KR100470227B1 - 화학기계적 연마장치의 캐리어 헤드 - Google Patents
화학기계적 연마장치의 캐리어 헤드 Download PDFInfo
- Publication number
- KR100470227B1 KR100470227B1 KR10-2001-0031788A KR20010031788A KR100470227B1 KR 100470227 B1 KR100470227 B1 KR 100470227B1 KR 20010031788 A KR20010031788 A KR 20010031788A KR 100470227 B1 KR100470227 B1 KR 100470227B1
- Authority
- KR
- South Korea
- Prior art keywords
- wafer
- membrane
- support assembly
- holder
- carrier head
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/0053—Control means for lapping machines or devices detecting loss or breakage of a workpiece during lapping
Abstract
Description
Claims (8)
- 캐리어 구동샤프트에 의하여 구동되는 캐리어 하우징(1)과, 상기 캐리어 하우징(1)의 하부 중앙에 설치된 링 형상의 홀더 하우징(3)과, 상기 홀더 하우징(3)의 내벽을 따라 상하로 수직 이동 가능한 웨이퍼 지지조립체(6)와, 상기 웨이퍼 지지조립체(6)를 상기 홀더 하우징(3)의 중앙에 형성한 내벽을 따라 상하로 이동시킬 수 있도록 구성되는 장착챔버(10)를 포함하는 화학기계적 연마장치의 캐리어 헤드에 있어서,상기 웨이퍼 지지조립체(6)는 그 내부에 가압 가능한 조정챔버(13)와 중앙에 구멍이 형성된 멤브레인(12)을 포함하며, 연마작업 중에 상기 조정챔버(13)의 내부에 유입된 가압유체는 상기 멤브레인(12)이 외측으로 팽창하도록 하여 웨이퍼의 뒷면의 일부분에 힘을 미치도록 하고, 상기 멤브레인(12)의 중앙부에 형성된 모서리부는 상기 조정챔버(13)의 내측부로 인입되어 진공파이프(35)에 연결되어 상기 웨이퍼 지지조립체(6)의 흡착수단을 이루며,상기 웨이퍼 지지조립체(6)의 외측에는 상기 웨이퍼 지지조립체(6)의 상하이동과는 별도로 상기 웨이퍼 지지조립체(6)의 하면을 기준으로 하여 그 하면과 수직방향으로 이동이 가능하도록 유지링(7)을 설치하고,상기 유지링(7)의 외측에는 상기 웨이퍼 지지조립체(6)의 상하이동과는 별도로 상기 웨이퍼 지지조립체(6)의 하면을 기준으로 하여 그 하면과 수직방향으로 이동이 가능하도록 컨디셔너(37)가 설치되는 것을 특징으로 하는 화학기계적 연마장치의 캐리어 헤드.
- 제 1 항에 있어서, 상기 웨이퍼 지지조립체(6)는 홀더 하우징(3)의 중앙에 형성한 구멍에 삽입되어 수직으로 이동 가능한 홀더샤프트(5)와, 상기 홀더샤프트(5)의 하부에 장착되는 멤브레인 상부홀더(8)와, 상기 멤브레인 상부홀더(8)의 하부에 위치하는 멤브레인 하부홀더(11)와, 상기 멤브레인 상부홀더(8)와 멤브레인 하부홀더(11)에 의해서 양 단부가 고정되어 웨이퍼(60)의 장착면을 제공하는 멤브레인(12)을 포함하여 이루어지는 것을 특징으로 하는 화학기계적 연마장치의 캐리어 헤드.
- 삭제
- 삭제
- 삭제
- 삭제
- 제 1 항에 있어서, 상기 진공파이프(35)에 세정액을 공급하는 세정장치가 추가로 구성되는 것을 특징으로 하는 화학기계적 연마장치의 캐리어 헤드.
- 제 1 항에 있어서, 상기 진공파이프(35)와 연결되어 그 진공압력을 측정할 수 있는 측정수단이 더 포함되는 것을 특징으로 하는 화학기계적 연마장치의 캐리어 헤드.
Priority Applications (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0031788A KR100470227B1 (ko) | 2001-06-07 | 2001-06-07 | 화학기계적 연마장치의 캐리어 헤드 |
AT02788980T ATE411612T1 (de) | 2001-06-07 | 2002-11-21 | Trägerkopf für chemisch-mechanische poliervorrichtung |
CNB028300696A CN100390942C (zh) | 2001-06-07 | 2002-11-21 | 用于化学机械抛光装置的托架头 |
DE60229449T DE60229449D1 (de) | 2001-06-07 | 2002-11-21 | Trägerkopf für chemisch-mechanische poliervorrichtung |
EP02788980A EP1568074B1 (en) | 2001-06-07 | 2002-11-21 | Carrier head for chemical mechanical polishing apparatus |
AU2002353628A AU2002353628A1 (en) | 2001-06-07 | 2002-11-21 | Carrier head for chemical mechanical polishing apparatus |
PCT/KR2002/002176 WO2004075275A1 (en) | 2001-06-07 | 2002-11-21 | Carrier head for chemical mechanical polishing apparatus |
JP2004568513A JP2006507691A (ja) | 2001-06-07 | 2002-11-21 | 化学機械的研磨装置のキャリアヘッド |
US11/133,148 US7121934B2 (en) | 2001-06-07 | 2005-05-18 | Carrier head for chemical mechanical polishing apparatus |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0031788A KR100470227B1 (ko) | 2001-06-07 | 2001-06-07 | 화학기계적 연마장치의 캐리어 헤드 |
PCT/KR2002/002176 WO2004075275A1 (en) | 2001-06-07 | 2002-11-21 | Carrier head for chemical mechanical polishing apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20020094079A KR20020094079A (ko) | 2002-12-18 |
KR100470227B1 true KR100470227B1 (ko) | 2005-02-05 |
Family
ID=33422235
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2001-0031788A KR100470227B1 (ko) | 2001-06-07 | 2001-06-07 | 화학기계적 연마장치의 캐리어 헤드 |
Country Status (9)
Country | Link |
---|---|
US (1) | US7121934B2 (ko) |
EP (1) | EP1568074B1 (ko) |
JP (1) | JP2006507691A (ko) |
KR (1) | KR100470227B1 (ko) |
CN (1) | CN100390942C (ko) |
AT (1) | ATE411612T1 (ko) |
AU (1) | AU2002353628A1 (ko) |
DE (1) | DE60229449D1 (ko) |
WO (1) | WO2004075275A1 (ko) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7687876B2 (en) | 2005-04-25 | 2010-03-30 | Smoltek Ab | Controlled growth of a nanostructure on a substrate |
KR100647041B1 (ko) * | 2005-06-17 | 2006-11-23 | 두산디앤디 주식회사 | 영역분할 연마 프로파일의 경계부 이상연마 제어기능을갖는 화학기계적 연마장치용 캐리어 헤드 |
US7777291B2 (en) | 2005-08-26 | 2010-08-17 | Smoltek Ab | Integrated circuits having interconnects and heat dissipators based on nanostructures |
US7364496B2 (en) * | 2006-03-03 | 2008-04-29 | Inopla Inc. | Polishing head for polishing semiconductor wafers |
US7699688B2 (en) | 2006-11-22 | 2010-04-20 | Applied Materials, Inc. | Carrier ring for carrier head |
US7654888B2 (en) | 2006-11-22 | 2010-02-02 | Applied Materials, Inc. | Carrier head with retaining ring and carrier ring |
CN104600057B (zh) | 2007-09-12 | 2018-11-02 | 斯莫特克有限公司 | 使用纳米结构连接和粘接相邻层 |
JP5464820B2 (ja) * | 2007-10-29 | 2014-04-09 | 株式会社荏原製作所 | 研磨装置 |
RU2010138584A (ru) | 2008-02-25 | 2012-04-10 | Смольтек Аб (Se) | Осаждение и селективное удаление электропроводного вспомогательного слоя для обработки наноструктуры |
JP5392483B2 (ja) * | 2009-08-31 | 2014-01-22 | 不二越機械工業株式会社 | 研磨装置 |
US9233452B2 (en) * | 2012-10-29 | 2016-01-12 | Wayne O. Duescher | Vacuum-grooved membrane abrasive polishing wafer workholder |
US10532441B2 (en) * | 2012-11-30 | 2020-01-14 | Applied Materials, Inc. | Three-zone carrier head and flexible membrane |
KR101516989B1 (ko) * | 2013-08-12 | 2015-04-30 | 주식회사 케이씨텍 | 압력 감시 정확성이 향상된 화학 기계적 연마 장치 |
KR101679131B1 (ko) * | 2014-12-29 | 2016-11-23 | 주식회사 엘지실트론 | 웨이퍼 연마장치 및 그 연마방법 |
KR102459834B1 (ko) * | 2017-11-22 | 2022-10-28 | 주식회사 케이씨텍 | 캐리어 및 이를 포함하는 화학 기계적 연마 장치 |
CN108145586B (zh) * | 2018-01-03 | 2019-10-11 | 京东方科技集团股份有限公司 | 抛光设备及抛光方法 |
CN113573844B (zh) | 2019-02-28 | 2023-12-08 | 应用材料公司 | 用于化学机械抛光承载头的固定器 |
CN110142689B (zh) * | 2019-04-17 | 2021-09-14 | 杭州众硅电子科技有限公司 | 一种晶圆装载支架、晶圆装载***及晶圆装片方法 |
US11660721B2 (en) | 2021-02-18 | 2023-05-30 | Applied Materials, Inc. | Dual loading retaining ring |
CN115106871A (zh) * | 2022-08-29 | 2022-09-27 | 成都中科卓尔智能科技集团有限公司 | 一种半导体材料表面缺陷柔性高精度修复装置及工艺 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06126615A (ja) * | 1992-10-12 | 1994-05-10 | Fujikoshi Mach Corp | ウエハーの研磨装置 |
JPH10286769A (ja) * | 1997-04-08 | 1998-10-27 | Ebara Corp | ポリッシング装置 |
US5916015A (en) * | 1997-07-25 | 1999-06-29 | Speedfam Corporation | Wafer carrier for semiconductor wafer polishing machine |
US6036587A (en) * | 1996-10-10 | 2000-03-14 | Applied Materials, Inc. | Carrier head with layer of conformable material for a chemical mechanical polishing system |
KR20020040529A (ko) * | 2000-11-23 | 2002-05-30 | 윤종용 | 화학적 기계적 평탄화 기계의 폴리싱 헤드 및 그것을이용한 폴리싱방법 |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8829089D0 (en) * | 1988-12-13 | 1989-01-25 | Coopers Animal Health | Intra ruminal device |
US5681215A (en) | 1995-10-27 | 1997-10-28 | Applied Materials, Inc. | Carrier head design for a chemical mechanical polishing apparatus |
US5643061A (en) * | 1995-07-20 | 1997-07-01 | Integrated Process Equipment Corporation | Pneumatic polishing head for CMP apparatus |
US5762544A (en) | 1995-10-27 | 1998-06-09 | Applied Materials, Inc. | Carrier head design for a chemical mechanical polishing apparatus |
US5957751A (en) | 1997-05-23 | 1999-09-28 | Applied Materials, Inc. | Carrier head with a substrate detection mechanism for a chemical mechanical polishing system |
US6398621B1 (en) * | 1997-05-23 | 2002-06-04 | Applied Materials, Inc. | Carrier head with a substrate sensor |
US5964653A (en) * | 1997-07-11 | 1999-10-12 | Applied Materials, Inc. | Carrier head with a flexible membrane for a chemical mechanical polishing system |
US5993302A (en) * | 1997-12-31 | 1999-11-30 | Applied Materials, Inc. | Carrier head with a removable retaining ring for a chemical mechanical polishing apparatus |
US5961169A (en) * | 1998-07-27 | 1999-10-05 | Strasbaugh | Apparatus for sensing the presence of a wafer |
US6210255B1 (en) * | 1998-09-08 | 2001-04-03 | Applied Materials, Inc. | Carrier head for chemical mechanical polishing a substrate |
US6162116A (en) | 1999-01-23 | 2000-12-19 | Applied Materials, Inc. | Carrier head for chemical mechanical polishing |
US6231428B1 (en) * | 1999-03-03 | 2001-05-15 | Mitsubishi Materials Corporation | Chemical mechanical polishing head assembly having floating wafer carrier and retaining ring |
US6224472B1 (en) * | 1999-06-24 | 2001-05-01 | Samsung Austin Semiconductor, L.P. | Retaining ring for chemical mechanical polishing |
US6358121B1 (en) * | 1999-07-09 | 2002-03-19 | Applied Materials, Inc. | Carrier head with a flexible membrane and an edge load ring |
US6206768B1 (en) * | 1999-07-29 | 2001-03-27 | Chartered Semiconductor Manufacturing, Ltd. | Adjustable and extended guide rings |
KR20010030213A (ko) * | 1999-09-02 | 2001-04-16 | 아끼모토 유미 | 연마 헤드, 이것을 이용한 연마 장치, 및 연마 상태 검출방법 |
SG90746A1 (en) * | 1999-10-15 | 2002-08-20 | Ebara Corp | Apparatus and method for polishing workpiece |
US6558232B1 (en) * | 2000-05-12 | 2003-05-06 | Multi-Planar Technologies, Inc. | System and method for CMP having multi-pressure zone loading for improved edge and annular zone material removal control |
WO2001087541A2 (en) * | 2000-05-12 | 2001-11-22 | Multi-Planar Technologies, Inc. | Pneumatic diaphragm head having an independent retaining ring and multi-region pressure control, and method to use the same |
US6540590B1 (en) * | 2000-08-31 | 2003-04-01 | Multi-Planar Technologies, Inc. | Chemical mechanical polishing apparatus and method having a rotating retaining ring |
JP2002187060A (ja) * | 2000-10-11 | 2002-07-02 | Ebara Corp | 基板保持装置、ポリッシング装置、及び研磨方法 |
US6652362B2 (en) * | 2000-11-23 | 2003-11-25 | Samsung Electronics Co., Ltd. | Apparatus for polishing a semiconductor wafer and method therefor |
DE10062496B4 (de) * | 2000-12-14 | 2005-03-17 | Peter Wolters Cmp - Systeme Gmbh & Co. Kg | Halter für flache Werkstücke, insbesondere Halbleiterwafer |
JP3922887B2 (ja) * | 2001-03-16 | 2007-05-30 | 株式会社荏原製作所 | ドレッサ及びポリッシング装置 |
US6893327B2 (en) * | 2001-06-04 | 2005-05-17 | Multi Planar Technologies, Inc. | Chemical mechanical polishing apparatus and method having a retaining ring with a contoured surface |
-
2001
- 2001-06-07 KR KR10-2001-0031788A patent/KR100470227B1/ko active IP Right Grant
-
2002
- 2002-11-21 AT AT02788980T patent/ATE411612T1/de not_active IP Right Cessation
- 2002-11-21 CN CNB028300696A patent/CN100390942C/zh not_active Expired - Fee Related
- 2002-11-21 AU AU2002353628A patent/AU2002353628A1/en not_active Abandoned
- 2002-11-21 JP JP2004568513A patent/JP2006507691A/ja not_active Ceased
- 2002-11-21 WO PCT/KR2002/002176 patent/WO2004075275A1/en active Application Filing
- 2002-11-21 DE DE60229449T patent/DE60229449D1/de not_active Expired - Fee Related
- 2002-11-21 EP EP02788980A patent/EP1568074B1/en not_active Expired - Lifetime
-
2005
- 2005-05-18 US US11/133,148 patent/US7121934B2/en not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06126615A (ja) * | 1992-10-12 | 1994-05-10 | Fujikoshi Mach Corp | ウエハーの研磨装置 |
US6036587A (en) * | 1996-10-10 | 2000-03-14 | Applied Materials, Inc. | Carrier head with layer of conformable material for a chemical mechanical polishing system |
JPH10286769A (ja) * | 1997-04-08 | 1998-10-27 | Ebara Corp | ポリッシング装置 |
US5916015A (en) * | 1997-07-25 | 1999-06-29 | Speedfam Corporation | Wafer carrier for semiconductor wafer polishing machine |
KR20020040529A (ko) * | 2000-11-23 | 2002-05-30 | 윤종용 | 화학적 기계적 평탄화 기계의 폴리싱 헤드 및 그것을이용한 폴리싱방법 |
Also Published As
Publication number | Publication date |
---|---|
CN1723546A (zh) | 2006-01-18 |
JP2006507691A (ja) | 2006-03-02 |
EP1568074A1 (en) | 2005-08-31 |
US20050272355A1 (en) | 2005-12-08 |
DE60229449D1 (de) | 2008-11-27 |
ATE411612T1 (de) | 2008-10-15 |
WO2004075275A1 (en) | 2004-09-02 |
EP1568074B1 (en) | 2008-10-15 |
CN100390942C (zh) | 2008-05-28 |
EP1568074A4 (en) | 2007-01-03 |
KR20020094079A (ko) | 2002-12-18 |
AU2002353628A1 (en) | 2004-09-09 |
US7121934B2 (en) | 2006-10-17 |
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