TWI443311B - Optical characteristic detection device - Google Patents

Optical characteristic detection device Download PDF

Info

Publication number: TWI443311B
Authority: TW; Taiwan
Prior art keywords: light; filter; detection; unit; value
Prior art date: 2007-11-30

Application number

TW097141751A

Other languages

English (en)

Chinese (zh)

Other versions

TW200936992A (en

Inventor

Nagashima Taku

Mizuguchi Tsutomu

Oshima Kosei

Original Assignee

Otsuka Denshi Kk

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2007-11-30

Filing date

2008-10-30

Publication date

2014-07-01

2008-10-30 Application filed by Otsuka Denshi Kk filed Critical Otsuka Denshi Kk

2009-09-01 Publication of TW200936992A publication Critical patent/TW200936992A/zh

2014-07-01 Application granted granted Critical

2014-07-01 Publication of TWI443311B publication Critical patent/TWI443311B/zh

Links

238000001514 detection method Methods 0.000 title claims description 142
230000003287 optical effect Effects 0.000 title claims description 70
238000012937 correction Methods 0.000 claims description 74
238000004364 calculation method Methods 0.000 claims description 26
238000004519 manufacturing process Methods 0.000 claims description 17
238000002834 transmittance Methods 0.000 claims description 14
239000011521 glass Substances 0.000 claims description 11
239000000758 substrate Substances 0.000 claims description 11
238000004611 spectroscopical analysis Methods 0.000 claims description 2
238000001914 filtration Methods 0.000 claims 1
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Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating

Landscapes

Physics & Mathematics (AREA)
Spectroscopy & Molecular Physics (AREA)
General Physics & Mathematics (AREA)
Spectrometry And Color Measurement (AREA)
Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Testing Of Optical Devices Or Fibers (AREA)
Led Devices (AREA)

TW097141751A 2007-11-30 2008-10-30 Optical characteristic detection device TWI443311B (zh)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP2007310395A JP5246395B2 (ja)	2007-11-30	2007-11-30	光学特性測定装置

Publications (2)

Publication Number	Publication Date
TW200936992A TW200936992A (en)	2009-09-01
TWI443311B true TWI443311B (zh)	2014-07-01

Family

ID=40865749

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
TW097141751A TWI443311B (zh)	2007-11-30	2008-10-30	Optical characteristic detection device

Country Status (3)

Country	Link
JP (1)	JP5246395B2 (ja)
KR (1)	KR101548017B1 (ja)
TW (1)	TWI443311B (ja)

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* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
CN102645276A (zh) *	2011-02-16	2012-08-22	台湾超微光学股份有限公司	光谱感测设备、***及方法
CN103487139B (zh) *	2012-06-12	2015-07-29	清华大学	光强分布的测量方法
CN103487141B (zh) *	2012-06-12	2015-07-29	清华大学	光强分布的检测***
CN103487143B (zh)	2012-06-12	2015-07-29	清华大学	光强分布的检测***
CN103487142B (zh) *	2012-06-12	2015-12-16	清华大学	光强分布的测量方法
EP2905591B1 (en) *	2012-10-01	2018-01-03	National University Corporation Kagawa University	Spectral characteristic measurement device
TWI490446B (zh) *	2013-04-10	2015-07-01	致茂電子股份有限公司	發光模組檢測裝置以及發光模組檢測方法
WO2015107657A1 (ja) *	2014-01-16	2015-07-23	パイオニア株式会社	光学測定装置
JP6277207B2 (ja) *	2014-01-16	2018-02-07	パイオニア株式会社	光学測定装置
CN111458107A (zh) *	2019-01-18	2020-07-28	宁波群志光电有限公司	自动检测***及其方法
JP2021015038A (ja) *	2019-07-12	2021-02-12	日置電機株式会社	光測定装置および光測定装置用プログラム
KR102419806B1 (ko) *	2020-05-14	2022-07-14	(주)에이앤아이	필터유닛을 포함하는 색상 및 휘도 측정장치
CN113759192B (zh) *	2021-07-29	2024-04-30	江铃汽车股份有限公司	一种emc测试方法、装置、可读存储介质及车辆

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPH05256702A (ja) *	1992-03-13	1993-10-05	Nec Corp	光スペクトラムアナライザ
JP3340150B2 (ja) *	1992-05-06	2002-11-05	日本分光株式会社	超高感度光検出装置
JPH11133211A (ja) *	1997-10-28	1999-05-21	Olympus Optical Co Ltd	フィルタ切換え装置
JP2002195882A (ja) *	2000-12-27	2002-07-10	Toshiba Corp	発光体検査装置
US7129519B2 (en) *	2002-05-08	2006-10-31	Advanced Technology Materials, Inc.	Monitoring system comprising infrared thermopile detector
JP2007078502A (ja) *	2005-09-14	2007-03-29	Oputo System:Kk	発光体の測光装置

2007
- 2007-11-30 JP JP2007310395A patent/JP5246395B2/ja active Active
2008
- 2008-10-30 TW TW097141751A patent/TWI443311B/zh active
- 2008-11-27 KR KR1020080118634A patent/KR101548017B1/ko active IP Right Grant

Also Published As

Publication number	Publication date
KR101548017B1 (ko)	2015-08-27
TW200936992A (en)	2009-09-01
JP5246395B2 (ja)	2013-07-24
KR20090056858A (ko)	2009-06-03
JP2009133735A (ja)	2009-06-18

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