JPS55110940A - Method of measuring magnetic strain constant by x-ray diffraction - Google Patents

Method of measuring magnetic strain constant by x-ray diffraction

Info

Publication number
JPS55110940A
JPS55110940A JP1822479A JP1822479A JPS55110940A JP S55110940 A JPS55110940 A JP S55110940A JP 1822479 A JP1822479 A JP 1822479A JP 1822479 A JP1822479 A JP 1822479A JP S55110940 A JPS55110940 A JP S55110940A
Authority
JP
Japan
Prior art keywords
variation
diffraction
rays
magnetic strain
diffraction angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1822479A
Other languages
Japanese (ja)
Inventor
Yoshio Sato
Iesada Hirai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP1822479A priority Critical patent/JPS55110940A/en
Publication of JPS55110940A publication Critical patent/JPS55110940A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To make it possible to measure the magnetic strain constant correctly by a compact device by causing different magnetization on samples at a position where the variation of the diffraction strength against the variation of the diffraction angle of X-rays is drastic and seeking the variation of the grid constant. CONSTITUTION:X-rays emitted from an X-ray tube 1 are converted into beams through a slit 2, and diffracted by a crystal on a goniometer 3 and by a smaple 6 on a gonimeter 5. The X-rays are detected by a scintillation counter 7, and their pulse heights are analyzed by a pulse height analyser 8. The X-rays are further recorded as diffraction spectra by an x-t(theta) recorder 9. In this case, the diffraction angle theta of the sample 6 is continuously varied to obtain the variation of the diffraction angle against the diffraction angle, and the variation of the grid constant is obtained from the variation of the diffraction strength in a position where the inclination of the diffraction spectrum becomes steep to obtain the magnetic strain constant.
JP1822479A 1979-02-19 1979-02-19 Method of measuring magnetic strain constant by x-ray diffraction Pending JPS55110940A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1822479A JPS55110940A (en) 1979-02-19 1979-02-19 Method of measuring magnetic strain constant by x-ray diffraction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1822479A JPS55110940A (en) 1979-02-19 1979-02-19 Method of measuring magnetic strain constant by x-ray diffraction

Publications (1)

Publication Number Publication Date
JPS55110940A true JPS55110940A (en) 1980-08-27

Family

ID=11965667

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1822479A Pending JPS55110940A (en) 1979-02-19 1979-02-19 Method of measuring magnetic strain constant by x-ray diffraction

Country Status (1)

Country Link
JP (1) JPS55110940A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61160641A (en) * 1984-11-16 1986-07-21 ヴァレオ Torsional vibration damper
US7206378B2 (en) 2004-02-27 2007-04-17 Rigaku Corporation X-ray analysis apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61160641A (en) * 1984-11-16 1986-07-21 ヴァレオ Torsional vibration damper
US7206378B2 (en) 2004-02-27 2007-04-17 Rigaku Corporation X-ray analysis apparatus

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