝配線には、上記幹配線の上層領域において、上記幹配線に沿って延伸されている枝配線延伸部が設けられており、
上記枝配線延伸部は、複数本の上記枝配線と電気的に接続されていることを特徴とする請求項1から13のいずれか1項に記載のTFTアレイ基板。 - 上記周辺領域には、上記枝配線が複数本設けられており、
上記枝配線には、上記幹配線の上層領域において、上記幹配線に沿って延伸されている枝配線延伸部が設けられており、
上記枝配線延伸部が複数本の上記枝配線と電気的に接続されていることで、上層領域に上記枝配線延伸部が設けられている当該幹配線に設けられている上記接続部分の個数が、複数本設けられている上記枝配線の本数よりも少ないことを特徴とする請求項1から13のいずれか1項に記載のTFTアレイ基板。 - 上記接続導体に、上層領域に上記枝配線延伸部が設けられている上記幹配線の上層領域において、上記幹配線に沿って延伸されている接続導体延伸部が設けられていることを特徴とする請求項14又は15に記載のTFTアレイ基板。
- 上記周辺領域において、上記接続部分と、上記絶縁基板の基板端辺との間に、上記駆動回路の少なくとも一部が設けられていることを特徴とする請求項1に記載のTFTアレイ基板。
- 上記周辺領域において、上記接続部分と、上記絶縁基板の基板端辺との間に、上記駆動回路の一部が設けられており、
上記駆動回路の一部と、上記駆動回路の他の部分との間に幹配線が配置されていると共に、当該幹配線がクロック配線であることを特徴とする請求項17に記載のTFTアレイ基板。 - 上記周辺領域において、上記接続部分と、上記絶縁基板の基板端辺との間に、上記周辺TFT素子の少なくとも一部が設けられていることを特徴とする請求項2に記載のTFTアレイ基板。
- 上記周辺領域において、上記接続部分と、上記絶縁基板の基板端辺との間に、上記周辺TFT素子の一部が設けられており、
上記周辺TFT素子の一部と、上記周辺TFT素子の他の部分との間に幹配線が配置されていると共に、当該幹配線がクロック配線であることを特徴とする請求項19に記載のTFTアレイ基板。 - 請求項1から20のいずれか1項に記載のTFTアレイ基板と、対向基板とがシールを介してはり合わされてなる液晶表示パネルであって、
上記シールが、上記周辺領域に設けられていることを特徴とする液晶表示パネル。 - 上記接続部分が、上記シールの下層領域に設けられていることを特徴とする請求項21に記載の液晶表示パネル。
- 上記シールは、UV光により硬化されることを特徴とする請求項21又は22に記載の液晶表示パネル。
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KR1020117019569A KR101359864B1 (ko) | 2009-02-16 | 2009-11-05 | Tft 어레이 기판 및 액정 표시 패널 |
US13/138,396 US8780311B2 (en) | 2009-02-16 | 2009-11-05 | TFT array substrate, and liquid crystal display panel |
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CN200980156284.0A CN102308253B (zh) | 2009-02-16 | 2009-11-05 | Tft阵列基板和液晶显示面板 |
US14/291,937 US9385143B2 (en) | 2009-02-16 | 2014-05-30 | TFT array substrate, and liquid crystal display panel |
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JP2017083759A (ja) * | 2015-10-30 | 2017-05-18 | 株式会社ジャパンディスプレイ | 表示装置 |
JP2022023953A (ja) * | 2019-01-11 | 2022-02-08 | 株式会社ジャパンディスプレイ | 表示パネル |
Also Published As
Publication number | Publication date |
---|---|
US20160282693A1 (en) | 2016-09-29 |
CN102308253B (zh) | 2014-12-17 |
RU2491591C2 (ru) | 2013-08-27 |
EP2397891A4 (en) | 2012-09-12 |
JP4890647B2 (ja) | 2012-03-07 |
US20140267969A1 (en) | 2014-09-18 |
JPWO2010092714A1 (ja) | 2012-08-16 |
CN102308253A (zh) | 2012-01-04 |
KR20110114677A (ko) | 2011-10-19 |
CN104345512A (zh) | 2015-02-11 |
EP2397891A1 (en) | 2011-12-21 |
RU2011135550A (ru) | 2013-02-27 |
EP2397891B1 (en) | 2016-03-16 |
KR101359864B1 (ko) | 2014-02-06 |
US8780311B2 (en) | 2014-07-15 |
US9385143B2 (en) | 2016-07-05 |
US20110291097A1 (en) | 2011-12-01 |
US9733538B2 (en) | 2017-08-15 |
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