JPS5771179A - Input protective circuit device - Google Patents
Input protective circuit deviceInfo
- Publication number
- JPS5771179A JPS5771179A JP55146954A JP14695480A JPS5771179A JP S5771179 A JPS5771179 A JP S5771179A JP 55146954 A JP55146954 A JP 55146954A JP 14695480 A JP14695480 A JP 14695480A JP S5771179 A JPS5771179 A JP S5771179A
- Authority
- JP
- Japan
- Prior art keywords
- region
- regions
- type diode
- type
- breakdown voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000001681 protective effect Effects 0.000 title abstract 2
- 230000015556 catabolic process Effects 0.000 abstract 3
- 238000009792 diffusion process Methods 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
- 238000000034 method Methods 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Amplifiers (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Protection Of Static Devices (AREA)
Abstract
PURPOSE:To effectively protect the next step circuit by a method wherein a junction-type diode and an MIS type diode are formed in parallel on one semiconductor substrate and a desired breakdown voltage is set by selecting the channel length of the MIS type diode. CONSTITUTION:A P type well region 2 is formed by diffusion in an N type Si substrate 1 and N<+> type regions 3 and 7 are provided in the region 2 and input is connected to the region 3 and a junction-type diode is composed between the regions 3 and 2. And a gate electrode 6 is mounted between the regions 3 and 7 through a thin gate oxide film 8 and an MIS type diode forming the regions 3 and 7 as a drain region and a source region respectively is composed. Next, each P<+> type region 4 is formed by diffusion at the outside of the regions 3 and 7 by locating the regions 4 in the region 2 through oxide films 5 and the regions 4 are connected to a low- potential source and the region 7 and the gate 6 are connected to the low-potential source. In this composition, with a desired breakdown voltage set by selecting the channel length of the MIS type diode, and increase in the breakdown voltage of a protective circuit connected to the MIS type diode is permitted.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55146954A JPS5771179A (en) | 1980-10-22 | 1980-10-22 | Input protective circuit device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55146954A JPS5771179A (en) | 1980-10-22 | 1980-10-22 | Input protective circuit device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5771179A true JPS5771179A (en) | 1982-05-01 |
JPH0572110B2 JPH0572110B2 (en) | 1993-10-08 |
Family
ID=15419327
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55146954A Granted JPS5771179A (en) | 1980-10-22 | 1980-10-22 | Input protective circuit device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5771179A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59218764A (en) * | 1983-05-27 | 1984-12-10 | Hitachi Ltd | Semiconductor integrated circuit device |
JPS6164152A (en) * | 1984-09-06 | 1986-04-02 | Fujitsu Ltd | C-mos circuit |
JPH02238668A (en) * | 1989-03-10 | 1990-09-20 | Fujitsu Ltd | Semiconductor device |
JPH0396273A (en) * | 1989-09-08 | 1991-04-22 | Nec Corp | Complementary-type mis semiconductor device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS532087A (en) * | 1976-06-29 | 1978-01-10 | Toshiba Corp | Input protection circuit |
-
1980
- 1980-10-22 JP JP55146954A patent/JPS5771179A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS532087A (en) * | 1976-06-29 | 1978-01-10 | Toshiba Corp | Input protection circuit |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59218764A (en) * | 1983-05-27 | 1984-12-10 | Hitachi Ltd | Semiconductor integrated circuit device |
JPH0526344B2 (en) * | 1983-05-27 | 1993-04-15 | Hitachi Ltd | |
JPS6164152A (en) * | 1984-09-06 | 1986-04-02 | Fujitsu Ltd | C-mos circuit |
JPH02238668A (en) * | 1989-03-10 | 1990-09-20 | Fujitsu Ltd | Semiconductor device |
JPH0396273A (en) * | 1989-09-08 | 1991-04-22 | Nec Corp | Complementary-type mis semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
JPH0572110B2 (en) | 1993-10-08 |
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