KR102342479B1 - 다이싱 다이 본딩 필름, 다이싱 다이 본딩 테이프 및 반도체 장치의 제조 방법 - Google Patents
다이싱 다이 본딩 필름, 다이싱 다이 본딩 테이프 및 반도체 장치의 제조 방법 Download PDFInfo
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- KR102342479B1 KR102342479B1 KR1020170049073A KR20170049073A KR102342479B1 KR 102342479 B1 KR102342479 B1 KR 102342479B1 KR 1020170049073 A KR1020170049073 A KR 1020170049073A KR 20170049073 A KR20170049073 A KR 20170049073A KR 102342479 B1 KR102342479 B1 KR 102342479B1
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- 239000011701 zinc Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68327—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used during dicing or grinding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68354—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used to support diced chips prior to mounting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68381—Details of chemical or physical process used for separating the auxiliary support from a device or wafer
- H01L2221/68386—Separation by peeling
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Dicing (AREA)
- Adhesive Tapes (AREA)
- Adhesives Or Adhesive Processes (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2016-086297 | 2016-04-22 | ||
| JP2016086297A JP6721398B2 (ja) | 2016-04-22 | 2016-04-22 | ダイシングダイボンディングフィルム、ダイシングダイボンディングテープおよび半導体装置の製造方法 |
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| Publication Number | Publication Date |
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| KR20170121065A KR20170121065A (ko) | 2017-11-01 |
| KR102342479B1 true KR102342479B1 (ko) | 2021-12-24 |
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| KR1020170049073A KR102342479B1 (ko) | 2016-04-22 | 2017-04-17 | 다이싱 다이 본딩 필름, 다이싱 다이 본딩 테이프 및 반도체 장치의 제조 방법 |
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| JP (1) | JP6721398B2 (ja) |
| KR (1) | KR102342479B1 (ja) |
| CN (1) | CN107331645A (ja) |
| TW (1) | TWI734774B (ja) |
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| JP2000038556A (ja) * | 1998-07-22 | 2000-02-08 | Nitto Denko Corp | 半導体ウエハ保持保護用ホットメルトシート及びその貼り付け方法 |
| JP4477346B2 (ja) | 2003-12-05 | 2010-06-09 | 古河電気工業株式会社 | 半導体ダイシング用粘接着テープ |
| JP4993662B2 (ja) * | 2005-05-12 | 2012-08-08 | 日東電工株式会社 | ダイシング用粘着シート、及びそれを用いたダイシング方法 |
| JP2007027474A (ja) * | 2005-07-19 | 2007-02-01 | Denki Kagaku Kogyo Kk | ウエハフルカット用ダイシングテープの基材フィルム及びそれを有するウエハフルカット用ダイシングテープ |
| JP2007031535A (ja) * | 2005-07-26 | 2007-02-08 | Denki Kagaku Kogyo Kk | 粘着シートおよびそれを用いた電子部品の製造方法。 |
| JP5140910B2 (ja) | 2005-08-30 | 2013-02-13 | 住友ベークライト株式会社 | フィルム基材および半導体ウエハ加工用粘着テープ |
| KR101488047B1 (ko) * | 2007-07-19 | 2015-01-30 | 세키스이가가쿠 고교가부시키가이샤 | 다이싱-다이본딩 테이프 및 반도체 칩의 제조 방법 |
| JP4717051B2 (ja) * | 2007-11-08 | 2011-07-06 | 日東電工株式会社 | ダイシング・ダイボンドフィルム |
| JP4801127B2 (ja) * | 2008-09-01 | 2011-10-26 | 日東電工株式会社 | ダイシング・ダイボンドフィルムの製造方法 |
| CN102421865B (zh) * | 2009-05-12 | 2013-11-13 | 电气化学工业株式会社 | 粘合剂、粘合片及电子元件的制造方法 |
| KR101083959B1 (ko) * | 2010-02-01 | 2011-11-16 | 닛토덴코 가부시키가이샤 | 반도체 장치 제조용 필름 및 반도체 장치의 제조 방법 |
| JP4976532B2 (ja) * | 2010-09-06 | 2012-07-18 | 日東電工株式会社 | 半導体装置用フィルム |
| JP2012209363A (ja) | 2011-03-29 | 2012-10-25 | Sumitomo Bakelite Co Ltd | ダイシングフィルム |
| CN103013365A (zh) * | 2011-09-23 | 2013-04-03 | 古河电气工业株式会社 | 晶片加工用带 |
| WO2013069784A1 (ja) * | 2011-11-10 | 2013-05-16 | カモ井加工紙株式会社 | 粘着テープ及びマスカー |
| JP6542504B2 (ja) * | 2013-02-20 | 2019-07-10 | 日東電工株式会社 | フィルム状接着剤、フィルム状接着剤付きダイシングテープ、半導体装置の製造方法、及び半導体装置 |
| WO2017098736A1 (ja) * | 2015-12-08 | 2017-06-15 | リンテック株式会社 | ダイシングシートおよびダイシングシートの製造方法 |
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| WO2016052444A1 (ja) * | 2014-09-29 | 2016-04-07 | リンテック株式会社 | 半導体ウエハ加工用シート用基材、半導体ウエハ加工用シート、および半導体装置の製造方法 |
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| Publication number | Publication date |
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| TW201805385A (zh) | 2018-02-16 |
| CN107331645A (zh) | 2017-11-07 |
| TWI734774B (zh) | 2021-08-01 |
| JP6721398B2 (ja) | 2020-07-15 |
| JP2017195336A (ja) | 2017-10-26 |
| KR20170121065A (ko) | 2017-11-01 |
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