JPS5635479A - Avalanche photodiode - Google Patents
Avalanche photodiodeInfo
- Publication number
- JPS5635479A JPS5635479A JP11022079A JP11022079A JPS5635479A JP S5635479 A JPS5635479 A JP S5635479A JP 11022079 A JP11022079 A JP 11022079A JP 11022079 A JP11022079 A JP 11022079A JP S5635479 A JPS5635479 A JP S5635479A
- Authority
- JP
- Japan
- Prior art keywords
- carrier
- layer
- ratio
- degree
- quantum efficiency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 125000005842 heteroatom Chemical group 0.000 abstract 2
- 239000004065 semiconductor Substances 0.000 abstract 2
- 238000010521 absorption reaction Methods 0.000 abstract 1
- 230000015556 catabolic process Effects 0.000 abstract 1
- 239000013078 crystal Substances 0.000 abstract 1
- 230000005684 electric field Effects 0.000 abstract 1
- 230000006798 recombination Effects 0.000 abstract 1
- 238000005215 recombination Methods 0.000 abstract 1
- 230000000717 retained effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier
- H01L31/107—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier the potential barrier working in avalanche mode, e.g. avalanche photodiodes
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Light Receiving Elements (AREA)
Abstract
PURPOSE:To contrive the improvements in the quantum efficiency and the S/N ratio of the avalanche photodiode by employing one having larger ratio of the ionization degree of of two crystals to multiply the carrier. CONSTITUTION:A semiconductor layer 10 is determined by considering a basic absorption edge, and incident light is exclusively absorbed, and carrier 14 is generated. Assume that the ionization degree beta (positive) of the layer is 10<alpha(electron). When the ionization degree ratio R is in the same degree or higher in a semiconductor 11, which is superimposed thereon, the carrier can be multiplied irrespective of the R of the layer 10, the larger the R is, the lower the noise is reduced. Even if the R is in the same degree, the affect of the carrier recombination is reduced at the hetero junction boundary between the layers 10 and 11, and the quantum efficiency thereof can be improved. The P-N junction 12 is isolated longer than 0.3mum at the side of the layer 11 from the hetero junction boundary, the tunnel current and emission current caused by the high electric field applied to the multiplied region are prevented, and uniform avalanche breakdown can be retained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11022079A JPS5635479A (en) | 1979-08-31 | 1979-08-31 | Avalanche photodiode |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11022079A JPS5635479A (en) | 1979-08-31 | 1979-08-31 | Avalanche photodiode |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5635479A true JPS5635479A (en) | 1981-04-08 |
Family
ID=14530116
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11022079A Pending JPS5635479A (en) | 1979-08-31 | 1979-08-31 | Avalanche photodiode |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5635479A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58169967A (en) * | 1982-03-30 | 1983-10-06 | Fujitsu Ltd | Semiconductor light receiving device |
JPS62200774A (en) * | 1986-02-28 | 1987-09-04 | Hitachi Ltd | Semiconductor photodetector |
JPS6325961U (en) * | 1986-07-31 | 1988-02-20 | ||
JPS63252188A (en) * | 1987-04-10 | 1988-10-19 | 大房 利隆 | Scissors |
-
1979
- 1979-08-31 JP JP11022079A patent/JPS5635479A/en active Pending
Non-Patent Citations (1)
Title |
---|
APPLIED PHYSICS LETTERS=1979 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58169967A (en) * | 1982-03-30 | 1983-10-06 | Fujitsu Ltd | Semiconductor light receiving device |
JPS62200774A (en) * | 1986-02-28 | 1987-09-04 | Hitachi Ltd | Semiconductor photodetector |
JPS6325961U (en) * | 1986-07-31 | 1988-02-20 | ||
JPS63252188A (en) * | 1987-04-10 | 1988-10-19 | 大房 利隆 | Scissors |
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