KR102648218B1 - 검사 장치 및 검사 방법 - Google Patents

검사 장치 및 검사 방법 Download PDF

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Publication number
KR102648218B1
KR102648218B1 KR1020210044999A KR20210044999A KR102648218B1 KR 102648218 B1 KR102648218 B1 KR 102648218B1 KR 1020210044999 A KR1020210044999 A KR 1020210044999A KR 20210044999 A KR20210044999 A KR 20210044999A KR 102648218 B1 KR102648218 B1 KR 102648218B1
Authority
KR
South Korea
Prior art keywords
potential side
electric cable
central conductor
circuit patterns
conductor
Prior art date
Application number
KR1020210044999A
Other languages
English (en)
Korean (ko)
Other versions
KR20210127874A (ko
Inventor
야스시 미야케
Original Assignee
야마하 파인 테크 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 야마하 파인 테크 가부시키가이샤 filed Critical 야마하 파인 테크 가부시키가이샤
Publication of KR20210127874A publication Critical patent/KR20210127874A/ko
Application granted granted Critical
Publication of KR102648218B1 publication Critical patent/KR102648218B1/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Relating To Insulation (AREA)
KR1020210044999A 2020-04-15 2021-04-07 검사 장치 및 검사 방법 KR102648218B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020072823A JP2021169951A (ja) 2020-04-15 2020-04-15 検査装置、及び検査方法
JPJP-P-2020-072823 2020-04-15

Publications (2)

Publication Number Publication Date
KR20210127874A KR20210127874A (ko) 2021-10-25
KR102648218B1 true KR102648218B1 (ko) 2024-03-18

Family

ID=76079842

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020210044999A KR102648218B1 (ko) 2020-04-15 2021-04-07 검사 장치 및 검사 방법

Country Status (3)

Country Link
JP (1) JP2021169951A (zh)
KR (1) KR102648218B1 (zh)
CN (2) CN113533908A (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115902356B (zh) * 2023-03-08 2023-05-26 华中科技大学 一种电力机车受电电压高频分量的非侵入式测量方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004045091A (ja) * 2002-07-09 2004-02-12 Oki Electric Ind Co Ltd 容量測定用装置及び容量測定方法
JP2010122097A (ja) * 2008-11-20 2010-06-03 Toshiba Corp 半導体集積回路装置及びプローブカード
JP2015010880A (ja) * 2013-06-27 2015-01-19 日置電機株式会社 絶縁検査装置
JP2019179875A (ja) 2018-03-30 2019-10-17 株式会社日本マイクロニクス プローバ

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5727976U (zh) 1980-12-27 1982-02-13
JP6553875B2 (ja) * 2014-01-17 2019-07-31 株式会社 堀場アドバンスドテクノ 電気特性測定装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004045091A (ja) * 2002-07-09 2004-02-12 Oki Electric Ind Co Ltd 容量測定用装置及び容量測定方法
JP2010122097A (ja) * 2008-11-20 2010-06-03 Toshiba Corp 半導体集積回路装置及びプローブカード
JP2015010880A (ja) * 2013-06-27 2015-01-19 日置電機株式会社 絶縁検査装置
JP2019179875A (ja) 2018-03-30 2019-10-17 株式会社日本マイクロニクス プローバ

Also Published As

Publication number Publication date
CN213337870U (zh) 2021-06-01
CN113533908A (zh) 2021-10-22
JP2021169951A (ja) 2021-10-28
KR20210127874A (ko) 2021-10-25

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