JP6799690B2 - 変調感度を有するspad検出器 - Google Patents
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Description
この特許協力条約特許出願は、米国特許仮出願第62/450,499号(2017年1月25日に出願)、発明の名称「SPAD Detector Having Modulated Sensitivity」に対する優先権を主張する。なおこの文献は、本明細書において完全に開示されているかのように参照により組み込まれている。
参照番号が同様の構造的要素を指定する、添付図面と共に以下の詳細な説明によって開示が容易に理解されよう。
Claims (18)
- 単一光子アバランシェダイオード(SPAD)検出器を動作させるための方法であって、
前記SPAD検出器は参照画素の参照サブアレイと撮像画素の撮像サブアレイとを含む画素アレイを含み、前記方法は、
前記参照サブアレイ内の参照画素内の参照SPADを用いて、前記撮像サブアレイ内の撮像画素内の撮像SPADの動作を有効にする開始時間を検出することと、
前記開始時間の検出に応じて、前記撮像SPADの前記動作を有効にして前記撮像SPADが光子を検出するように動作可能とすることと、
各検出された光子に対して、対応する飛行時間を決定することと、
各検出された光子の飛行時間に基づいて不均一ヒストグラムを構成することであって、前記不均一ヒストグラムは、
第1の幅を有する第1のビンであって、第1の範囲の飛行時間の間に検出された飛行時間を有する光子の第1のカウントを表わす第1のビンと、
前記第1の幅とは異なる第2の幅を有する第2のビンであって、前記第1の範囲の飛行時間とは異なる第2の範囲の飛行時間の間に検出された飛行時間を有する光子の第2のカウントを表わす第2のビンと、を含む方法。 - 前記不均一ヒストグラムを構成した後に前記撮像SPADの前記動作を無効にすることを更に含む、請求項1に記載の方法。
- 第2のターゲットより、前記SPAD検出器により近い第1のターゲットから反射した第1の検出された光子の第1の飛行時間によって、前記第1のビンにおける前記第1のカウントが増加し、
前記第2のターゲットから反射した第2の検出された光子の第2の飛行時間によって、前記第2のビンにおける前記第2のカウントが増加する、請求項1に記載の方法。 - 単一光子アバランシェダイオード(SPAD)検出器であって、
複数の画素ラインを含む画素アレイであって、各画素はSPADを含む、画素アレイと、
前記画素アレイに動作可能に接続された時間デジタル変換器(TDC)アレイ回路であって、前記TDCアレイ回路はTDC回路のアレイを含み、前記TDC回路のサブセットが各対応する画素ラインに動作可能に接続されている、TDCアレイ回路と、
前記TDCアレイ回路に動作可能に接続されたメモリであって、前記メモリは不均一ヒストグラムを記憶するように構成されており、前記不均一ヒストグラムは、
第1の幅を有する第1のビンであって、第1の範囲の飛行時間の間に検出された飛行時間を有する光子の第1のカウントを表わす第1のビンと、
前記第1の幅とは異なる第2の幅を有する第2のビンであって、前記第1の範囲の飛行時間とは異なる第2の範囲の飛行時間の間に検出された飛行時間を有する光子の第2のカウントを表わす第2のビンと、を含む、メモリと、を備えるSPAD検出器。 - 前記TDCアレイ回路に動作可能に接続されたコントローラを更に備え、前記コントローラは、前記TDCアレイ回路に対するクロック信号を生成するように構成されている、請求項4に記載のSPAD検出器。
- 前記SPAD検出器はラインスキャンシステムに含まれており、
前記画素アレイ内の前記複数の画素ラインは行及び列で配列され、
前記画素アレイ内の前記画素はセクション内でスキャンされ、
各セクションは前記画素アレイ内の列のサブセットを含み、
前記TDC回路の各サブセット内のTDC回路の数は、各セクション内の各行におけるスキャンされた画素のサブセットに対応する、請求項4に記載のSPAD検出器。 - 前記画素アレイは、
参照画素を含む参照サブアレイと、
撮像画素を含む撮像サブアレイと、を備え
前記SPAD検出器は、前記TDCアレイ回路に動作可能に接続されたコントローラを更に含み、前記コントローラは、
第1の位相を有する第1のクロック信号と、異なる第2の位相を有する第2のクロック信号とを含む第1の組のクロック信号を生成し、
第3の位相を有する第3のクロック信号と、異なる第4の位相を有する第4のクロック信号とを含む第2の組のクロック信号を生成する、ように構成され、
前記第1の組のクロック信号は、前記参照画素に接続された前記TDC回路によって受信され、
前記第2の組のクロック信号は、前記撮像画素に接続された前記TDC回路によって受信される、請求項6に記載のSPAD検出器。 - 前記メモリは複数の不均一ヒストグラムを記憶するように構成されており、各不均一ヒストグラムは、各セクションの各行における各スキャンされた画素に対応付けられる、請求項6に記載のSPAD検出器。
- 前記画素アレイは、
1つ以上の参照画素を含む参照サブアレイと、
1つ以上の撮像画素を含む撮像サブアレイと、を含む、請求項4に記載のSPAD検出器。 - 前記撮像サブアレイ内の各撮像画素は、
ノードと第1の電圧源との間に動作可能に接続されたSPADと、
前記ノードと基準電圧源との間に動作可能に接続されたゲートトランジスタと、
前記ノードと第2の電圧源との間に動作可能に接続されたクエンチトランジスタと、を含み、
前記ゲートトランジスタは、前記SPADの動作を有効にし、又は前記SPADの前記動作を無効にするように構成されている、請求項9に記載のSPAD検出器。 - 各撮像画素に動作可能に接続された各TDC回路は、前記撮像画素に対して複数のTDC出力値を出力し、前記複数のTDC出力値は、前記撮像画素の検出時間にわたって不均一に増加する、請求項9に記載のSPAD検出器。
- 前記TDCアレイ回路と前記メモリとの間に動作可能に接続されたエンコーダ回路を更に備え、
対応する撮像画素に動作可能に接続された各TDC回路は前記撮像画素に対して複数のTDC出力値を出力し、
前記複数のTDC出力値は前記撮像画素の検出時間にわたって直線的に増加し、
前記エンコーダ回路は、前記複数のTDC出力値をエンコードして、複数のエンコードされたTDC出力値が前記撮像画素の前記検出時間にわたって不均一に増加するように構成されている、請求項9に記載のSPAD検出器。 - 前記参照サブアレイは、前記撮像サブアレイのエッジに隣接して位置する、請求項9に記載のSPAD検出器。
- 単一光子アバランシェダイオード(SPAD)検出器内の画素であって、
ノードと第1の電圧源との間に動作可能に接続されたSPADと、
前記ノードと基準電圧源との間に動作可能に接続されたゲートトランジスタと、
前記ノードと第2の電圧源との間に動作可能に接続されたクエンチトランジスタと、を備え、
前記ゲートトランジスタは、第1の時間で前記SPADの動作を有効にし、第2の時間で前記SPADの前記動作を続いて無効にするゲート信号を受信するように構成され、
前記クエンチトランジスタのゲートは、第1のスイッチ及び第2のスイッチに接続され、
前記第1のスイッチは、第1のクエンチ信号に接続され、
前記第2のスイッチは、前記第1のクエンチ信号とは異なる第2のクエンチ信号に接続されている、画素。 - 前記第1の時間と前記第2の時間との間の時間間隔は、前記SPADが光子を検出する前記SPADに対する検出時間を決定する、請求項14の画素。
- 前記第1のクエンチ信号は、前記SPADにおける感度制御された時間を生成し、
前記SPADは、前記感度制御された時間の間に可変感度を有し、
前記第2のクエンチ信号は前記SPADにおいて一定感度時間を生成する、請求項14の画素。 - 前記クエンチトランジスタと前記ゲートトランジスタとの間に動作可能に接続された選択トランジスタを更に備え、前記選択トランジスタのゲートと前記ゲートトランジスタのゲートとは共通の入力ラインに接続されている、請求項14の画素。
- 前記不均一ヒストグラムは、さらに、
前記第1の幅及び前記第2の幅とは異なる第3の幅を有する第3のビンであって、前記第1の範囲の飛行時間及び前記第2の範囲の飛行時間とは異なる第3の範囲の飛行時間内の飛行時間を有する光子の第3のカウントを表わす第3のビンを含む、請求項4に記載のSPAD検出器。
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US201762450499P | 2017-01-25 | 2017-01-25 | |
US62/450,499 | 2017-01-25 | ||
PCT/US2018/015082 WO2018140522A2 (en) | 2017-01-25 | 2018-01-24 | Spad detector having modulated sensitivity |
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Families Citing this family (78)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9741754B2 (en) | 2013-03-06 | 2017-08-22 | Apple Inc. | Charge transfer circuit with storage nodes in image sensors |
US9686485B2 (en) | 2014-05-30 | 2017-06-20 | Apple Inc. | Pixel binning in an image sensor |
GB201511551D0 (en) | 2015-07-01 | 2015-08-12 | St Microelectronics Res & Dev | Photonics device |
US10620300B2 (en) | 2015-08-20 | 2020-04-14 | Apple Inc. | SPAD array with gated histogram construction |
JP6730150B2 (ja) | 2016-09-16 | 2020-07-29 | 株式会社東芝 | 光検出器、及び距離測定装置 |
CN109716525B (zh) | 2016-09-23 | 2020-06-09 | 苹果公司 | 堆叠式背面照明spad阵列 |
US10656251B1 (en) | 2017-01-25 | 2020-05-19 | Apple Inc. | Signal acquisition in a SPAD detector |
US10962628B1 (en) | 2017-01-26 | 2021-03-30 | Apple Inc. | Spatial temporal weighting in a SPAD detector |
EP3646057A1 (en) | 2017-06-29 | 2020-05-06 | Apple Inc. | Time-of-flight depth mapping with parallax compensation |
US10622538B2 (en) | 2017-07-18 | 2020-04-14 | Apple Inc. | Techniques for providing a haptic output and sensing a haptic input using a piezoelectric body |
US10440301B2 (en) | 2017-09-08 | 2019-10-08 | Apple Inc. | Image capture device, pixel, and method providing improved phase detection auto-focus performance |
US10785400B2 (en) * | 2017-10-09 | 2020-09-22 | Stmicroelectronics (Research & Development) Limited | Multiple fields of view time of flight sensor |
KR102403544B1 (ko) | 2017-12-18 | 2022-05-30 | 애플 인크. | 방출기들의 어드레스가능 어레이를 사용하는 비행 시간 감지 |
US10996323B2 (en) * | 2018-02-22 | 2021-05-04 | Stmicroelectronics (Research & Development) Limited | Time-of-flight imaging device, system and method |
DE102018203534A1 (de) * | 2018-03-08 | 2019-09-12 | Ibeo Automotive Systems GmbH | Empfängeranordnung zum Empfang von Lichtimpulsen, LiDAR-Modul und Verfahren zum Empfangen von Lichtimpulsen |
DE102018205378A1 (de) * | 2018-04-10 | 2019-10-10 | Ibeo Automotive Systems GmbH | Verfahren zur Ansteuerung von Sensorelementen eines LIDAR Messsystems |
US10848693B2 (en) | 2018-07-18 | 2020-11-24 | Apple Inc. | Image flare detection using asymmetric pixels |
US11019294B2 (en) | 2018-07-18 | 2021-05-25 | Apple Inc. | Seamless readout mode transitions in image sensors |
US11353563B2 (en) * | 2018-09-13 | 2022-06-07 | Pixart Imaging Inc. | Avalanche diode based object detection device |
US11408983B2 (en) | 2018-10-01 | 2022-08-09 | Infineon Technologies Ag | Lidar 2D receiver array architecture |
JP6723317B2 (ja) * | 2018-10-25 | 2020-07-15 | 三菱電機株式会社 | レーザ距離測定装置 |
US11275146B2 (en) | 2018-11-08 | 2022-03-15 | Infineon Technologies Ag | LIDAR system with non-uniform sensitivity response |
US11233966B1 (en) | 2018-11-29 | 2022-01-25 | Apple Inc. | Breakdown voltage monitoring for avalanche diodes |
DE102018132473B4 (de) * | 2018-12-17 | 2020-07-30 | Sick Ag | Optoelektronischer Sensor und Verfahren zur Erfassung eines Objekts |
JP2020098146A (ja) * | 2018-12-18 | 2020-06-25 | ソニーセミコンダクタソリューションズ株式会社 | 測距装置および計測装置 |
JP7438730B2 (ja) * | 2018-12-18 | 2024-02-27 | キヤノン株式会社 | 光電変換装置、撮像システム及び移動体 |
EP3894887A4 (en) * | 2019-01-18 | 2022-08-17 | Sense Photonics, Inc. | DIGITAL PIXELS AND THEIR OPERATING METHODS |
JP7218191B2 (ja) * | 2019-01-30 | 2023-02-06 | キヤノン株式会社 | 光電変換装置、撮像システム、移動体 |
US11835659B2 (en) * | 2019-02-15 | 2023-12-05 | Sony Semiconductor Solutions Corporation | Time-of-flight apparatus and method |
JP2020139810A (ja) * | 2019-02-27 | 2020-09-03 | ソニーセミコンダクタソリューションズ株式会社 | 測定装置および測距装置 |
JP2020143959A (ja) * | 2019-03-05 | 2020-09-10 | ソニーセミコンダクタソリューションズ株式会社 | 制御回路および測距システム |
EP3715907B1 (en) * | 2019-03-27 | 2024-02-28 | Infineon Technologies AG | Methods and apparatuses for compensating light reflections from a cover of a time-of-flight camera |
US11500094B2 (en) * | 2019-06-10 | 2022-11-15 | Apple Inc. | Selection of pulse repetition intervals for sensing time of flight |
JP2021001763A (ja) * | 2019-06-20 | 2021-01-07 | ソニーセミコンダクタソリューションズ株式会社 | 測距装置、測距方法、および、測距システム |
US20220357434A1 (en) * | 2019-06-27 | 2022-11-10 | Ams International Ag | Imaging system and detection method |
WO2020259928A1 (en) * | 2019-06-27 | 2020-12-30 | Ams International Ag | Imaging system and detection method |
US11555900B1 (en) | 2019-07-17 | 2023-01-17 | Apple Inc. | LiDAR system with enhanced area coverage |
CN110632576B (zh) * | 2019-08-30 | 2022-03-29 | 深圳奥锐达科技有限公司 | 时间编码解调处理电路及方法 |
JP7414440B2 (ja) * | 2019-09-18 | 2024-01-16 | ソニーセミコンダクタソリューションズ株式会社 | 測距センサ |
CN110596722B (zh) * | 2019-09-19 | 2022-10-04 | 深圳奥锐达科技有限公司 | 直方图可调的飞行时间距离测量***及测量方法 |
CN110596724B (zh) * | 2019-09-19 | 2022-07-29 | 深圳奥锐达科技有限公司 | 动态直方图绘制飞行时间距离测量方法及测量*** |
CN110596723B (zh) * | 2019-09-19 | 2023-03-14 | 深圳奥锐达科技有限公司 | 动态直方图绘制飞行时间距离测量方法及测量*** |
CN110596725B (zh) * | 2019-09-19 | 2022-03-04 | 深圳奥锐达科技有限公司 | 基于插值的飞行时间测量方法及测量*** |
CN110596721B (zh) * | 2019-09-19 | 2022-06-14 | 深圳奥锐达科技有限公司 | 双重共享tdc电路的飞行时间距离测量***及测量方法 |
US20210109224A1 (en) * | 2019-10-15 | 2021-04-15 | Sense Photonics, Inc. | Strobing flash lidar with full frame utilization |
US11573302B2 (en) * | 2019-10-17 | 2023-02-07 | Argo AI, LLC | LiDAR system comprising a Geiger-mode avalanche photodiode-based receiver having pixels with multiple-return capability |
JP2021071458A (ja) * | 2019-11-01 | 2021-05-06 | ソニーセミコンダクタソリューションズ株式会社 | 受光装置、測距装置および受光回路 |
US11733359B2 (en) | 2019-12-03 | 2023-08-22 | Apple Inc. | Configurable array of single-photon detectors |
US11105679B2 (en) | 2019-12-12 | 2021-08-31 | Stmicroelectronics (Research & Development) Limited | Extended hold-off time for SPAD quench assistance |
US11162839B2 (en) | 2019-12-12 | 2021-11-02 | Stmicroelectronics (Research & Development) Limited | Photodetection circuit with extended hold-off time for SPAD quench assistance |
DE102019134701A1 (de) | 2019-12-17 | 2021-06-17 | Sick Ag | Optoelektronischer Sensor und Verfahren zur Erfassung eines Objekts |
EP4062191A4 (en) * | 2020-01-09 | 2023-11-29 | Sense Photonics, Inc. | PIPELINE HISTOGRAM PIXELS |
US20210231782A1 (en) * | 2020-01-27 | 2021-07-29 | Sense Photonics, Inc. | Dram-based lidar pixel |
US20210302586A1 (en) * | 2020-03-25 | 2021-09-30 | Oulun Yliopisto | Range imaging apparatus and method of performing range imaging |
US11644551B2 (en) | 2020-03-30 | 2023-05-09 | Semiconductor Components Industries, Llc | Lidar systems with improved time-to-digital conversion circuitry |
US11476372B1 (en) | 2020-05-13 | 2022-10-18 | Apple Inc. | SPAD-based photon detectors with multi-phase sampling TDCs |
CN111796296A (zh) * | 2020-06-04 | 2020-10-20 | 深圳奥锐达科技有限公司 | 一种距离测量方法、***及计算机可读存储介质 |
CN111830530B (zh) * | 2020-06-04 | 2023-02-24 | 深圳奥锐达科技有限公司 | 一种距离测量方法、***及计算机可读存储介质 |
CN111766596A (zh) * | 2020-06-04 | 2020-10-13 | 深圳奥锐达科技有限公司 | 一种距离测量方法、***及计算机可读存储介质 |
US11428792B2 (en) | 2020-06-08 | 2022-08-30 | Stmicroelectronics (Research & Development) Limited | Routing for DTOF sensors |
CN111856485B (zh) * | 2020-06-12 | 2022-04-26 | 深圳奥锐达科技有限公司 | 一种距离测量***及测量方法 |
CN114071040A (zh) * | 2020-07-31 | 2022-02-18 | 宁波飞芯电子科技有限公司 | 一种图像传感器和读出信号的方法 |
WO2022022432A1 (zh) * | 2020-07-31 | 2022-02-03 | 宁波飞芯电子科技有限公司 | 探测装置及方法 |
JP2022061517A (ja) * | 2020-10-07 | 2022-04-19 | ソニーセミコンダクタソリューションズ株式会社 | 受光素子、測距モジュール、および、受光素子の制御方法 |
US11523043B2 (en) | 2020-10-12 | 2022-12-06 | Apple Inc. | Camera autofocus using time-of-flight assistance |
GB202101369D0 (en) * | 2021-02-01 | 2021-03-17 | Univ Edinburgh | Sensor Device for Imaging |
US20240094400A1 (en) * | 2021-02-11 | 2024-03-21 | Sony Semiconductor Solutions Corporation | Configuration control circuitry and configuration control method |
CN116888440A (zh) * | 2021-03-10 | 2023-10-13 | 华为技术加拿大有限公司 | 基于高速时间门控单光子检测器阵列的光学计算方法和*** |
US20220308189A1 (en) * | 2021-03-24 | 2022-09-29 | Samsung Electronics Co., Ltd. | LOW POWER LiDAR SYSTEM WITH SMART LASER INTERROGRATION |
CN112799097B (zh) * | 2021-04-14 | 2023-11-28 | 深圳阜时科技有限公司 | 深度图和灰度图的获取方法、深度相机、以及电子设备 |
JP2022168739A (ja) * | 2021-04-26 | 2022-11-08 | キヤノン株式会社 | 測距装置および計測ユニット |
US11988835B2 (en) | 2021-05-28 | 2024-05-21 | Microsoft Technology Licensing, Llc | Systems and methods for power efficient image acquisition using single photon avalanche diodes (SPADs) |
US11681028B2 (en) | 2021-07-18 | 2023-06-20 | Apple Inc. | Close-range measurement of time of flight using parallax shift |
CN113325436B (zh) * | 2021-08-03 | 2021-12-14 | 中国科学院西安光学精密机械研究所 | 基于后向散射模型的单光子成像***仿真模型及建模方法 |
CN113777582A (zh) * | 2021-09-06 | 2021-12-10 | 上海惚恍微电子科技有限公司 | 飞行时间tof传感装置及其控制方法 |
CN113759344A (zh) * | 2021-09-06 | 2021-12-07 | 上海惚恍微电子科技有限公司 | 直接飞行时间dtof传感器的感测控制装置和方法 |
WO2024083997A1 (en) * | 2022-10-20 | 2024-04-25 | Ams International Ag | Avalanche diode arrangement and method for driving an avalanche diode arrangement |
CN116756475A (zh) * | 2023-06-27 | 2023-09-15 | 北京信息科技大学 | 一种微环谐振器权重矩阵的抖动控制方法及*** |
Family Cites Families (341)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4373804A (en) | 1979-04-30 | 1983-02-15 | Diffracto Ltd. | Method and apparatus for electro-optically determining the dimension, location and attitude of objects |
JPH07114472B2 (ja) | 1984-11-19 | 1995-12-06 | 株式会社ニコン | 固体撮像素子の駆動方法 |
US4686648A (en) | 1985-12-03 | 1987-08-11 | Hughes Aircraft Company | Charge coupled device differencer |
SE465551B (sv) | 1990-02-16 | 1991-09-30 | Aake Oeberg | Anordning foer bestaemning av en maenniskas hjaert- och andningsfrekvens genom fotopletysmografisk maetning |
US5105264A (en) | 1990-09-28 | 1992-04-14 | Eastman Kodak Company | Color image sensor having an optimum exposure time for each color |
US5329313A (en) | 1992-04-01 | 1994-07-12 | Intel Corporation | Method and apparatus for real time compression and decompression of a digital motion video signal using a fixed Huffman table |
US5550677A (en) | 1993-02-26 | 1996-08-27 | Donnelly Corporation | Automatic rearview mirror system using a photosensor array |
JP3358620B2 (ja) | 1993-04-09 | 2002-12-24 | ソニー株式会社 | 画像符号化方法及び画像符号化装置 |
US5471515A (en) | 1994-01-28 | 1995-11-28 | California Institute Of Technology | Active pixel sensor with intra-pixel charge transfer |
US5841126A (en) | 1994-01-28 | 1998-11-24 | California Institute Of Technology | CMOS active pixel sensor type imaging system on a chip |
US5949483A (en) | 1994-01-28 | 1999-09-07 | California Institute Of Technology | Active pixel sensor array with multiresolution readout |
US5541402A (en) | 1994-10-17 | 1996-07-30 | At&T Corp. | Imaging active pixel device having a non-destructive read-out gate |
JP3284803B2 (ja) | 1994-12-16 | 2002-05-20 | 富士ゼロックス株式会社 | 画像入力装置 |
US6233013B1 (en) | 1997-10-23 | 2001-05-15 | Xerox Corporation | Color readout system for an active pixel image sensor |
US6714239B2 (en) | 1997-10-29 | 2004-03-30 | Eastman Kodak Company | Active pixel sensor with programmable color balance |
JP3667058B2 (ja) | 1997-11-19 | 2005-07-06 | キヤノン株式会社 | 光電変換装置 |
US6008486A (en) | 1997-12-31 | 1999-12-28 | Gentex Corporation | Wide dynamic range optical sensor |
US6348929B1 (en) | 1998-01-16 | 2002-02-19 | Intel Corporation | Scaling algorithm and architecture for integer scaling in video |
JPH11217315A (ja) | 1998-01-27 | 1999-08-10 | Pola Chem Ind Inc | 自然に見えるメークアップ化粧料 |
JPH11216970A (ja) | 1998-01-30 | 1999-08-10 | Toppan Forms Co Ltd | カード送付用台紙 |
US6040568A (en) | 1998-05-06 | 2000-03-21 | Raytheon Company | Multipurpose readout integrated circuit with in cell adaptive non-uniformity correction and enhanced dynamic range |
JP3697073B2 (ja) | 1998-08-05 | 2005-09-21 | キヤノン株式会社 | 撮像装置及びそれを用いた撮像システム |
US6956605B1 (en) | 1998-08-05 | 2005-10-18 | Canon Kabushiki Kaisha | Image pickup apparatus |
US8310577B1 (en) | 1999-08-19 | 2012-11-13 | Youliza, Gehts B.V. Limited Liability Company | Method and apparatus for color compensation |
US7133073B1 (en) | 1999-08-19 | 2006-11-07 | Dialog Imaging Systems Gmbh | Method and apparatus for color interpolation |
JP2001285717A (ja) | 2000-03-29 | 2001-10-12 | Toshiba Corp | 固体撮像装置 |
US6616613B1 (en) | 2000-04-27 | 2003-09-09 | Vitalsines International, Inc. | Physiological signal monitoring system |
US6448550B1 (en) | 2000-04-27 | 2002-09-10 | Agilent Technologies, Inc. | Method and apparatus for measuring spectral content of LED light source and control thereof |
JP3685686B2 (ja) | 2000-06-12 | 2005-08-24 | 三菱電機株式会社 | 撮像エリアセンサおよび撮像装置 |
TW516184B (en) | 2000-06-20 | 2003-01-01 | Pixelplus Co Ltd | CMOS active pixel for improving sensitivity |
US6713796B1 (en) | 2001-01-19 | 2004-03-30 | Dalsa, Inc. | Isolated photodiode |
US7554067B2 (en) | 2001-05-07 | 2009-06-30 | Panavision Imaging Llc | Scanning imager employing multiple chips with staggered pixels |
US7084914B2 (en) | 2001-07-20 | 2006-08-01 | Micron Technology, Inc. | Variable pixel clock electronic shutter control |
US6541751B1 (en) | 2001-10-03 | 2003-04-01 | Pixim Inc | Time multiplexing image processing functions for noise reduction |
KR100464821B1 (ko) | 2001-10-23 | 2005-01-17 | 임좌상 | 생리신호를 이용한 감성평가방법 |
KR100455286B1 (ko) | 2002-01-11 | 2004-11-06 | 삼성전자주식회사 | 생리신호획득 및 해석을 이용한 동물의 상태 파악 방법 및장치 |
US7906826B2 (en) | 2002-02-05 | 2011-03-15 | E-Phocus | Many million pixel image sensor |
KR100462182B1 (ko) | 2002-04-15 | 2004-12-16 | 삼성전자주식회사 | Ppg 기반의 심박 검출 장치 및 방법 |
US6816676B2 (en) | 2002-04-19 | 2004-11-09 | Hewlett-Packard Development Company, L.P. | Adaptive control of LCD display utilizing imaging sensor measurements |
GB0216075D0 (en) | 2002-07-11 | 2002-08-21 | Qinetiq Ltd | Photodetector circuits |
US6670904B1 (en) | 2002-08-22 | 2003-12-30 | Micron Technology, Inc. | Double-ramp ADC for CMOS sensors |
US7786543B2 (en) | 2002-08-27 | 2010-08-31 | E-Phocus | CDS capable sensor with photon sensing layer on active pixel circuit |
US7525168B2 (en) | 2002-08-27 | 2009-04-28 | E-Phocus, Inc. | CMOS sensor with electrodes across photodetectors at approximately equal potential |
JP4403687B2 (ja) | 2002-09-18 | 2010-01-27 | ソニー株式会社 | 固体撮像装置およびその駆動制御方法 |
US20040207836A1 (en) | 2002-09-27 | 2004-10-21 | Rajeshwar Chhibber | High dynamic range optical inspection system and method |
US7471315B2 (en) | 2003-03-14 | 2008-12-30 | Aptina Imaging Corporation | Apparatus and method for detecting and compensating for illuminant intensity changes within an image |
US7075049B2 (en) | 2003-06-11 | 2006-07-11 | Micron Technology, Inc. | Dual conversion gain imagers |
US20050026332A1 (en) | 2003-07-29 | 2005-02-03 | Fratti Roger A. | Techniques for curvature control in power transistor devices |
WO2005020798A2 (en) | 2003-08-27 | 2005-03-10 | Datex-Ohmeda, Inc. | Multi-domain motion estimation and plethysmographic recognition using fuzzy neural-nets |
US7115855B2 (en) | 2003-09-05 | 2006-10-03 | Micron Technology, Inc. | Image sensor having pinned floating diffusion diode |
JP4106554B2 (ja) | 2003-09-08 | 2008-06-25 | ソニー株式会社 | 撮影環境判定方法および撮像装置 |
US7154075B2 (en) | 2003-11-13 | 2006-12-26 | Micron Technology, Inc. | Method and apparatus for pixel signal binning and interpolation in column circuits of a sensor circuit |
US7332786B2 (en) | 2003-11-26 | 2008-02-19 | Micron Technology, Inc. | Anti-blooming storage pixel |
US7091466B2 (en) | 2003-12-19 | 2006-08-15 | Micron Technology, Inc. | Apparatus and method for pixel binning in an image sensor |
JP4259998B2 (ja) | 2003-12-19 | 2009-04-30 | 三洋電機株式会社 | フリッカ検出装置及び撮像装置 |
US7437013B2 (en) | 2003-12-23 | 2008-10-14 | General Instrument Corporation | Directional spatial video noise reduction |
US7446812B2 (en) | 2004-01-13 | 2008-11-04 | Micron Technology, Inc. | Wide dynamic range operations for imaging |
CN1947414A (zh) | 2004-04-21 | 2007-04-11 | 高通股份有限公司 | 用于图像感测装置的闪烁检测 |
KR100574890B1 (ko) | 2004-04-27 | 2006-04-27 | 매그나칩 반도체 유한회사 | 이미지센서 및 이미지센서의 플리커 노이즈 검출 방법 |
KR100578647B1 (ko) | 2004-04-27 | 2006-05-11 | 매그나칩 반도체 유한회사 | 이미지센서의 인티그레이션 방법 |
US7102117B2 (en) | 2004-06-08 | 2006-09-05 | Eastman Kodak Company | Active pixel sensor cell with integrating varactor and method for using such cell |
US7825973B2 (en) | 2004-07-16 | 2010-11-02 | Micron Technology, Inc. | Exposure control for image sensors |
US7880785B2 (en) | 2004-07-21 | 2011-02-01 | Aptina Imaging Corporation | Rod and cone response sensor |
JP4455215B2 (ja) | 2004-08-06 | 2010-04-21 | キヤノン株式会社 | 撮像装置 |
US7259413B2 (en) | 2004-09-28 | 2007-08-21 | Micron Technology, Inc. | High dynamic range image sensor |
US20060103749A1 (en) | 2004-11-12 | 2006-05-18 | Xinping He | Image sensor and pixel that has switchable capacitance at the floating node |
US7555158B2 (en) | 2004-12-07 | 2009-06-30 | Electronics And Telecommunications Research Institute | Apparatus for recovering background in image sequence and method thereof |
US7502054B2 (en) | 2004-12-20 | 2009-03-10 | Pixim, Inc. | Automatic detection of fluorescent flicker in video images |
US7190039B2 (en) | 2005-02-18 | 2007-03-13 | Micron Technology, Inc. | Microelectronic imagers with shaped image sensors and methods for manufacturing microelectronic imagers |
JP4377840B2 (ja) | 2005-03-31 | 2009-12-02 | イーストマン コダック カンパニー | デジタルカメラ |
JP4855704B2 (ja) | 2005-03-31 | 2012-01-18 | 株式会社東芝 | 固体撮像装置 |
US7443421B2 (en) | 2005-04-05 | 2008-10-28 | Hewlett-Packard Development Company, L.P. | Camera sensor |
US20060244843A1 (en) | 2005-04-29 | 2006-11-02 | Bart Dierickx | Illumination flicker detection |
JP4207926B2 (ja) | 2005-05-13 | 2009-01-14 | ソニー株式会社 | フリッカ補正方法、フリッカ補正装置及び撮像装置 |
US7361877B2 (en) | 2005-05-27 | 2008-04-22 | Eastman Kodak Company | Pinned-photodiode pixel with global shutter |
TW201101476A (en) | 2005-06-02 | 2011-01-01 | Sony Corp | Semiconductor image sensor module and method of manufacturing the same |
US20060274161A1 (en) | 2005-06-03 | 2006-12-07 | Intel Corporation | Method and apparatus to determine ambient light using a camera |
US7415096B2 (en) | 2005-07-26 | 2008-08-19 | Jordan Valley Semiconductors Ltd. | Curved X-ray reflector |
US8274715B2 (en) | 2005-07-28 | 2012-09-25 | Omnivision Technologies, Inc. | Processing color and panchromatic pixels |
JP4227152B2 (ja) | 2005-08-02 | 2009-02-18 | 三星電機株式会社 | Cmosイメージセンサの能動ピクセルアレイ |
JP4904749B2 (ja) | 2005-09-08 | 2012-03-28 | ソニー株式会社 | フリッカ低減方法、フリッカ低減回路及び撮像装置 |
KR100775058B1 (ko) | 2005-09-29 | 2007-11-08 | 삼성전자주식회사 | 픽셀 및 이를 이용한 이미지 센서, 그리고 상기 이미지센서를 포함하는 이미지 처리 시스템 |
US8032206B1 (en) | 2005-10-20 | 2011-10-04 | Pacesetter, Inc. | Use of motion sensor for dynamic updating of heart detection threshold |
KR100715932B1 (ko) | 2005-10-24 | 2007-05-08 | (주) 픽셀플러스 | 플리커 검출장치 |
US8355117B2 (en) | 2005-12-21 | 2013-01-15 | Ecole Polytechnique Federale De Lausanne | Method and arrangement for measuring the distance to an object |
US7211802B1 (en) | 2005-12-30 | 2007-05-01 | Eastman Kodak Company | X-ray impingement event detection system and method for a digital radiography detector |
US7626626B2 (en) | 2006-01-13 | 2009-12-01 | Micron Technology, Inc. | Method and apparatus providing pixel storage gate charge sensing for electronic stabilization in imagers |
RU2416840C2 (ru) | 2006-02-01 | 2011-04-20 | Конинклейке Филипс Электроникс, Н.В. | Лавинный фотодиод в режиме счетчика гейгера |
US20070263099A1 (en) | 2006-05-09 | 2007-11-15 | Pixim Inc. | Ambient Light Rejection In Digital Video Images |
JP3996618B1 (ja) | 2006-05-11 | 2007-10-24 | 総吉 廣津 | 半導体撮像素子 |
US7667400B1 (en) | 2006-06-09 | 2010-02-23 | Array Optronix, Inc. | Back-illuminated Si photomultipliers: structure and fabrication methods |
US8026966B2 (en) | 2006-08-29 | 2011-09-27 | Micron Technology, Inc. | Method, apparatus and system providing a storage gate pixel with high dynamic range |
US7773138B2 (en) | 2006-09-13 | 2010-08-10 | Tower Semiconductor Ltd. | Color pattern and pixel level binning for APS image sensor using 2×2 photodiode sharing scheme |
WO2008032442A1 (fr) | 2006-09-14 | 2008-03-20 | Nikon Corporation | Dispositif de traitement d'images, caméra électronique et programme de traitement d'images |
WO2008055042A2 (en) | 2006-10-30 | 2008-05-08 | Wesleyan University | Apparatus and method for real time image compression for particle tracking |
KR20080041912A (ko) | 2006-11-08 | 2008-05-14 | 삼성전자주식회사 | 감도 제어가 가능한 씨모스 이미지 센서의 픽셀 회로 |
KR100828943B1 (ko) | 2006-12-19 | 2008-05-13 | (주)실리콘화일 | 3t-4s 스텝 & 리피트 단위 셀 및 상기 단위 셀을 구비한 이미지센서, 데이터 저장 장치, 반도체 공정 마스크, 반도체 웨이퍼 |
US7742090B2 (en) | 2006-12-22 | 2010-06-22 | Palo Alto Research Center Incorporated | Flexible segmented image sensor |
US7589316B2 (en) | 2007-01-18 | 2009-09-15 | Ethicon Endo-Surgery, Inc. | Scanning beam imaging with adjustable detector sensitivity or gain |
KR20080069851A (ko) | 2007-01-24 | 2008-07-29 | 삼성전자주식회사 | 생체 신호 측정 센서 장치 및 상기 센서 장치를 구비한헤드셋 장치 및 팬던트 장치 |
US7796171B2 (en) | 2007-02-16 | 2010-09-14 | Flir Advanced Imaging Systems, Inc. | Sensor-based gamma correction of a digital camera |
CN101622859B (zh) | 2007-03-05 | 2011-06-15 | 瑞萨电子株式会社 | 成像装置和闪烁检测方法 |
KR100835892B1 (ko) | 2007-03-26 | 2008-06-09 | (주)실리콘화일 | 칩 적층 이미지센서 |
KR100853195B1 (ko) | 2007-04-10 | 2008-08-21 | 삼성전자주식회사 | 이미지 센서 |
JP4935486B2 (ja) | 2007-04-23 | 2012-05-23 | ソニー株式会社 | 固体撮像装置、固体撮像装置の駆動方法、固体撮像装置の信号処理方法および撮像装置 |
JP5163935B2 (ja) | 2007-05-17 | 2013-03-13 | ソニー株式会社 | イメージセンサ |
KR100871981B1 (ko) | 2007-06-25 | 2008-12-08 | 주식회사 동부하이텍 | 이미지센서 및 그 제조방법 |
KR100872991B1 (ko) | 2007-06-25 | 2008-12-08 | 주식회사 동부하이텍 | 이미지센서 및 그 제조방법 |
JP2009021809A (ja) | 2007-07-11 | 2009-01-29 | Canon Inc | 撮像装置の駆動方法、撮像装置、及び撮像システム |
US8098372B2 (en) | 2007-07-23 | 2012-01-17 | Applied Materials South East Asia Pte. Ltd. | Optical inspection tool featuring multiple speed modes |
US7696483B2 (en) * | 2007-08-10 | 2010-04-13 | General Electric Company | High DQE photon counting detector using statistical recovery of pile-up events |
US7873236B2 (en) | 2007-08-28 | 2011-01-18 | General Electric Company | Systems, methods and apparatus for consistency-constrained filtered backprojection for out-of-focus artifacts in digital tomosythesis |
JP2009054870A (ja) | 2007-08-28 | 2009-03-12 | Sanyo Electric Co Ltd | 撮像装置 |
KR100887887B1 (ko) | 2007-11-06 | 2009-03-06 | 주식회사 동부하이텍 | 이미지센서 |
JP5163068B2 (ja) | 2007-11-16 | 2013-03-13 | 株式会社ニコン | 撮像装置 |
JP4971956B2 (ja) | 2007-11-27 | 2012-07-11 | キヤノン株式会社 | フリッカ補正装置、フリッカ補正方法並びに撮像装置 |
US20090146234A1 (en) | 2007-12-06 | 2009-06-11 | Micron Technology, Inc. | Microelectronic imaging units having an infrared-absorbing layer and associated systems and methods |
US8259228B2 (en) | 2007-12-10 | 2012-09-04 | Ati Technologies Ulc | Method and apparatus for high quality video motion adaptive edge-directional deinterlacing |
US7952635B2 (en) | 2007-12-19 | 2011-05-31 | Teledyne Licensing, Llc | Low noise readout apparatus and method with snapshot shutter and correlated double sampling |
JP5026951B2 (ja) | 2007-12-26 | 2012-09-19 | オリンパスイメージング株式会社 | 撮像素子の駆動装置、撮像素子の駆動方法、撮像装置、及び撮像素子 |
US9017748B2 (en) | 2007-12-28 | 2015-04-28 | Kraft Foods Group Brands Llc | Potassium fortification in foodstuffs |
JP5111100B2 (ja) | 2007-12-28 | 2012-12-26 | キヤノン株式会社 | 画像処理装置、画像処理方法、プログラム及び記憶媒体 |
EP2398055B1 (en) | 2008-01-10 | 2012-12-12 | Stmicroelectronics Sa | Pixel circuit for global electronic shutter |
US8227844B2 (en) | 2008-01-14 | 2012-07-24 | International Business Machines Corporation | Low lag transfer gate device |
US20090201400A1 (en) | 2008-02-08 | 2009-08-13 | Omnivision Technologies, Inc. | Backside illuminated image sensor with global shutter and storage capacitor |
KR20090087644A (ko) | 2008-02-13 | 2009-08-18 | 삼성전자주식회사 | 따른 픽셀 회로 어레이 |
US8874377B1 (en) * | 2008-02-29 | 2014-10-28 | The United States Of America As Represented By The Secretary Of The Army | Photon counting based particles detection method and apparatus |
JP2009212909A (ja) | 2008-03-05 | 2009-09-17 | Sharp Corp | 固体撮像装置、固体撮像装置のフリッカ検出方法、制御プログラム、可読記録媒体および電子情報機器 |
JP5568880B2 (ja) | 2008-04-03 | 2014-08-13 | ソニー株式会社 | 固体撮像装置、固体撮像装置の駆動方法および電子機器 |
US8116540B2 (en) | 2008-04-04 | 2012-02-14 | Validity Sensors, Inc. | Apparatus and method for reducing noise in fingerprint sensing circuits |
JP4494492B2 (ja) | 2008-04-09 | 2010-06-30 | キヤノン株式会社 | 固体撮像装置及び固体撮像装置の駆動方法 |
CA2628792A1 (en) | 2008-04-10 | 2009-10-10 | Chaji G. Reza | High dynamic range active pixel sensor |
WO2009140360A1 (en) | 2008-05-14 | 2009-11-19 | Espenuda Holding, Llc | Physical activity monitor and data collection unit |
JP5188275B2 (ja) | 2008-06-06 | 2013-04-24 | キヤノン株式会社 | 固体撮像装置、その駆動方法及び撮像システム |
US8637875B2 (en) | 2008-07-11 | 2014-01-28 | The Regents Of The University Of California | Single photon IR detectors and their integration with silicon detectors |
KR20100008239A (ko) | 2008-07-15 | 2010-01-25 | (주)에스엔티 | 피피지 신호의 동잡음 제거방법 |
JP5300356B2 (ja) | 2008-07-18 | 2013-09-25 | キヤノン株式会社 | 撮像装置、及び撮像装置の制御方法 |
US8388346B2 (en) | 2008-08-30 | 2013-03-05 | Nokia Corporation | Tactile feedback |
JP2010080604A (ja) | 2008-09-25 | 2010-04-08 | Panasonic Corp | 固体撮像装置およびその駆動方法 |
US20100110018A1 (en) | 2008-10-30 | 2010-05-06 | Research In Motion Limited | Portable electronic device including touch-sensitive input device and method of controlling same |
JP2010113230A (ja) | 2008-11-07 | 2010-05-20 | Sony Corp | 画素回路及び表示装置と電子機器 |
JP2010114834A (ja) | 2008-11-10 | 2010-05-20 | Olympus Imaging Corp | 撮像装置 |
JP5254762B2 (ja) | 2008-11-28 | 2013-08-07 | キヤノン株式会社 | 撮像装置、撮像システム、及び撮像装置における信号の補正方法 |
KR20100065084A (ko) | 2008-12-05 | 2010-06-15 | 한국전자통신연구원 | 움직임 잡음에 강인한 맥파 측정 장치 및 그 방법 |
US7838956B2 (en) | 2008-12-17 | 2010-11-23 | Eastman Kodak Company | Back illuminated sensor with low crosstalk |
US8164669B2 (en) | 2008-12-19 | 2012-04-24 | Truesense Imaging, Inc. | Charge-coupled device image sensor with efficient binning of same-color pixels |
US20100159632A1 (en) | 2008-12-23 | 2010-06-24 | Omnivision Technologies, Inc. | Technique for fabrication of backside illuminated image sensor |
US8686952B2 (en) | 2008-12-23 | 2014-04-01 | Apple Inc. | Multi touch with multi haptics |
US8760413B2 (en) | 2009-01-08 | 2014-06-24 | Synaptics Incorporated | Tactile surface |
US8340407B2 (en) | 2009-01-14 | 2012-12-25 | Cisco Technology, Inc. | System and method for image demosaicing |
US20120159996A1 (en) | 2010-12-28 | 2012-06-28 | Gary Edwin Sutton | Curved sensor formed from silicon fibers |
US8184188B2 (en) | 2009-03-12 | 2012-05-22 | Micron Technology, Inc. | Methods and apparatus for high dynamic operation of a pixel cell |
JP4835710B2 (ja) | 2009-03-17 | 2011-12-14 | ソニー株式会社 | 固体撮像装置、固体撮像装置の製造方法、固体撮像装置の駆動方法、及び電子機器 |
US8140143B2 (en) | 2009-04-16 | 2012-03-20 | Massachusetts Institute Of Technology | Washable wearable biosensor |
US8089036B2 (en) | 2009-04-30 | 2012-01-03 | Omnivision Technologies, Inc. | Image sensor with global shutter and in pixel storage transistor |
JP2011004390A (ja) | 2009-05-18 | 2011-01-06 | Canon Inc | 撮像装置、撮像システム、及び撮像装置の駆動方法 |
US8350940B2 (en) | 2009-06-08 | 2013-01-08 | Aptina Imaging Corporation | Image sensors and color filter arrays for charge summing and interlaced readout modes |
CN101567977B (zh) | 2009-06-09 | 2013-09-18 | 北京中星微电子有限公司 | 一种闪烁检测方法及其装置 |
JP5681176B2 (ja) | 2009-06-22 | 2015-03-04 | トヨタ モーター ヨーロッパ ナームロゼ フェンノートシャップ/ソシエテ アノニム | パルス光による光学式距離計 |
KR101597785B1 (ko) | 2009-07-14 | 2016-02-25 | 삼성전자주식회사 | 이미지 센서 및 영상 처리 방법 |
US8755854B2 (en) | 2009-07-31 | 2014-06-17 | Nellcor Puritan Bennett Ireland | Methods and apparatus for producing and using lightly filtered photoplethysmograph signals |
JP5625284B2 (ja) | 2009-08-10 | 2014-11-19 | ソニー株式会社 | 固体撮像装置、固体撮像装置の駆動方法および電子機器 |
TWI423246B (zh) | 2009-08-21 | 2014-01-11 | Primax Electronics Ltd | 圖像處理方法及其相關裝置 |
JP2011049697A (ja) | 2009-08-25 | 2011-03-10 | Panasonic Corp | フリッカ検出装置、撮像装置、フリッカ検出プログラム、及び、フリッカ検出方法 |
US8619163B2 (en) | 2009-09-18 | 2013-12-31 | Canon Kabushiki Kaisha | Solid state imaging using a correction parameter for correcting a cross talk between adjacent pixels |
US9066660B2 (en) | 2009-09-29 | 2015-06-30 | Nellcor Puritan Bennett Ireland | Systems and methods for high-pass filtering a photoplethysmograph signal |
US8194165B2 (en) | 2009-09-30 | 2012-06-05 | Truesense Imaging, Inc. | Methods for capturing and reading out images from an image sensor |
US20110080500A1 (en) | 2009-10-05 | 2011-04-07 | Hand Held Products, Inc. | Imaging terminal, imaging sensor having multiple reset and/or multiple read mode and methods for operating the same |
JP4881987B2 (ja) | 2009-10-06 | 2012-02-22 | キヤノン株式会社 | 固体撮像装置および撮像装置 |
JP2011091775A (ja) | 2009-10-26 | 2011-05-06 | Toshiba Corp | 固体撮像装置 |
WO2011053711A1 (en) | 2009-10-30 | 2011-05-05 | Invisage Technologies, Inc. | Systems and methods for color binning |
FI20096232A0 (sv) | 2009-11-23 | 2009-11-23 | Valtion Teknillinen | Fysisk aktivitetsbaserad styrning för en anordning |
TWI420662B (zh) | 2009-12-25 | 2013-12-21 | Sony Corp | 半導體元件及其製造方法,及電子裝置 |
US8330829B2 (en) | 2009-12-31 | 2012-12-11 | Microsoft Corporation | Photographic flicker detection and compensation |
US20110156197A1 (en) | 2009-12-31 | 2011-06-30 | Tivarus Cristian A | Interwafer interconnects for stacked CMOS image sensors |
US9870053B2 (en) | 2010-02-08 | 2018-01-16 | Immersion Corporation | Systems and methods for haptic feedback using laterally driven piezoelectric actuators |
JP5641287B2 (ja) | 2010-03-31 | 2014-12-17 | ソニー株式会社 | 固体撮像装置、固体撮像装置の駆動方法、および、電子機器 |
CN101803925B (zh) | 2010-03-31 | 2012-01-04 | 上海交通大学 | 运动状态下的血氧饱和度监测装置 |
US9451887B2 (en) | 2010-03-31 | 2016-09-27 | Nellcor Puritan Bennett Ireland | Systems and methods for measuring electromechanical delay of the heart |
JP2011216673A (ja) | 2010-03-31 | 2011-10-27 | Sony Corp | 固体撮像装置、固体撮像装置の製造方法、および電子機器 |
JP5516960B2 (ja) | 2010-04-02 | 2014-06-11 | ソニー株式会社 | 固体撮像装置、固体撮像装置の駆動方法、および、電子機器 |
US8653434B2 (en) | 2010-04-08 | 2014-02-18 | Bae Systems Information And Electronic Systems Integration Inc. | Avalanche photodiode operating voltage selection algorithm |
EP2387229B1 (en) | 2010-05-14 | 2016-04-06 | Casio Computer Co., Ltd. | Image capturing apparatus and camera shake correction method, and computer-readable medium |
JP5644451B2 (ja) | 2010-05-25 | 2014-12-24 | 株式会社リコー | 画像処理装置および画像処理方法、ならびに、撮像装置 |
KR101473424B1 (ko) | 2010-06-01 | 2014-12-24 | 볼리 미디어 커뮤니케이션스 (센젠) 캄파니 리미티드 | 다중 스펙트럼 감광소자 및 그 샘플링 방법 |
KR101198249B1 (ko) | 2010-07-07 | 2012-11-07 | 에스케이하이닉스 주식회사 | 이미지센서의 컬럼 회로 및 픽셀 비닝 회로 |
WO2012011095A1 (en) | 2010-07-19 | 2012-01-26 | Yeda Research And Development Co. Ltd. | Linear optical characterization of ultrashort optical pulses |
JP5682174B2 (ja) | 2010-08-09 | 2015-03-11 | ソニー株式会社 | 固体撮像装置とその製造方法、並びに電子機器 |
US8338856B2 (en) | 2010-08-10 | 2012-12-25 | Omnivision Technologies, Inc. | Backside illuminated image sensor with stressed film |
GB201014843D0 (en) | 2010-09-08 | 2010-10-20 | Univ Edinburgh | Single photon avalanche diode for CMOS circuits |
US20120092541A1 (en) | 2010-10-19 | 2012-04-19 | Nokia Corporation | Method and apparatus for ambient light measurement system |
JP5739640B2 (ja) | 2010-10-20 | 2015-06-24 | キヤノン株式会社 | 撮像素子及び撮像装置 |
CN102451160A (zh) | 2010-10-22 | 2012-05-16 | 夏落 | 一种长循环纳米粒的制备方法 |
US9857469B2 (en) | 2010-10-22 | 2018-01-02 | Heptagon Micro Optics Pte. Ltd. | System and method for multi TOF camera operation using phase hopping |
JP5589760B2 (ja) | 2010-10-27 | 2014-09-17 | ソニー株式会社 | 画像処理装置、撮像装置、画像処理方法およびプログラム。 |
DE102010060527B3 (de) * | 2010-11-12 | 2012-04-19 | Picoquant Gmbh | Schaltungsanordnung zum Nachweis einzelner Photonen |
US10120446B2 (en) | 2010-11-19 | 2018-11-06 | Apple Inc. | Haptic input device |
JP5721405B2 (ja) | 2010-11-22 | 2015-05-20 | キヤノン株式会社 | 撮像システム、その制御方法及びプログラム |
JP5724322B2 (ja) | 2010-11-24 | 2015-05-27 | ソニー株式会社 | 固体撮像装置の製造方法 |
GB2485994A (en) | 2010-11-30 | 2012-06-06 | St Microelectronics Res & Dev | Navigation device using a Single Photon Avalanche Diode (SPAD) detector |
JP5673063B2 (ja) | 2010-12-15 | 2015-02-18 | ソニー株式会社 | 固体撮像素子および駆動方法、並びに電子機器 |
US8723094B2 (en) | 2010-12-21 | 2014-05-13 | Sionyx, Inc. | Photodetecting imager devices having correlated double sampling and associated methods |
DE102010061382B4 (de) * | 2010-12-21 | 2019-02-14 | Sick Ag | Optoelektronischer Sensor und Verfahren zur Erfassung und Abstandsbestimmung von Objekten |
GB2486668A (en) * | 2010-12-22 | 2012-06-27 | St Microelectronics Res & Dev | Real-time processing method and system for an optical range finder |
EP2469301A1 (en) | 2010-12-23 | 2012-06-27 | André Borowski | Methods and devices for generating a representation of a 3D scene at very high speed |
EP2469295A1 (en) | 2010-12-23 | 2012-06-27 | André Borowski | 3D landscape real-time imager and corresponding imaging methods |
US8723975B2 (en) | 2011-01-24 | 2014-05-13 | Aptina Imaging Corporation | High-dynamic-range imaging devices |
US8803990B2 (en) | 2011-01-25 | 2014-08-12 | Aptina Imaging Corporation | Imaging system with multiple sensors for producing high-dynamic-range images |
JP5426587B2 (ja) | 2011-01-31 | 2014-02-26 | 株式会社東芝 | 固体撮像装置及びその画素平均化処理方法 |
CN103329513B (zh) | 2011-02-04 | 2017-06-27 | 松下知识产权经营株式会社 | 固体摄像装置及其驱动方法 |
JP2012169530A (ja) | 2011-02-16 | 2012-09-06 | Sony Corp | 固体撮像装置、および、その製造方法、電子機器 |
KR101833269B1 (ko) | 2011-03-10 | 2018-02-28 | 사이오닉스, 엘엘씨 | 3차원 센서, 시스템, 및 관련 방법 |
DE102011005740A1 (de) * | 2011-03-17 | 2012-09-20 | Robert Bosch Gmbh | Messvorrichtung zur Messung einer Entfernung zwischen der Messvorrichtung und einem Zielobjekt mit Hilfe optischer Messstrahlung |
RU2589468C2 (ru) * | 2011-04-05 | 2016-07-10 | Конинклейке Филипс Н.В. | Матрица детекторов с аналого-цифровым преобразованием времени, имеющая повышенную временную точность |
US9088727B2 (en) | 2011-04-06 | 2015-07-21 | Pelco, Inc. | Spatially-varying flicker detection |
KR101294386B1 (ko) | 2011-04-13 | 2013-08-08 | 엘지이노텍 주식회사 | 픽셀, 픽셀 어레이 및 픽셀 어레이를 포함하는 이미지센서 |
US8575531B2 (en) | 2011-04-26 | 2013-11-05 | Aptina Imaging Corporation | Image sensor array for back side illumination with global shutter using a junction gate photodiode |
CN103503438A (zh) | 2011-05-24 | 2014-01-08 | 索尼公司 | 固态图像拾取装置和相机*** |
US8643132B2 (en) | 2011-06-08 | 2014-02-04 | Omnivision Technologies, Inc. | In-pixel high dynamic range imaging |
JP5885403B2 (ja) | 2011-06-08 | 2016-03-15 | キヤノン株式会社 | 撮像装置 |
TWI505453B (zh) | 2011-07-12 | 2015-10-21 | Sony Corp | 固態成像裝置,用於驅動其之方法,用於製造其之方法,及電子裝置 |
RU2014107914A (ru) * | 2011-08-03 | 2015-09-10 | Конинклейке Филипс Н.В. | Режимы позиционночувствительного считывания для матриц цифровых кремниевых фотоэлектронных умножителей |
JP2013051523A (ja) | 2011-08-30 | 2013-03-14 | Sharp Corp | フリッカ検出装置、フリッカ検出方法、制御プログラム、可読記録媒体、固体撮像装置、多眼撮像装置および電子情報機器 |
JP2013055500A (ja) | 2011-09-02 | 2013-03-21 | Sony Corp | 固体撮像素子およびカメラシステム |
JP5935274B2 (ja) | 2011-09-22 | 2016-06-15 | ソニー株式会社 | 固体撮像装置、固体撮像装置の制御方法および固体撮像装置の制御プログラム |
JP5945395B2 (ja) | 2011-10-13 | 2016-07-05 | オリンパス株式会社 | 撮像装置 |
GB2494479A (en) * | 2011-10-19 | 2013-03-13 | St Microelectronics Res & Dev | A proximity sensor with a cover for directing radiation from a radiation source to a reference radiation detector |
US8594170B2 (en) | 2011-10-24 | 2013-11-26 | Sigear Europe Sarl | Clock masking scheme in a mixed-signal system |
WO2013066959A1 (en) | 2011-10-31 | 2013-05-10 | The Trustees Of Columbia University In The City Of New York | Systems and methods for imaging using single photon avalanche diodes |
JP5764466B2 (ja) | 2011-11-04 | 2015-08-19 | ルネサスエレクトロニクス株式会社 | 固体撮像装置 |
US8982237B2 (en) | 2011-12-09 | 2015-03-17 | Htc Corporation | Portable electronic device with auto-exposure control adaptive to environment brightness and image capturing method using the same |
CN103165103A (zh) | 2011-12-12 | 2013-06-19 | 深圳富泰宏精密工业有限公司 | 电子装置显示屏的亮度调整***及方法 |
JP6239820B2 (ja) | 2011-12-19 | 2017-11-29 | キヤノン株式会社 | 撮像装置及びその制御方法 |
JP5497874B2 (ja) | 2011-12-22 | 2014-05-21 | 富士フイルム株式会社 | 放射線画像検出器、放射線画像撮像装置、及び放射線画像撮像システム |
KR101386649B1 (ko) | 2011-12-26 | 2014-09-23 | 전자부품연구원 | 사용자의 상태 적용 게임 장치 및 그 게임 제공 방법 |
FR2985570A1 (fr) * | 2012-01-09 | 2013-07-12 | St Microelectronics Grenoble 2 | Dispositif de detection de la proximite d'un objet, comprenant des photodiodes spad |
EP2624569B1 (en) | 2012-02-06 | 2016-09-28 | Harvest Imaging bvba | Method for correcting image data from an image sensor having image pixels and non-image pixels, and image sensor implementing the same |
JP6151530B2 (ja) | 2012-02-29 | 2017-06-21 | 株式会社半導体エネルギー研究所 | イメージセンサ、カメラ、及び監視システム |
CN104221365B (zh) | 2012-03-30 | 2018-11-06 | 株式会社尼康 | 拍摄元件、摄影方法及拍摄装置 |
FR2989518A1 (fr) | 2012-04-13 | 2013-10-18 | St Microelectronics Crolles 2 | Procede de fabrication d'un capteur d'image a surface courbe |
US9270906B2 (en) | 2012-05-02 | 2016-02-23 | Semiconductor Components Industries, Llc | Exposure time selection using stacked-chip image sensors |
GB201209412D0 (en) | 2012-05-28 | 2012-07-11 | Obs Medical Ltd | Narrow band feature extraction from cardiac signals |
GB201209413D0 (en) | 2012-05-28 | 2012-07-11 | Obs Medical Ltd | Respiration rate extraction from cardiac signals |
US9420208B2 (en) | 2012-07-13 | 2016-08-16 | Canon Kabushiki Kaisha | Driving method for image pickup apparatus and driving method for image pickup system |
US10334181B2 (en) | 2012-08-20 | 2019-06-25 | Microsoft Technology Licensing, Llc | Dynamically curved sensor for optical zoom lens |
US8817154B2 (en) | 2012-08-30 | 2014-08-26 | Omnivision Technologies, Inc. | Image sensor with fixed potential output transistor |
JP2014057268A (ja) | 2012-09-13 | 2014-03-27 | Toshiba Corp | 撮像装置 |
US9448110B2 (en) | 2012-09-27 | 2016-09-20 | Northrop Grumman Systems Corporation | Three-dimensional hyperspectral imaging systems and methods using a light detection and ranging (LIDAR) focal plane array |
JP6012375B2 (ja) | 2012-09-28 | 2016-10-25 | 株式会社メガチップス | 画素補間処理装置、撮像装置、プログラムおよび集積回路 |
JP6225411B2 (ja) | 2012-10-16 | 2017-11-08 | 株式会社豊田中央研究所 | 光学的測距装置 |
GB201219781D0 (en) * | 2012-11-02 | 2012-12-19 | St Microelectronics Res & Dev | Improvements in time of flight pixel circuits |
GB2507783B (en) | 2012-11-09 | 2015-03-11 | Ge Aviat Systems Ltd | Aircraft haptic touch screen and method for operating same |
US9700240B2 (en) | 2012-12-14 | 2017-07-11 | Microsoft Technology Licensing, Llc | Physical activity inference from environmental metrics |
US9164144B2 (en) | 2012-12-27 | 2015-10-20 | General Electric Company | Characterization and calibration of large area solid state photomultiplier breakdown voltage and/or capacitance |
CN103090971B (zh) * | 2013-01-24 | 2014-12-31 | 中国科学院空间科学与应用研究中心 | 一种超灵敏时间分辨成像光谱仪及其时间分辨成像方法 |
US9380245B1 (en) | 2013-02-14 | 2016-06-28 | Rambus Inc. | Conditional-reset image sensor with analog counter array |
GB2510890A (en) | 2013-02-18 | 2014-08-20 | St Microelectronics Res & Dev | Method and apparatus |
US8934030B2 (en) | 2013-02-20 | 2015-01-13 | Hewlett-Packard Development Company, L.P. | Suppressing flicker in digital images |
JP6087674B2 (ja) | 2013-02-27 | 2017-03-01 | キヤノン株式会社 | 撮像装置 |
US9293500B2 (en) | 2013-03-01 | 2016-03-22 | Apple Inc. | Exposure control for image sensors |
US9276031B2 (en) | 2013-03-04 | 2016-03-01 | Apple Inc. | Photodiode with different electric potential regions for image sensors |
US9041837B2 (en) | 2013-03-05 | 2015-05-26 | Apple Inc. | Image sensor with reduced blooming |
KR20140109668A (ko) | 2013-03-06 | 2014-09-16 | 삼성전자주식회사 | 플리커를 검출하기 위한 방법 및 시스템 |
US9741754B2 (en) | 2013-03-06 | 2017-08-22 | Apple Inc. | Charge transfer circuit with storage nodes in image sensors |
KR102009189B1 (ko) | 2013-03-12 | 2019-08-09 | 삼성전자주식회사 | 이미지 센서 및 2행 동시 독출 방법 |
US9549099B2 (en) | 2013-03-12 | 2017-01-17 | Apple Inc. | Hybrid image sensor |
US9319611B2 (en) | 2013-03-14 | 2016-04-19 | Apple Inc. | Image sensor with flexible pixel summing |
WO2014144391A1 (en) | 2013-03-15 | 2014-09-18 | Rambus Inc. | Threshold-monitoring, conditional-reset image sensor |
US9066017B2 (en) | 2013-03-25 | 2015-06-23 | Google Inc. | Viewfinder display based on metering images |
US9160949B2 (en) | 2013-04-01 | 2015-10-13 | Omnivision Technologies, Inc. | Enhanced photon detection device with biased deep trench isolation |
JP6104049B2 (ja) | 2013-05-21 | 2017-03-29 | オリンパス株式会社 | 画像処理装置、画像処理方法、および画像処理用プログラム |
US9154750B2 (en) | 2013-05-28 | 2015-10-06 | Omnivision Technologies, Inc. | Correction of image sensor fixed-pattern noise (FPN) due to color filter pattern |
JP2015012127A (ja) | 2013-06-28 | 2015-01-19 | ソニー株式会社 | 固体撮像素子および電子機器 |
GB2520232A (en) * | 2013-08-06 | 2015-05-20 | Univ Edinburgh | Multiple Event Time to Digital Converter |
JP6090060B2 (ja) | 2013-08-23 | 2017-03-08 | 株式会社豊田中央研究所 | シングルフォトンアバランシェダイオード |
US9344649B2 (en) | 2013-08-23 | 2016-05-17 | Semiconductor Components Industries, Llc | Floating point image sensors with different integration times |
EP3054671B1 (en) | 2013-10-02 | 2018-12-19 | Nikon Corporation | Image pickup element and image pickup apparatus |
US9596423B1 (en) | 2013-11-21 | 2017-03-14 | Apple Inc. | Charge summing in an image sensor |
US9596420B2 (en) | 2013-12-05 | 2017-03-14 | Apple Inc. | Image sensor having pixels with different integration periods |
US9473706B2 (en) | 2013-12-09 | 2016-10-18 | Apple Inc. | Image sensor flicker detection |
US9331116B2 (en) | 2014-01-15 | 2016-05-03 | Omnivision Technologies, Inc. | Back side illuminated single photon avalanche diode imaging sensor with high short wavelength detection efficiency |
US9312401B2 (en) | 2014-01-15 | 2016-04-12 | Omnivision Technologies, Inc. | Single photon avalanche diode imaging sensor for complementary metal oxide semiconductor stacked chip applications |
KR102135586B1 (ko) | 2014-01-24 | 2020-07-20 | 엘지전자 주식회사 | 이동 단말기 및 이의 제어방법 |
US10285626B1 (en) | 2014-02-14 | 2019-05-14 | Apple Inc. | Activity identification using an optical heart rate monitor |
CN103779437A (zh) | 2014-02-17 | 2014-05-07 | 苏州超锐微电子有限公司 | 一种基于标准cmos工艺的单光子级分辨率传感器单元结构 |
US9232150B2 (en) | 2014-03-12 | 2016-01-05 | Apple Inc. | System and method for estimating an ambient light condition using an image sensor |
US9277144B2 (en) | 2014-03-12 | 2016-03-01 | Apple Inc. | System and method for estimating an ambient light condition using an image sensor and field-of-view compensation |
US9584743B1 (en) | 2014-03-13 | 2017-02-28 | Apple Inc. | Image sensor with auto-focus and pixel cross-talk compensation |
US9478030B1 (en) | 2014-03-19 | 2016-10-25 | Amazon Technologies, Inc. | Automatic visual fact extraction |
CN106164808A (zh) | 2014-04-01 | 2016-11-23 | 苹果公司 | 用于戒指计算设备的设备和方法 |
WO2015157341A1 (en) * | 2014-04-07 | 2015-10-15 | Samsung Electronics Co., Ltd. | High resolution, high frame rate, low power image sensor |
US9497397B1 (en) | 2014-04-08 | 2016-11-15 | Apple Inc. | Image sensor with auto-focus and color ratio cross-talk comparison |
US9538106B2 (en) | 2014-04-25 | 2017-01-03 | Apple Inc. | Image sensor having a uniform digital power signature |
US9445018B2 (en) | 2014-05-01 | 2016-09-13 | Semiconductor Components Industries, Llc | Imaging systems with phase detection pixels |
US9686485B2 (en) | 2014-05-30 | 2017-06-20 | Apple Inc. | Pixel binning in an image sensor |
US9888198B2 (en) | 2014-06-03 | 2018-02-06 | Semiconductor Components Industries, Llc | Imaging systems having image sensor pixel arrays with sub-pixel resolution capabilities |
JP6384171B2 (ja) * | 2014-07-23 | 2018-09-05 | アイシン精機株式会社 | 欠陥抽出装置及び欠陥抽出方法 |
JP6610962B2 (ja) | 2014-07-25 | 2019-11-27 | ソニー株式会社 | 固体撮像素子、ad変換器、および電子機器 |
US9209320B1 (en) | 2014-08-07 | 2015-12-08 | Omnivision Technologies, Inc. | Method of fabricating a single photon avalanche diode imaging sensor |
US20160050379A1 (en) | 2014-08-18 | 2016-02-18 | Apple Inc. | Curved Light Sensor |
US9894304B1 (en) | 2014-08-18 | 2018-02-13 | Rambus Inc. | Line-interleaved image sensors |
US9658336B2 (en) * | 2014-08-20 | 2017-05-23 | Omnivision Technologies, Inc. | Programmable current source for a time of flight 3D image sensor |
WO2016033036A2 (en) | 2014-08-26 | 2016-03-03 | Massachusetts Institute Of Technology | Methods and apparatus for three-dimensional (3d) imaging |
US9685576B2 (en) | 2014-10-03 | 2017-06-20 | Omnivision Technologies, Inc. | Back side illuminated image sensor with guard ring region reflecting structure |
US9973678B2 (en) | 2015-01-14 | 2018-05-15 | Invisage Technologies, Inc. | Phase-detect autofocus |
US10217889B2 (en) | 2015-01-27 | 2019-02-26 | Ladarsystems, Inc. | Clamped avalanche photodiode |
JP6333189B2 (ja) | 2015-02-09 | 2018-05-30 | 三菱電機株式会社 | レーザ受信装置 |
US9608027B2 (en) * | 2015-02-17 | 2017-03-28 | Omnivision Technologies, Inc. | Stacked embedded SPAD image sensor for attached 3D information |
JP6481405B2 (ja) * | 2015-02-17 | 2019-03-13 | 株式会社デンソー | 演算装置 |
KR20160103302A (ko) | 2015-02-24 | 2016-09-01 | 에스케이하이닉스 주식회사 | 램프전압 제너레이터 및 그를 포함하는 이미지 센싱 장치 |
CN104810377B (zh) | 2015-03-04 | 2018-03-06 | 南京邮电大学 | 一种高集成度的单光子雪崩二极管探测器阵列单元 |
KR20160109002A (ko) | 2015-03-09 | 2016-09-21 | 에스케이하이닉스 주식회사 | 출력 극성 변환을 이용한 전치 증폭기 및 그를 이용한 비교기와 아날로그-디지털 변환 장치 |
EP3070494B1 (de) | 2015-03-18 | 2021-04-28 | Leica Geosystems AG | Elektrooptisches distanzmessverfahren und ebensolcher distanzmesser |
US9749556B2 (en) | 2015-03-24 | 2017-08-29 | Semiconductor Components Industries, Llc | Imaging systems having image sensor pixel arrays with phase detection capabilities |
US10145678B2 (en) | 2015-04-20 | 2018-12-04 | Samsung Electronics Co., Ltd. | CMOS image sensor for depth measurement using triangulation with point scan |
US9661308B1 (en) | 2015-04-20 | 2017-05-23 | Samsung Electronics Co., Ltd. | Increasing tolerance of sensor-scanner misalignment of the 3D camera with epipolar line laser point scanning |
CN105047517B (zh) * | 2015-07-08 | 2017-11-14 | 武汉京邦科技有限公司 | 一种数字光电倍增器件 |
KR20170019542A (ko) | 2015-08-11 | 2017-02-22 | 삼성전자주식회사 | 자동 초점 이미지 센서 |
US10620300B2 (en) | 2015-08-20 | 2020-04-14 | Apple Inc. | SPAD array with gated histogram construction |
US10108151B2 (en) | 2015-09-21 | 2018-10-23 | Apple Inc. | Indicators for wearable electronic devices |
US10613225B2 (en) | 2015-09-21 | 2020-04-07 | Kabushiki Kaisha Toshiba | Distance measuring device |
CN105185796B (zh) | 2015-09-30 | 2018-06-29 | 南京邮电大学 | 一种高探测效率的单光子雪崩二极管探测器阵列单元 |
GB2542811A (en) * | 2015-09-30 | 2017-04-05 | Stmicroelectronics (Research & Development) Ltd | Sensing apparatus having a light sensitive detector |
KR102386471B1 (ko) | 2015-10-28 | 2022-04-15 | 에스케이하이닉스 주식회사 | 램프전압 제너레이터, 그를 포함하는 이미지 센싱 장치 및 그 이미지 센싱 장치의 구동 방법 |
FR3043797A1 (ja) | 2015-11-16 | 2017-05-19 | Stmicroelectronics (Grenoble 2) Sas | |
KR20170056909A (ko) | 2015-11-16 | 2017-05-24 | 삼성전자주식회사 | 이미지 센서 및 이를 포함하는 전자 장치 |
CN111239708B (zh) | 2015-12-20 | 2024-01-09 | 苹果公司 | 光检测和测距传感器 |
EP3206234B1 (en) | 2016-02-09 | 2023-08-09 | ams AG | Semiconductor element with a single photon avalanche diode and method for manufacturing such semiconductor element |
JP6735582B2 (ja) | 2016-03-17 | 2020-08-05 | キヤノン株式会社 | 撮像素子およびその駆動方法、および撮像装置 |
US9985163B2 (en) * | 2016-04-13 | 2018-05-29 | Stmicroelectronics (Research & Development) Limited | Single photon avalanche diode having pulse shaping filter |
US9912883B1 (en) | 2016-05-10 | 2018-03-06 | Apple Inc. | Image sensor with calibrated column analog-to-digital converters |
US10775605B2 (en) | 2016-06-16 | 2020-09-15 | Intel Corporation | Combined biometrics capture system with ambient free IR |
US10153310B2 (en) | 2016-07-18 | 2018-12-11 | Omnivision Technologies, Inc. | Stacked-chip backside-illuminated SPAD sensor with high fill-factor |
CN106124471B (zh) * | 2016-07-19 | 2019-04-16 | 天津大学 | 时域荧光寿命成像结构及寿命测试获取方法 |
US10495736B2 (en) * | 2016-08-04 | 2019-12-03 | Stmicroelectronics (Research & Development) Limited | Single SPAD array ranging system |
CN106206638B (zh) * | 2016-08-31 | 2019-01-11 | 中国科学院上海高等研究院 | 单光子雪崩二极管像素结构及像素阵列结构 |
FR3056019B1 (fr) | 2016-09-13 | 2018-10-12 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Photodiode de type spad |
CN109716525B (zh) | 2016-09-23 | 2020-06-09 | 苹果公司 | 堆叠式背面照明spad阵列 |
US10271037B2 (en) | 2017-01-20 | 2019-04-23 | Semiconductor Components Industries, Llc | Image sensors with hybrid three-dimensional imaging |
WO2019014494A1 (en) | 2017-07-13 | 2019-01-17 | Apple Inc. | EARLY-DELAYED PULSE COUNTING FOR DEPTH SENSORS EMITTING LIGHT |
US10622538B2 (en) | 2017-07-18 | 2020-04-14 | Apple Inc. | Techniques for providing a haptic output and sensing a haptic input using a piezoelectric body |
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