JPS57146340A - Data transfer system - Google Patents

Data transfer system

Info

Publication number
JPS57146340A
JPS57146340A JP56031315A JP3131581A JPS57146340A JP S57146340 A JPS57146340 A JP S57146340A JP 56031315 A JP56031315 A JP 56031315A JP 3131581 A JP3131581 A JP 3131581A JP S57146340 A JPS57146340 A JP S57146340A
Authority
JP
Japan
Prior art keywords
data
prc
output
printer
latch circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56031315A
Other languages
Japanese (ja)
Inventor
Tetsuo Okuhara
Hiroaki Miyoshi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP56031315A priority Critical patent/JPS57146340A/en
Publication of JPS57146340A publication Critical patent/JPS57146340A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To achieve error detection, by connecting a printer controller (PRC) and a printer with a bidirectionally transferrable interface circuit, returning data transferred from the PRC from the printer and comparing transmission and reception data at the PRC.
CONSTITUTION: Data to be transmitted from a PRC 1 are set to a transmission data storage latch circuit 3 from a data line 2. The output is given to a transmission gate 11, which is driven with a transmission gate signal 8 from a print instruction line 4, the data is transmitted to a cable 12 and latched to a latch circuit 15 of a printer 17 with a strobe signal 9. Next, the output of the latch circuit 15 is inputted to a latch circuit 18 through a reception gate 10 at the PRC 1 side via a transmission gate 22 and the cable 12 with a gate signal 14. A comparison circuit 19 compares stored data of the latch circuits 3 and 8 and if they are coincident, an output 21 goes to low level, and if discident, the output goes to high level and set to a flip-flop 20. The PRC 1 retransmits data when discidence and the next data is transmitted at coincidence.
COPYRIGHT: (C)1982,JPO&Japio
JP56031315A 1981-03-06 1981-03-06 Data transfer system Pending JPS57146340A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56031315A JPS57146340A (en) 1981-03-06 1981-03-06 Data transfer system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56031315A JPS57146340A (en) 1981-03-06 1981-03-06 Data transfer system

Publications (1)

Publication Number Publication Date
JPS57146340A true JPS57146340A (en) 1982-09-09

Family

ID=12327842

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56031315A Pending JPS57146340A (en) 1981-03-06 1981-03-06 Data transfer system

Country Status (1)

Country Link
JP (1) JPS57146340A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59173819A (en) * 1983-03-23 1984-10-02 Hitachi Ltd Input device
JPS614226U (en) * 1984-06-12 1986-01-11 ブラザー工業株式会社 printing device
JPH01173221A (en) * 1987-12-28 1989-07-07 Nec Corp Printing device
US5965943A (en) * 1997-10-01 1999-10-12 Mitsubishi Denki Kabushiki Kaisha Semiconductor device with bonding pad electrode
US6087840A (en) * 1997-10-21 2000-07-11 Mitsubishi Denki Kabushiki Kaisha Probe card with vertical needle for enabling improved wafer testing and method of manufacturing the same
US6100708A (en) * 1997-09-26 2000-08-08 Mitsubishi Denki Kabushiki Kaisha Probe card and wafer testing method using the same
US6144212A (en) * 1997-10-21 2000-11-07 Mitsubishi Denki Kabushiki Kaisha Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59173819A (en) * 1983-03-23 1984-10-02 Hitachi Ltd Input device
JPS6336540B2 (en) * 1983-03-23 1988-07-20 Hitachi Ltd
JPS614226U (en) * 1984-06-12 1986-01-11 ブラザー工業株式会社 printing device
JPH01173221A (en) * 1987-12-28 1989-07-07 Nec Corp Printing device
US6100708A (en) * 1997-09-26 2000-08-08 Mitsubishi Denki Kabushiki Kaisha Probe card and wafer testing method using the same
US5965943A (en) * 1997-10-01 1999-10-12 Mitsubishi Denki Kabushiki Kaisha Semiconductor device with bonding pad electrode
US6087840A (en) * 1997-10-21 2000-07-11 Mitsubishi Denki Kabushiki Kaisha Probe card with vertical needle for enabling improved wafer testing and method of manufacturing the same
US6144212A (en) * 1997-10-21 2000-11-07 Mitsubishi Denki Kabushiki Kaisha Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card

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