GB1329695A - Diffractometry - Google Patents
DiffractometryInfo
- Publication number
- GB1329695A GB1329695A GB1329695DA GB1329695A GB 1329695 A GB1329695 A GB 1329695A GB 1329695D A GB1329695D A GB 1329695DA GB 1329695 A GB1329695 A GB 1329695A
- Authority
- GB
- United Kingdom
- Prior art keywords
- specimen
- detector
- diffracted
- arrangement
- ray diffractometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
1329695 X-ray diffractometer J C NUTTER 9 Sept 1970 [3 Oct 1969] 48824/69 Heading GIA [ Also in Division H5] An X-ray diffractometer is designed, for analysis of a continuously moving specimen, in such a way that a plurality of the beams diffracted by the specimen may be detected without movement of the detector. In the arrangement of Fig. 1, the beam from tube target S is a continuous spectrum and is collimated at R and applied to a powder or alloy specimen M moving in a stream into the plane of the drawing. Diffracted radiation is detected via slit B by detector D. In order to differentiate between the proportions of the diffracted beam due to different constituents in the specimen, the detector circuit includes an array of pulse height analysers P after the linear amplifier C. By varying the analyser selected, the rate of pulses of the same amplitude in different amplitude bands may be measured, each band corresponding to a particular wavelength and thus lattice spacing, which in turn is characteristic of a particular constituent. If the chart recorder Q is synchronised with the analyser variation, a diffraction pattern will be traced out. Instead of single pulse height analysers, a multi channel device may be used to give a more complete pattern trace. In the arrangement of Fig. 2, Seemann-Bohlin focusing is used to avoid the need for a very small specimen. The specimen is curved with the detector D located at a point on the circle of sample curvature. Similar circuitry to Fig. 1 is used. Slit B may be dispensed with. The detector may be, for example, a silicon surface barrier device, or a lithium drifted silicon or germanium device. Fluorescent radiation may be prevented from interfering with the measurements by use of suitable filters
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB4882469 | 1970-09-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1329695A true GB1329695A (en) | 1973-09-12 |
Family
ID=10450044
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1329695D Expired GB1329695A (en) | 1970-09-09 | 1970-09-09 | Diffractometry |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB1329695A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2423774A1 (en) * | 1978-04-22 | 1979-11-16 | Hoesch Werke Ag | METHOD AND DEVICE FOR DETERMINING TECHNOLOGICAL CHARACTERISTICS |
GB2166630A (en) * | 1984-10-27 | 1986-05-08 | Mtu Muenchen Gmbh | Method and apparatus for inspecting a crystalline object |
EP0354045A2 (en) * | 1988-08-03 | 1990-02-07 | Ion Track Instruments | X-ray diffraction inspection system and method |
CN112037626A (en) * | 2020-09-24 | 2020-12-04 | 深圳市美信检测技术股份有限公司 | X-ray diffractometer simulation device and using method thereof |
-
1970
- 1970-09-09 GB GB1329695D patent/GB1329695A/en not_active Expired
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2423774A1 (en) * | 1978-04-22 | 1979-11-16 | Hoesch Werke Ag | METHOD AND DEVICE FOR DETERMINING TECHNOLOGICAL CHARACTERISTICS |
GB2166630A (en) * | 1984-10-27 | 1986-05-08 | Mtu Muenchen Gmbh | Method and apparatus for inspecting a crystalline object |
EP0354045A2 (en) * | 1988-08-03 | 1990-02-07 | Ion Track Instruments | X-ray diffraction inspection system and method |
EP0354045A3 (en) * | 1988-08-03 | 1991-10-02 | Ion Track Instruments | X-ray diffraction inspection system and method |
CN112037626A (en) * | 2020-09-24 | 2020-12-04 | 深圳市美信检测技术股份有限公司 | X-ray diffractometer simulation device and using method thereof |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PLNP | Patent lapsed through nonpayment of renewal fees |