JPS55132937A - Defect detector - Google Patents
Defect detectorInfo
- Publication number
- JPS55132937A JPS55132937A JP4149179A JP4149179A JPS55132937A JP S55132937 A JPS55132937 A JP S55132937A JP 4149179 A JP4149179 A JP 4149179A JP 4149179 A JP4149179 A JP 4149179A JP S55132937 A JPS55132937 A JP S55132937A
- Authority
- JP
- Japan
- Prior art keywords
- projector
- main
- tip
- disposed
- angle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4149179A JPS55132937A (en) | 1979-04-04 | 1979-04-04 | Defect detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4149179A JPS55132937A (en) | 1979-04-04 | 1979-04-04 | Defect detector |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55132937A true JPS55132937A (en) | 1980-10-16 |
Family
ID=12609813
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4149179A Pending JPS55132937A (en) | 1979-04-04 | 1979-04-04 | Defect detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55132937A (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60157037A (ja) * | 1984-01-26 | 1985-08-17 | Hajime Sangyo Kk | 物体の表面検査装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5036189A (ja) * | 1973-07-31 | 1975-04-05 |
-
1979
- 1979-04-04 JP JP4149179A patent/JPS55132937A/ja active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5036189A (ja) * | 1973-07-31 | 1975-04-05 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60157037A (ja) * | 1984-01-26 | 1985-08-17 | Hajime Sangyo Kk | 物体の表面検査装置 |
JPH0570101B2 (ja) * | 1984-01-26 | 1993-10-04 | Hajime Sangyo |
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