PT1038186E - Tomada de teste - Google Patents

Tomada de teste

Info

Publication number
PT1038186E
PT1038186E PT99970473T PT99970473T PT1038186E PT 1038186 E PT1038186 E PT 1038186E PT 99970473 T PT99970473 T PT 99970473T PT 99970473 T PT99970473 T PT 99970473T PT 1038186 E PT1038186 E PT 1038186E
Authority
PT
Portugal
Prior art keywords
contact pin
housing
test socket
elastomers
contact
Prior art date
Application number
PT99970473T
Other languages
English (en)
Inventor
Un-Young Chung
Original Assignee
Un-Young Chung
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=27483286&utm_source=***_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=PT1038186(E) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from KR2019980019351U external-priority patent/KR19990003962U/ko
Priority claimed from KR2019990008830U external-priority patent/KR19990034968U/ko
Application filed by Un-Young Chung filed Critical Un-Young Chung
Publication of PT1038186E publication Critical patent/PT1038186E/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Dry Shavers And Clippers (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
PT99970473T 1998-10-10 1999-10-08 Tomada de teste PT1038186E (pt)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR2019980019351U KR19990003962U (ko) 1998-10-10 1998-10-10 반도체소자 검사용 소켓 어셈블리
KR19980023017 1998-11-25
KR19980023018 1998-11-25
KR2019990008830U KR19990034968U (ko) 1999-05-21 1999-05-21 콘택트핑거를이용한반도체검사용소켓어셈블리

Publications (1)

Publication Number Publication Date
PT1038186E true PT1038186E (pt) 2005-08-31

Family

ID=27483286

Family Applications (1)

Application Number Title Priority Date Filing Date
PT99970473T PT1038186E (pt) 1998-10-10 1999-10-08 Tomada de teste

Country Status (12)

Country Link
US (1) US6448803B1 (pt)
EP (1) EP1038186B1 (pt)
JP (1) JP2002527868A (pt)
KR (1) KR100333526B1 (pt)
AT (1) ATE296448T1 (pt)
AU (1) AU6009399A (pt)
DE (1) DE69925456T2 (pt)
ES (1) ES2242451T3 (pt)
MY (1) MY122475A (pt)
PT (1) PT1038186E (pt)
TW (1) TW535333B (pt)
WO (1) WO2000022445A1 (pt)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100964848B1 (ko) * 2001-12-28 2010-06-24 니혼 하츠쵸 가부시키가이샤 검사용소켓
DE10300532B4 (de) * 2003-01-09 2010-11-11 Qimonda Ag System mit mindestens einer Test-Sockel-Vorrichtung zum Testen von Halbleiter-Bauelementen
DE10300531A1 (de) * 2003-01-09 2004-07-29 Infineon Technologies Ag Sockel- bzw. Adapter-Vorrichtung, insbesondere für Halbleiter-Bauelemente, Verfahren zum Testen von Halbleiter-Bauelementen, sowie System mit mindestens einer Sockel- bzw. Adapter-Vorrichtung
JP4957792B2 (ja) * 2007-03-29 2012-06-20 富士通株式会社 コネクタ、電子装置、及び、電子装置の製造方法
TW201107757A (en) * 2009-08-26 2011-03-01 Kodi S Co Ltd Contact-type integrated circuit probe unit for inspecting monitor and manufacture method thereof
US8337217B2 (en) * 2011-03-29 2012-12-25 Digi International Inc. Socket for surface mount module
US10037933B2 (en) * 2014-06-20 2018-07-31 Xcerra Corporation Test socket assembly and related methods
USD813171S1 (en) * 2016-04-08 2018-03-20 Abb Schweiz Ag Cover for an electric connector
USD824859S1 (en) * 2016-04-08 2018-08-07 Abb Schweiz Ag Electric connector
JP6627655B2 (ja) * 2016-06-17 2020-01-08 オムロン株式会社 ソケット
CN106340469B (zh) * 2016-11-16 2023-06-23 长电科技（滁州）有限公司 一种测试凹槽可调式晶体管封装体测试座及其操作方法
CN107742814A (zh) * 2017-09-25 2018-02-27 郑州华力信息技术有限公司 线夹孔心***
CN108318713B (zh) * 2018-01-30 2020-11-03 兰州大学 基于压力调节夹持面积和数量的接触电阻测试夹持装置
CN109085391B (zh) * 2018-09-19 2020-12-22 四川爱联科技股份有限公司 电子设备测试装置及电子设备
CN109870657A (zh) * 2019-02-14 2019-06-11 株洲福德轨道交通研究院有限公司 浮动插头组件
KR20230043016A (ko) 2021-09-23 2023-03-30 주식회사 지디텍 반도체 검사 소켓장치

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3517144A (en) * 1969-01-23 1970-06-23 Us Army Integrated circuit package programmable test socket
US4547031A (en) * 1984-06-29 1985-10-15 Amp Incorporated Chip carrier socket and contact
US4735580A (en) * 1986-12-22 1988-04-05 Itt Corporation Test adapter for integrated circuit carrier
JP2784570B2 (ja) * 1987-06-09 1998-08-06 日本テキサス・インスツルメンツ 株式会社 ソケツト
US4962356A (en) 1988-08-19 1990-10-09 Cray Research, Inc. Integrated circuit test socket
US5069629A (en) * 1991-01-09 1991-12-03 Johnson David A Electrical interconnect contact system
US5634801A (en) * 1991-01-09 1997-06-03 Johnstech International Corporation Electrical interconnect contact system
US5388996A (en) * 1991-01-09 1995-02-14 Johnson; David A. Electrical interconnect contact system
JPH05343142A (ja) * 1992-06-02 1993-12-24 Minnesota Mining & Mfg Co <3M> Ｉｃソケット
KR960002806Y1 (ko) * 1992-07-08 1996-04-08 문정환 반도체 디바이스 테스트용 매뉴얼 소켓
JP3051596B2 (ja) * 1993-04-30 2000-06-12 フレッシュクエストコーポレーション 半導体チップテスト用ソケット
US5557212A (en) * 1994-11-18 1996-09-17 Isaac; George L. Semiconductor test socket and contacts
EP0726620B1 (en) * 1995-02-07 2003-06-18 Johnstech International Corporation Apparatus for providing controlled impedance in an electrical contact
KR0130142Y1 (ko) * 1995-06-01 1999-02-01 김주용 반도체 디바이스 테스트용 소켓
JP2922139B2 (ja) * 1995-09-19 1999-07-19 ユニテクノ株式会社 Ｉｃソケット
JP2908747B2 (ja) 1996-01-10 1999-06-21 三菱電機株式会社 Ｉｃソケット
KR100259060B1 (ko) * 1997-12-06 2000-06-15 신명순 반도체 칩 테스트 소켓 및 콘텍터 제조방법

Also Published As

Publication number Publication date
EP1038186B1 (en) 2005-05-25
ATE296448T1 (de) 2005-06-15
WO2000022445A1 (en) 2000-04-20
TW535333B (en) 2003-06-01
JP2002527868A (ja) 2002-08-27
US6448803B1 (en) 2002-09-10
MY122475A (en) 2006-04-29
AU6009399A (en) 2000-05-01
DE69925456D1 (de) 2005-06-30
ES2242451T3 (es) 2005-11-01
KR100333526B1 (ko) 2002-04-25
DE69925456T2 (de) 2006-02-02
KR20000028942A (ko) 2000-05-25
EP1038186A1 (en) 2000-09-27

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