KR101548017B1 - 광학 특성 측정 장치 - Google Patents

광학 특성 측정 장치 Download PDF

Info

Publication number: KR101548017B1
Authority: KR; South Korea
Prior art keywords: light; unit; optical; filter; measurement
Prior art date: 2007-11-30

Application number

KR1020080118634A

Other languages

English (en)

Korean (ko)

Other versions

KR20090056858A (ko

Inventor

다꾸 나가시마

쯔또무 미즈구찌

고세이 오시마

Original Assignee

오츠카 일렉트로닉스 가부시키가이샤

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2007-11-30

Filing date

2008-11-27

Publication date

2015-08-27

2008-11-27 Application filed by 오츠카 일렉트로닉스 가부시키가이샤 filed Critical 오츠카 일렉트로닉스 가부시키가이샤

2009-06-03 Publication of KR20090056858A publication Critical patent/KR20090056858A/ko

2015-08-27 Application granted granted Critical

2015-08-27 Publication of KR101548017B1 publication Critical patent/KR101548017B1/ko

Links

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Images

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating

Landscapes

Physics & Mathematics (AREA)
Spectroscopy & Molecular Physics (AREA)
General Physics & Mathematics (AREA)
Spectrometry And Color Measurement (AREA)
Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Testing Of Optical Devices Or Fibers (AREA)
Led Devices (AREA)

KR1020080118634A 2007-11-30 2008-11-27 광학 특성 측정 장치 KR101548017B1 (ko)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
JP2007310395A JP5246395B2 (ja)	2007-11-30	2007-11-30	光学特性測定装置
JPJP-P-2007-310395		2007-11-30

Publications (2)

Publication Number	Publication Date
KR20090056858A KR20090056858A (ko)	2009-06-03
KR101548017B1 true KR101548017B1 (ko)	2015-08-27

Family

ID=40865749

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
KR1020080118634A KR101548017B1 (ko)	2007-11-30	2008-11-27	광학 특성 측정 장치

Country Status (3)

Country	Link
JP (1)	JP5246395B2 (ja)
KR (1)	KR101548017B1 (ja)
TW (1)	TWI443311B (ja)

Cited By (1)

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WO2021230452A1 (ko) *	2020-05-14	2021-11-18	(주)에이앤아이	필터유닛을 포함하는 색상 및 휘도 측정장치

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CN102645276A (zh) *	2011-02-16	2012-08-22	台湾超微光学股份有限公司	光谱感测设备、***及方法
CN103487139B (zh) *	2012-06-12	2015-07-29	清华大学	光强分布的测量方法
CN103487141B (zh) *	2012-06-12	2015-07-29	清华大学	光强分布的检测***
CN103487143B (zh)	2012-06-12	2015-07-29	清华大学	光强分布的检测***
CN103487142B (zh) *	2012-06-12	2015-12-16	清华大学	光强分布的测量方法
EP2905591B1 (en) *	2012-10-01	2018-01-03	National University Corporation Kagawa University	Spectral characteristic measurement device
TWI490446B (zh) *	2013-04-10	2015-07-01	致茂電子股份有限公司	發光模組檢測裝置以及發光模組檢測方法
WO2015107657A1 (ja) *	2014-01-16	2015-07-23	パイオニア株式会社	光学測定装置
JP6277207B2 (ja) *	2014-01-16	2018-02-07	パイオニア株式会社	光学測定装置
CN111458107A (zh) *	2019-01-18	2020-07-28	宁波群志光电有限公司	自动检测***及其方法
JP2021015038A (ja) *	2019-07-12	2021-02-12	日置電機株式会社	光測定装置および光測定装置用プログラム
CN113759192B (zh) *	2021-07-29	2024-04-30	江铃汽车股份有限公司	一种emc测试方法、装置、可读存储介质及车辆

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Publication number	Priority date	Publication date	Assignee	Title
JPH05256702A (ja) *	1992-03-13	1993-10-05	Nec Corp	光スペクトラムアナライザ
JP3340150B2 (ja) *	1992-05-06	2002-11-05	日本分光株式会社	超高感度光検出装置
JPH11133211A (ja) *	1997-10-28	1999-05-21	Olympus Optical Co Ltd	フィルタ切換え装置
JP2002195882A (ja) *	2000-12-27	2002-07-10	Toshiba Corp	発光体検査装置
US7129519B2 (en) *	2002-05-08	2006-10-31	Advanced Technology Materials, Inc.	Monitoring system comprising infrared thermopile detector
JP2007078502A (ja) *	2005-09-14	2007-03-29	Oputo System:Kk	発光体の測光装置

2007
- 2007-11-30 JP JP2007310395A patent/JP5246395B2/ja active Active
2008
- 2008-10-30 TW TW097141751A patent/TWI443311B/zh active
- 2008-11-27 KR KR1020080118634A patent/KR101548017B1/ko active IP Right Grant

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
WO2021230452A1 (ko) *	2020-05-14	2021-11-18	(주)에이앤아이	필터유닛을 포함하는 색상 및 휘도 측정장치
KR20210140880A (ko) *	2020-05-14	2021-11-23	(주)에이앤아이	필터유닛을 포함하는 색상 및 휘도 측정장치
KR102419806B1 (ko) *	2020-05-14	2022-07-14	(주)에이앤아이	필터유닛을 포함하는 색상 및 휘도 측정장치
US11422035B2 (en)	2020-05-14	2022-08-23	Ani. Co. Ltd	Color and luminance measuring device including filter unit

Also Published As

Publication number	Publication date
TWI443311B (zh)	2014-07-01
TW200936992A (en)	2009-09-01
JP5246395B2 (ja)	2013-07-24
KR20090056858A (ko)	2009-06-03
JP2009133735A (ja)	2009-06-18

Legal Events

Date	Code	Title	Description
2013-10-04	A201	Request for examination
2015-02-23	E902	Notification of reason for refusal
2015-07-30	E701	Decision to grant or registration of patent right
2015-08-21	GRNT	Written decision to grant
2018-06-19	FPAY	Annual fee payment	Payment date: 20180620 Year of fee payment: 4
2019-06-12	FPAY	Annual fee payment	Payment date: 20190613 Year of fee payment: 5

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