JPS5744868A - Measuring method for magnetostriction constant - Google Patents
Measuring method for magnetostriction constantInfo
- Publication number
- JPS5744868A JPS5744868A JP11908080A JP11908080A JPS5744868A JP S5744868 A JPS5744868 A JP S5744868A JP 11908080 A JP11908080 A JP 11908080A JP 11908080 A JP11908080 A JP 11908080A JP S5744868 A JPS5744868 A JP S5744868A
- Authority
- JP
- Japan
- Prior art keywords
- magnetostriction
- diffracted
- sample
- rays
- magnetic field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measuring Magnetic Variables (AREA)
Abstract
PURPOSE:To enable to measure a magnetostriction constant with higher accuracy on the basis of micro magnetostriction, by providing a magnetic field applying means on an x-ray two-crystal diffraction device, and utilizing a steep slope part to measure a lattice constant. CONSTITUTION:With two-crystal x-rays, a sample 12 on a sample bedplate is irradiated, and diffracted x-rays are detected with a detector 16. When the detector 16 is shifted to a steep ramp part theta, of a curved line of diffracted x-ray intensity, diffracted x-ray intensity almost overlapping in the peak value is identified by means of micro magnetostriction and detected. Accordingly, a lattice constant changing in accordance with a magnetostriction constant is determined on the basis of a difference among diffracted x-rays detected in a case where a magnetic field is applied by means of magnetic field applying means 18-20 and in a case not applied in the two directions perpendicular and parallel to the surface of the sample 12, and the magnetostriction constant of a magnetic thin film and others is measured with higher accuracy.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11908080A JPS5744868A (en) | 1980-08-29 | 1980-08-29 | Measuring method for magnetostriction constant |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11908080A JPS5744868A (en) | 1980-08-29 | 1980-08-29 | Measuring method for magnetostriction constant |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5744868A true JPS5744868A (en) | 1982-03-13 |
JPS6236541B2 JPS6236541B2 (en) | 1987-08-07 |
Family
ID=14752376
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11908080A Granted JPS5744868A (en) | 1980-08-29 | 1980-08-29 | Measuring method for magnetostriction constant |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5744868A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006120775A1 (en) * | 2005-03-28 | 2006-11-16 | Tokyo Gakugei University | Method and apparatus for concurrently measuring magnetostriction and magnetization |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0452997Y2 (en) * | 1987-09-12 | 1992-12-14 |
-
1980
- 1980-08-29 JP JP11908080A patent/JPS5744868A/en active Granted
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006120775A1 (en) * | 2005-03-28 | 2006-11-16 | Tokyo Gakugei University | Method and apparatus for concurrently measuring magnetostriction and magnetization |
US8036338B2 (en) | 2005-03-28 | 2011-10-11 | Tokyo Gakugei University | Method and device for simultaneous measurement of magnetostriction and magnetization |
Also Published As
Publication number | Publication date |
---|---|
JPS6236541B2 (en) | 1987-08-07 |
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