JPS5744868A - Measuring method for magnetostriction constant - Google Patents

Measuring method for magnetostriction constant

Info

Publication number
JPS5744868A
JPS5744868A JP11908080A JP11908080A JPS5744868A JP S5744868 A JPS5744868 A JP S5744868A JP 11908080 A JP11908080 A JP 11908080A JP 11908080 A JP11908080 A JP 11908080A JP S5744868 A JPS5744868 A JP S5744868A
Authority
JP
Japan
Prior art keywords
magnetostriction
diffracted
sample
rays
magnetic field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11908080A
Other languages
Japanese (ja)
Other versions
JPS6236541B2 (en
Inventor
Junji Mada
Yoshio Sato
Kazuyuki Yamaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP11908080A priority Critical patent/JPS5744868A/en
Publication of JPS5744868A publication Critical patent/JPS5744868A/en
Publication of JPS6236541B2 publication Critical patent/JPS6236541B2/ja
Granted legal-status Critical Current

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  • Measuring Magnetic Variables (AREA)

Abstract

PURPOSE:To enable to measure a magnetostriction constant with higher accuracy on the basis of micro magnetostriction, by providing a magnetic field applying means on an x-ray two-crystal diffraction device, and utilizing a steep slope part to measure a lattice constant. CONSTITUTION:With two-crystal x-rays, a sample 12 on a sample bedplate is irradiated, and diffracted x-rays are detected with a detector 16. When the detector 16 is shifted to a steep ramp part theta, of a curved line of diffracted x-ray intensity, diffracted x-ray intensity almost overlapping in the peak value is identified by means of micro magnetostriction and detected. Accordingly, a lattice constant changing in accordance with a magnetostriction constant is determined on the basis of a difference among diffracted x-rays detected in a case where a magnetic field is applied by means of magnetic field applying means 18-20 and in a case not applied in the two directions perpendicular and parallel to the surface of the sample 12, and the magnetostriction constant of a magnetic thin film and others is measured with higher accuracy.
JP11908080A 1980-08-29 1980-08-29 Measuring method for magnetostriction constant Granted JPS5744868A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11908080A JPS5744868A (en) 1980-08-29 1980-08-29 Measuring method for magnetostriction constant

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11908080A JPS5744868A (en) 1980-08-29 1980-08-29 Measuring method for magnetostriction constant

Publications (2)

Publication Number Publication Date
JPS5744868A true JPS5744868A (en) 1982-03-13
JPS6236541B2 JPS6236541B2 (en) 1987-08-07

Family

ID=14752376

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11908080A Granted JPS5744868A (en) 1980-08-29 1980-08-29 Measuring method for magnetostriction constant

Country Status (1)

Country Link
JP (1) JPS5744868A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006120775A1 (en) * 2005-03-28 2006-11-16 Tokyo Gakugei University Method and apparatus for concurrently measuring magnetostriction and magnetization

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0452997Y2 (en) * 1987-09-12 1992-12-14

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006120775A1 (en) * 2005-03-28 2006-11-16 Tokyo Gakugei University Method and apparatus for concurrently measuring magnetostriction and magnetization
US8036338B2 (en) 2005-03-28 2011-10-11 Tokyo Gakugei University Method and device for simultaneous measurement of magnetostriction and magnetization

Also Published As

Publication number Publication date
JPS6236541B2 (en) 1987-08-07

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