JPS5667739A - Defect inspecting apparatus - Google Patents
Defect inspecting apparatusInfo
- Publication number
- JPS5667739A JPS5667739A JP14281679A JP14281679A JPS5667739A JP S5667739 A JPS5667739 A JP S5667739A JP 14281679 A JP14281679 A JP 14281679A JP 14281679 A JP14281679 A JP 14281679A JP S5667739 A JPS5667739 A JP S5667739A
- Authority
- JP
- Japan
- Prior art keywords
- point
- beams
- reflected
- defect inspection
- defect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To improve a defect inspection reliably by employing a plurality of coherent light beams applied from different directions to each other. CONSTITUTION:Laser beams 101-103 from laser sources 51-53 at different positions from each other are applied to a point P on the surface of an object 1 being inspected, with incident angles of 1-3 deg., in other words, the beams 101-103 are applied nearly parallel to the surface of the object 1, and reflected from the point P to be reflected-lights 201-203. The light scattering at the point P is led to a photodetector 7 through a lens system 6 set vertically to the object 1. Therefore, the specular-reflection components of the laser beams are removed and only signals (scattered light) from a minute defect are received. Moreover, a rotating mechanism 3 and a moving mechanism 4 permit the beam irradiation point P to spirally scan the surface of the object 1. By this, the reliability of the defect inspection can be improved.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14281679A JPS5667739A (en) | 1979-11-06 | 1979-11-06 | Defect inspecting apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14281679A JPS5667739A (en) | 1979-11-06 | 1979-11-06 | Defect inspecting apparatus |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP23887691A Division JPH0545303A (en) | 1991-08-27 | 1991-08-27 | Defect inspecting apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5667739A true JPS5667739A (en) | 1981-06-08 |
JPH0254494B2 JPH0254494B2 (en) | 1990-11-21 |
Family
ID=15324286
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14281679A Granted JPS5667739A (en) | 1979-11-06 | 1979-11-06 | Defect inspecting apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5667739A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62261045A (en) * | 1986-05-06 | 1987-11-13 | Hitachi Electronics Eng Co Ltd | Surface inspecting device |
JPH0545303A (en) * | 1991-08-27 | 1993-02-23 | Toshiba Corp | Defect inspecting apparatus |
US7154597B2 (en) | 2003-06-30 | 2006-12-26 | Kabushiki Kaisha Topcon | Method for inspecting surface and apparatus for inspecting it |
US7245366B2 (en) | 2003-06-10 | 2007-07-17 | Kabushiki Kaisha Topcon | Surface inspection method and surface inspection apparatus |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4573308B2 (en) * | 2008-04-03 | 2010-11-04 | 芝浦メカトロニクス株式会社 | Surface inspection apparatus and method |
JP5946751B2 (en) * | 2012-11-08 | 2016-07-06 | 株式会社日立ハイテクノロジーズ | Defect detection method and apparatus, and defect observation method and apparatus |
-
1979
- 1979-11-06 JP JP14281679A patent/JPS5667739A/en active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62261045A (en) * | 1986-05-06 | 1987-11-13 | Hitachi Electronics Eng Co Ltd | Surface inspecting device |
JPH0545303A (en) * | 1991-08-27 | 1993-02-23 | Toshiba Corp | Defect inspecting apparatus |
US7245366B2 (en) | 2003-06-10 | 2007-07-17 | Kabushiki Kaisha Topcon | Surface inspection method and surface inspection apparatus |
US7154597B2 (en) | 2003-06-30 | 2006-12-26 | Kabushiki Kaisha Topcon | Method for inspecting surface and apparatus for inspecting it |
Also Published As
Publication number | Publication date |
---|---|
JPH0254494B2 (en) | 1990-11-21 |
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