TW200618128A - Method of and apparatus for dispensing photoresist in manufacturing semiconductor devices or the like - Google Patents
Method of and apparatus for dispensing photoresist in manufacturing semiconductor devices or the likeInfo
- Publication number
- TW200618128A TW200618128A TW094131500A TW94131500A TW200618128A TW 200618128 A TW200618128 A TW 200618128A TW 094131500 A TW094131500 A TW 094131500A TW 94131500 A TW94131500 A TW 94131500A TW 200618128 A TW200618128 A TW 200618128A
- Authority
- TW
- Taiwan
- Prior art keywords
- photoresist
- dispensing pump
- dispensing
- wafer
- supply line
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D19/00—Degasification of liquids
- B01D19/0031—Degasification of liquids by filtration
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/016—Diazonium salts or compounds
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/10—Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
- B05C11/1002—Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Coating Apparatus (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040081565A KR100643494B1 (ko) | 2004-10-13 | 2004-10-13 | 반도체 제조용 포토레지스트의 디스펜싱장치 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200618128A true TW200618128A (en) | 2006-06-01 |
Family
ID=36129123
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094131500A TW200618128A (en) | 2004-10-13 | 2005-09-13 | Method of and apparatus for dispensing photoresist in manufacturing semiconductor devices or the like |
Country Status (6)
Country | Link |
---|---|
US (1) | US7685963B2 (zh) |
JP (1) | JP2006114906A (zh) |
KR (1) | KR100643494B1 (zh) |
CN (1) | CN1766734A (zh) |
DE (1) | DE102005048262A1 (zh) |
TW (1) | TW200618128A (zh) |
Cited By (3)
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TWI621472B (zh) * | 2013-10-02 | 2018-04-21 | 東京威力科創股份有限公司 | 處理液供給裝置及處理液供給方法 |
TWI687594B (zh) * | 2013-03-15 | 2020-03-11 | 美商泰勒達數位影像美國公司 | 具有一快換馬達驅動、自動式氣體移除與流體回收系統以及其遠端監測、觀察與控制的綜合式泵系統和方法 |
TWI732235B (zh) * | 2018-06-29 | 2021-07-01 | 台灣積體電路製造股份有限公司 | 光阻劑分配系統及光阻劑的回收方法 |
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KR100766443B1 (ko) * | 2006-05-23 | 2007-10-11 | 주식회사 케이씨텍 | 슬릿 노즐의 폭방향 토출 균일도 측정 장치 및 방법 |
KR100766444B1 (ko) * | 2006-05-23 | 2007-10-11 | 주식회사 케이씨텍 | 슬릿 노즐의 폭방향 토출 균일도 측정 장치 및 방법 |
JP5060835B2 (ja) * | 2006-07-26 | 2012-10-31 | 芝浦メカトロニクス株式会社 | 基板の処理装置 |
JP5257915B2 (ja) * | 2006-09-29 | 2013-08-07 | 国立大学法人東北大学 | 膜塗布装置および膜塗布方法 |
US8865454B2 (en) * | 2007-03-22 | 2014-10-21 | Scandinavian Micro Biodevices Aps | Flow through system, flow through device and a method of performing a test |
CN101131541B (zh) * | 2007-10-15 | 2010-08-18 | 彩虹集团电子股份有限公司 | 感光胶液体的供给装置 |
JP5355881B2 (ja) * | 2007-12-05 | 2013-11-27 | 東京応化工業株式会社 | 塗布装置 |
JP4831061B2 (ja) * | 2007-12-26 | 2011-12-07 | パナソニック株式会社 | 電子部品実装用装置および電子部品実装用装置の非常停止方法 |
JP5231028B2 (ja) * | 2008-01-21 | 2013-07-10 | 東京エレクトロン株式会社 | 塗布液供給装置 |
US20090214782A1 (en) * | 2008-02-21 | 2009-08-27 | Forrest Stephen R | Organic vapor jet printing system |
CN101762984B (zh) * | 2008-12-25 | 2012-08-22 | 中芯国际集成电路制造(上海)有限公司 | 光刻胶滴注***、光刻胶喷嘴及其使用方法 |
CN102274812B (zh) * | 2011-06-30 | 2014-04-23 | 深圳市华星光电技术有限公司 | 一种涂胶***及其涂胶方法 |
JP5741549B2 (ja) * | 2012-10-09 | 2015-07-01 | 東京エレクトロン株式会社 | 処理液供給方法、処理液供給装置及び記憶媒体 |
US9656197B2 (en) * | 2012-11-12 | 2017-05-23 | Pall Corporation | Systems and methods for conditioning a filter assembly |
KR101456458B1 (ko) * | 2013-06-19 | 2014-10-31 | 주식회사 나래나노텍 | 개선된 hmds 공급 장치 및 방법, 및 개선된 약액 공급 장치 및 방법 |
US10074547B2 (en) * | 2013-12-19 | 2018-09-11 | Taiwan Semiconductor Manufacturing Co., Ltd. | Photoresist nozzle device and photoresist supply system |
US9718082B2 (en) * | 2014-01-26 | 2017-08-01 | Tokyo Electron Limited | Inline dispense capacitor |
CN103910493B (zh) * | 2014-03-21 | 2016-05-04 | 京东方科技集团股份有限公司 | 光刻胶回收装置,涂布***及涂布方法 |
CN103894312B (zh) * | 2014-03-28 | 2016-04-13 | 郑州格兰高环境工程有限公司 | 智能移动式胶水补给*** |
CN105728243A (zh) * | 2014-12-08 | 2016-07-06 | 沈阳芯源微电子设备有限公司 | 一种光刻胶喷头保湿装置及其保湿方法 |
SG11201804657QA (en) * | 2015-12-09 | 2018-06-28 | Acm Res Shanghai Inc | Method and apparatus for cleaning substrates using high temperature chemicals and ultrasonic device |
JP2016189493A (ja) * | 2016-08-09 | 2016-11-04 | 東京エレクトロン株式会社 | 液処理方法、液処理装置及び記憶媒体 |
US10403501B2 (en) * | 2016-08-11 | 2019-09-03 | Tokyo Electron Limited | High-purity dispense system |
US10354872B2 (en) | 2016-08-11 | 2019-07-16 | Tokyo Electron Limited | High-precision dispense system with meniscus control |
KR102394995B1 (ko) | 2016-08-11 | 2022-05-04 | 도쿄엘렉트론가부시키가이샤 | 고순도 분배 유닛 |
CN106890768A (zh) * | 2017-04-24 | 2017-06-27 | 桂林紫竹乳胶制品有限公司 | 一种避孕套润滑剂滴加装置 |
CN107121897A (zh) * | 2017-05-25 | 2017-09-01 | 上海华力微电子有限公司 | 一种光刻胶管路设计 |
CN107899781A (zh) * | 2017-11-16 | 2018-04-13 | 上海华力微电子有限公司 | 一种新型的实时监控光刻胶喷涂***及工作方法 |
US11273396B2 (en) * | 2018-08-31 | 2022-03-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Liquid supply system with improved bubble venting capacity |
KR102221258B1 (ko) * | 2018-09-27 | 2021-03-02 | 세메스 주식회사 | 약액 토출 장치 |
CN109569081B (zh) | 2018-12-04 | 2021-02-26 | 惠科股份有限公司 | 过滤装置和光阻涂布*** |
KR20200126552A (ko) | 2019-04-30 | 2020-11-09 | 삼성전자주식회사 | 다중 필터들을 가진 레지스트 필터링 시스템 및 레지스트 코팅 설비 |
CN112786479B (zh) * | 2019-11-08 | 2022-12-02 | 夏泰鑫半导体(青岛)有限公司 | 管理液体供应的***与方法 |
CN114345644B (zh) * | 2020-10-13 | 2023-10-20 | 中国科学院微电子研究所 | 光刻胶输送*** |
CN113187741B (zh) * | 2021-04-29 | 2022-12-02 | 长鑫存储技术有限公司 | 液体回吸***及回吸方法 |
CN115487998A (zh) * | 2021-06-17 | 2022-12-20 | 上海集成电路材料研究院有限公司 | 高通量光刻胶配胶曝光一体化设备及光刻工艺 |
KR20230051888A (ko) * | 2021-10-12 | 2023-04-19 | 삼성전자주식회사 | 감광액 공급 시스템 및 이를 이용한 반도체 장치의 제조 방법 |
CN116273729B (zh) * | 2023-01-28 | 2023-10-20 | 中山市美速光电技术有限公司 | 一种用于超微间距光纤阵列的点胶装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2803859B2 (ja) * | 1989-09-29 | 1998-09-24 | 株式会社日立製作所 | 流動体供給装置およびその制御方法 |
US5585466A (en) * | 1994-12-06 | 1996-12-17 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Crystals of serum albumin for use in genetic engineering and rational drug design |
US5858466A (en) * | 1996-06-24 | 1999-01-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Photoresist supply system with air venting |
US6171367B1 (en) * | 1997-06-05 | 2001-01-09 | Taiwan Semiconductor Manufacturing Co., Ltd | Method and apparatus for delivering and recycling a bubble-free liquid chemical |
US6616760B2 (en) * | 1999-12-17 | 2003-09-09 | Tokyo Electron Limited | Film forming unit |
US6848625B2 (en) * | 2002-03-19 | 2005-02-01 | Tokyo Electron Limited | Process liquid supply mechanism and process liquid supply method |
-
2004
- 2004-10-13 KR KR1020040081565A patent/KR100643494B1/ko not_active IP Right Cessation
-
2005
- 2005-09-07 US US11/219,662 patent/US7685963B2/en not_active Expired - Fee Related
- 2005-09-13 TW TW094131500A patent/TW200618128A/zh unknown
- 2005-10-07 DE DE102005048262A patent/DE102005048262A1/de not_active Withdrawn
- 2005-10-11 JP JP2005296755A patent/JP2006114906A/ja active Pending
- 2005-10-13 CN CN200510113645.7A patent/CN1766734A/zh active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI687594B (zh) * | 2013-03-15 | 2020-03-11 | 美商泰勒達數位影像美國公司 | 具有一快換馬達驅動、自動式氣體移除與流體回收系統以及其遠端監測、觀察與控制的綜合式泵系統和方法 |
TWI621472B (zh) * | 2013-10-02 | 2018-04-21 | 東京威力科創股份有限公司 | 處理液供給裝置及處理液供給方法 |
TWI732235B (zh) * | 2018-06-29 | 2021-07-01 | 台灣積體電路製造股份有限公司 | 光阻劑分配系統及光阻劑的回收方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20060032674A (ko) | 2006-04-18 |
KR100643494B1 (ko) | 2006-11-10 |
US20060075965A1 (en) | 2006-04-13 |
CN1766734A (zh) | 2006-05-03 |
DE102005048262A1 (de) | 2006-04-27 |
US7685963B2 (en) | 2010-03-30 |
JP2006114906A (ja) | 2006-04-27 |
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