TWI534410B - Linear shape measurement method and linear shape measuring device - Google Patents

Linear shape measurement method and linear shape measuring device Download PDF

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Publication number
TWI534410B
TWI534410B TW104106310A TW104106310A TWI534410B TW I534410 B TWI534410 B TW I534410B TW 104106310 A TW104106310 A TW 104106310A TW 104106310 A TW104106310 A TW 104106310A TW I534410 B TWI534410 B TW I534410B
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TW
Taiwan
Prior art keywords
measured
linear shape
curvature
sampling
height data
Prior art date
Application number
TW104106310A
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English (en)
Chinese (zh)
Other versions
TW201534864A (zh
Inventor
Koichi Ichihara
Original Assignee
Sumitomo Heavy Industries
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Publication date
Application filed by Sumitomo Heavy Industries filed Critical Sumitomo Heavy Industries
Publication of TW201534864A publication Critical patent/TW201534864A/zh
Application granted granted Critical
Publication of TWI534410B publication Critical patent/TWI534410B/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
TW104106310A 2014-03-05 2015-02-26 Linear shape measurement method and linear shape measuring device TWI534410B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014042251A JP6199205B2 (ja) 2014-03-05 2014-03-05 真直形状測定方法及び真直形状測定装置

Publications (2)

Publication Number Publication Date
TW201534864A TW201534864A (zh) 2015-09-16
TWI534410B true TWI534410B (zh) 2016-05-21

Family

ID=54029918

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104106310A TWI534410B (zh) 2014-03-05 2015-02-26 Linear shape measurement method and linear shape measuring device

Country Status (4)

Country Link
JP (1) JP6199205B2 (ja)
KR (1) KR20150104538A (ja)
CN (1) CN104897105B (ja)
TW (1) TWI534410B (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108844497A (zh) * 2018-06-07 2018-11-20 东北大学 一种数控机床导轨安装面直线度检测装置及方法
CN109855590B (zh) * 2019-01-12 2021-03-23 吉林大学 一种圆柱类零件弯曲变形轴线杠杆式连续测量方法
CN109596075A (zh) * 2019-01-28 2019-04-09 天津市兆瑞测控技术有限公司 一种直线度或弯曲度在线测量装置及方法
JP7296334B2 (ja) * 2020-03-26 2023-06-22 住友重機械工業株式会社 真直度計測システム、変位センサ校正方法、及び真直度計測方法
CN111644901B (zh) * 2020-04-09 2022-05-13 武汉船用机械有限责任公司 工件加工轴线的校正方法和装置
CN115235376B (zh) * 2022-09-23 2023-01-17 国网天津市电力公司电力科学研究院 一种非接触式电缆敷设质量检测方法及检测装置
CN115854949B (zh) * 2023-03-02 2023-05-16 泗水县金佳工贸有限公司 一种卷纸用弧形辊的弧形自动检测装置及控制方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2617707C2 (de) * 1975-04-23 1986-02-20 The Rank Organisation Ltd., London Vorrichtung zum Vermessen einer Oberfläche
FR2727198A1 (fr) * 1994-11-18 1996-05-24 Otis Elevator Co Capteur de distance et notamment du positionnement des cabines d'ascenseur
JPH09210668A (ja) * 1996-02-07 1997-08-12 Mitsubishi Heavy Ind Ltd 真直形状測定方法
JP2003254747A (ja) * 2002-02-28 2003-09-10 Mitsutoyo Corp 真直度測定法
JP2005062016A (ja) * 2003-08-13 2005-03-10 Fuji Photo Film Co Ltd 放射線像変換体およびその製造方法
JP4400331B2 (ja) * 2004-06-17 2010-01-20 信越半導体株式会社 ウエーハの形状評価方法及び管理方法
JP4197339B2 (ja) * 2006-01-16 2008-12-17 アンリツ株式会社 三次元形状測定装置
JP2007333556A (ja) * 2006-06-15 2007-12-27 Micro Engineering Inc 逐次多点式真直度測定法および測定装置
JP5100612B2 (ja) * 2008-10-29 2012-12-19 住友重機械工業株式会社 真直度測定方法及び真直度測定装置
JP5263126B2 (ja) * 2009-11-09 2013-08-14 新日鐵住金株式会社 板材の光学式形状測定方法及び測定装置
CN102221354B (zh) * 2011-04-02 2013-01-09 中南大学 一种多测点浮动定位表面不平顺测量方法
CN104359413B (zh) * 2014-10-15 2017-02-15 武汉中科创新技术股份有限公司 一种利用激光位移传感器测量钢管直径的装置及方法

Also Published As

Publication number Publication date
KR20150104538A (ko) 2015-09-15
JP6199205B2 (ja) 2017-09-20
CN104897105A (zh) 2015-09-09
JP2015169451A (ja) 2015-09-28
CN104897105B (zh) 2018-08-07
TW201534864A (zh) 2015-09-16

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