JPS6488240A - Inspection of photosensitive material - Google Patents

Inspection of photosensitive material

Info

Publication number
JPS6488240A
JPS6488240A JP24436887A JP24436887A JPS6488240A JP S6488240 A JPS6488240 A JP S6488240A JP 24436887 A JP24436887 A JP 24436887A JP 24436887 A JP24436887 A JP 24436887A JP S6488240 A JPS6488240 A JP S6488240A
Authority
JP
Japan
Prior art keywords
light
polarized light
receiving part
discoloration
light receiving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP24436887A
Other languages
Japanese (ja)
Other versions
JPH0731133B2 (en
Inventor
Tokuji Takahashi
Kazumi Furuta
Kiyoshi Ishimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konica Minolta Inc
Original Assignee
Konica Minolta Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konica Minolta Inc filed Critical Konica Minolta Inc
Priority to JP24436887A priority Critical patent/JPH0731133B2/en
Publication of JPS6488240A publication Critical patent/JPS6488240A/en
Publication of JPH0731133B2 publication Critical patent/JPH0731133B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To detect a discoloration defect with high accuracy, in a inspection method for performing inspection by irradiating a photosensitive material with light having polarized light of a wavelength characteristic not substantially sensitizing said material, by using P-polarized light as the polarized light. CONSTITUTION:A light source 10, an ND filter 34, a rotary scanner 35, a magnifying reflected light receiving part 40 and a regular reflected light receiving part 41 are mounted on the title apparatus. A photosensitive material A is scanned by the light having P-polarized light from the light source 10 through the filter 34, the scanner 35 and an Ftheta lens 36 and the reflected light from the material A is detected by the light receiving parts 40, 41. Then, the P- polarized light is allowed to be incident to the flaw place 50 due to discoloration of the material A to form diffused reflected light which is, in turn, received by the light receiving part 40. Therefore, the flaw due to discoloration generated not only on the surface of the material A but also in the material A can be detected with high accuracy.
JP24436887A 1987-09-30 1987-09-30 Inspection method for photosensitive materials Expired - Lifetime JPH0731133B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24436887A JPH0731133B2 (en) 1987-09-30 1987-09-30 Inspection method for photosensitive materials

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24436887A JPH0731133B2 (en) 1987-09-30 1987-09-30 Inspection method for photosensitive materials

Publications (2)

Publication Number Publication Date
JPS6488240A true JPS6488240A (en) 1989-04-03
JPH0731133B2 JPH0731133B2 (en) 1995-04-10

Family

ID=17117655

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24436887A Expired - Lifetime JPH0731133B2 (en) 1987-09-30 1987-09-30 Inspection method for photosensitive materials

Country Status (1)

Country Link
JP (1) JPH0731133B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5182850A (en) * 1991-01-25 1993-02-02 Seiko Epson Corporation Parts assembling device
JPH06281589A (en) * 1993-03-26 1994-10-07 Mitsui Mining & Smelting Co Ltd Defect evaluating apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5182850A (en) * 1991-01-25 1993-02-02 Seiko Epson Corporation Parts assembling device
JPH06281589A (en) * 1993-03-26 1994-10-07 Mitsui Mining & Smelting Co Ltd Defect evaluating apparatus

Also Published As

Publication number Publication date
JPH0731133B2 (en) 1995-04-10

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