TWI266525B - AD conversion method, AD converter, semiconductor device for detecting distribution of physical quantities, and electronic apparatus - Google Patents
AD conversion method, AD converter, semiconductor device for detecting distribution of physical quantities, and electronic apparatusInfo
- Publication number
- TWI266525B TWI266525B TW094110873A TW94110873A TWI266525B TW I266525 B TWI266525 B TW I266525B TW 094110873 A TW094110873 A TW 094110873A TW 94110873 A TW94110873 A TW 94110873A TW I266525 B TWI266525 B TW I266525B
- Authority
- TW
- Taiwan
- Prior art keywords
- clock
- voltage comparator
- comparison
- converter
- performs
- Prior art date
Links
- 238000006243 chemical reaction Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
- 238000003384 imaging method Methods 0.000 abstract 1
- 230000002123 temporal effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/1205—Multiplexed conversion systems
- H03M1/123—Simultaneous, i.e. using one converter per channel but with common control or reference circuits for multiple converters
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/50—Analogue/digital converters with intermediate conversion to time interval
- H03M1/56—Input signal compared with linear ramp
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Theoretical Computer Science (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Analogue/Digital Conversion (AREA)
- Studio Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004116470A JP4655500B2 (ja) | 2004-04-12 | 2004-04-12 | Ad変換装置並びに物理量分布検知の半導体装置および電子機器 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200539694A TW200539694A (en) | 2005-12-01 |
TWI266525B true TWI266525B (en) | 2006-11-11 |
Family
ID=35095884
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094110873A TWI266525B (en) | 2004-04-12 | 2005-04-06 | AD conversion method, AD converter, semiconductor device for detecting distribution of physical quantities, and electronic apparatus |
Country Status (5)
Country | Link |
---|---|
US (1) | US7088279B2 (zh) |
JP (1) | JP4655500B2 (zh) |
KR (1) | KR101194927B1 (zh) |
CN (1) | CN100579171C (zh) |
TW (1) | TWI266525B (zh) |
Families Citing this family (92)
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TW576099B (en) * | 2002-09-26 | 2004-02-11 | Veutron Corp | Scanning device and the operating method thereof for transmitting the analog electronic signal by the differential pair mode |
JP4107269B2 (ja) * | 2004-02-23 | 2008-06-25 | ソニー株式会社 | 固体撮像装置 |
JP4289206B2 (ja) * | 2004-04-26 | 2009-07-01 | ソニー株式会社 | カウンタ回路 |
EP2065714B1 (en) * | 2004-11-08 | 2012-01-04 | Sony Corporation | Comparing method and device for analog-to-digital conversion method, analog-to-digital converter, semiconductor device for detecting distribution of physical quantity |
JP2006303752A (ja) * | 2005-04-19 | 2006-11-02 | Sony Corp | 撮像装置 |
US8179296B2 (en) | 2005-09-30 | 2012-05-15 | The Massachusetts Institute Of Technology | Digital readout method and apparatus |
US7250884B1 (en) * | 2005-11-21 | 2007-07-31 | National Semiconductor Corporation | Analog-to-digital converters for control loop applications |
US7593050B2 (en) * | 2006-02-27 | 2009-09-22 | Eastman Kodak Company | Delay management circuit for reading out large S/H arrays |
JP4442578B2 (ja) * | 2006-03-14 | 2010-03-31 | ソニー株式会社 | Ad変換装置、物理量分布検出装置および撮像装置 |
JP4615472B2 (ja) * | 2006-04-03 | 2011-01-19 | ソニー株式会社 | 物理量分布検出装置および撮像装置 |
JP4744343B2 (ja) * | 2006-04-10 | 2011-08-10 | ソニー株式会社 | 固体撮像装置および固体撮像装置の駆動方法 |
US7342528B2 (en) * | 2006-06-15 | 2008-03-11 | Semiconductor Components Industries, L.L.C. | Circuit and method for reducing electromagnetic interference |
JP4882652B2 (ja) * | 2006-10-06 | 2012-02-22 | ソニー株式会社 | 固体撮像装置、固体撮像装置の駆動方法および撮像装置 |
US8237808B2 (en) * | 2007-01-17 | 2012-08-07 | Sony Corporation | Solid state imaging device and imaging apparatus adjusting the spatial positions of pixels after addition by controlling the ratio of weight values during addition |
KR100871828B1 (ko) * | 2007-01-29 | 2008-12-03 | 삼성전자주식회사 | 히스테리시스 특성을 이용한 싱글 슬로프 adc와 그 변환 방법, 및 상기 싱글 슬로프 adc를 구비하는 cmos 이미지 센서 |
JP4101281B1 (ja) | 2007-03-15 | 2008-06-18 | キヤノン株式会社 | 固体撮像装置及び固体撮像装置の駆動方法 |
JP5034610B2 (ja) | 2007-03-30 | 2012-09-26 | ソニー株式会社 | 固体撮像装置、固体撮像装置の信号処理方法および撮像装置 |
JP4458113B2 (ja) * | 2007-05-02 | 2010-04-28 | ソニー株式会社 | データ転送回路、固体撮像素子、およびカメラシステム |
JP2008306695A (ja) | 2007-05-10 | 2008-12-18 | Sony Corp | データ転送回路、固体撮像素子、およびカメラシステム |
US7656338B2 (en) | 2007-05-23 | 2010-02-02 | Seiko Epson Corporation | Analog-digital converter and image sensor |
JP4953959B2 (ja) * | 2007-07-25 | 2012-06-13 | パナソニック株式会社 | 物理量検知装置およびその駆動方法 |
JP4953970B2 (ja) * | 2007-08-03 | 2012-06-13 | パナソニック株式会社 | 物理量検知装置およびその駆動方法 |
JP4929090B2 (ja) * | 2007-07-26 | 2012-05-09 | パナソニック株式会社 | 固体撮像装置およびその駆動方法 |
JP2009038531A (ja) * | 2007-07-31 | 2009-02-19 | Panasonic Corp | 固体撮像装置及びその駆動方法 |
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KR101377270B1 (ko) | 2007-08-29 | 2014-03-21 | 삼성전자주식회사 | 리플 카운터를 포함하는 이미지 센서와 상기 이미지 센서의 동작 방법 |
KR101448917B1 (ko) * | 2007-09-11 | 2014-10-13 | 삼성전자주식회사 | 의사 멀티플 샘플링 방법을 사용하는 아날로그-디지털 변환장치 및 방법 |
JP4946761B2 (ja) | 2007-09-28 | 2012-06-06 | ソニー株式会社 | 固体撮像素子およびカメラシステム |
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JP6132506B2 (ja) * | 2012-10-05 | 2017-05-24 | キヤノン株式会社 | 光電変換装置および撮像システム |
WO2014082660A1 (en) | 2012-11-27 | 2014-06-05 | Sabanci Üniversitesi | Pixel level digital implementation of time delay integration algorithm for low noise, high dynamic range and low power readout integrated circuits |
JP6146015B2 (ja) * | 2013-01-18 | 2017-06-14 | 株式会社リコー | 光電変換素子、画像読取装置及び画像形成装置 |
GB201300999D0 (en) | 2013-01-21 | 2013-03-06 | Cmosis Nv | Analog-to-digital conversation in pixel arrays |
KR102007386B1 (ko) | 2013-05-30 | 2019-08-05 | 에스케이하이닉스 주식회사 | 디지털 아날로그 변환기, 그를 포함하는 이미지 센싱 장치 및 이미지 센싱 장치의 구동방법 |
JP6188451B2 (ja) | 2013-06-27 | 2017-08-30 | オリンパス株式会社 | アナログデジタル変換器および固体撮像装置 |
KR102135684B1 (ko) | 2013-07-24 | 2020-07-20 | 삼성전자주식회사 | 카운터 회로, 이를 포함하는 아날로그-디지털 컨버터, 이미지 센서 및 이를 이용하는 상관 이중 샘플링 방법 |
JP5767287B2 (ja) | 2013-09-13 | 2015-08-19 | オリンパス株式会社 | 撮像装置 |
TW201519655A (zh) * | 2013-11-01 | 2015-05-16 | Himax Imaging Inc | 影像感測器 |
JP6411795B2 (ja) * | 2014-02-13 | 2018-10-24 | ソニーセミコンダクタソリューションズ株式会社 | 信号処理装置および方法、撮像素子、並びに、撮像装置 |
KR102196713B1 (ko) | 2014-04-21 | 2020-12-30 | 삼성전자주식회사 | 연산 메모리 장치, 이를 포함하는 이미지 센서 및 그 연산 메모리 장치의 동작 방법 |
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JP6371407B2 (ja) * | 2014-11-12 | 2018-08-08 | オリンパス株式会社 | 時間検出回路、ad変換回路、および固体撮像装置 |
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JP6676983B2 (ja) * | 2016-01-28 | 2020-04-08 | 株式会社リコー | 光電変換素子、画像読取装置、画像形成装置及び画像読取方法 |
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CN106840440B (zh) * | 2017-03-03 | 2023-07-28 | 成都信息工程大学 | 一种基于mcu内部比较器的温度采集器及温度采集方法 |
CN107566704A (zh) * | 2017-09-28 | 2018-01-09 | 中国科学院长春光学精密机械与物理研究所 | 多输出高清高速成像记录一体摄像机 |
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JPH0282135U (zh) * | 1988-12-14 | 1990-06-25 | ||
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JP2004015206A (ja) * | 2002-06-04 | 2004-01-15 | Matsushita Electric Ind Co Ltd | A/d内蔵型マイクロコンピュータ |
JP4470700B2 (ja) * | 2004-02-23 | 2010-06-02 | ソニー株式会社 | Ad変換方法およびad変換装置並びに物理量分布検知の半導体装置および電子機器 |
-
2004
- 2004-04-12 JP JP2004116470A patent/JP4655500B2/ja not_active Expired - Lifetime
-
2005
- 2005-04-05 US US11/098,986 patent/US7088279B2/en active Active
- 2005-04-06 TW TW094110873A patent/TWI266525B/zh not_active IP Right Cessation
- 2005-04-12 KR KR1020050030319A patent/KR101194927B1/ko active IP Right Grant
- 2005-04-12 CN CN200510079269A patent/CN100579171C/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20050231624A1 (en) | 2005-10-20 |
US7088279B2 (en) | 2006-08-08 |
KR101194927B1 (ko) | 2012-10-25 |
JP4655500B2 (ja) | 2011-03-23 |
TW200539694A (en) | 2005-12-01 |
JP2005303648A (ja) | 2005-10-27 |
CN1694491A (zh) | 2005-11-09 |
KR20060045620A (ko) | 2006-05-17 |
CN100579171C (zh) | 2010-01-06 |
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