SG11201508398TA - Silicon wafer polishing composition - Google Patents
Silicon wafer polishing compositionInfo
- Publication number
- SG11201508398TA SG11201508398TA SG11201508398TA SG11201508398TA SG11201508398TA SG 11201508398T A SG11201508398T A SG 11201508398TA SG 11201508398T A SG11201508398T A SG 11201508398TA SG 11201508398T A SG11201508398T A SG 11201508398TA SG 11201508398T A SG11201508398T A SG 11201508398TA
- Authority
- SG
- Singapore
- Prior art keywords
- silicon wafer
- polishing composition
- wafer polishing
- composition
- silicon
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
- B24B37/044—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1436—Composite particles, e.g. coated particles
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02024—Mirror polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Mechanical Engineering (AREA)
- Composite Materials (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013120328 | 2013-06-07 | ||
JP2014010836 | 2014-01-23 | ||
PCT/JP2014/062176 WO2014196299A1 (ja) | 2013-06-07 | 2014-05-02 | シリコンウエハ研磨用組成物 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201508398TA true SG11201508398TA (en) | 2015-11-27 |
Family
ID=52007952
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201508398TA SG11201508398TA (en) | 2013-06-07 | 2014-05-02 | Silicon wafer polishing composition |
Country Status (8)
Country | Link |
---|---|
US (2) | US20160122591A1 (zh) |
EP (1) | EP3007213B1 (zh) |
JP (2) | JP6037416B2 (zh) |
KR (1) | KR102239045B1 (zh) |
CN (1) | CN105264647B (zh) |
SG (1) | SG11201508398TA (zh) |
TW (1) | TWI650410B (zh) |
WO (1) | WO2014196299A1 (zh) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6403324B2 (ja) * | 2014-12-25 | 2018-10-10 | 花王株式会社 | シリコンウェーハ用研磨液組成物 |
JP6366139B2 (ja) * | 2014-12-25 | 2018-08-01 | 花王株式会社 | シリコンウェーハ用研磨液組成物の製造方法 |
US10748778B2 (en) | 2015-02-12 | 2020-08-18 | Fujimi Incorporated | Method for polishing silicon wafer and surface treatment composition |
KR102520942B1 (ko) * | 2015-02-12 | 2023-04-13 | 가부시키가이샤 후지미인코퍼레이티드 | 실리콘 웨이퍼의 연마 방법 및 표면 처리 조성물 |
JP6654696B2 (ja) * | 2015-07-10 | 2020-02-26 | フエロ コーポレーション | 有機ポリマー系眼用基材を研磨するためのスラリー組成物及び方法、並びに眼用レンズ |
JP6801964B2 (ja) * | 2016-01-19 | 2020-12-16 | 株式会社フジミインコーポレーテッド | 研磨用組成物及びシリコン基板の研磨方法 |
KR102645587B1 (ko) * | 2016-02-29 | 2024-03-11 | 가부시키가이샤 후지미인코퍼레이티드 | 연마용 조성물 및 이것을 사용한 연마 방법 |
WO2018055941A1 (ja) * | 2016-09-21 | 2018-03-29 | 株式会社フジミインコーポレーテッド | 表面処理組成物 |
JP7275025B2 (ja) * | 2017-03-31 | 2023-05-17 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
JP6916039B2 (ja) * | 2017-06-05 | 2021-08-11 | Atシリカ株式会社 | 研磨用組成物 |
JP7303111B2 (ja) | 2017-11-06 | 2023-07-04 | 株式会社フジミインコーポレーテッド | 研磨用組成物およびその製造方法 |
JP7353051B2 (ja) * | 2019-03-26 | 2023-09-29 | 株式会社フジミインコーポレーテッド | シリコンウェーハ研磨用組成物 |
JP7356248B2 (ja) * | 2019-03-28 | 2023-10-04 | 株式会社フジミインコーポレーテッド | リンス用組成物およびリンス方法 |
CN110922897B (zh) * | 2019-11-18 | 2024-03-08 | 宁波日晟新材料有限公司 | 一种用于硅化合物的低雾值无损伤抛光液及其制备方法 |
JP7512035B2 (ja) * | 2019-12-24 | 2024-07-08 | ニッタ・デュポン株式会社 | 研磨用組成物 |
JPWO2021182276A1 (zh) * | 2020-03-13 | 2021-09-16 | ||
JP2024523285A (ja) * | 2021-06-14 | 2024-06-28 | インテグリス・インコーポレーテッド | 硬質基板の研削 |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100447551B1 (ko) * | 1999-01-18 | 2004-09-08 | 가부시끼가이샤 도시바 | 복합 입자 및 그의 제조 방법, 수계 분산체, 화학 기계연마용 수계 분산체 조성물 및 반도체 장치의 제조 방법 |
KR20010046395A (ko) * | 1999-11-12 | 2001-06-15 | 안복현 | 연마용 조성물 |
CN100377310C (zh) * | 2003-01-31 | 2008-03-26 | 日立化成工业株式会社 | Cmp研磨剂以及研磨方法 |
TWI361218B (en) | 2005-04-14 | 2012-04-01 | Showa Denko Kk | Polishing composition |
EP2410558A3 (en) | 2005-11-11 | 2012-04-18 | Hitachi Chemical Co., Ltd. | Polishing slurry for silicon oxide, additive liquid and polishing method |
TWI437083B (zh) * | 2006-07-28 | 2014-05-11 | Showa Denko Kk | 研磨組成物 |
JP2008091524A (ja) * | 2006-09-29 | 2008-04-17 | Fujifilm Corp | 金属用研磨液 |
JP2008181955A (ja) * | 2007-01-23 | 2008-08-07 | Fujifilm Corp | 金属用研磨液及びそれを用いた研磨方法 |
JP2009123880A (ja) * | 2007-11-14 | 2009-06-04 | Showa Denko Kk | 研磨組成物 |
KR101564676B1 (ko) * | 2008-02-01 | 2015-11-02 | 가부시키가이샤 후지미인코퍼레이티드 | 연마용 조성물 및 이를 이용한 연마 방법 |
WO2009104517A1 (ja) * | 2008-02-18 | 2009-08-27 | Jsr株式会社 | 化学機械研磨用水系分散体および化学機械研磨方法 |
US8652350B2 (en) * | 2008-02-27 | 2014-02-18 | Jsr Corporation | Chemical mechanical polishing aqueous dispersion, chemical mechanical polishing method using the same, and method of recycling chemical mechanical polishing aqueous dispersion |
TWI546373B (zh) * | 2008-04-23 | 2016-08-21 | 日立化成股份有限公司 | 研磨劑及其製造方法、基板研磨方法以及研磨劑套組及其製造方法 |
JP5413456B2 (ja) * | 2009-04-20 | 2014-02-12 | 日立化成株式会社 | 半導体基板用研磨液及び半導体基板の研磨方法 |
SG177270A1 (en) | 2009-07-15 | 2012-02-28 | Lam Res Corp | Materials and systems for advanced substrate cleaning |
WO2011058952A1 (ja) * | 2009-11-11 | 2011-05-19 | 株式会社クラレ | 化学的機械的研磨用スラリー並びにそれを用いる基板の研磨方法 |
JP4772156B1 (ja) | 2010-07-05 | 2011-09-14 | 花王株式会社 | シリコンウエハ用研磨液組成物 |
KR101907229B1 (ko) * | 2011-02-03 | 2018-10-11 | 니타 하스 인코포레이티드 | 연마용 조성물 및 그것을 이용한 연마 방법 |
SG10201606827RA (en) * | 2012-02-21 | 2016-10-28 | Hitachi Chemical Co Ltd | Polishing agent, polishing agent set, and substrate polishing method |
JP5822356B2 (ja) * | 2012-04-17 | 2015-11-24 | 花王株式会社 | シリコンウェーハ用研磨液組成物 |
-
2014
- 2014-05-02 SG SG11201508398TA patent/SG11201508398TA/en unknown
- 2014-05-02 EP EP14807048.5A patent/EP3007213B1/en active Active
- 2014-05-02 KR KR1020157034595A patent/KR102239045B1/ko active IP Right Grant
- 2014-05-02 WO PCT/JP2014/062176 patent/WO2014196299A1/ja active Application Filing
- 2014-05-02 CN CN201480032514.3A patent/CN105264647B/zh active Active
- 2014-05-02 US US14/895,318 patent/US20160122591A1/en not_active Abandoned
- 2014-05-02 JP JP2015521346A patent/JP6037416B2/ja active Active
- 2014-05-21 TW TW103117769A patent/TWI650410B/zh active
-
2016
- 2016-07-08 JP JP2016135649A patent/JP6360108B2/ja active Active
-
2017
- 2017-05-23 US US15/602,679 patent/US10745588B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
TW201510197A (zh) | 2015-03-16 |
EP3007213B1 (en) | 2020-03-18 |
JPWO2014196299A1 (ja) | 2017-02-23 |
WO2014196299A1 (ja) | 2014-12-11 |
KR102239045B1 (ko) | 2021-04-12 |
JP6360108B2 (ja) | 2018-07-18 |
CN105264647A (zh) | 2016-01-20 |
TWI650410B (zh) | 2019-02-11 |
US20170253767A1 (en) | 2017-09-07 |
EP3007213A1 (en) | 2016-04-13 |
US20160122591A1 (en) | 2016-05-05 |
US10745588B2 (en) | 2020-08-18 |
KR20160013896A (ko) | 2016-02-05 |
JP2016201557A (ja) | 2016-12-01 |
EP3007213A4 (en) | 2017-02-22 |
JP6037416B2 (ja) | 2016-12-07 |
CN105264647B (zh) | 2018-01-09 |
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