KR20060100246A - 가스 공급 부재 및 처리 장치 - Google Patents
가스 공급 부재 및 처리 장치 Download PDFInfo
- Publication number
- KR20060100246A KR20060100246A KR1020060023794A KR20060023794A KR20060100246A KR 20060100246 A KR20060100246 A KR 20060100246A KR 1020060023794 A KR1020060023794 A KR 1020060023794A KR 20060023794 A KR20060023794 A KR 20060023794A KR 20060100246 A KR20060100246 A KR 20060100246A
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- KR
- South Korea
- Prior art keywords
- gas
- gas supply
- main body
- processing
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68735—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge profile or support profile
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/16—Constructional details or arrangements
- G06F1/20—Cooling means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/20—Modifications to facilitate cooling, ventilating, or heating
- H05K7/20009—Modifications to facilitate cooling, ventilating, or heating using a gaseous coolant in electronic enclosures
- H05K7/20136—Forced ventilation, e.g. by fans
- H05K7/20172—Fan mounting or fan specifications
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Theoretical Computer Science (AREA)
- Human Computer Interaction (AREA)
- General Engineering & Computer Science (AREA)
- Thermal Sciences (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Drying Of Semiconductors (AREA)
- Feeding And Controlling Fuel (AREA)
- Resistance Heating (AREA)
Abstract
Description
Claims (9)
- 처리 대상물을 유지하는 처리 부재와의 사이에 상기 처리 대상물상에 가스를 공급하는 가스 공급로를 형성하는 본체부를 구비하고,이 본체부에 상기 가스 공급로의 도중에 위치하는 가스 체류부가 형성되어 있는 것인 가스 공급 부재.
- 제1항에 있어서, 상기 본체부는 상기 처리 부재 측면과의 사이에 상기 가스 공급로를 형성하는 통 형상부를 갖는 것인 가스 공급 부재.
- 제1항에 있어서, 상기 본체부는 상기 처리 부재 상면과의 사이에 상기 가스 공급로를 형성하는 상판부를 갖는 것인 가스 공급 부재.
- 제1항에 있어서, 상기 가스 체류부는 상기 가스 흐름의 방향을 바꾸는 위치에 형성되어 있는 것인 가스 공급 부재.
- 제1항에 있어서, 상기 가스 체류부는 상기 가스 공급로의 위쪽에 형성되어 있는 것인 가스 공급 부재.
- 제1항에 있어서, 상기 본체부에는 복수의 상기 가스 체류부가 형성되어 있는 것인 가스 공급 부재.
- 제1항에 있어서, 상기 본체부는 세라믹스로 형성되어 있는 것인 가스 공급 부재.
- 처리 대상물을 유지하는 처리 부재와, 이 처리 부재의 주위에 배치된 가스 공급 부재를 구비하는 처리 장치로서,상기 가스 공급 부재는 상기 처리 부재와의 사이에 상기 처리 대상물상에 가스를 공급하는 가스 공급로를 형성하는 본체부를 구비하고,이 본체부에 상기 가스 공급로의 도중에 위치하는 가스 체류부가 형성되어 있는 것인 처리 장치.
- 제8항에 있어서, 상기 처리 부재는 상기 처리 대상물에 대하여 가열 처리를 행하는 가열 부재인 것인 처리 장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US66218805P | 2005-03-16 | 2005-03-16 | |
US60/662188 | 2005-03-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20060100246A true KR20060100246A (ko) | 2006-09-20 |
KR100766846B1 KR100766846B1 (ko) | 2007-10-18 |
Family
ID=36297303
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020060023794A KR100766846B1 (ko) | 2005-03-16 | 2006-03-15 | 가스 공급 부재 및 이를 포함하는 기판 처리 장치 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7632356B2 (ko) |
EP (1) | EP1703545B1 (ko) |
JP (1) | JP4590363B2 (ko) |
KR (1) | KR100766846B1 (ko) |
TW (1) | TWI321163B (ko) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8097120B2 (en) * | 2006-02-21 | 2012-01-17 | Lam Research Corporation | Process tuning gas injection from the substrate edge |
JP5179482B2 (ja) * | 2007-05-09 | 2013-04-10 | 株式会社アルバック | パージガスアセンブリ |
JP5141155B2 (ja) * | 2007-09-21 | 2013-02-13 | 東京エレクトロン株式会社 | 成膜装置 |
US8622021B2 (en) * | 2007-10-31 | 2014-01-07 | Lam Research Corporation | High lifetime consumable silicon nitride-silicon dioxide plasma processing components |
US10227695B2 (en) * | 2009-12-31 | 2019-03-12 | Applied Materials, Inc. | Shadow ring for modifying wafer edge and bevel deposition |
KR101092122B1 (ko) * | 2010-02-23 | 2011-12-12 | 주식회사 디엠에스 | 에칭 프로파일 제어를 위한 가스 인젝션 시스템 |
US9123762B2 (en) * | 2010-10-22 | 2015-09-01 | Applied Materials, Inc. | Substrate support with symmetrical feed structure |
JP5819154B2 (ja) | 2011-10-06 | 2015-11-18 | 株式会社日立ハイテクノロジーズ | プラズマエッチング装置 |
US9738975B2 (en) * | 2015-05-12 | 2017-08-22 | Lam Research Corporation | Substrate pedestal module including backside gas delivery tube and method of making |
JP2018073613A (ja) * | 2016-10-28 | 2018-05-10 | 京セラ株式会社 | ヒータ |
JP6837911B2 (ja) * | 2017-05-17 | 2021-03-03 | 株式会社Screenホールディングス | 熱処理装置 |
US20210114067A1 (en) * | 2019-10-18 | 2021-04-22 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor cleaning apparatus and method |
US20220049350A1 (en) * | 2020-08-13 | 2022-02-17 | Applied Materials, Inc. | Apparatus design for photoresist deposition |
US11818810B2 (en) * | 2021-03-26 | 2023-11-14 | Applied Materials, Inc. | Heater assembly with purge gap control and temperature uniformity for batch processing chambers |
US11976363B2 (en) * | 2021-08-19 | 2024-05-07 | Applied Materials, Inc. | Purge ring for pedestal assembly |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5447570A (en) * | 1990-04-23 | 1995-09-05 | Genus, Inc. | Purge gas in wafer coating area selection |
US5843233A (en) | 1990-07-16 | 1998-12-01 | Novellus Systems, Inc. | Exclusion guard and gas-based substrate protection for chemical vapor deposition apparatus |
US5695568A (en) * | 1993-04-05 | 1997-12-09 | Applied Materials, Inc. | Chemical vapor deposition chamber |
TW439094B (en) * | 1998-02-16 | 2001-06-07 | Komatsu Co Ltd | Apparatus for controlling temperature of substrate |
US6179924B1 (en) * | 1998-04-28 | 2001-01-30 | Applied Materials, Inc. | Heater for use in substrate processing apparatus to deposit tungsten |
US6494955B1 (en) * | 2000-02-15 | 2002-12-17 | Applied Materials, Inc. | Ceramic substrate support |
US6223447B1 (en) | 2000-02-15 | 2001-05-01 | Applied Materials, Inc. | Fastening device for a purge ring |
KR20010095696A (ko) * | 2000-04-11 | 2001-11-07 | 윤종용 | 파티클 오염을 방지하는 침전 고리를 구비한 정전척 |
JP4386606B2 (ja) * | 2001-11-08 | 2009-12-16 | 日本碍子株式会社 | 支持装置の製造方法 |
US6730175B2 (en) * | 2002-01-22 | 2004-05-04 | Applied Materials, Inc. | Ceramic substrate support |
JP4041722B2 (ja) * | 2002-11-05 | 2008-01-30 | キヤノンアネルバ株式会社 | プラズマ処理装置 |
-
2006
- 2006-03-10 JP JP2006065747A patent/JP4590363B2/ja active Active
- 2006-03-13 US US11/374,529 patent/US7632356B2/en active Active
- 2006-03-15 KR KR1020060023794A patent/KR100766846B1/ko active IP Right Grant
- 2006-03-15 TW TW095108704A patent/TWI321163B/zh active
- 2006-03-15 EP EP06251374A patent/EP1703545B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR100766846B1 (ko) | 2007-10-18 |
TWI321163B (en) | 2010-03-01 |
JP2006261665A (ja) | 2006-09-28 |
US7632356B2 (en) | 2009-12-15 |
JP4590363B2 (ja) | 2010-12-01 |
EP1703545A2 (en) | 2006-09-20 |
EP1703545A3 (en) | 2009-02-18 |
TW200706689A (en) | 2007-02-16 |
US20060207509A1 (en) | 2006-09-21 |
EP1703545B1 (en) | 2012-09-26 |
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