WO2006118163A1 - 高周波スイッチングモジュール及び高周波回路の周波数特性調整方法 - Google Patents
高周波スイッチングモジュール及び高周波回路の周波数特性調整方法 Download PDFInfo
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- WO2006118163A1 WO2006118163A1 PCT/JP2006/308780 JP2006308780W WO2006118163A1 WO 2006118163 A1 WO2006118163 A1 WO 2006118163A1 JP 2006308780 W JP2006308780 W JP 2006308780W WO 2006118163 A1 WO2006118163 A1 WO 2006118163A1
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- frequency
- inductor
- frequency switching
- filter
- capacitor
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Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
- H04B1/38—Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
- H04B1/40—Circuits
- H04B1/44—Transmit/receive switching
- H04B1/48—Transmit/receive switching in circuits for connecting transmitter and receiver to a common transmission path, e.g. by energy of transmitter
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P1/00—Auxiliary devices
- H01P1/10—Auxiliary devices for switching or interrupting
- H01P1/15—Auxiliary devices for switching or interrupting by semiconductor devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P1/00—Auxiliary devices
- H01P1/20—Frequency-selective devices, e.g. filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P1/00—Auxiliary devices
- H01P1/20—Frequency-selective devices, e.g. filters
- H01P1/201—Filters for transverse electromagnetic waves
- H01P1/203—Strip line filters
Definitions
- the present invention relates to a high frequency switching module, and more particularly to a high frequency switching module in which a high frequency switch including a diode FET switch as a switching element and a high frequency filter including an inductor and a capacitor are integrated.
- the present invention also relates to a method for adjusting the frequency characteristics of a high-frequency circuit, in particular, an RF front-end circuit including a high-frequency switch including a diode or a FET switch as a switching element and a high-frequency filter including a shunt-connected capacitor.
- the present invention relates to a method for adjusting the attenuation characteristic.
- High-frequency switching modules in mobile communication devices such as cellular phones are used in RF front-end circuits.
- Diodes are used as switching elements to switch the transmission path of high-frequency signals in the 8GHz and 900MHz bands. Has been.
- this type of high-frequency switch is composed of two diodes, an inductor, a capacitor, a resistor, and the like, and controls the voltage applied to the power supply terminal to control the signal. The transmission / reception is switched.
- high-frequency filters and RF front-end circuits are composed of ⁇ -type low-pass filters with ground capacitors (shunt capacitors) at both ends of the LC parallel resonant circuit, and in particular, low-noise amplifiers ( It is configured to remove the 2nd and 3rd order higher harmonics generated by LNA).
- the diode D shown in Fig. 28 (A) is shown in Fig. 28 (B) when forward bias is applied to the diode D.
- the equivalent circuit shown in FIG. That is, when the diode D was turned on, it was found that a circuit in which the capacitor component C was connected in parallel to the series resistance component R and inductance component L was formed.
- Patent Document 1 JP 2001-177434 A
- Patent Document 2 JP 2003-133994 A
- an object of the present invention is to provide a high-frequency switching module having desired frequency characteristics.
- Another object of the present invention is to provide a method of adjusting the frequency characteristics of a high-frequency circuit that can shift the cut-off frequency to the low-frequency side and can suppress ripples to a small level.
- the first invention provides:
- a high frequency switch that includes a high frequency switching element that selectively switches a transmission path of a high frequency signal, and a ⁇ -type high frequency filter that includes an inductor and a capacitor and removes unwanted waves in the transmission path.
- switching module includes a high frequency switching element that selectively switches a transmission path of a high frequency signal, and a ⁇ -type high frequency filter that includes an inductor and a capacitor and removes unwanted waves in the transmission path.
- the frequency fk is included in the frequency band other than the n (an integer of 2 or more) order harmonic attenuation region of the fundamental wave. That
- the inductor constituting the ⁇ -type high-frequency filter is connected in series and directly to the high-frequency switch, so that the ripple (passband A high frequency switching module having a desired frequency characteristic can be obtained with a simple configuration in which the frequency of zero point (fx) does not enter.
- the frequency fk is preferably located between a second-order harmonic attenuation region and a third-harmonic attenuation region.
- the high-frequency switch selectively switches between the transmission path of the transmission signal and the transmission path of the reception signal, and the ⁇ -type high-frequency filter is disposed on the transmission path of the transmission signal to remove higher-order harmonics of the transmission signal. It may be configured to do so.
- the high-frequency switch may include a diode as a high-frequency switching element, and the inductor of the ⁇ -type high-frequency filter may be directly connected in series to the diode.
- the high-frequency switch may include a FET switch as a high-frequency switching element, and the inductor of the ⁇ -type high-frequency filter may be directly connected in series to the FET switch.
- the ⁇ -type high-frequency filter is provided on the high-frequency signal transmission path, connected in parallel with the capacitor, and includes a first inductor that forms part of the LC parallel resonant circuit, and a parallel capacitor.
- the LC parallel resonance circuit may be configured, and may be configured with a low-pass filter including the second inductor. In this case, it is connected in series and directly to the second inductor power high-frequency switch that does not constitute the LC parallel resonant circuit.
- the inductor of the ⁇ -type high frequency filter preferably has an electrical length that is at least twice as short as the shortest electrical length between one end of the high frequency switch and another element to which the one end is connected. Inn As the ductance increases, the cut-off frequency can be shifted to a lower frequency side, and the effect of suppressing ripples also increases.
- the inductor of the ⁇ -type high frequency filter may be incorporated as a strip line in a module body formed by laminating a plurality of dielectric layers, or a plurality of dielectric layers may be used as a chip component. It may be mounted on a laminated module body. If it is formed as a strip line, the module can be made smaller. If it is formed as a chip component, an inductor having a larger inductance value can be easily applied.
- the high-frequency switching module is a single-band compatible type that selectively switches a signal transmission path for transmitting a single-wavelength high-frequency signal, and transmits high-frequency signals of two different wavelengths.
- Single-band or multiple different wavelengths such as dual-band compatible that selectively switches signal transmission paths, or triple-band compatible that selectively switches signal transmission paths that transmit high-frequency signals of three different wavelengths It can be configured as a single-band, multi-band compatible switching module that selectively switches signal transmission paths for transmitting high-frequency signals.
- the second invention is:
- a method of adjusting frequency characteristics of a high-frequency circuit including a high-frequency switching element and a shunt capacitor shunt-connected at a preceding stage or a subsequent stage of the high-frequency switching element, wherein an inductor is added directly and serially to the high-frequency switching element
- the cutoff frequency of the Chebyshev-type low-pass filter circuit formed by the inductance component formed when the high-frequency switching element is turned on, the capacitance component of the capacitor, and the shunt capacitor is shifted to the low-frequency side and passed. Reduce the ripple frequency, which is the zero of the band, and
- the inductance f is adjusted so that the frequency fk is included in a frequency band other than the n (an integer of 2 or more) order harmonic attenuation region of the fundamental wave,
- a ripple (passband The cut-off frequency can be shifted to the low frequency side as desired, and ripple can be suppressed, so that the frequency of the zero point: fx) can not be entered.
- fx the frequency of the zero point
- the frequency fk is preferably located between the second harmonic attenuation region and the third harmonic attenuation region.
- the inductor preferably has an electrical length that is at least twice the shortest electrical length between one end of the high-frequency switching element and the element to which the one end is connected.
- an element is, for example, a capacitor shunt-connected at the front stage or the rear stage of the high-frequency switching element.
- the high-frequency switching element is a diode or FET switch, and the inductor is connected in series and directly to the diode or FET switch.
- FIG. 1 is an equivalent circuit diagram for explaining the principle of the present invention.
- FIG. 2 is an equivalent circuit diagram for simulation of a high-frequency circuit.
- FIG. 3 is a graph showing high-frequency attenuation characteristics in the equivalent circuit shown in FIG.
- FIG. 4 Another equivalent circuit diagram for high-frequency circuit simulation.
- FIG. 5 is a graph showing high-frequency attenuation characteristics in the equivalent circuit shown in FIG.
- FIG. 6 is a graph showing the high-frequency attenuation characteristics when the inductance value of the inductor is changed in the equivalent circuit shown in FIG.
- FIG. 7 is still another equivalent circuit diagram for high-frequency circuit simulation.
- FIG. 8 is a graph showing high-frequency attenuation characteristics (inductance value 0. OnH) in the equivalent circuit shown in FIG.
- FIG. 9 is a graph showing high-frequency attenuation characteristics (inductance value 0.3 nH) in the equivalent circuit shown in FIG.
- FIG. 10 is a graph showing high-frequency attenuation characteristics (inductance value 0.5 nH) in the equivalent circuit shown in FIG.
- FIG. 11 is a graph showing high-frequency attenuation characteristics (inductance value 2. OnH) in the equivalent circuit shown in FIG.
- FIG. 12 is a graph showing high-frequency attenuation characteristics (inductance value 8. OnH) in the equivalent circuit shown in FIG.
- FIG. 13 is a block diagram showing a high-frequency switching module according to the first embodiment. 14] It is explanatory drawing which shows the electrode shape formed in each sheet
- FIG. 17 is a plan view showing a mounting state of each circuit element on the surface of the ceramic multilayer substrate of the first embodiment.
- FIG. 18 is a block diagram showing a high frequency switching module according to a second embodiment.
- FIG. 19 is a block diagram showing a high frequency switching module according to a third embodiment.
- FIG. 20 is a block diagram showing a high frequency switching module according to a fourth embodiment.
- FIG. 21 is a block diagram showing a high frequency switching module according to a fifth embodiment.
- FIG. 22 is a block diagram showing a high frequency switching module according to a sixth embodiment.
- FIG. 23A is a graph showing the high-frequency attenuation characteristics in the sixth embodiment
- FIG. 23B is a graph showing the high-frequency attenuation characteristics in the comparative example in which the inductor DL is removed from the circuit of the sixth embodiment.
- FIG. 27 is a plan view showing a mounting state of each circuit element on the surface of the ceramic multilayer substrate of the sixth embodiment.
- FIG. 28 shows a conventional diode switch, where (A) is a switch circuit diagram and (B) and (C) are equivalent circuit diagrams.
- the basic configuration of the high-frequency switching module is that the inductor L of the high-frequency filter is connected in series and directly (without any other elements) to the diode D as a switching element.
- the high-frequency filter connected to the anode of the diode D constituting the high-frequency switch SW via the inductor L is a low-pass filter LPF, and the filter LPF is connected to the inductor L1 provided on the signal line.
- the capacitor Cla connected in parallel to the inductor L1 and the shunt capacitors Clb and Clc connected in the front and rear stages of the inductor L1 are connected to each other.
- the inductor L is also one of the low-pass filters LPF. Part.
- [0026] 02 (A) is an equivalent circuit for simulation of a high-frequency circuit in which a low-pass filter is connected to a diode.
- an inductor L that constitutes part of the low-pass filter an OnH inductor L is placed after the diode.
- Figure 2 (B) is an equivalent circuit for comparison, and forms part of the low-pass filter. 5.
- OnH inductor L is placed after the shunt capacitor that forms the low-pass filter. This simulation is for GSM1800 (center frequency: 1747. 5MHz).
- Fig. 3 shows the results of simulating the high-frequency attenuation characteristics in the equivalent circuits of both.
- the attenuation curve b of the circuit where the OnH inductor L is inserted directly in series with the diode is shown in ml, m2. In other words, the ripple is greatly reduced.
- the rise of the decay curve is reduced, and sufficient attenuation is obtained in the band where attenuation is desired.
- the attenuation pole near 3400MHz is the attenuation pole due to the LC parallel resonant circuit and corresponds to the harmonic band twice the fundamental wave. This attenuation pole is almost the same in each curve a and b.
- Fig. 4 (A) is a simulation circuit using an equivalent circuit of a diode
- Fig. 4 (B) is a simulation circuit using an S parameter of a diode. It is inserted.
- Figure 5 shows the results of simulating the high-frequency attenuation characteristics of each equivalent circuit.
- the attenuation curve c shows the characteristics of the equivalent circuit in FIG. 4 (A)
- the attenuation curve d shows the characteristics of the equivalent circuit in FIG. 4 (B).
- the attenuation characteristic shown in Fig. 5 is that the inductance value of inductor L is as small as 1. OnH, and the inductance value is the element connected to one end of diode D shown in Fig. 1 (shunt capacitor Clb). It is equivalent to the shortest electrical length L.
- FIG. 6 (B) shows an attenuation curve when the inductance value of the inductor L is 2. OnH
- FIG. 6 (C) shows an attenuation curve when 5. OnH is set.
- Fig. 6 (A) shows the attenuation curve for comparison when the inductance value is 1. OnH (same as Fig. 5).
- inductance value of inductor L increases to 2. OnH, and further to 5. OnH, the cutoff frequency increases. A large shift to the low frequency side reduces ripple. This is because a diode and a shunt capacitor are compared with a Chebyshev-type low-pass filter formed by an inductance component and a capacitor component formed when the diode is turned on, and a shunt capacitor arranged adjacent to the diode. This is a result of increasing the inductance in the Chepschev type low-pass filter by increasing the inductance value of the inductor.
- Induct L is a “filter component” that constitutes a high-frequency filter, and adds a new inductance component to the inductance component formed when the diode is turned on! It plays a role as a “inductance addition element”.
- the cutoff in the Chebyshev-type low-pass filter without changing the number of elements constituting the high-frequency switching module is achieved.
- the frequency can be shifted to the low frequency side, and the ripple can be reduced to approximate a Butterworth low-pass filter, thereby realizing a high-frequency switching module having desired attenuation characteristics.
- the inductance value added to the diode D corresponds to the electrical length between the diode D force and the shunt capacitor of the low-pass filter that is an adjacent element.
- the inductance value of the inductor L is such that one end of the diode D and one end thereof are Twice the shortest electrical length L with the connected element
- U which preferably corresponds to an electrical length of 0 or more.
- FIG. 7 shows still another equivalent circuit as a principle description of the present invention.
- This equivalent circuit is a simulation circuit using diode S-parameters, and the low-pass filter is an LC parallel resonant circuit LC1 for attenuating the second harmonic and an LC parallel resonant circuit LC2 for attenuating the third harmonic. It is configured.
- the fundamental wave of this simulation is about 1.81 GHz and the bandwidth is about 0.2 GHz.
- Figs. 8 to 12 show the inductance values of the inductor L in the simulation circuit shown in Fig. 7 as 0. OnH (Fig. 8), 0.3nH (Fig. 9), and 0.5nH (Fig. 10), respectively. 2.
- Frequency characteristics when OnH (Fig. 1 1) and 8. OnH (Fig. 12) are set.
- ml and m2 represent the second harmonic attenuation region
- m3 and m4 represent the third harmonic attenuation region.
- the dotted line shows the frequency characteristics of the Chebyshev-type low-pass filter
- the solid line shows the combined frequency of the Chebyshev-type low-pass filter and the ⁇ -type low-pass filter for the second and third harmonic attenuation. The characteristics are shown.
- the ripple frequency on the dotted line is located between the second harmonic band and the third harmonic band. As a result, it is possible to suppress the deterioration of the attenuation that occurs on the higher frequency side than the third harmonic band.
- the inductance value of the inductor L when the inductance value of the inductor L is set to 2. OnH, the frequency of the ripple on the dotted line is between the second harmonic band and the third harmonic band, and 2 It is formed around 3.7 GHz near the second harmonic band. As a result, more attenuation can be obtained in the third harmonic band. Comparing the frequency characteristics of Fig. 10 and Fig. 11, the amount of attenuation in the jumping part of the attenuation pole generated between the 3rd harmonic band and the 4th harmonic band has an inductance value of 0.5 nH (Fig. 10 (Refer to Fig. 11). On the other hand, when the inductance value is set to 2. OnH (see Fig. 11), it is about -45 dB, which means that more attenuation can be obtained.
- the LC parallel resonance circuit for attenuation of the third harmonic (referred to by LC2 in Fig. 7) by using the attenuation region of the Chebyshev type low-pass filter (higher frequency than the ripple frequency). Can be omitted. This also applies to the example of FIG. 12 shown below.
- the first embodiment is a triple-band compatible high-frequency switching module (front-end module) corresponding to three communication systems (GSM900 system and GSM1800Z1900 system) as shown in the equivalent circuit of FIG.
- a diplexer 20 that branches a GSM900 signal path and a GSM1800 / 1900 signal path is provided downstream of the antenna terminal ANT.
- a first high frequency switch 900SW, a first LC filter 900LPF, and a first balanced surface acoustic wave filter SAW1 are arranged in the signal path of the GSM900 system.
- the second high frequency switch GSM1800Z1900SW—A, the second LC filter 1800 Z1900LPF, the third high frequency switch 1800Z1900SW—B, and the second balanced elastic surface wave filter SAW2, SAW3 are arranged in the signal path of the GSM1800Z1900 system. ing.
- the first high-frequency switch 900SW includes a signal path between the antenna terminal ANT and the first transmission-side input terminal GSM90 OTx (that is, a transmission path of a transmission signal of the GSM900 system), an antenna terminal ⁇ , and a first reception.
- the signal path to the GSM900RX ie, the transmission path for GSM 900 system received signals
- the first LC filter 900LPF is arranged between the first high frequency switch 900SW and the first transmission side input terminal GSM900TX, that is, in the transmission path of the GSM900 transmission signal.
- the first balanced surface acoustic wave filter SAW1 is disposed between the first high-frequency switch 900SW and the first reception-side balanced output terminal GSM9 OORx, that is, in the transmission path of the GSM900-based received signal.
- an inductor LG is connected in parallel between the first balanced surface acoustic wave filter SAW1 and the first receiving-side balanced output terminal GSM900RX for the purpose of phase adjustment between the non-lance output terminals. ing.
- Second high-frequency switch GSM1800Z1900SW— A is the antenna terminal ANT and second transmission ⁇ Signal path between J human power terminal GSM1800 / 1900Tx, ie, transmission path of GSM1800 / 1900 system transmission signal), and between antenna terminal ANT and second and third receiver balanced output terminals GSM1900Rx, GSM1800Rx Select the signal path (Ryoichi, GSM1800 / 1900 system received signal transmission path) selectively.
- the 2nd LC filter 1800Z1900LPF is good between the 2nd high frequency switch GSM1800Z1900SW-A and the 2nd transmission side input terminal GSM18 00 / 1900Tx! That is, it is placed in the transmission path of GSM 1800/1900 series transmission signals.
- the third high-frequency switch 1800Z1900SW-B is the signal path between the second high-frequency switch GSM1800Z19 OOSW-A and the second and third receiver-side balanced output terminals GSM1900Rx, GSM1800Rx (that is, GSM 1800/1900 series reception) Select the signal transmission path).
- the second balanced surface acoustic wave filters SAW2 and SAW3 are the third high-frequency switch 1800Z1900SW—B and the second and third receiver-side balanced output terminals GSM1900RX and GSM1800Rx. Is placed on the transmission path of the received signal.
- the gap between the second balanced surface acoustic wave filters SAW2 and SAW3 and the second and third receiver-side balanced output terminals GSM1900Rx and GSM1800Rx is intended for phase adjustment between the balanced output terminals.
- Inductors LP and LD are connected to each other.
- the diplexer 20 sends GSM900 or GSM1800Z1900 power transmission signals to the antenna terminal ANT during transmission, and receives signals received at the antenna terminal ANT to the GSM900 or GSM1800Z1900 system during reception. send.
- the first port P11 of the diplexer 20 has an antenna terminal ANT force
- the second port P12 has the first high-frequency switch 900SW first port P31g force
- the third port P13 has the second high-frequency switch GSM1800Z 1900SW—the first port P31d of A Each is connected.
- the first port P21g of the first LC filter 900LPF is connected to the second port P32g of the first high-frequency switch 900SW, and the first balanced surface acoustic wave filter SAW1 is connected to the third port P33g.
- the first transmission side input terminal GSM900TX is connected to the second port P22g of the first LC filter 900LPF.
- GSM1800 / 1900 series (This is the second high-frequency switch GSM1800 / 1900SW— A
- the second port P32d is connected to the first port P21d of the second LC filter 1800 / 1900LPF
- the third port P33d is connected to the first port P4 Id of the third high-frequency switch 1800Z1900SW-B.
- the second transmission side input terminal GSM1800Z1900TX is connected to the second port P22d of the second LC filter 1800Z1900LPF.
- the second balanced surface acoustic wave filters SAW2 and SAW3 are connected to the second port P42d and the third port P43d of the third high-frequency switch 1800Z1900SW-B, respectively.
- the diplexer 20 includes inductors Ltl and Lt2 and capacitors Ccl, Cc2, Ctl, Ct2 and Cu1.
- a parallel circuit composed of an inductor Ltl and a capacitor Ctl is connected between the first port P11 and the second port P12, and the second port P12 side of the parallel circuit is grounded via the capacitor Cul.
- Capacitors Ccl and Cc2 are connected in series between the first port P11 and the third port P13, and are grounded via the connection point inductor Lt2 and the capacitor Ct2. That is, a high-pass filter is formed by the inductor Ltl and the capacitors Ctl, Ccl, and Ct2.
- the first high-frequency switch 900SW includes switching elements such as diodes GDI and GD2, inductors GSL1 and GSL2, a capacitor GC5, and a resistor Rg.
- a diode GDI is connected between the first port P 31g and the second port P32g so that the anode is on the first port P31g side, and the force sword is grounded via the inductor GSL1.
- the diode GD2 is connected to the first port P31g via the force sword force inductor GSL2, and the anode is grounded via the capacitor GC5.
- the control terminal Vcl is connected to the connection point between the diode GD2 and the capacitor GC5 via the resistor Rg.
- the connection point between the power sword of the diode GD2 and the third port P33g is grounded through the capacitor GCu3.
- the second high-frequency switch GSM1800Z1900SW-A is composed of diodes DDI, DD2, inductors DPSL1, DSL2, DPSLt, capacitors DC4, DC5, CD Pr, Dcu3, DPCtl, and a resistor Rd, which are switching elements.
- a diode DDI is connected between the first port P31d and the second port P3 2d so that the force sword is on the first port P31d side, and the anode is grounded via the inductor DPSL1 and the capacitor DC4.
- a series circuit of a capacitor DPCtl and an inductor DPSLt is connected in parallel with the diode DDI between the first port P31d and the second port P32d.
- the anode of the diode DD2 is connected to the first port P31d via the inductor DSL2 and grounded via the capacitor Dcu3.
- the power sword of diode DD2 is grounded through capacitor DC5.
- the anode of the diode DD2 is connected to the third port P33d via the capacitor C DPr, and the connection point between the force sword and the capacitor DC5 is grounded via the resistor Rd.
- the control terminal Vc2 is connected to the connection point between the inductor DPSL1 and the capacitor DC4.
- the first LC filter 900LPF is obtained by connecting a parallel circuit of an inductor GLtl and a capacitor GCcl between a first port P21g and a second port P22g. Both ends of the inductor GLtl are grounded via capacitors GCul and GCu2. A capacitor Cgt is connected between the second port P22g and the first transmission side input terminal GSM900TX.
- the inductor DLt2 and the inductor DLtl are connected in series between the first port P21d and the second port P22d, and a parallel circuit of the inductor DLtl and the capacitor DCc 1 is connected. Talk! Both ends of the inductor DLt 1 are grounded through capacitors DCul and DCu2, respectively. Also, a capacitor Cdp is connected between the second port P22d and the second transmitter input terminal GSM 1800 / 1900Tx!
- a diode DD3 is connected between the first port P41d and the second port P42d, and the anode of the diode DD3 is grounded via the inductor PSL1 and the capacitor PC4.
- the control terminal Vc3 is connected to the connection point between the inductor PSL 1 and the capacitor PC4.
- the inductor PSL2 is connected between the first port P41d and the third port P43d, the connection point between the inductor PSL2 and the third port P43d is connected to the anode of the diode DD4, and the force sword of the diode DD4 is a capacitor Grounded via PC5.
- the connection point between the power sword of the diode DD4 and the capacitor PC5 is grounded through the resistor Rp.
- the feature is that the inductor DLt2 of the second LC filter 1800/19 OOLPF is connected in series and directly to the anode of the diode DDI.
- Inductor DLt2 has the function of shifting the cutoff frequency of the low-pass filter circuit formed when diode DDI is turned on to the low frequency side and reducing ripples as shown in Figs. 6 (B) and (C).
- an inductor may be provided between the first LC filter 900LPF and the diode GDI.
- FIGS. 14 to 16 show capacitor electrodes, strip line electrodes, and the like formed by screen printing on each sheet layer constituting the ceramic multilayer substrate of the high-frequency switching module according to the first embodiment.
- the ceramic multilayer substrate is made by laminating first to 22nd sheet layers 61a to 61v, which also have ceramic power mainly composed of barium oxide, aluminum oxide, and silica, in order, and firing them at a temperature of 1000 ° C or less. It is formed.
- Various external connection terminal electrodes are formed on the first sheet layer 61a.
- a ground electrode G1 is formed on the second sheet layer 61b, and electrodes of capacitors Ct2, GC, GCu2, and DC4 are formed on the third sheet layer 61c, and a capacitance is formed with the ground electrode G1.
- a ground electrode G2 is formed on the fourth sheet layer 61d, and electrodes of capacitors G C, Cul, PC4, and GCul are formed on the fifth sheet layer 61e, and a capacitance is formed with the ground electrode G2.
- a ground electrode G3 is formed on the sixth sheet layer 61f, and electrodes of capacitors DCul, DCu2, and DCu3 are formed on the seventh sheet layer 61g, and a capacitance is formed with the ground electrode G3.
- Inductors Ltl, Lt2, DLtl, DLt2, GLtl, DSL2, GSL2, and PSL2 are formed on the ninth, tenth, and eleventh sheet layers 61i, 61j, and 61k, respectively, by stripline electrodes, and each is formed of a via-hole conductor. It is connected.
- inductors GLtl, DSL2, GSL2, and PSL2 are formed on the twelfth sheet layer 611 by stripline electrodes, and the same type is connected by via-hole conductors.
- the electrode of the capacitor Ctl is formed on the 14th sheet layer 61 ⁇ , and the electrode of the capacitor DCc 1 and the electrode of the antenna terminal ANT are formed on the 15th sheet layer 61 ⁇ .
- Capacitors Ccl, GCcl, and DCcl are formed on the 16th sheet layer 61p.
- the 17th sheet layer 61q is provided with electrodes of capacitors Cc2 and GCcl and a ground electrode G4.
- Electrodes of capacitors DC5 and PC5 are formed on the 18th sheet layer 61r, and a ground electrode G5 is formed on the 19th sheet layer 61s.
- the surface of the 22nd sheet layer 61v is the surface of the ceramic multilayer substrate 50, on which various connection terminal electrodes are formed.
- the first, second, Third surface acoustic wave filters SAW1, SAW2, SAW3 and diodes GDI, GD2, DDI, DD2, DD3, DD4 are mounted on the surface.
- resistors Rg, Rd, Rp are installed, and inductors DPCtl, DPSLl, DPSLt, GSLl, PSL1, and capacitor CDPr are installed.
- the second high-frequency switch GSM1800Z1900SW-A applies 3V to the control terminal Vc2, for example, to turn on the diodes DDI and DD2, thereby turning on the GSM1800Z1900 transmission signal. It passes through the 2LC filter 1800Z1900LPF, the second high-frequency switch GSM1800Z1900 SW—A and the diplexer 20, and is transmitted from the antenna terminal ANT connected to the first port PI1 of the diplexer 20.
- the first high frequency switch 900SW for example, OV is applied to the control terminal Vcl to turn off the diode GDI so that a GSM900 transmission signal is not transmitted. Also, by connecting the diplexer 20, the transmission signal of the GSM1800Z1900 system is prevented from entering the first transmission side input terminal GSM900TX and the first reception side balance output terminal GSM 900Rx. In addition, the 2nd LC FINORETA 1800 / 1900LPF attenuates the second and third harmonics of the GSM1800Z1900 system.
- the second high-frequency switch GSM1800Z1900SW-A for example, OV is applied to the control terminal Vc2 to turn off the diode DDI so that the GSM1800Z1900 transmission signal is not transmitted. Also, by connecting the diplexer 20, the GSM900 transmission signal is prevented from wrapping around the second transmission side input terminal GSM1800Z1900TX and the second 'third reception side balance output terminal GSM1900Rx, GSM1800Rx.
- the second harmonic of the GSM900 system is attenuated by the low-pass filter consisting of the capacitor Ctl, the inductor Ltl, and the shunt capacitor Cu 1 of the diplexer 20, and the third harmonic of the GSM900 system is attenuated by the first LC filter 900LPF. I am letting.
- the third high-frequency switch 1800Z1 When receiving a GSM1800Z1900 series received signal, the third high-frequency switch 1800Z1
- the received signal of the GSM1800Z1900 system is prevented from entering the GSM900 system and the received signal strength of the GSM900 system SGSM1800 / 1900 system.
- the second embodiment is a triple-band compatible high-frequency switching module (front-end module) compatible with three communication systems (GSM900 system and GSM1800Z1900 system).
- the second embodiment has basically the same configuration as the first embodiment. The difference is that in the second high-frequency switch 1800Z1900SW-A, the inductor DLt2 is connected to the power sword of the diode DDI. Even in this configuration, the inductor DLt2 shifts the cutoff frequency to the low frequency side as shown in Fig. 6 when the diode DDI is on. In addition, it has a function of reducing ripple.
- the other configuration is the same as that of the first embodiment, and a duplicate description is omitted.
- the third embodiment is a dual-band compatible high-frequency switching module (front-end module) compatible with two communication systems (GSM900 system and GSM1800 system).
- the GSM 1900 system circuit is omitted and the surface acoustic wave filters SAW1, SAW2, and SAW3 are omitted in the first embodiment.
- a capacitor Cgr is connected between the first high-frequency switch 900SW and the first receiver-side balanced output terminal GSM900RX, and a capacitor Cdr is connected between the second high-frequency switch 1800SW-A and the second receiver-side balanced output terminal GSM1800RX. Is connected.
- one end of the inductor DPSL1 of the second high-frequency switch 1800SW-A is connected to the connection point of the inductors DLtl and DLt2.
- the inductor DLt2 has a function of shifting the cutoff frequency to the low frequency side and reducing the ripple as shown in Fig. 6 when the diode DDI is on.
- the fourth embodiment is a single-band compatible high-frequency switching module (front-end module) corresponding to one communication system (GSM1800 system).
- the GSM900 circuit and the diplexer 20 are omitted in the third embodiment.
- the inductor DLt2 has a function of shifting the cutoff frequency to the low frequency side and reducing the ripple as shown in FIG. 6 when the diode DDI is on.
- the fifth embodiment is a dual-band compatible high-frequency switching module that supports two communication systems (GSM900 and GSM1800). Module (front-end module).
- the fifth embodiment has basically the same configuration as the third embodiment. The difference is that the second LC filter 1800LPF is omitted and the inductor DLtl is grounded via the capacitor DCcl. Also in the fifth embodiment, the inductor DLt2 has a function of shifting the cut-off frequency to the low frequency side and reducing the ripple as shown in FIG. 6 when the diode DDI is on.
- this sixth embodiment is a quad-band compatible high-frequency switching module (front-end module) that supports four communication systems (GSM, DCS, PCS, and WCDMA). ).
- the GSM transmission transmission path and the reception transmission path are the same as those in the third embodiment, and the DCSZPCS transmission transmission path and the reception transmission path, and the WCDMA reception transmission path and the diplexer.
- a FET switch specifically, a GaAs switch 21 is provided between 20q and 20q.
- the diplexer 20q includes a parallel circuit including the inductor DLtl and the capacitor DCcl, and a shunt capacitor Dcul is a DCSZPCS system. And added to the WCDMA system. This added low-pass filter supplements the DCSZPCS system second LC filter LPF connected to the DCSZPCS system transmission side input terminal Tx.
- the GaAs switch 21 switches the DCSZPCS transmission transmission path, the DCS reception transmission path, the PCS reception transmission path, and the WCDMA system by switching the connection relationship with the terminal T to the terminals T1 to T4.
- the receiving transmission path is switched.
- This GaAs switch 21 forms a circuit in which a capacitor C is connected in parallel to the series resistor R and inductor L shown in FIG. 28 (B) during DCSZPCS transmission, as with the diode DDI. . Accordingly, stray capacitance is formed by the shunt capacitor C1 shown in FIG. 28C, and this low-pass filter has Chebyshev characteristics.
- an inductor DL is connected in series with the GaAs switch 21 in series.
- the second LC filter LPF of the DCS / PCS system includes the inductor DL, the inductors DLt2 and DLt3, and the capacitor DCc2 connected in parallel with the inductor DLt2, and includes the shunt capacitors Dcu2 and DPTxC.
- the feature is that the inductor DL of the second LC filter LPF is connected in series and directly to the terminal T1 of the GaAs switch 21.
- the inductor DL shifts the cutoff frequency of the low-pass filter circuit formed when the terminal T1 of the GaAs switch 21 is turned on and ripples. It has a function to keep it small.
- attenuation of the third harmonic can be obtained.
- Figure 23 (A) shows the attenuation characteristics when the inductor DL is inserted.
- Figure 23 (B) shows the attenuation characteristics for comparison when the inductor DL is not inserted.
- the inductor DL As shown in Fig. 23 (B), it is generated in 5.1 to 5.2 GHz, which is a band almost three times the fundamental frequency (around 1.75 GHz). As shown in Fig. 23 (A), the ripples that have been generated (the rise of the attenuation pole) is a band that has nothing to do with the higher-order harmonics of the fundamental frequency. 3. It can be moved without changing the attenuation pole (around 7GHz).
- inductor DL may be provided in series and directly between terminal T of GaAs switch 21 and diplexer 2 Oq.
- a FET switch such as a CMOS switch can be used instead of the GaAs switch 21.
- FIGS. 24 to 26 show capacitor electrodes, stripline electrodes, and the like formed by screen printing on each sheet layer constituting the ceramic multilayer substrate of the high-frequency switching module according to the sixth embodiment.
- the ceramic multilayer substrate is composed of the first to 21st sheet layers 71a to 71u, which have barium oxide, aluminum oxide, and silica as the main components, and the lower forces are sequentially laminated and fired at a temperature of 1000 ° C or lower. Is formed.
- Various external connection terminal electrodes are formed on the first sheet layer 71a, and a ground electrode G1 is formed on the second sheet layer 71b.
- Capacitors GC5, Ct2, Cul, and GTxC electrodes are formed on the third sheet layer 71c, and a ground electrode G2 is formed on the fourth sheet layer 71d.
- Capacitors GC5, GCul, and DPTxC are formed on the fifth sheet layer 71e, and a ground electrode G3 is formed on the sixth sheet layer 71f. 7th sheet layer 71g
- the electrodes of GRxC, DCul, and DCu2 are formed.
- Inductors Lt2, DLtl, DLt2, DLt3, and GSL2 are formed on the ninth sheet layer 71i by stripline electrodes, respectively.
- inductors GLtl and Ltl are formed by strip line electrodes, respectively.
- electrodes of capacitors Ctl and GCcl are formed on the 14th sheet layer 71 ⁇
- electrodes of capacitors G Ccl and DCcl and a ground electrode G4 are formed on the 15th sheet layer 71 ⁇ .
- Electrodes of capacitors GCcl, GC5, DCc2, and Ccl are formed on the sixteenth sheet layer 71p.
- the electrode of the capacitor DCc2 and the ground electrode G5 are formed on the 17th sheet layer 71q.
- the inductor DL is formed on the 20th sheet layer 71t!
- the surface of the 21st sheet layer 71u is the surface of the ceramic multilayer substrate 51, on which various connection terminal electrodes are formed.
- GaAs switch 21, resistor Rg, inductor GSL1, diodes GDI and GD2 are mounted on the surface.
- the method for adjusting the frequency characteristics of the high-frequency switching module and the high-frequency circuit according to the present invention is not limited to the above-described embodiments, and various changes can be made within the scope of the gist thereof! ⁇ .
- the present invention is useful for a high-frequency switching module, and is particularly excellent in that it can be adjusted to a desired frequency characteristic while suppressing ripples.
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Abstract
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Priority Applications (5)
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JP2007514782A JP4182160B2 (ja) | 2005-04-28 | 2006-04-26 | 高周波スイッチングモジュール及び高周波回路の周波数特性調整方法 |
EP06732386.5A EP1876722B1 (en) | 2005-04-28 | 2006-04-26 | High frequency switching module and method for adjusting frequency characteristic of high frequency circuit |
CN2006800056388A CN101128986B (zh) | 2005-04-28 | 2006-04-26 | 高频开关模块及用于高频电路的频率特性调整方法 |
KR1020077018892A KR100890711B1 (ko) | 2005-04-28 | 2006-04-26 | 고주파 스위칭모듈 및 고주파회로의 주파수특성 조정방법 |
US11/838,000 US7466211B2 (en) | 2005-04-28 | 2007-08-13 | High-frequency switching module and frequency-characteristic adjusting method for high-frequency circuit |
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JP2005-132920 | 2005-04-28 | ||
JP2005-132921 | 2005-04-28 | ||
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JP2005-254197 | 2005-09-01 | ||
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US11/838,000 Continuation US7466211B2 (en) | 2005-04-28 | 2007-08-13 | High-frequency switching module and frequency-characteristic adjusting method for high-frequency circuit |
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US (1) | US7466211B2 (ja) |
EP (1) | EP1876722B1 (ja) |
JP (1) | JP4182160B2 (ja) |
KR (1) | KR100890711B1 (ja) |
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KR100843120B1 (ko) | 2007-05-18 | 2008-07-02 | (주)비씨엔이글로발 | 동축선로상의 저고역 주파수 분리기 |
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TWI442621B (zh) * | 2007-01-19 | 2014-06-21 | Murata Manufacturing Co | High frequency parts |
EP2144377B8 (en) * | 2007-05-10 | 2013-03-06 | Murata Manufacturing Co. Ltd. | Composite high-frequency component |
KR100916271B1 (ko) * | 2007-10-24 | 2009-09-10 | 엘지이노텍 주식회사 | 고주파 모듈레이터 |
US9324885B2 (en) | 2009-10-02 | 2016-04-26 | Tigo Energy, Inc. | Systems and methods to provide enhanced diode bypass paths |
US9425783B2 (en) * | 2010-03-15 | 2016-08-23 | Tigo Energy, Inc. | Systems and methods to provide enhanced diode bypass paths |
KR101714175B1 (ko) | 2015-07-22 | 2017-03-09 | 한국항공우주연구원 | 스위칭 모듈 및 이를 이용한 스위칭 소자의 동작 확인 방법 |
CN105846789B (zh) * | 2016-03-23 | 2018-07-24 | 深圳振华富电子有限公司 | 低通滤波器及其制备方法 |
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US7466211B2 (en) | 2008-12-16 |
EP1876722B1 (en) | 2016-08-24 |
EP1876722A1 (en) | 2008-01-09 |
KR20070099651A (ko) | 2007-10-09 |
CN101128986B (zh) | 2012-06-27 |
JPWO2006118163A1 (ja) | 2008-12-18 |
KR100890711B1 (ko) | 2009-03-27 |
US20080258839A1 (en) | 2008-10-23 |
EP1876722A4 (en) | 2010-08-18 |
CN101128986A (zh) | 2008-02-20 |
JP4182160B2 (ja) | 2008-11-19 |
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